Claims
- 1. A touch probe for use on a coordinate positioning machine, comprising:
- a fixed structure by which the probe may be supported on a movable arm of the machine;
- a retaining member supported on the fixed structure;
- a module, comprising a supporting structure and a stylus connected to said supporting structure, the stylus having a stem and a sensing tip provided at a free end of the stem;
- a magnetic bias for exchangeably, releasably biasing said supporting structure into a first rest position on said retaining member, thereby to enable exchange of said module,
- said magnetic bias enabling tilting displacement of said supporting structure relative to said retaining member out of said first rest position in response to a displacing force, and return of said supporting structure to said first rest position on said retaining member, under the influence of said magnetic bias when said displacing force is removed.
- 2. A touch probe according to claim 1, wherein said retaining member is supported on the fixed structure in a second rest position, from which said retaining member is displaceable in response to said displacing force, and to which said retaining member may return when said displacing force is removed.
- 3. A touch probe according to claim 2, wherein said retaining member is supported on said fixed structure on a strain sensitive load cell, for sensing strain in said stylus responsive to contact between said sensing tip and a surface.
- 4. A touch probe according to claim 2, wherein the supporting structure of said module comprises a supporting body to which said stylus is directly connected.
- 5. A touch probe according to claim 1, further comprising a first magnetic member on said retaining member and a second magnetic member on said supporting structure, said first and second magnetic members providing said magnetic bias.
Priority Claims (3)
Number |
Date |
Country |
Kind |
9123853 |
Nov 1991 |
GBX |
|
9124777 |
Nov 1991 |
GBX |
|
9215512 |
Jul 1992 |
GBX |
|
Parent Case Info
This is a continuation of application Ser. No. 07/973,747, filed Nov. 9, 1992, now U.S. Pat. No. 5,327,657.
US Referenced Citations (19)
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EPX |
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EPX |
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Oct 1989 |
DEX |
9010591.5 |
Jan 1991 |
DEX |
2163554 |
Feb 1986 |
GBX |
2167559 |
May 1986 |
GBX |
WO9113316 |
Sep 1991 |
WOX |
Non-Patent Literature Citations (2)
Entry |
"Autochange Flexible Probing System for Co-Ordinate Measuring Machines;" Renishaw Electrical Limited Sales Literature; Issue 1, Aug. 1984, pp. 1-29. |
"Automatic Probe Changer Enhances Measuring Machines;" 123 Engineering, 226 (1986) Jul., Aug. No. 7/8, London, Great Britain, p. 517. |
Continuations (1)
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Number |
Date |
Country |
Parent |
973747 |
Nov 1992 |
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