-
-
Universal rotameter
-
Patent number 5,193,400
-
Issue date Mar 16, 1993
-
Hyok S. Lew
-
G01 - MEASURING TESTING
-
-
-
3385114
-
Patent number 3,385,114
-
Issue date May 28, 1968
-
G01 - MEASURING TESTING
-
3377869
-
Patent number 3,377,869
-
Issue date Apr 16, 1968
-
G01 - MEASURING TESTING
-
3365932
-
Patent number 3,365,932
-
Issue date Jan 30, 1968
-
G01 - MEASURING TESTING
-
3126745
-
Patent number 3,126,745
-
Issue date Mar 31, 1964
-
G01 - MEASURING TESTING
-
2926528
-
Patent number 2,926,528
-
Issue date Mar 1, 1960
-
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
-
2923159
-
Patent number 2,923,159
-
Issue date Feb 2, 1960
-
G01 - MEASURING TESTING
-
2891403
-
Patent number 2,891,403
-
Issue date Jun 23, 1959
-
G01 - MEASURING TESTING
-
2777320
-
Patent number 2,777,320
-
Issue date Jan 15, 1957
-
G01 - MEASURING TESTING
-
2765662
-
Patent number 2,765,662
-
Issue date Oct 9, 1956
-
G01 - MEASURING TESTING
-
2727392
-
Patent number 2,727,392
-
Issue date Dec 20, 1955
-
G01 - MEASURING TESTING
-
2459542
-
Patent number 2,459,542
-
Issue date Jan 18, 1949
-
G01 - MEASURING TESTING