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G01N2223/317

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

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Patents Grantslast 30 patents

Information Patent Grant
Structure for pressurization analysis, X-ray diffraction apparatus...
- Patent number 11,913,891
- Issue date Feb 27, 2024
- Rigaku Corporation
- Koichiro Ito
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
X-ray examination device
- Patent number 11,821,856
- Issue date Nov 21, 2023
- Anton Paar GmbH
- Josef Gautsch
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluoresence apparatus for a measurement of mineral slurries
- Patent number 11,644,431
- Issue date May 9, 2023
- Microtrace Pty Limited
- Gregory John Roach
- G01 - MEASURING TESTING
Information Patent Grant
Shutter assembly for x-ray detection
- Patent number 11,577,320
- Issue date Feb 14, 2023
- Thermo Electron Scientific Instruments LLC
- Justin Morrow
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Device, system and method for X-ray diffraction analysis of an elec...
- Patent number 11,181,492
- Issue date Nov 23, 2021
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Julien Vulliet
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
X-ray detector monitoring device
- Patent number 10,837,925
- Issue date Nov 17, 2020
- Shimadzu Corporation
- Keijiro Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
High resolution X-Ray imaging system
- Patent number 10,839,972
- Issue date Nov 17, 2020
- Joseph T. Young
- G01 - MEASURING TESTING
Information Patent Grant
XRF analyzer for light element detection
- Patent number 10,175,184
- Issue date Jan 8, 2019
- Moxtek, Inc.
- Richard Creighton
- G01 - MEASURING TESTING
Information Patent Grant
XRF instrument with removably attached window protecting film assembly
- Patent number 10,024,811
- Issue date Jul 17, 2018
- Olympus Scientific Solutions Americas Inc.
- Peter Hardman
- G01 - MEASURING TESTING
Information Patent Grant
Pre-stressed gamma densitometer window and method of fabrication
- Patent number 9,791,389
- Issue date Oct 17, 2017
- Schlumberger Technology Corporation
- Rolf Rustad
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
XRF instrument with removably attached window protecting films
- Patent number 9,372,164
- Issue date Jun 21, 2016
- Olympus Scientific Solutions Americas Inc.
- Fabrice Cancre
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence analyzer
- Patent number 9,188,553
- Issue date Nov 17, 2015
- Hitachi High-Tech Science Corporation
- Masahiro Sakuta
- G01 - MEASURING TESTING
Information Patent Grant
X-ray detection apparatus for X-ray fluorescence analysis
- Patent number 9,116,106
- Issue date Aug 25, 2015
- Horiba, Ltd.
- Satoru Goto
- G01 - MEASURING TESTING
Information Patent Grant
Arrangement of analyzer measuring window
- Patent number 8,670,524
- Issue date Mar 11, 2014
- Outotec Oyj
- Kari Mann
- G01 - MEASURING TESTING
Information Patent Grant
Technique and apparatus for two-phase systems analysis directly in...
- Patent number 4,490,832
- Issue date Dec 25, 1984
- Middle East Trade Alliance, Inc.
- Emil A. Ab
- G01 - MEASURING TESTING
Information Patent Grant
3514602
- Patent number 3,514,602
- Issue date May 26, 1970
- G01 - MEASURING TESTING
Information Patent Grant
3409769
- Patent number 3,409,769
- Issue date Nov 5, 1968
- G01 - MEASURING TESTING
Information Patent Grant
3296478
- Patent number 3,296,478
- Issue date Jan 3, 1967
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY DETECTOR FOR X-RAY DIFFRACTION ANALYSIS APPARATUS
- Publication number 20230296538
- Publication date Sep 21, 2023
- MALVERN PANALYTICAL B.V.
- Roelof De Vries
- G01 - MEASURING TESTING
Information Patent Application
JOINT FOR A SCAN WINDOW FORMED TO A CYLINDER
- Publication number 20230263484
- Publication date Aug 24, 2023
- GE Precision Healthcare LLC
- Michael Eric Smith
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
APPARATUS FOR THE MEASUREMENT OF MINERAL SLURRIES
- Publication number 20210310969
- Publication date Oct 7, 2021
- MICROTRACE PTY LIMITED
- Gregory John ROACH
- G01 - MEASURING TESTING
Information Patent Application
DEVICE, SYSTEM AND METHOD FOR X-RAY DIFFRACTION ANALYSIS OF AN ELEC...
- Publication number 20210109043
- Publication date Apr 15, 2021
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Julien Vulliet
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
CARBON FIBER WINDOW FOR X-RAY DIFFRACTOMETER
- Publication number 20210080410
- Publication date Mar 18, 2021
- PROTO PATENTS LTD.
- Vedran Nicholas VUKOTIC
- B32 - LAYERED PRODUCTS
Information Patent Application
High Resolution X-Ray Imaging System
- Publication number 20180277275
- Publication date Sep 27, 2018
- Joseph T. Young
- G01 - MEASURING TESTING
Information Patent Application
PRE-STRESSED GAMMA DENSITOMETER WINDOW AND METHOD OF FABRICATION
- Publication number 20170010225
- Publication date Jan 12, 2017
- SCHLUMBERGER TECHNOLOGY CORPORATION
- Rolf Rustad
- G01 - MEASURING TESTING
Information Patent Application
XRF Analyzer for Light Element Detection
- Publication number 20160370307
- Publication date Dec 22, 2016
- MOXTEK, INC.
- Richard Creighton
- G01 - MEASURING TESTING
Information Patent Application
XRF INSTRUMENT WITH REMOVABLY ATTACHED WINDOW PROTECTING FILMS
- Publication number 20140307849
- Publication date Oct 16, 2014
- OLYMPUS SCIENTIFIC SOLUTIONS AMERICAS, INC
- Fabrice Cancre
- G01 - MEASURING TESTING
Information Patent Application
PROTECTIVE SHIELD FOR X-RAY FLUORESCENCE (XRF) SYSTEM
- Publication number 20140301531
- Publication date Oct 9, 2014
- James L. Failla
- G01 - MEASURING TESTING
Information Patent Application
PROTECTIVE SHIELD FOR X-RAY FLUORESCENCE (XRF) SYSTEM
- Publication number 20140301532
- Publication date Oct 9, 2014
- James L. Failla
- G01 - MEASURING TESTING
Information Patent Application
PROTECTIVE SHIELD FOR X-RAY FLUORESCENCE (XRF) SYSTEM
- Publication number 20140301533
- Publication date Oct 9, 2014
- James L. Failla
- G01 - MEASURING TESTING
Information Patent Application
X-Ray Fluorescence Analyzer
- Publication number 20140286474
- Publication date Sep 25, 2014
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Masahiro Sakuta
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DETECTION APPARATUS
- Publication number 20130272497
- Publication date Oct 17, 2013
- Horiba, Ltd.
- Satoru GOTO
- G01 - MEASURING TESTING
Information Patent Application
ARRANGEMENT OF ANALYZER MEASURING WINDOW
- Publication number 20120093300
- Publication date Apr 19, 2012
- OUTOTEC OYJ
- Kari Mann
- G01 - MEASURING TESTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Structure for pressurization analysis, X-ray diffraction apparatus...

X-ray examination device

X-ray fluoresence apparatus for a measurement of mineral slurries

Shutter assembly for x-ray detection

Device, system and method for X-ray diffraction analysis of an elec...

X-ray detector monitoring device

High resolution X-Ray imaging system

XRF analyzer for light element detection

XRF instrument with removably attached window protecting film assembly

Pre-stressed gamma densitometer window and method of fabrication

XRF instrument with removably attached window protecting films

X-ray fluorescence analyzer

X-ray detection apparatus for X-ray fluorescence analysis

Arrangement of analyzer measuring window

Technique and apparatus for two-phase systems analysis directly in...

3514602

3409769

3296478

Patents Applicationslast 30 patents

X-RAY DETECTOR FOR X-RAY DIFFRACTION ANALYSIS APPARATUS

JOINT FOR A SCAN WINDOW FORMED TO A CYLINDER

APPARATUS FOR THE MEASUREMENT OF MINERAL SLURRIES

DEVICE, SYSTEM AND METHOD FOR X-RAY DIFFRACTION ANALYSIS OF AN ELEC...

CARBON FIBER WINDOW FOR X-RAY DIFFRACTOMETER

High Resolution X-Ray Imaging System

PRE-STRESSED GAMMA DENSITOMETER WINDOW AND METHOD OF FABRICATION

XRF Analyzer for Light Element Detection

XRF INSTRUMENT WITH REMOVABLY ATTACHED WINDOW PROTECTING FILMS

PROTECTIVE SHIELD FOR X-RAY FLUORESCENCE (XRF) SYSTEM

PROTECTIVE SHIELD FOR X-RAY FLUORESCENCE (XRF) SYSTEM

PROTECTIVE SHIELD FOR X-RAY FLUORESCENCE (XRF) SYSTEM

X-Ray Fluorescence Analyzer

X-RAY DETECTION APPARATUS

ARRANGEMENT OF ANALYZER MEASURING WINDOW