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LOW POWER ATOMIC SENSOR
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SRI International
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WUHAN INSTITUTE OF PHYSICS AND MATHEMATICS, CHINESE ACADEMY OF SCIENCES
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Sihong GU
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G01 - MEASURING TESTING
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CHIP-SCALE ATOMIC GYROSCOPE
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MICROSEMI CORPORATION
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Kim Richard OVERSTREET
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G01 - MEASURING TESTING
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Northrop Grumman Systems Corporation
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G01 - MEASURING TESTING
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ATOM BEAM GYROSCOPE
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Publication date Jan 15, 2015
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Michael D. BULATOWICZ
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G01 - MEASURING TESTING
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CHIP-SCALE ATOMIC GYROSCOPE
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Microsemi Frequency and Time Corporation
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Kim Richard OVERSTREET
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G01 - MEASURING TESTING
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