with improved layout

Industry

CPC
G11C29/80

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Parent Industries

GPHYSICS G11Information storage G11CSTATIC STORES G11C29/00Checking stores for correct operation; Subsequent repair Testing stores during standby or offline operation

Current Industry

G11C29/80with improved layout

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Memory device with redundancy for page-based repair
- Patent number 12,062,407
- Issue date Aug 13, 2024
- Micron Technology, Inc.
- Alan John Wilson
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory testing techniques
- Patent number 11,862,271
- Issue date Jan 2, 2024
- ARM Limited
- Andy Wangkun Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for determining repair location for redundancy circuit, meth...
- Patent number 11,842,788
- Issue date Dec 12, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Lei Yang
- G11 - INFORMATION STORAGE
Information Patent Grant
Three-dimensional stacked memory device and method
- Patent number 11,830,562
- Issue date Nov 28, 2023
- Samsung Electronics Co., Ltd.
- Shinhaeng Kang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Controller to detect malfunctioning address of memory device
- Patent number 11,783,910
- Issue date Oct 10, 2023
- RAMBUS INC.
- Adrian E. Ong
- G11 - INFORMATION STORAGE
Information Patent Grant
Fail bit repair solution determination method and device
- Patent number 11,776,654
- Issue date Oct 3, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Yui-Lang Chen
- G11 - INFORMATION STORAGE
Information Patent Grant
Systems and methods for improving radiation tolerance of three-dime...
- Patent number 11,728,004
- Issue date Aug 15, 2023
- Board of Trustees of the University of Alabama
- Biswajit Ray
- G11 - INFORMATION STORAGE
Information Patent Grant
Grown bad block management in a memory sub-system
- Patent number 11,728,006
- Issue date Aug 15, 2023
- Micron Technology, Inc.
- Tao Liu
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device
- Patent number 11,664,087
- Issue date May 30, 2023
- SK hynix Inc.
- A Ram Rim
- G11 - INFORMATION STORAGE
Information Patent Grant
Quarter match concurrent compensation in a memory system
- Patent number 11,626,154
- Issue date Apr 11, 2023
- Micron Technology, Inc.
- Jacob Rice
- G11 - INFORMATION STORAGE
Information Patent Grant
Redundancy in microelectronic devices, and related methods, devices...
- Patent number 11,615,845
- Issue date Mar 28, 2023
- Micron Technology, Inc.
- Toru Ishikawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Multi-state programming for memory devices
- Patent number 11,562,787
- Issue date Jan 24, 2023
- Western Digital Technologies, Inc.
- Richard David Barndt
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Controller to detect malfunctioning address of memory device
- Patent number 11,501,848
- Issue date Nov 15, 2022
- RAMBUS INC.
- Adrian E. Ong
- G11 - INFORMATION STORAGE
Information Patent Grant
Runtime cell row replacement in a memory
- Patent number 11,481,294
- Issue date Oct 25, 2022
- Intel Corporation
- Satish Muthiyalu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory device with post package repair function and method for oper...
- Patent number 11,468,966
- Issue date Oct 11, 2022
- NANYA TECHNOLOGY CORPORATION
- Nung Yen
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus and techniques for programming anti-fuses to repair a mem...
- Patent number 11,468,965
- Issue date Oct 11, 2022
- Micron Technology, Inc.
- Seth A. Eichmeyer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor memory devices and methods of operating semiconductor...
- Patent number 11,450,396
- Issue date Sep 20, 2022
- Samsung Electronics Co., Ltd.
- Kyungryun Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Three-dimensional stacked memory device and method
- Patent number 11,386,975
- Issue date Jul 12, 2022
- Samsung Electronics Co., Ltd.
- Shinhaeng Kang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Grown bad block management in a memory sub-system
- Patent number 11,373,729
- Issue date Jun 28, 2022
- Micron Technology, Inc.
- Tao Liu
- G11 - INFORMATION STORAGE
Information Patent Grant
Microelectronic device testing, and associated methods, devices, an...
- Patent number 11,367,495
- Issue date Jun 21, 2022
- Micron Technology, Inc.
- Ahmad Zainal Amrie Bin Shaari
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for selecting bad columns in data storage medium
- Patent number 11,335,432
- Issue date May 17, 2022
- Silicon Motion, Inc.
- Sheng-Yuan Huang
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatuses and methods for fuse latch redundancy
- Patent number 11,257,566
- Issue date Feb 22, 2022
- Micron Technology, Inc.
- Dennis G. Montierth
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory repair scheme
- Patent number 11,211,142
- Issue date Dec 28, 2021
- Taiwan Semiconductor Manufacturing Company Limited
- Yi-Chun Shih
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory devices having spare column remap storages and methods of re...
- Patent number 11,200,962
- Issue date Dec 14, 2021
- SK hynix Inc.
- Hokyoon Lee
- G11 - INFORMATION STORAGE
Information Patent Grant
Substitute redundant memory
- Patent number 11,119,857
- Issue date Sep 14, 2021
- MoSys, Inc.
- Dipak K Sikdar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor memory devices and methods of operating semiconductor...
- Patent number 11,094,390
- Issue date Aug 17, 2021
- Samsung Electronics Co., Ltd.
- Kyungryun Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Multi-state programming for memory devices
- Patent number 11,087,836
- Issue date Aug 10, 2021
- Western Digital Technologies, Inc.
- Richard David Barndt
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-level memory repurposing technology to process a request to m...
- Patent number 11,069,425
- Issue date Jul 20, 2021
- Intel Corporation
- Jim S. Baca
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory device and memory system
- Patent number 11,049,905
- Issue date Jun 29, 2021
- SONY SEMICONDUCTOR SOLUTIONS CORPORATION
- Haruhiko Terada
- G11 - INFORMATION STORAGE
Information Patent Grant
Using dual channel memory as single channel memory with spares
- Patent number 11,037,619
- Issue date Jun 15, 2021
- International Business Machines Corporation
- Kyu-Hyoun Kim
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
MEMORY DEVICE WITH REDUNDANCY FOR PAGE-BASED REPAIR
- Publication number 20240363192
- Publication date Oct 31, 2024
- Micron Technology, Inc.
- Alan John Wilson
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE PERFORMING TARGET REFRESH OPERATION AND OPERATING MET...
- Publication number 20240161861
- Publication date May 16, 2024
- SK HYNIX INC.
- Jung Taek YOU
- G11 - INFORMATION STORAGE
Information Patent Application
Memory Testing Techniques
- Publication number 20240136006
- Publication date Apr 25, 2024
- ARM Limited
- Andy Wangkun Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY DEVICE WITH REDUNDANCY FOR PAGE-BASED REPAIR
- Publication number 20240071558
- Publication date Feb 29, 2024
- Micron Technology, Inc.
- Alan John Wilson
- G11 - INFORMATION STORAGE
Information Patent Application
CONTROLLER TO DETECT MALFUNCTIONING ADDRESS OF MEMORY DEVICE
- Publication number 20240071559
- Publication date Feb 29, 2024
- Rambus Inc.
- Adrian E. Ong
- G11 - INFORMATION STORAGE
Information Patent Application
NEUROMORPHIC DEVICE
- Publication number 20230386601
- Publication date Nov 30, 2023
- Samsung Electronics Co., Ltd.
- Youngnam HWANG
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20220406399
- Publication date Dec 22, 2022
- SK HYNIX INC.
- A Ram RIM
- G11 - INFORMATION STORAGE
Information Patent Application
THREE-DIMENSIONAL STACKED MEMORY DEVICE AND METHOD
- Publication number 20220310194
- Publication date Sep 29, 2022
- Samsung Electronics Co., Ltd.
- Shinhaeng KANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
GROWN BAD BLOCK MANAGEMENT IN A MEMORY SUB-SYSTEM
- Publication number 20220277802
- Publication date Sep 1, 2022
- Micron Technology, Inc.
- Tao Liu
- G11 - INFORMATION STORAGE
Information Patent Application
CONTROLLER TO DETECT MALFUNCTIONING ADDRESS OF MEMORY DEVICE
- Publication number 20220238177
- Publication date Jul 28, 2022
- Rambus Inc.
- Adrian E. Ong
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD FOR DETERMINING REPAIR LOCATION FOR REDUNDANCY CIRCUIT, METH...
- Publication number 20220165351
- Publication date May 26, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Lei YANG
- G11 - INFORMATION STORAGE
Information Patent Application
FAIL BIT REPAIR SOLUTION DETERMINATION METHOD AND DEVICE
- Publication number 20220084620
- Publication date Mar 17, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Yui-Lang CHEN
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY DEVICES AND METHODS OF OPERATING SEMICONDUCTOR...
- Publication number 20220020445
- Publication date Jan 20, 2022
- Samsung Electronics Co., Ltd.
- Kyungryun Kim
- G11 - INFORMATION STORAGE
Information Patent Application
CONTROLLER TO DETECT MALFUNCTIONING ADDRESS OF MEMORY DEVICE
- Publication number 20210407619
- Publication date Dec 30, 2021
- Rambus Inc.
- Adrian E. Ong
- G11 - INFORMATION STORAGE
Information Patent Application
GROWN BAD BLOCK MANAGEMENT IN A MEMORY SUB-SYSTEM
- Publication number 20210391029
- Publication date Dec 16, 2021
- Micron Technology, Inc.
- Tao Liu
- G11 - INFORMATION STORAGE
Information Patent Application
Multi-State Programming for Memory Devices
- Publication number 20210319828
- Publication date Oct 14, 2021
- Western Digital Technologies, Inc.
- Richard David BARNDT
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR SELECTING BAD COLUMNS IN DATA STORAGE MEDIUM
- Publication number 20210249099
- Publication date Aug 12, 2021
- SILICON MOTION, INC.
- SHENG-YUAN HUANG
- G11 - INFORMATION STORAGE
Information Patent Application
MICROELECTRONIC DEVICE TESTING, AND ASSOCIATED METHODS, DEVICES, AN...
- Publication number 20210241842
- Publication date Aug 5, 2021
- Micron Technology, Inc.
- Ahmad Zainal Amrie Bin Shaari
- G11 - INFORMATION STORAGE
Information Patent Application
Multi-State Programming for Memory Devices
- Publication number 20210104275
- Publication date Apr 8, 2021
- Western Digital Technologies, Inc.
- Richard David BARNDT
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUSES AND METHODS FOR FUSE LATCH AND MATCH CIRCUITS
- Publication number 20210043269
- Publication date Feb 11, 2021
- Micron Technology, Inc.
- Yuan He
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUSES AND METHODS FOR FUSE LATCH REDUNDANCY
- Publication number 20200381077
- Publication date Dec 3, 2020
- Micron Technology, Inc.
- Dennis G. Montierth
- G11 - INFORMATION STORAGE
Information Patent Application
Multi-State Programming for Memory Devices
- Publication number 20200350007
- Publication date Nov 5, 2020
- Western Digital Technologies, Inc.
- Richard David BARNDT
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY DEVICES HAVING SPARE COLUMN REMAP STORAGES AND METHODS OF RE...
- Publication number 20200312423
- Publication date Oct 1, 2020
- SK HYNIX INC.
- Hokyoon LEE
- G11 - INFORMATION STORAGE
Information Patent Application
CONTROLLER TO DETECT MALFUNCTIONING ADDRESS OF MEMORY DEVICE
- Publication number 20200273534
- Publication date Aug 27, 2020
- RAMBUS INC.
- Adrian E. Ong
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE AND MEMORY SYSTEM
- Publication number 20200273909
- Publication date Aug 27, 2020
- Sony Semiconductor Solutions Corporation
- Haruhiko TERADA
- G11 - INFORMATION STORAGE
Information Patent Application
Memory Repair Scheme
- Publication number 20200227133
- Publication date Jul 16, 2020
- Taiwan Semiconductor Manufacturing Company Limited
- Yi-Chun Shih
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTI-STATE PROGRAMMING FOR MEMORY DEVICES
- Publication number 20200194064
- Publication date Jun 18, 2020
- Western Digital Technologies, Inc.
- Richard David BARNDT
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Memory Testing Techniques
- Publication number 20200194093
- Publication date Jun 18, 2020
- ARM Limited
- Andy Wangkun Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTROLLER TO DETECT MALFUNCTIONING ADDRESS OF MEMORY DEVICE
- Publication number 20200111540
- Publication date Apr 9, 2020
- RAMBUS INC.
- Adrian E. Ong
- G11 - INFORMATION STORAGE
Information Patent Application
REDUNDANCY ARRAY COLUMN DECODER FOR MEMORY
- Publication number 20200090726
- Publication date Mar 19, 2020
- Micron Technology, Inc.
- Daniele Vimercati
- G11 - INFORMATION STORAGE

with improved layout

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Memory device with redundancy for page-based repair

Memory testing techniques

Method for determining repair location for redundancy circuit, meth...

Three-dimensional stacked memory device and method

Controller to detect malfunctioning address of memory device

Fail bit repair solution determination method and device

Systems and methods for improving radiation tolerance of three-dime...

Grown bad block management in a memory sub-system

Semiconductor device

Quarter match concurrent compensation in a memory system

Redundancy in microelectronic devices, and related methods, devices...

Multi-state programming for memory devices

Controller to detect malfunctioning address of memory device

Runtime cell row replacement in a memory

Memory device with post package repair function and method for oper...

Apparatus and techniques for programming anti-fuses to repair a mem...

Semiconductor memory devices and methods of operating semiconductor...

Three-dimensional stacked memory device and method

Grown bad block management in a memory sub-system

Microelectronic device testing, and associated methods, devices, an...

Method for selecting bad columns in data storage medium

Apparatuses and methods for fuse latch redundancy

Memory repair scheme

Memory devices having spare column remap storages and methods of re...

Substitute redundant memory

Semiconductor memory devices and methods of operating semiconductor...

Multi-state programming for memory devices

Multi-level memory repurposing technology to process a request to m...

Memory device and memory system

Using dual channel memory as single channel memory with spares

Patents Applicationslast 30 patents

MEMORY DEVICE WITH REDUNDANCY FOR PAGE-BASED REPAIR

MEMORY DEVICE PERFORMING TARGET REFRESH OPERATION AND OPERATING MET...

Memory Testing Techniques

MEMORY DEVICE WITH REDUNDANCY FOR PAGE-BASED REPAIR

CONTROLLER TO DETECT MALFUNCTIONING ADDRESS OF MEMORY DEVICE

NEUROMORPHIC DEVICE

SEMICONDUCTOR DEVICE

THREE-DIMENSIONAL STACKED MEMORY DEVICE AND METHOD

GROWN BAD BLOCK MANAGEMENT IN A MEMORY SUB-SYSTEM

CONTROLLER TO DETECT MALFUNCTIONING ADDRESS OF MEMORY DEVICE

METHOD FOR DETERMINING REPAIR LOCATION FOR REDUNDANCY CIRCUIT, METH...

FAIL BIT REPAIR SOLUTION DETERMINATION METHOD AND DEVICE

SEMICONDUCTOR MEMORY DEVICES AND METHODS OF OPERATING SEMICONDUCTOR...

CONTROLLER TO DETECT MALFUNCTIONING ADDRESS OF MEMORY DEVICE

GROWN BAD BLOCK MANAGEMENT IN A MEMORY SUB-SYSTEM

Multi-State Programming for Memory Devices

METHOD FOR SELECTING BAD COLUMNS IN DATA STORAGE MEDIUM

MICROELECTRONIC DEVICE TESTING, AND ASSOCIATED METHODS, DEVICES, AN...

Multi-State Programming for Memory Devices

APPARATUSES AND METHODS FOR FUSE LATCH AND MATCH CIRCUITS

APPARATUSES AND METHODS FOR FUSE LATCH REDUNDANCY

Multi-State Programming for Memory Devices

MEMORY DEVICES HAVING SPARE COLUMN REMAP STORAGES AND METHODS OF RE...

CONTROLLER TO DETECT MALFUNCTIONING ADDRESS OF MEMORY DEVICE

MEMORY DEVICE AND MEMORY SYSTEM

Memory Repair Scheme

MULTI-STATE PROGRAMMING FOR MEMORY DEVICES

Memory Testing Techniques

CONTROLLER TO DETECT MALFUNCTIONING ADDRESS OF MEMORY DEVICE

REDUNDANCY ARRAY COLUMN DECODER FOR MEMORY