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G01J2003/1828
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G
PHYSICS
G01
Measuring instruments
G01J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
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G01J2003/1828
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Patents Grants
last 30 patents
Information
Patent Grant
Measuring apparatus
Patent number
11,506,536
Issue date
Nov 22, 2022
Kioxia Corporation
Taro Shiokawa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Spectrometer arrangement
Patent number
10,746,598
Issue date
Aug 18, 2020
Analytik Jena AG
Stefan Münch
G01 - MEASURING TESTING
Information
Patent Grant
Gas imager employing an array imager pixels with order filters
Patent number
10,578,597
Issue date
Mar 3, 2020
UVIA GROUP LLC
Michele Hinnrichs
G02 - OPTICS
Information
Patent Grant
Spectrometer with two-dimensional spectrum
Patent number
10,488,254
Issue date
Nov 26, 2019
Analytik Jena AG
Stefan Münch
G01 - MEASURING TESTING
Information
Patent Grant
Data blending multiple dispersive range monochromator
Patent number
10,215,635
Issue date
Feb 26, 2019
Westco Scientific Instruments, Inc.
Jerome J. Workman
G01 - MEASURING TESTING
Information
Patent Grant
Gas imager employing an array imager pixels with order filters
Patent number
10,191,022
Issue date
Jan 29, 2019
UVIA GROUP LLC
Michele Hinnrichs
G02 - OPTICS
Information
Patent Grant
Spectral balancing technique
Patent number
9,910,266
Issue date
Mar 6, 2018
The Boeing Company
Douglas Ralph Jungwirth
G02 - OPTICS
Information
Patent Grant
Spectrometer arrangement
Patent number
8,873,048
Issue date
Oct 28, 2014
Leibniz-Institut fur Analytische Wissenschaften - ISAS - e.V.
Stefan Florek
G01 - MEASURING TESTING
Information
Patent Grant
Echelle spectrometer arrangement using internal predispersion
Patent number
8,681,329
Issue date
Mar 25, 2014
Leibniz—Institut für Analytische Wissenschaften—ISAS—e.V.
Helmut Becker-Roβ
G01 - MEASURING TESTING
Information
Patent Grant
Calibration method for optical metrology
Patent number
7,924,422
Issue date
Apr 12, 2011
Tokyo Electron Limited
Fred Stanke
G01 - MEASURING TESTING
Information
Patent Grant
Optical external cavities having brewster angle wedges
Patent number
7,238,954
Issue date
Jul 3, 2007
Theodore Denis Fay, Jr.
G01 - MEASURING TESTING
Information
Patent Grant
Miniature optical spectrometer
Patent number
7,019,833
Issue date
Mar 28, 2006
Agence Spatiale Europeenne
Bernd Harnisch
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for monitoring WDM channels and for analyzing...
Patent number
6,967,718
Issue date
Nov 22, 2005
Silicon Light Machines Corportion
Clinton B. Carlisle
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for spectrochemical analysis
Patent number
6,813,019
Issue date
Nov 2, 2004
Varian Australia Pty. Ltd.
Michael R. Hammer
G01 - MEASURING TESTING
Information
Patent Grant
Optical shutter for spectroscopy instrument
Patent number
6,753,959
Issue date
Jun 22, 2004
Varian Australia Pty. Ltd.
Michael R. Hammer
G01 - MEASURING TESTING
Information
Patent Grant
Spectral instrument using multiple non-interfering optical beam pat...
Patent number
6,714,298
Issue date
Mar 30, 2004
Damond V. Ryer
G01 - MEASURING TESTING
Information
Patent Grant
Near infrared blood glucose monitoring system
Patent number
6,675,030
Issue date
Jan 6, 2004
Euro-Celtique, S.A.
Emil W. Ciurczak
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Imaging spectrograph for multiorder spectroscopy
Patent number
6,628,383
Issue date
Sep 30, 2003
Ronnie Lewis Hilliard
G01 - MEASURING TESTING
Information
Patent Grant
Optical system providing concurrent detection of a calibration sign...
Patent number
6,573,990
Issue date
Jun 3, 2003
Tektronix, Inc.
Duwayne R. Anderson
G01 - MEASURING TESTING
Information
Patent Grant
Hemispherical detector
Patent number
6,534,768
Issue date
Mar 18, 2003
Euro-Oeltique, S.A.
Emil W. Ciurczak
G01 - MEASURING TESTING
Information
Patent Grant
Light source apparatus and measurement method
Patent number
6,404,492
Issue date
Jun 11, 2002
Kyoto Daiichi Kagaku Co., Ltd.
Kexin Xu
G01 - MEASURING TESTING
Information
Patent Grant
Multiwavelength imaging and spectroscopic photoemission microscope...
Patent number
6,222,187
Issue date
Apr 24, 2001
Institute of Microelectronics
Kandiah Shivanandan
G02 - OPTICS
Information
Patent Grant
Computer operated spectrometric instrument and associated calculator
Patent number
6,122,052
Issue date
Sep 19, 2000
Perkin Elmer LLC
Robert F. Barnes
G01 - MEASURING TESTING
Information
Patent Grant
Immersion echelle spectrograph
Patent number
6,078,048
Issue date
Jun 20, 2000
The Regents of the University of California
Charles G. Stevens
G02 - OPTICS
Information
Patent Grant
Hyperspectral imaging method and apparatus
Patent number
6,008,492
Issue date
Dec 28, 1999
Mark Slater
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for carrying out spectral analysis of an optical light so...
Patent number
5,859,702
Issue date
Jan 12, 1999
Peter Lindblom
G01 - MEASURING TESTING
Information
Patent Grant
Multiplicative signal correction method and apparatus
Patent number
5,568,400
Issue date
Oct 22, 1996
Edward W. Stark
G01 - MEASURING TESTING
Information
Patent Grant
Monochromator
Patent number
5,504,576
Issue date
Apr 2, 1996
Kabelwerke Reinshagen GmbH
Klaus-Michael Ohle
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for imaging
Patent number
5,461,477
Issue date
Oct 24, 1995
Physical Sciences, Inc.
William J. Marinelli
G01 - MEASURING TESTING
Information
Patent Grant
Echelle polychromator
Patent number
5,448,351
Issue date
Sep 5, 1995
Bodenseewerk Perkin-Elmer GmbH
Stefan Florek
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MEASURING APPARATUS
Publication number
20200292387
Publication date
Sep 17, 2020
Toshiba Memory Corporation
Taro SHIOKAWA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SPECTROMETER ARRANGEMENT
Publication number
20190368933
Publication date
Dec 5, 2019
Analytik Jena AG
Stefan MÜNCH
G01 - MEASURING TESTING
Information
Patent Application
GAS IMAGER EMPLOYING AN ARRAY IMAGER PIXELS WITH ORDER FILTERS
Publication number
20190113493
Publication date
Apr 18, 2019
Michele Hinnrichs
G01 - MEASURING TESTING
Information
Patent Application
SPECTROSCOPIC MAPPING SYSTEM AND METHOD
Publication number
20170010153
Publication date
Jan 12, 2017
HORIBA INSTRUMENTS INCORPORATED
Nicolas VEZARD
G01 - MEASURING TESTING
Information
Patent Application
LENSLET ARRAY WITH INTEGRAL TUNED OPTICAL BANDPASS FILTER AND POLAR...
Publication number
20140268146
Publication date
Sep 18, 2014
Michele Hinnrichs
G02 - OPTICS
Information
Patent Application
SPECTROMETER ARRANGEMENT
Publication number
20120262713
Publication date
Oct 18, 2012
Leibniz Institut fur Analytische Wissenschaften- ISAS-e.V.
Stefan Florek
G01 - MEASURING TESTING
Information
Patent Application
ECHELLE SPECTROMETER ARRANGEMENT USING INTERNAL PREDISPERSION
Publication number
20110285993
Publication date
Nov 24, 2011
Leibniz Institut fur Analytische Wissenschaften- ISAS-e.V.
Helmut Becker-Ross
G01 - MEASURING TESTING
Information
Patent Application
CALIBRATION METHOD FOR OPTICAL METROLOGY
Publication number
20100201981
Publication date
Aug 12, 2010
TOKYO ELECTRON LIMITED
Fred STANKE
G01 - MEASURING TESTING
Information
Patent Application
Miniature optical spectrometer
Publication number
20050046839
Publication date
Mar 3, 2005
Agence Spatiale Europeenne
Bernd Harnisch
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL SHUTTER FOR SPECTROSCOPY INSTRUMENT
Publication number
20040085535
Publication date
May 6, 2004
Michael R. Hammer
G01 - MEASURING TESTING
Information
Patent Application
Hemispherical detector
Publication number
20030102433
Publication date
Jun 5, 2003
Emil W. Ciurczak
G01 - MEASURING TESTING
Information
Patent Application
Near infrared blood glucose monitoring system
Publication number
20020193671
Publication date
Dec 19, 2002
Emil W. Ciurczak
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for spectrochemical analysis
Publication number
20020180970
Publication date
Dec 5, 2002
Michael R. Hammer
G01 - MEASURING TESTING
Information
Patent Application
Spectral instrument using multiple non-interfering optical beam pat...
Publication number
20010046047
Publication date
Nov 29, 2001
Damond V. Ryer
G01 - MEASURING TESTING