with incident ion beam

Industry

CPC
G01N23/2255

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

Current Industry

G01N23/2255with incident ion beam

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method for cross-section sample preparation
- Patent number 12,007,344
- Issue date Jun 11, 2024
- Fibics Incorporated
- Michael William Phaneuf
- G01 - MEASURING TESTING
Information Patent Grant
Method for cross-section sample preparation
- Patent number 11,726,050
- Issue date Aug 15, 2023
- Fibics Incorporated
- Michael William Phaneuf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Correlation between emission spots utilizing CAD data in combinatio...
- Patent number 11,561,256
- Issue date Jan 24, 2023
- Synopsys, Inc.
- Ankush Bharati Oberai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for cross-section sample preparation
- Patent number 11,366,074
- Issue date Jun 21, 2022
- Fibics Incorporated
- Michael William Phaneuf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structured detectors and detector systems for radiation imaging
- Patent number 11,099,282
- Issue date Aug 24, 2021
- MINNESOTA IMAGING AND ENGINEERING LLC
- Robert Sigurd Nelson
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Structured detectors and detector systems for radiation imaging
- Patent number 10,884,141
- Issue date Jan 5, 2021
- MINNESOTA IMAGING AND ENGINEERING LLC
- Robert Sigurd Nelson
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Dispositioning defects detected on extreme ultraviolet photomasks
- Patent number 10,866,197
- Issue date Dec 15, 2020
- KLA Corp.
- Vikram Tolani
- G01 - MEASURING TESTING
Information Patent Grant
Structured detectors and detector systems for radiation imaging
- Patent number 10,712,455
- Issue date Jul 14, 2020
- MINNESOTA IMAGING AND ENGINEERING LLC
- Robert Sigurd Nelson
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Structured detectors and detector systems for radiation imaging
- Patent number 10,520,611
- Issue date Dec 31, 2019
- MINNESOTA IMAGING AND ENGINEERING LLC
- Robert Sigurd Nelson
- G01 - MEASURING TESTING
Information Patent Grant
Structured detectors and detector systems for radiation imaging
- Patent number 10,509,135
- Issue date Dec 17, 2019
- MINNESOTA IMAGING AND ENGINEERING LLC
- Robert Sigurd Nelson
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Structured detectors and detector systems for radiation imaging
- Patent number 10,473,800
- Issue date Nov 12, 2019
- MINNESOTA IMAGING AND ENGINEERING LLC
- Robert Sigurd Nelson
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Structured detectors and detector systems for radiation imaging
- Patent number 10,473,799
- Issue date Nov 12, 2019
- MINNESOTA IMAGING AND ENGINEERING LLC
- Robert Sigurd Nelson
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Position feedback for multi-beam particle detector
- Patent number 10,338,013
- Issue date Jul 2, 2019
- KLA-Tencor Corporation
- Alan D. Brodie
- G01 - MEASURING TESTING
Information Patent Grant
Structured detectors and detector systems for radiation imaging
- Patent number 10,267,927
- Issue date Apr 23, 2019
- MINNESOTA IMAGING AND ENGINEERING LLC
- Robert Sigurd Nelson
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method for mapping crystal orientations in a sample made of a polyc...
- Patent number 10,062,145
- Issue date Aug 28, 2018
- Institut National des Sciences Appliquees de Lyon
- Cyril Langlois
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Cross-section processing and observation method and cross-section p...
- Patent number 9,966,226
- Issue date May 8, 2018
- Hitachi High-Tech Science Corporation
- Atsushi Uemoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focused ion beam apparatus, method for observing cross-section of s...
- Patent number 9,934,938
- Issue date Apr 3, 2018
- Hitachi High-Tech Science Corporation
- Atsushi Uemoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuit tracing using a focused ion beam
- Patent number 9,915,628
- Issue date Mar 13, 2018
- TECHINSIGHTS INC.
- Christopher Pawlowicz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for generating image data relating to an object and particle...
- Patent number 9,857,318
- Issue date Jan 2, 2018
- Carl Zeiss Microscopy GmbH
- Fabian Pérez-Willard
- G02 - OPTICS
Information Patent Grant
Alignment marking for rock sample analysis
- Patent number 9,552,958
- Issue date Jan 24, 2017
- Weatherford Technology Holdings, LLC
- Kultaransingh N. Hooghan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuit tracing using a focused ion beam
- Patent number 9,529,040
- Issue date Dec 27, 2016
- TECHINSIGHTS INC.
- Christopher Pawlowicz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
FIB-SEM array tomography
- Patent number 9,464,995
- Issue date Oct 11, 2016
- Carl Zeiss Microscopy GmbH
- Martin Edelmann
- G01 - MEASURING TESTING
Information Patent Grant
Bulk deposition for tilted mill protection
- Patent number 9,412,560
- Issue date Aug 9, 2016
- FEI Company
- Stacey Stone
- G01 - MEASURING TESTING
Information Patent Grant
Circuit tracing using a focused ion beam
- Patent number 9,383,327
- Issue date Jul 5, 2016
- TECHINSIGHTS INC.
- Chris Pawlowicz
- G01 - MEASURING TESTING
Information Patent Grant
Charged-particle microscope device and method for inspecting sample...
- Patent number 9,341,584
- Issue date May 17, 2016
- Hitachi High-Technologies Corporation
- Kenji Nakahira
- G01 - MEASURING TESTING
Information Patent Grant
Digital rock analysis systems and methods with multiphase flow REV...
- Patent number 9,080,946
- Issue date Jul 14, 2015
- Ingrain, Inc.
- Giuseppe De Prisco
- G01 - MEASURING TESTING
Information Patent Grant
Isotope ion microscope methods and systems
- Patent number 8,648,299
- Issue date Feb 11, 2014
- Carl Zeiss Microscopy, LLC
- John A. Notte
- G01 - MEASURING TESTING
Information Patent Grant
Gas charge container, atom probe apparatus, and method for analyzin...
- Patent number 8,567,233
- Issue date Oct 29, 2013
- Nippon Steel & Sumitomo Metal Corporation
- Jun Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Surface analyzer of object to be measured and analyzing method
- Patent number 8,541,738
- Issue date Sep 24, 2013
- Japan Science and Technology Agency
- Masahide Tona
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for cross-section processing and observation
- Patent number 8,542,275
- Issue date Sep 24, 2013
- SII NanoTechnology Inc.
- Masahiro Kiyohara
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF 3D VOLUME INSPECTION OF SEMICONDUCTOR WAFERS WITH INCREAS...
- Publication number 20240328970
- Publication date Oct 3, 2024
- Carl Zeiss SMT GMBH
- Dmitry Klochkov
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CROSS-SECTION SAMPLE PREPARATION
- Publication number 20230358696
- Publication date Nov 9, 2023
- Fibics Incorporated
- Michael William PHANEUF
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR MODELING A ROCK SAMPLE
- Publication number 20230229827
- Publication date Jul 20, 2023
- Saudi Arabian Oil Company
- Abrar Alabbad
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ANALYSIS DEVICE AND ANALYSIS METHOD
- Publication number 20220349848
- Publication date Nov 3, 2022
- KEYENCE CORPORATION
- Hayato OHBA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CROSS-SECTION SAMPLE PREPARATION
- Publication number 20220317072
- Publication date Oct 6, 2022
- Fibics Incorporated
- Michael William PHANEUF
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Systems and Methods for Hydrocarbon Reservoir Divided Model Generat...
- Publication number 20220011465
- Publication date Jan 13, 2022
- Saudi Arabian Oil Company
- Kenneth Richard Kibodeaux
- G01 - MEASURING TESTING
Information Patent Application
Correlation between Emission Spots Utilizing CAD Data in Combinatio...
- Publication number 20210199714
- Publication date Jul 1, 2021
- Synopsys, Inc.
- Ankush Bharati OBERAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR CROSS-SECTION SAMPLE PREPARATION
- Publication number 20200264115
- Publication date Aug 20, 2020
- Fibics Incorporated
- Michael William PHANEUF
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURED DETECTORS AND DETECTOR SYSTEMS FOR RADIATION IMAGING
- Publication number 20200142083
- Publication date May 7, 2020
- Minnesota Imaging and Engineering LLC
- Robert Sigurd Nelson
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
DISPOSITIONING DEFECTS DETECTED ON EXTREME ULTRAVIOLET PHOTOMASKS
- Publication number 20200096862
- Publication date Mar 26, 2020
- KLA Corporation
- Vikram Tolani
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
STRUCTURED DETECTORS AND DETECTOR SYSTEMS FOR RADIATION IMAGING
- Publication number 20200033486
- Publication date Jan 30, 2020
- Minnesota Imaging and Engineering LLC
- Robert Sigurd Nelson
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
STRUCTURED DETECTORS AND DETECTOR SYSTEMS FOR RADIATION IMAGING
- Publication number 20190317227
- Publication date Oct 17, 2019
- Minnesota Imaging and Engineering LLC
- Robert Sigurd Nelson
- G01 - MEASURING TESTING
Information Patent Application
POSITION FEEDBACK FOR MULTI-BEAM PARTICLE DETECTOR
- Publication number 20190227010
- Publication date Jul 25, 2019
- KLA-Tencor Corporation
- Alan D. Brodie
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURED DETECTORS AND DETECTOR SYSTEMS FOR RADIATION IMAGING
- Publication number 20180172847
- Publication date Jun 21, 2018
- Minnesota Imaging and Engineering LLC
- Robert Sigurd Nelson
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
STRUCTURED DETECTORS AND DETECTOR SYSTEMS FOR RADIATION IMAGING
- Publication number 20180172849
- Publication date Jun 21, 2018
- Minnesota Imaging and Engineering LLC
- Robert Sigurd Nelson
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
STRUCTURED DETECTORS AND DETECTOR SYSTEMS FOR RADIATION IMAGING
- Publication number 20180172848
- Publication date Jun 21, 2018
- Minnesota Imaging and Engineering LLC
- Robert Sigurd Nelson
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD FOR MAPPING CRYSTAL ORIENTATIONS IN A SAMPLE MADE OF A POLYC...
- Publication number 20170011518
- Publication date Jan 12, 2017
- Institut National Des Sciences Appliquees De Lyon
- Cyril LANGLOIS
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT TRACING USING A FOCUSED ION BEAM
- Publication number 20160282287
- Publication date Sep 29, 2016
- TECHINSIGHTS INC.
- Christopher PAWLOWICZ
- G01 - MEASURING TESTING
Information Patent Application
CROSS-SECTION PROCESSING AND OBSERVATION METHOD AND CROSS-SECTION P...
- Publication number 20150262788
- Publication date Sep 17, 2015
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Atsushi UEMOTO
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT TRACING USING A FOCUSED ION BEAM
- Publication number 20140319343
- Publication date Oct 30, 2014
- Chris Pawlowicz
- G01 - MEASURING TESTING
Information Patent Application
FOCUSED ION BEAM APPARATUS, METHOD FOR OBSERVING CROSS-SECTION OF S...
- Publication number 20140291508
- Publication date Oct 2, 2014
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Atsushi UEMOTO
- G01 - MEASURING TESTING
Information Patent Application
CROSS-SECTION PROCESSING AND OBSERVATION METHOD AND CROSS-SECTION P...
- Publication number 20140131575
- Publication date May 15, 2014
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Atsushi UEMOTO
- G01 - MEASURING TESTING
Information Patent Application
Digital Rock Analysis Systems and Methods with Multiphase Flow REV...
- Publication number 20130338976
- Publication date Dec 19, 2013
- Ingrain Inc.
- Giuseppe De Prisco
- G01 - MEASURING TESTING
Information Patent Application
ISOTOPE ION MICROSCOPE METHODS AND SYSTEMS
- Publication number 20130175444
- Publication date Jul 11, 2013
- CARL ZEISS NTS, LLC.
- John A. Notte
- G01 - MEASURING TESTING
Information Patent Application
CHARGED-PARTICLE MICROSCOPE DEVICE AND METHOD FOR INSPECTING SAMPLE...
- Publication number 20120098952
- Publication date Apr 26, 2012
- Kenji Nakahira
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SURFACE ANALYZER OF OBJECT TO BE MEASURED AND ANALYZING METHOD
- Publication number 20120061564
- Publication date Mar 15, 2012
- Japan Science and Technology Agency
- Masahide Tona
- G01 - MEASURING TESTING
Information Patent Application
QUANTIFICATION METHOD OF FUNCTIONAL GROUPS OF ORGANIC LAYER
- Publication number 20110163228
- Publication date Jul 7, 2011
- Korea Research Institute of Standards and Science
- Tae Geol Lee
- G01 - MEASURING TESTING
Information Patent Application
ISOTOPE ION MICROSCOPE METHODS AND SYSTEMS
- Publication number 20110139979
- Publication date Jun 16, 2011
- CARL ZEISS NTS, LLC.
- John A. Notte, IV
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON DETECTION SYSTEMS AND METHODS
- Publication number 20110127428
- Publication date Jun 2, 2011
- CARL ZEISS NTS, LLC.
- Raymond Hill
- G01 - MEASURING TESTING
Information Patent Application
GAS CHARGE CONTAINER, ATOM PROBE APPARATUS, AND METHOD FOR ANALYZIN...
- Publication number 20110113858
- Publication date May 19, 2011
- Jun Takahashi
- G01 - MEASURING TESTING

with incident ion beam

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method for cross-section sample preparation

Method for cross-section sample preparation

Correlation between emission spots utilizing CAD data in combinatio...

Method for cross-section sample preparation

Structured detectors and detector systems for radiation imaging

Structured detectors and detector systems for radiation imaging

Dispositioning defects detected on extreme ultraviolet photomasks

Structured detectors and detector systems for radiation imaging

Structured detectors and detector systems for radiation imaging

Structured detectors and detector systems for radiation imaging

Structured detectors and detector systems for radiation imaging

Structured detectors and detector systems for radiation imaging

Position feedback for multi-beam particle detector

Structured detectors and detector systems for radiation imaging

Method for mapping crystal orientations in a sample made of a polyc...

Cross-section processing and observation method and cross-section p...

Focused ion beam apparatus, method for observing cross-section of s...

Circuit tracing using a focused ion beam

Method for generating image data relating to an object and particle...

Alignment marking for rock sample analysis

Circuit tracing using a focused ion beam

FIB-SEM array tomography

Bulk deposition for tilted mill protection

Circuit tracing using a focused ion beam

Charged-particle microscope device and method for inspecting sample...

Digital rock analysis systems and methods with multiphase flow REV...

Isotope ion microscope methods and systems

Gas charge container, atom probe apparatus, and method for analyzin...

Surface analyzer of object to be measured and analyzing method

Method and apparatus for cross-section processing and observation

Patents Applicationslast 30 patents

METHOD OF 3D VOLUME INSPECTION OF SEMICONDUCTOR WAFERS WITH INCREAS...

METHOD FOR CROSS-SECTION SAMPLE PREPARATION

SYSTEM AND METHOD FOR MODELING A ROCK SAMPLE

ANALYSIS DEVICE AND ANALYSIS METHOD

METHOD FOR CROSS-SECTION SAMPLE PREPARATION

Systems and Methods for Hydrocarbon Reservoir Divided Model Generat...

Correlation between Emission Spots Utilizing CAD Data in Combinatio...

METHOD FOR CROSS-SECTION SAMPLE PREPARATION

STRUCTURED DETECTORS AND DETECTOR SYSTEMS FOR RADIATION IMAGING

DISPOSITIONING DEFECTS DETECTED ON EXTREME ULTRAVIOLET PHOTOMASKS

STRUCTURED DETECTORS AND DETECTOR SYSTEMS FOR RADIATION IMAGING

STRUCTURED DETECTORS AND DETECTOR SYSTEMS FOR RADIATION IMAGING

POSITION FEEDBACK FOR MULTI-BEAM PARTICLE DETECTOR

STRUCTURED DETECTORS AND DETECTOR SYSTEMS FOR RADIATION IMAGING

STRUCTURED DETECTORS AND DETECTOR SYSTEMS FOR RADIATION IMAGING

STRUCTURED DETECTORS AND DETECTOR SYSTEMS FOR RADIATION IMAGING

METHOD FOR MAPPING CRYSTAL ORIENTATIONS IN A SAMPLE MADE OF A POLYC...

CIRCUIT TRACING USING A FOCUSED ION BEAM

CROSS-SECTION PROCESSING AND OBSERVATION METHOD AND CROSS-SECTION P...

CIRCUIT TRACING USING A FOCUSED ION BEAM

FOCUSED ION BEAM APPARATUS, METHOD FOR OBSERVING CROSS-SECTION OF S...

CROSS-SECTION PROCESSING AND OBSERVATION METHOD AND CROSS-SECTION P...

Digital Rock Analysis Systems and Methods with Multiphase Flow REV...

ISOTOPE ION MICROSCOPE METHODS AND SYSTEMS

CHARGED-PARTICLE MICROSCOPE DEVICE AND METHOD FOR INSPECTING SAMPLE...

SURFACE ANALYZER OF OBJECT TO BE MEASURED AND ANALYZING METHOD

QUANTIFICATION METHOD OF FUNCTIONAL GROUPS OF ORGANIC LAYER

ISOTOPE ION MICROSCOPE METHODS AND SYSTEMS

ELECTRON DETECTION SYSTEMS AND METHODS

GAS CHARGE CONTAINER, ATOM PROBE APPARATUS, AND METHOD FOR ANALYZIN...