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G01R17/18

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R17/00Measuring arrangements involving comparison with a reference value

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G01R17/18with more than four branches

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Patents Grantslast 30 patents

Information Patent Grant
Electrical multi-position measuring device
- Patent number 4,644,262
- Issue date Feb 17, 1987
- Hottinger Baldwin Measurements, Inc.
- Manfred Kreuzer
- G01 - MEASURING TESTING
Information Patent Grant
Leakage current testing circuit
- Patent number 4,292,585
- Issue date Sep 29, 1981
- George F. Charette
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for measuring insulation resistance in an operating three...
- Patent number 4,200,836
- Issue date Apr 29, 1980
- Fuji Electric Co., Ltd.
- Isamu Okada
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents