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Y10S977/871

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YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS Y10USPC classification Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS Y10S977/00Nanotechnology

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Y10S977/871with environmental regulation means

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Patents Grantslast 30 patents

Information Patent Grant
Scanning tunneling microscope assembly, reactor, and system
- Patent number 8,893,309
- Issue date Nov 18, 2014
- The Regents of the University of California
- Feng Tao
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Methods of manufacturing diamond capsules
- Patent number 8,778,196
- Issue date Jul 15, 2014
- Sunshell LLC
- Victor B. Kley
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Zero thermal expansion, low heat transfer, variable temperature sam...
- Patent number 8,763,161
- Issue date Jun 24, 2014
- The United States of America, as represented by the Secretary of Commerce, th...
- Rachel Cannara
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscopy inspection and modification system
- Patent number 8,499,621
- Issue date Aug 6, 2013
- Victor B. Kley
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Methods of manufacturing diamond capsules
- Patent number 8,318,029
- Issue date Nov 27, 2012
- Terraspan LLC
- Victor B. Kley
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus for modifying and measuring diamond and other workpiece s...
- Patent number 7,514,680
- Issue date Apr 7, 2009
- Metadigm LLC
- Victor B. Kley
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Probe microscope system suitable for observing sample of long body
- Patent number 7,507,957
- Issue date Mar 24, 2009
- SII NanoTechnology Inc.
- Masamichi Fujihira
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscopy inspection and modification system
- Patent number 7,485,856
- Issue date Feb 3, 2009
- General Nanotechnology LLP
- Victor B. Kley
- G11 - INFORMATION STORAGE
Information Patent Grant
Cryogenic variable temperature vacuum scanning tunneling microscope
- Patent number 7,414,250
- Issue date Aug 19, 2008
- Northwestern University
- Mark C. Hersam
- G01 - MEASURING TESTING
Information Patent Grant
Methods of manufacturing diamond capsules
- Patent number 7,309,446
- Issue date Dec 18, 2007
- Metadigm LLC
- Victor B. Kley
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Apparatus for modifying and measuring diamond and other workpiece s...
- Patent number 7,183,548
- Issue date Feb 27, 2007
- Metadigm LLC
- Victor B. Kley
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Scanning probe microscopy inspection and modification system
- Patent number 7,045,780
- Issue date May 16, 2006
- General Nanotechnology, L.L.C.
- Victor B. Kley
- G11 - INFORMATION STORAGE
Information Patent Grant
Scanning probe microscopy inspection and modification system
- Patent number 6,861,648
- Issue date Mar 1, 2005
- General Nanotechnology L.L.C.
- Victor B. Kley
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for performing atomic force microscopy measure...
- Patent number 6,823,723
- Issue date Nov 30, 2004
- Interuniversitair Microelektronica Centrum (IMEC)
- Wilfried Vandervorst
- G01 - MEASURING TESTING
Information Patent Grant
Enhanced scanning probe microscope and nanolithographic methods usi...
- Patent number 6,737,646
- Issue date May 18, 2004
- Northwestern University
- Peter V. Schwartz
- G01 - MEASURING TESTING
Information Patent Grant
Enhanced scanning probe microscope
- Patent number 6,674,074
- Issue date Jan 6, 2004
- Northwestern University
- Peter V. Schwartz
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for controlling the temperature of a surface
- Patent number 6,648,904
- Issue date Nov 18, 2003
- Palomar Medical Technologies, Inc.
- Gregory Altshuler
- A46 - BRUSHWARE
Information Patent Grant
Hyperbaric hydrothermal atomic force microscope
- Patent number 6,586,734
- Issue date Jul 1, 2003
- The Regents of the University of California
- Kevin G. Knauss
- G01 - MEASURING TESTING
Information Patent Grant
Near-field optical recording apparatus assistively heating recordin...
- Patent number 6,584,062
- Issue date Jun 24, 2003
- Fuji Photo Film Co., Ltd.
- Masayuki Naya
- G11 - INFORMATION STORAGE
Information Patent Grant
Humidity chamber for scanning stylus atomic force microscope with c...
- Patent number 6,490,913
- Issue date Dec 10, 2002
- The United States of America as represented by the Secretary of Commerce
- Jonathan W. Martin
- G01 - MEASURING TESTING
Information Patent Grant
Hyperbaric hydrothermal atomic force microscope
- Patent number 6,437,328
- Issue date Aug 20, 2002
- The Regents of the University of California
- Kevin G. Knauss
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and system for increasing the accuracy of a probe-based inst...
- Patent number 6,389,886
- Issue date May 21, 2002
- Veeco Instruments Inc.
- Robert Daniels
- G01 - MEASURING TESTING
Information Patent Grant
Object inspection and/or modification system and method
- Patent number 6,337,479
- Issue date Jan 8, 2002
- Victor B. Kley
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Investigation and/or manipulation device
- Patent number 6,249,747
- Issue date Jun 19, 2001
- International Business Machines Corporation
- Gerd K. Binnig
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Microscopic system equipt with an electron microscope and a scannin...
- Patent number 6,242,737
- Issue date Jun 5, 2001
- Japan Science and Technology Corporation
- Hideaki Ohnishi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Temperature control for microscopy
- Patent number 6,233,093
- Issue date May 15, 2001
- The Goodyear Tire & Rubber Company
- William Allen Arnold
- G02 - OPTICS
Information Patent Grant
Scanning near-field optic/atomic force microscope
- Patent number 6,229,609
- Issue date May 8, 2001
- Seiko Instruments Inc.
- Hiroshi Muramatsu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and system for increasing the accuracy of a probe-based inst...
- Patent number 6,185,992
- Issue date Feb 13, 2001
- Veeco Instruments Inc.
- Robert Daniels
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic modulation of force sensor for AC detection in an atomic f...
- Patent number 6,134,955
- Issue date Oct 24, 2000
- Molecular Imaging Corporation
- Wenhai Han
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning microscope for image topography and surface potential
- Patent number 6,073,485
- Issue date Jun 13, 2000
- Jeol Ltd.
- Shinichi Kitamura
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR DELIVERING LOW POWER OPTICAL TREATMENTS
- Publication number 20140100489
- Publication date Apr 10, 2014
- Palomar Medical Technologies, Inc.
- Gregory B. Altshuler
- A46 - BRUSHWARE
Information Patent Application
ZERO THERMAL EXPANSION, LOW HEAT TRANSFER, VARIABLE TEMPERATURE SAM...
- Publication number 20130212750
- Publication date Aug 15, 2013
- THE NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY
- Rachel Cannara
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHODS OF MANUFACTURING DIAMOND CAPSULES
- Publication number 20130037978
- Publication date Feb 14, 2013
- Terraspan LLC
- Victor B. KLEY
- B82 - NANO-TECHNOLOGY
Information Patent Application
Scanning Tunneling Microscope Assembly, Reactor, and System
- Publication number 20120244038
- Publication date Sep 27, 2012
- The Regents of the University of California
- Feng Tao
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR DELIVERING LOW POWER OPTICAL TREATMENTS
- Publication number 20090287195
- Publication date Nov 19, 2009
- Palomar Medical Technologies, Inc.
- Gregory B. Altshuler
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Diamond structures as fuel capsules for nuclear fusion
- Publication number 20080256850
- Publication date Oct 23, 2008
- General Nanotechnology LLC
- Victor B. Kley
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
Scanning Probe Microscopy Inspection and Modification System
- Publication number 20080121028
- Publication date May 29, 2008
- General Nanotechnology LLC
- Victor B. Kley
- G02 - OPTICS
Information Patent Application
Scanning probe microscopy inspection and modification system
- Publication number 20070022804
- Publication date Feb 1, 2007
- General Nanotechnology LLC
- Victor B. Kley
- G02 - OPTICS
Information Patent Application
Probe microscope system suitable for observing sample of long body
- Publication number 20060060778
- Publication date Mar 23, 2006
- Masamichi Fujihira
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscopy inspection and modification system
- Publication number 20050172703
- Publication date Aug 11, 2005
- General Nanotechnology LLC
- Victor B. Kley
- G02 - OPTICS
Information Patent Application
Method and apparatus for controlling the temperature of a surface
- Publication number 20030100936
- Publication date May 29, 2003
- Gregory Altshuler
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Enhanced scanning probe microscope and nanolithographic methods usi...
- Publication number 20030007242
- Publication date Jan 9, 2003
- Peter V. Schwartz
- B82 - NANO-TECHNOLOGY
Information Patent Application
Enhanced scanning probe microscope
- Publication number 20030005755
- Publication date Jan 9, 2003
- Peter V. Schwartz
- B82 - NANO-TECHNOLOGY
Information Patent Application
Hyperbaric hydrothermal atomic force microscope
- Publication number 20020162960
- Publication date Nov 7, 2002
- The Regents of the University of California.
- Kevin G. Knauss
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method and apparatus for performing atomic force microscopy measure...
- Publication number 20020157457
- Publication date Oct 31, 2002
- Wilfried Vandervorst
- B82 - NANO-TECHNOLOGY
Information Patent Application
Object inspection and/or modification system and method
- Publication number 20020117611
- Publication date Aug 29, 2002
- Victor B. Kley
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method and system for increasing the accuracy of a probe-based inst...
- Publication number 20010000279
- Publication date Apr 19, 2001
- Veeco Instruments Inc.
- Robert Daniels
- G01 - MEASURING TESTING

with environmental regulation means

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Scanning tunneling microscope assembly, reactor, and system

Methods of manufacturing diamond capsules

Zero thermal expansion, low heat transfer, variable temperature sam...

Scanning probe microscopy inspection and modification system

Methods of manufacturing diamond capsules

Apparatus for modifying and measuring diamond and other workpiece s...

Probe microscope system suitable for observing sample of long body

Scanning probe microscopy inspection and modification system

Cryogenic variable temperature vacuum scanning tunneling microscope

Methods of manufacturing diamond capsules

Apparatus for modifying and measuring diamond and other workpiece s...

Scanning probe microscopy inspection and modification system

Scanning probe microscopy inspection and modification system

Method and apparatus for performing atomic force microscopy measure...

Enhanced scanning probe microscope and nanolithographic methods usi...

Enhanced scanning probe microscope

Method and apparatus for controlling the temperature of a surface

Hyperbaric hydrothermal atomic force microscope

Near-field optical recording apparatus assistively heating recordin...

Humidity chamber for scanning stylus atomic force microscope with c...

Hyperbaric hydrothermal atomic force microscope

Method and system for increasing the accuracy of a probe-based inst...

Object inspection and/or modification system and method

Investigation and/or manipulation device

Microscopic system equipt with an electron microscope and a scannin...

Temperature control for microscopy

Scanning near-field optic/atomic force microscope

Method and system for increasing the accuracy of a probe-based inst...

Magnetic modulation of force sensor for AC detection in an atomic f...

Scanning microscope for image topography and surface potential

Patents Applicationslast 30 patents

METHOD AND APPARATUS FOR DELIVERING LOW POWER OPTICAL TREATMENTS

ZERO THERMAL EXPANSION, LOW HEAT TRANSFER, VARIABLE TEMPERATURE SAM...

METHODS OF MANUFACTURING DIAMOND CAPSULES

Scanning Tunneling Microscope Assembly, Reactor, and System

METHODS AND APPARATUS FOR DELIVERING LOW POWER OPTICAL TREATMENTS

Diamond structures as fuel capsules for nuclear fusion

Scanning Probe Microscopy Inspection and Modification System

Scanning probe microscopy inspection and modification system

Probe microscope system suitable for observing sample of long body

Scanning probe microscopy inspection and modification system

Method and apparatus for controlling the temperature of a surface

Enhanced scanning probe microscope and nanolithographic methods usi...

Enhanced scanning probe microscope

Hyperbaric hydrothermal atomic force microscope

Method and apparatus for performing atomic force microscopy measure...

Object inspection and/or modification system and method

Method and system for increasing the accuracy of a probe-based inst...