Wavelength-dispersive spectrometer

Industry

CPC
H01J2237/24425

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/24425Wavelength-dispersive spectrometer

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Electron probe microanalyzer and storage medium
- Patent number 10,410,825
- Issue date Sep 10, 2019
- Shimadzu Corporation
- Hiroshi Sakamae
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated mineral classification
- Patent number 9,778,215
- Issue date Oct 3, 2017
- FEI Company
- Michael James Owen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray detection system
- Patent number 8,421,007
- Issue date Apr 16, 2013
- TOHOKU UNIVERSITY
- Masami Terauchi
- G01 - MEASURING TESTING
Information Patent Grant
X-ray detection system for wavelength dispersive and energy dispers...
- Patent number 7,928,400
- Issue date Apr 19, 2011
- Bruker AXS, Inc.
- Yacouba Diawara
- G01 - MEASURING TESTING
Information Patent Grant
Wavelength-dispersive X-ray spectrometer
- Patent number 7,864,922
- Issue date Jan 4, 2011
- Jeol Ltd.
- Kazuyasu Kawabe
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analyzer using electron beam
- Patent number 7,592,591
- Issue date Sep 22, 2009
- Jeol Ltd.
- Satoshi Notoya
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for analyzing sample
- Patent number 7,579,591
- Issue date Aug 25, 2009
- Jeol Ltd.
- Masaru Takakura
- G01 - MEASURING TESTING
Information Patent Grant
X-ray metrology with diffractors
- Patent number 7,519,153
- Issue date Apr 14, 2009
- KLA-Tencor Technologies Corporation
- Jeffrey A. Moore
- G01 - MEASURING TESTING
Information Patent Grant
Large collection angle x-ray monochromators for electron probe micr...
- Patent number 7,427,757
- Issue date Sep 23, 2008
- KLA-Tencor Technologies Corporation
- Gary R. Janik
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray analysis apparatus provided with a double collimator mask
- Patent number 5,898,752
- Issue date Apr 27, 1999
- U.S. Philips Corporation
- Hendricus G. M. Van Der Wal
- G01 - MEASURING TESTING
Information Patent Grant
Electron probe microanalyzer and X-ray analysis using same
- Patent number 5,656,812
- Issue date Aug 12, 1997
- Jeol Ltd.
- Hideyuki Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3514599
- Patent number 3,514,599
- Issue date May 26, 1970
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTRON PROBE MICROANALYZER AND STORAGE MEDIUM
- Publication number 20190006146
- Publication date Jan 3, 2019
- Shimadzu Corporation
- Hiroshi SAKAMAE
- G01 - MEASURING TESTING
Information Patent Application
X-Ray Detection System
- Publication number 20120292508
- Publication date Nov 22, 2012
- JEOL Ltd.
- Masami Terauchi
- G01 - MEASURING TESTING
Information Patent Application
Wavelength-dispersive X-ray spectrometer
- Publication number 20100284513
- Publication date Nov 11, 2010
- JEOL Ltd.
- Kazuyasu KAWABE
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Analyzing Sample
- Publication number 20080111072
- Publication date May 15, 2008
- JEOL Ltd.
- Masaru Takakura
- G01 - MEASURING TESTING
Information Patent Application
X-ray analyzer using electron beam
- Publication number 20080067379
- Publication date Mar 20, 2008
- JEOL Ltd.
- Satoshi Notoya
- G01 - MEASURING TESTING

Wavelength-dispersive spectrometer

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Electron probe microanalyzer and storage medium

Automated mineral classification

X-ray detection system

X-ray detection system for wavelength dispersive and energy dispers...

Wavelength-dispersive X-ray spectrometer

X-ray analyzer using electron beam

Method and apparatus for analyzing sample

X-ray metrology with diffractors

Large collection angle x-ray monochromators for electron probe micr...

X-ray analysis apparatus provided with a double collimator mask

Electron probe microanalyzer and X-ray analysis using same

3514599

Patents Applicationslast 30 patents

ELECTRON PROBE MICROANALYZER AND STORAGE MEDIUM

X-Ray Detection System

Wavelength-dispersive X-ray spectrometer

Method and Apparatus for Analyzing Sample

X-ray analyzer using electron beam