with means for monitoring the sample temperature

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CPC
H01J49/0486

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/0486with means for monitoring the sample temperature

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Substance analyzer and substance analysis method
- Patent number 11,776,800
- Issue date Oct 3, 2023
- HITACHI HIGH-TECH CORPORATION
- Yasuaki Takada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Retractable ion guide, grid holder, and technology for removal of c...
- Patent number 11,728,146
- Issue date Aug 15, 2023
- Wisconsin Alumni Research Foundation
- Michael Scott Westphall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bench-top time of flight mass spectrometer
- Patent number 11,621,154
- Issue date Apr 4, 2023
- Micromass UK Limited
- Ruth Wamsley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry apparatus, gas chromatograph-mass spectrometry ap...
- Patent number 11,474,084
- Issue date Oct 18, 2022
- Jeol Ltd.
- Masaaki Ubukata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometry device
- Patent number 11,443,934
- Issue date Sep 13, 2022
- Shimadzu Corporation
- Tomoya Kudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer
- Patent number 11,257,666
- Issue date Feb 22, 2022
- Shimadzu Corporation
- Tomoya Kudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MEMS frame heating platform for electron imagable fluid reservoirs...
- Patent number 11,170,968
- Issue date Nov 9, 2021
- PROTOCHIPS, INC.
- Franklin Stampley Walden
- G01 - MEASURING TESTING
Information Patent Grant
System for automatic sampling, sample digestion, and joining a plur...
- Patent number 11,062,893
- Issue date Jul 13, 2021
- Elemental Scientific, Inc.
- Nathan Saetveit
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and system for active heat transfer management in ESI ion...
- Patent number 11,056,330
- Issue date Jul 6, 2021
- Thermo Finnigan LLC.
- Oleg Silivra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion trap device
- Patent number 10,770,281
- Issue date Sep 8, 2020
- Shimadzu Corporation
- Makoto Hazama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization chamber with temperature-controlled gas feed
- Patent number 9,824,873
- Issue date Nov 21, 2017
- Andreas Brekenfeld
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for ion production enhancement
- Patent number 7,372,043
- Issue date May 13, 2008
- Agilent Technologies, Inc.
- Timothy H. Joyce
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion source of mass spectrometer
- Patent number 5,196,700
- Issue date Mar 23, 1993
- Shimadzu Corporation
- Norio Kameshima
- G01 - MEASURING TESTING
Information Patent Grant
Electrospray ionization interface and method for mass spectrometry
- Patent number 4,999,493
- Issue date Mar 12, 1991
- Vestec Corporation
- Mark Allen
- G01 - MEASURING TESTING
Information Patent Grant
Method and means for vaporizing liquids by means of heating a sampl...
- Patent number 4,960,992
- Issue date Oct 2, 1990
- Research Corporation Technologies
- Marvin L. Vestal
- G01 - MEASURING TESTING
Information Patent Grant
Ion vapor source for mass spectrometry of liquids
- Patent number 4,861,989
- Issue date Aug 29, 1989
- Research Corporation Technologies, Inc.
- Marvin L. Vestal
- G01 - MEASURING TESTING
Information Patent Grant
Method and means for vaporizing liquids for detection or analysis
- Patent number 4,814,612
- Issue date Mar 21, 1989
- Research Corporation
- Marvin L. Vestal
- G01 - MEASURING TESTING
Information Patent Grant
Ion vapor source for mass spectrometry of liquids
- Patent number 4,730,111
- Issue date Mar 8, 1988
- Research Corporation
- Marvin L. Vestal
- G01 - MEASURING TESTING
Information Patent Grant
3888107
- Patent number 3,888,107
- Issue date Jun 10, 1975
- G01 - MEASURING TESTING
Information Patent Grant
3667279
- Patent number 3,667,279
- Issue date Jun 6, 1972
- G01 - MEASURING TESTING
Information Patent Grant
3667278
- Patent number 3,667,278
- Issue date Jun 6, 1972
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEMPERATURE CONTROL PLASMA SOURCE ANALYZER ARRANGEMENT AND TEMPERAT...
- Publication number 20240420941
- Publication date Dec 19, 2024
- GEOMAR Helmholtz Centre for Ocean Research Kiel
- Jan Fietzke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTANCE ANALYZER AND SUBSTANCE ANALYSIS METHOD
- Publication number 20220359182
- Publication date Nov 10, 2022
- HITACHI HIGH-TECH CORPORATION
- Yasuaki TAKADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Retractable Ion Guide, Grid Holder, and Technology for Removal of C...
- Publication number 20220223394
- Publication date Jul 14, 2022
- Wisconsin Alumni Research Foundation
- Michael Scott WESTPHALL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-OF-FLIGHT MASS SPECTROMETER
- Publication number 20210249248
- Publication date Aug 12, 2021
- SHIMADZU CORPORATION
- Tomoya KUDO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-OF-FLIGHT MASS SPECTROMETRY DEVICE
- Publication number 20210210327
- Publication date Jul 8, 2021
- SHIMADZU CORPORATION
- Tomoya KUDO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BENCH-TOP TIME OF FLIGHT MASS SPECTROMETER
- Publication number 20210210322
- Publication date Jul 8, 2021
- Micromass UK Limited
- Ruth Wamsley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and System for Active Heat Transfer Management in Ion Sou...
- Publication number 20200203141
- Publication date Jun 25, 2020
- Thermo Finnigan LLC
- Oleg SILIVRA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometry Apparatus, Gas Chromatograph-Mass Spectrometry Ap...
- Publication number 20200158699
- Publication date May 21, 2020
- JEOL Ltd.
- Masaaki Ubukata
- G01 - MEASURING TESTING
Information Patent Application
ION TRAP DEVICE
- Publication number 20200090921
- Publication date Mar 19, 2020
- Shimadzu Corporation
- Makoto HAZAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM FOR AUTOMATIC SAMPLING, SAMPLE DIGESTION, AND JOINING A PLUR...
- Publication number 20190214242
- Publication date Jul 11, 2019
- ELEMENTAL SCIENTIFIC, INC.
- Nathan Saetvet
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IONIZATION CHAMBER WITH TEMPERATURE-CONTROLLED GAS FEED
- Publication number 20160086784
- Publication date Mar 24, 2016
- Bruker Daltonik GmbH
- Andreas BREKENFELD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method for ion production enhancement
- Publication number 20050274905
- Publication date Dec 15, 2005
- Timothy H. Joyce
- H01 - BASIC ELECTRIC ELEMENTS

with means for monitoring the sample temperature

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Substance analyzer and substance analysis method

Retractable ion guide, grid holder, and technology for removal of c...

Bench-top time of flight mass spectrometer

Mass spectrometry apparatus, gas chromatograph-mass spectrometry ap...

Time-of-flight mass spectrometry device

Time-of-flight mass spectrometer

MEMS frame heating platform for electron imagable fluid reservoirs...

System for automatic sampling, sample digestion, and joining a plur...

Apparatus and system for active heat transfer management in ESI ion...

Ion trap device

Ionization chamber with temperature-controlled gas feed

Apparatus and method for ion production enhancement

Ion source of mass spectrometer

Electrospray ionization interface and method for mass spectrometry

Method and means for vaporizing liquids by means of heating a sampl...

Ion vapor source for mass spectrometry of liquids

Method and means for vaporizing liquids for detection or analysis

Ion vapor source for mass spectrometry of liquids

3888107

3667279

3667278

Patents Applicationslast 30 patents

TEMPERATURE CONTROL PLASMA SOURCE ANALYZER ARRANGEMENT AND TEMPERAT...

SUBSTANCE ANALYZER AND SUBSTANCE ANALYSIS METHOD

Retractable Ion Guide, Grid Holder, and Technology for Removal of C...

TIME-OF-FLIGHT MASS SPECTROMETER

TIME-OF-FLIGHT MASS SPECTROMETRY DEVICE

BENCH-TOP TIME OF FLIGHT MASS SPECTROMETER

Apparatus and System for Active Heat Transfer Management in Ion Sou...

Mass Spectrometry Apparatus, Gas Chromatograph-Mass Spectrometry Ap...

ION TRAP DEVICE

SYSTEM FOR AUTOMATIC SAMPLING, SAMPLE DIGESTION, AND JOINING A PLUR...

IONIZATION CHAMBER WITH TEMPERATURE-CONTROLLED GAS FEED

Apparatus and method for ion production enhancement