with magnetic means

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CPC
H01J2237/04753

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/04753with magnetic means

Industries

Patents Grantslast 30 patents

Information Patent Grant
High performance inspection scanning electron microscope device and...
- Patent number 10,504,684
- Issue date Dec 10, 2019
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Pavel Adamec
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe assembly with high bandwidth beam
- Patent number 10,163,601
- Issue date Dec 25, 2018
- Intel Corporation
- Amir Raveh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 6,979,821
- Issue date Dec 27, 2005
- Hitachi, Ltd.
- Naomasa Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 6,555,819
- Issue date Apr 29, 2003
- Hitachi, Ltd.
- Naomasa Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for ion-plasma machining workpiece surfaces including imp...
- Patent number 5,262,611
- Issue date Nov 16, 1993
- Hauzer Holding B.V.
- Sergey V. Danysh
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Scanning electron microscope
- Publication number 20040113074
- Publication date Jun 17, 2004
- Hitachi, Ltd
- Naomasa Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning electron microscope
- Publication number 20030122074
- Publication date Jul 3, 2003
- Hitachi, Ltd
- Naomasa Suzuki
- H01 - BASIC ELECTRIC ELEMENTS