with environmental specimen chamber

Industry

CPC
H01J2237/2608

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/2608with environmental specimen chamber

Industries

Patents Grantslast 30 patents

Information Patent Grant
Build material handling unit for a powder module for an apparatus f...
- Patent number 11,878,463
- Issue date Jan 23, 2024
- CONCEPT LASER GMBH
- Dominik Eideloth
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Multidimensional printer
- Patent number 11,738,312
- Issue date Aug 29, 2023
- GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY O...
- Andrei A. Kolmakov
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Light guide assembly for an electron microscope
- Patent number 11,335,536
- Issue date May 17, 2022
- FEI Company
- Marek Uncovsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle optical apparatus for through-the-lens detection o...
- Patent number 11,276,547
- Issue date Mar 15, 2022
- Carl Zeiss Microscopy GmbH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle optical apparatus for through-the-lens detection o...
- Patent number 10,861,670
- Issue date Dec 8, 2020
- Carl Zeiss Microscopy GmbH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Membrane assembly, examination container and electron microscope
- Patent number 10,593,513
- Issue date Mar 17, 2020
- TAIWAN ELECTRON MICROSCOPE INSTRUMENT CORPORATION
- Tsu-Wei Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle optical apparatus for through-the-lens detection o...
- Patent number 10,522,321
- Issue date Dec 31, 2019
- Carl Zeiss Microscopy GmbH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging device for imaging an object and for imaging a structural u...
- Patent number 10,460,904
- Issue date Oct 29, 2019
- Carl Zeiss Microscopy GmbH
- Wolfgang Berger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray analysis in air
- Patent number 10,354,834
- Issue date Jul 16, 2019
- Oxford Instruments Nanotechnology Tools Limited
- Peter J. Statham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion beam device and sample observation method
- Patent number 10,340,117
- Issue date Jul 2, 2019
- Hitachi, Ltd.
- Shinichi Matsubara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam-induced etching
- Patent number 10,304,658
- Issue date May 28, 2019
- FEI Company
- Aiden Martin
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Wide field atmospheric scanning electron microscope
- Patent number 10,262,832
- Issue date Apr 16, 2019
- Gerasimos Daniel Danilatos
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device, image generation method, observation...
- Patent number 9,824,854
- Issue date Nov 21, 2017
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged-particle-beam device, specimen-image acquisition method, an...
- Patent number 9,741,530
- Issue date Aug 22, 2017
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray analysis in air
- Patent number 9,704,688
- Issue date Jul 11, 2017
- Oxford Instruments Nanotechnology Tools Limited
- Peter Statham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device, method for adjusting charged particle...
- Patent number 9,673,020
- Issue date Jun 6, 2017
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam microscope with improved imaging gas and method of use
- Patent number 9,633,816
- Issue date Apr 25, 2017
- FEI Company
- Toby Shanley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample holder for scanning electron microscope, scanning electron m...
- Patent number 9,552,959
- Issue date Jan 24, 2017
- National Institute of Advanced Industrial Science and Technology
- Toshihiko Ogura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 9,543,111
- Issue date Jan 10, 2017
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample base, charged particle beam device and sample observation me...
- Patent number 9,508,527
- Issue date Nov 29, 2016
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device, sample stage unit, and sample observa...
- Patent number 9,472,375
- Issue date Oct 18, 2016
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Compound microscope device
- Patent number 9,310,596
- Issue date Apr 12, 2016
- Inter-University Research Institute Corporation National Institute of Natural...
- Kuniaki Nagayama
- G02 - OPTICS
Information Patent Grant
Charged particle beam device, position adjusting method for diaphra...
- Patent number 9,251,996
- Issue date Feb 2, 2016
- Hitachi High-Technologies Corporation
- Shinsuke Kawanishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection or observation apparatus and sample inspection or observ...
- Patent number 9,236,217
- Issue date Jan 12, 2016
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device, method for adjusting charged particle...
- Patent number 9,165,741
- Issue date Oct 20, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle optical apparatus with a predetermined final vacuum pressure
- Patent number 9,153,414
- Issue date Oct 6, 2015
- FEI Company
- Hendrik Nicolaas Slingerland
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam-induced etching
- Patent number 9,123,506
- Issue date Sep 1, 2015
- FEI Company
- Aiden Martin
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Charged particle beam apparatus
- Patent number 9,105,442
- Issue date Aug 11, 2015
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle radiation apparatus, and method for displaying thr...
- Patent number 9,099,281
- Issue date Aug 4, 2015
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Methods for observing samples and preprocessing thereof
- Patent number 9,086,343
- Issue date Jul 21, 2015
- Hitachi High-Technologies Corporation
- Masamichi Shiono
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SPECIMEN CONTROL MEANS FOR PARTICLE BEAM MICROSCOPY
- Publication number 20210285899
- Publication date Sep 16, 2021
- Gerasimos Daniel DANILATOS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIGHT GUIDE ASSEMBLY FOR AN ELECTRON MICROSCOPE
- Publication number 20210082659
- Publication date Mar 18, 2021
- FEI Company
- Marek Uncovsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...
- Publication number 20210050178
- Publication date Feb 18, 2021
- CARL ZEISS MICROSCOPY GMBH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...
- Publication number 20200135425
- Publication date Apr 30, 2020
- CARL ZEISS MICROSCOPY GMBH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMBRANE ASSEMBLY, EXAMINATION CONTAINER AND ELECTRON MICROSCOPE
- Publication number 20200027695
- Publication date Jan 23, 2020
- Taiwan Electron Microscope Instrument Corporation
- Tsu-Wei Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...
- Publication number 20180342368
- Publication date Nov 29, 2018
- CARL ZEISS MICROSCOPY GMBH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WIDE FIELD ATOMOSPHERIC SCANNING ELECTRON MICROSCOPE
- Publication number 20180226221
- Publication date Aug 9, 2018
- Gerasimos Daniel DANILATOS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGING DEVICE FOR IMAGING AN OBJECT AND FOR IMAGING A STRUCTURAL U...
- Publication number 20180218877
- Publication date Aug 2, 2018
- CARL ZEISS MICROSCOPY GMBH
- Wolfgang Berger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY ANALYSIS IN AIR
- Publication number 20170271125
- Publication date Sep 21, 2017
- OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
- Peter J. STATHAM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged-Particle-Beam Device, Specimen-Image Acquisition Method, an...
- Publication number 20160336145
- Publication date Nov 17, 2016
- Hitachi High-Technologies Corporation
- Yusuke OMINAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY ANALYSIS IN AIR
- Publication number 20160233051
- Publication date Aug 11, 2016
- OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
- Peter STATHAM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE OPTICAL APPARATUS HAVING A SELECTIVELY POSITIONABL...
- Publication number 20150348742
- Publication date Dec 3, 2015
- CARL ZEISS MICROSCOPY GMBH
- Michael Albiez
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR OBSERVING SAMPLES AND PREPROCESSING THEREOF
- Publication number 20140370540
- Publication date Dec 18, 2014
- Masamichi Shiono
- G01 - MEASURING TESTING
Information Patent Application
Electron Beam-Induced Etching
- Publication number 20140363978
- Publication date Dec 11, 2014
- Aiden Martin
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
INSPECTION OR OBSERVATION APPARATUS AND SAMPLE INSPECTION OR OBSERV...
- Publication number 20140246583
- Publication date Sep 4, 2014
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20140175278
- Publication date Jun 26, 2014
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE, METHOD FOR ADJUSTING CHARGED PARTICLE...
- Publication number 20140151553
- Publication date Jun 5, 2014
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20140123898
- Publication date May 8, 2014
- Hitachi High-Technologies Corporation
- Tsunenori Nomaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20140021347
- Publication date Jan 23, 2014
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20130313430
- Publication date Nov 28, 2013
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPOUND MICROSCOPE DEVICE
- Publication number 20130088775
- Publication date Apr 11, 2013
- Kuniaki Nagayama
- G02 - OPTICS
Information Patent Application
Charged Particle Radiation Apparatus, and Method for Displaying Thr...
- Publication number 20120212583
- Publication date Aug 23, 2012
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICES
- Publication number 20120091337
- Publication date Apr 19, 2012
- Carl Zeiss NTS Limited
- Stewart John Bean
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Environmental cell for a particle-optical apparatus
- Publication number 20120091338
- Publication date Apr 19, 2012
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE, AN INTERFACE AND A METHOD FOR OBSERVI...
- Publication number 20110168889
- Publication date Jul 14, 2011
- Dov Shachal
- G01 - MEASURING TESTING
Information Patent Application
AMBIENT PRESSURE PHOTOELECTRON MICROSCOPE
- Publication number 20110006205
- Publication date Jan 13, 2011
- Raymond Browning
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BEAM DEVICE SYSTEM COMPRISING A PARTICLE BEAM DEVICE AND AN OPTICAL...
- Publication number 20100224780
- Publication date Sep 9, 2010
- Bernd Spruck
- G02 - OPTICS
Information Patent Application
Sample Inspection Apparatus, Sample Inspection Method and Sample In...
- Publication number 20100096549
- Publication date Apr 22, 2010
- JEOL Ltd.
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING
Information Patent Application
Particle Beam System
- Publication number 20100051803
- Publication date Mar 4, 2010
- JEOL Ltd.
- Mitsuru Koizumi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Specimen Holder, Specimen Inspection Apparatus, and Specimen Inspec...
- Publication number 20090314955
- Publication date Dec 24, 2009
- JEOL Ltd.
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING

with environmental specimen chamber

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Build material handling unit for a powder module for an apparatus f...

Multidimensional printer

Light guide assembly for an electron microscope

Charged particle optical apparatus for through-the-lens detection o...

Charged particle optical apparatus for through-the-lens detection o...

Membrane assembly, examination container and electron microscope

Charged particle optical apparatus for through-the-lens detection o...

Imaging device for imaging an object and for imaging a structural u...

X-ray analysis in air

Ion beam device and sample observation method

Electron beam-induced etching

Wide field atmospheric scanning electron microscope

Charged particle beam device, image generation method, observation...

Charged-particle-beam device, specimen-image acquisition method, an...

X-ray analysis in air

Charged particle beam device, method for adjusting charged particle...

Electron beam microscope with improved imaging gas and method of use

Sample holder for scanning electron microscope, scanning electron m...

Charged particle beam device

Sample base, charged particle beam device and sample observation me...

Charged particle beam device, sample stage unit, and sample observa...

Compound microscope device

Charged particle beam device, position adjusting method for diaphra...

Inspection or observation apparatus and sample inspection or observ...

Charged particle beam device, method for adjusting charged particle...

Particle optical apparatus with a predetermined final vacuum pressure

Electron beam-induced etching

Charged particle beam apparatus

Charged particle radiation apparatus, and method for displaying thr...

Methods for observing samples and preprocessing thereof

Patents Applicationslast 30 patents

SPECIMEN CONTROL MEANS FOR PARTICLE BEAM MICROSCOPY

LIGHT GUIDE ASSEMBLY FOR AN ELECTRON MICROSCOPE

CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...

CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...

MEMBRANE ASSEMBLY, EXAMINATION CONTAINER AND ELECTRON MICROSCOPE

CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...

WIDE FIELD ATOMOSPHERIC SCANNING ELECTRON MICROSCOPE

IMAGING DEVICE FOR IMAGING AN OBJECT AND FOR IMAGING A STRUCTURAL U...

X-RAY ANALYSIS IN AIR

Charged-Particle-Beam Device, Specimen-Image Acquisition Method, an...

X-RAY ANALYSIS IN AIR

CHARGED PARTICLE OPTICAL APPARATUS HAVING A SELECTIVELY POSITIONABL...

METHODS FOR OBSERVING SAMPLES AND PREPROCESSING THEREOF

Electron Beam-Induced Etching

INSPECTION OR OBSERVATION APPARATUS AND SAMPLE INSPECTION OR OBSERV...

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM DEVICE, METHOD FOR ADJUSTING CHARGED PARTICLE...

CHARGED PARTICLE BEAM DEVICE

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM DEVICE

COMPOUND MICROSCOPE DEVICE

Charged Particle Radiation Apparatus, and Method for Displaying Thr...

CHARGED PARTICLE BEAM DEVICES

Environmental cell for a particle-optical apparatus

SCANNING ELECTRON MICROSCOPE, AN INTERFACE AND A METHOD FOR OBSERVI...

AMBIENT PRESSURE PHOTOELECTRON MICROSCOPE

BEAM DEVICE SYSTEM COMPRISING A PARTICLE BEAM DEVICE AND AN OPTICAL...

Sample Inspection Apparatus, Sample Inspection Method and Sample In...

Particle Beam System

Specimen Holder, Specimen Inspection Apparatus, and Specimen Inspec...