wear behaviour, roughness

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CPC
G01N2223/634

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

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G01N2223/634wear behaviour, roughness

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Patents Grantslast 30 patents

Information Patent Grant
Method for estimating abrasion resistance and fracture resistance
- Patent number 10,794,893
- Issue date Oct 6, 2020
- Sumitomo Rubber Industries, Ltd.
- Fusae Kaneko
- G01 - MEASURING TESTING
Information Patent Grant
Single-crystal silicon carbide substrate, method for producing sing...
- Patent number 10,283,351
- Issue date May 7, 2019
- Hitachi Metals, Ltd.
- Taisuke Hirooka
- C30 - CRYSTAL GROWTH
Information Patent Grant
Wafer inspection apparatus and wafer inspection method
- Patent number 10,209,203
- Issue date Feb 19, 2019
- Sumitomo Chemical Company, Limited
- Hajime Fujikura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Nitride crystal, nitride crystal substrate, epilayer-containing nit...
- Patent number 10,078,059
- Issue date Sep 18, 2018
- Sumitomo Electric Industries, Ltd.
- Keiji Ishibashi
- C30 - CRYSTAL GROWTH
Information Patent Grant
Mannequins for use in imaging and systems including the same
- Patent number 9,244,022
- Issue date Jan 26, 2016
- The Procter & Gamble Company
- David John Maltbie
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
In-situ determination of thin film and multilayer structure and che...
- Patent number 8,513,603
- Issue date Aug 20, 2013
- West Virginia University
- David Lederman
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring concentration of magnetic material
- Patent number 8,115,478
- Issue date Feb 14, 2012
- Diesel United, Ltd.
- Takashi Fujii
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring reduction of surface layer material and apparat...
- Patent number 5,317,605
- Issue date May 31, 1994
- General Sekiyu Kabushiki Kaisha
- Toshiso Kosako
- G01 - MEASURING TESTING
Information Patent Grant
Sand detector
- Patent number 5,250,807
- Issue date Oct 5, 1993
- Norsk Hydro a.s
- Terje Sontvedt
- G01 - MEASURING TESTING
Information Patent Grant
Inspection of buried pipelines
- Patent number 4,785,175
- Issue date Nov 15, 1988
- British Gas plc
- Malcolm R. Wormald
- G01 - MEASURING TESTING
Information Patent Grant
3315076
- Patent number 3,315,076
- Issue date Apr 18, 1967
- G01 - MEASURING TESTING
Information Patent Grant
2811650
- Patent number 2,811,650
- Issue date Oct 29, 1957
- G01 - MEASURING TESTING
Information Patent Grant
2751506
- Patent number 2,751,506
- Issue date Jun 19, 1956
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
NITRIDE CRYSTAL, NITRIDE CRYSTAL SUBSTRATE, EPILAYER-CONTAINING NIT...
- Publication number 20170115239
- Publication date Apr 27, 2017
- Sumitomo Electric Industries, Ltd.
- Keiji ISHIBASHI
- C30 - CRYSTAL GROWTH
Information Patent Application
In-situ determination of thin film and multilayer structure and che...
- Publication number 20130216022
- Publication date Aug 22, 2013
- David Lederman
- G01 - MEASURING TESTING
Information Patent Application
Mannequins For Use In Imaging And Systems Including The Same
- Publication number 20120321040
- Publication date Dec 20, 2012
- David John Maltbie
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR MEASURING CONCENTRATION OF MAGNETIC MATERIAL
- Publication number 20090189599
- Publication date Jul 30, 2009
- DIESEL UNITED, LTD.
- Takashi Fujii
- G01 - MEASURING TESTING

wear behaviour, roughness

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method for estimating abrasion resistance and fracture resistance

Single-crystal silicon carbide substrate, method for producing sing...

Wafer inspection apparatus and wafer inspection method

Nitride crystal, nitride crystal substrate, epilayer-containing nit...

Mannequins for use in imaging and systems including the same

In-situ determination of thin film and multilayer structure and che...

Device and method for measuring concentration of magnetic material

Method of measuring reduction of surface layer material and apparat...

Sand detector

Inspection of buried pipelines

3315076

2811650

2751506

Patents Applicationslast 30 patents

NITRIDE CRYSTAL, NITRIDE CRYSTAL SUBSTRATE, EPILAYER-CONTAINING NIT...

In-situ determination of thin film and multilayer structure and che...

Mannequins For Use In Imaging And Systems Including The Same

DEVICE AND METHOD FOR MEASURING CONCENTRATION OF MAGNETIC MATERIAL