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Leaf thickness sensing device
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Patent number 6,185,833
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Issue date Feb 13, 2001
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Yissum Research Development Company of the Hebrew University of Jerusalem
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Ben-Ami Bravdo
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G01 - MEASURING TESTING
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Touch probe
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Patent number 5,404,649
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Issue date Apr 11, 1995
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Renishaw Metrology Ltd.
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Peter Hajdukiewicz
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B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
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Supporting device
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Patent number 5,207,554
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Issue date May 4, 1993
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Fujitsu Limited
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Kazuo Asakawa
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B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
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Surface-sensing device
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Patent number 5,152,072
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Issue date Oct 6, 1992
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Renishaw plc
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David R. McMurtry
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G01 - MEASURING TESTING
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Tube curvature measuring probe and method
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Patent number 4,910,877
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Issue date Mar 27, 1990
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The United States of America as represented by the United States Department o...
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George J. Sokol
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G01 - MEASURING TESTING
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Inductance strain gauge
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Patent number 4,890,084
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Issue date Dec 26, 1989
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The Institute of Rock & Soil Mechanics Academia Sinica
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Li Chu
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G01 - MEASURING TESTING
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Magnetic amplifier
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Patent number 4,675,615
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Issue date Jun 23, 1987
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Donato Bramanti
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G01 - MEASURING TESTING
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Electronic dendrometer
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Patent number 4,549,355
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Issue date Oct 29, 1985
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Battelle Memorial Institute
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Ronald H. Sauer
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G01 - MEASURING TESTING