with retarding grids

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H01J49/488

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/488with retarding grids

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Electrostatic lens, and parallel beam generation device and paralle...
- Patent number 10,614,992
- Issue date Apr 7, 2020
- National University Corporation Nara Institute of Science and Technology
- Fumihiko Matsui
- G01 - MEASURING TESTING
Information Patent Grant
Retarding potential type energy analyzer
- Patent number 10,319,578
- Issue date Jun 11, 2019
- Japan Synchrotron Radiation Research Institute
- Takayuki Muro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of electrical signaling in an ion energy analyzer
- Patent number 9,087,677
- Issue date Jul 21, 2015
- Tokyo Electron Limited
- Merritt Funk
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Parallel radial mirror analyser with an angled zero-volt equipotent...
- Patent number 8,981,292
- Issue date Mar 17, 2015
- National University of Singapore
- Anjam Khursheed
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion energy analyzer
- Patent number 8,847,159
- Issue date Sep 30, 2014
- Tokyo Electron Limited
- Lee Chen
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Ion energy analyzer and methods of manufacturing the same
- Patent number 8,816,281
- Issue date Aug 26, 2014
- Tokyo Electron Limited
- Merritt Funk
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Charged particle analyser and method using electrostatic filter gri...
- Patent number 8,421,027
- Issue date Apr 16, 2013
- Oxford Instruments Nanotechnology Tools Limited
- Ian Richard Barkshire
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated optical element and Faraday cup
- Patent number 8,350,556
- Issue date Jan 8, 2013
- The United States of America as represented by the Secretary of Commerce, NIST
- Brenton J. Knuffman
- G01 - MEASURING TESTING
Information Patent Grant
Device for photon energy measurement and method thereof
- Patent number 7,638,745
- Issue date Dec 29, 2009
- NovaTrans Group SA
- Erez Halahmi
- G01 - MEASURING TESTING
Information Patent Grant
Analyzing system and charged particle beam device
- Patent number 7,439,500
- Issue date Oct 21, 2008
- ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
- Juergen Frosien
- G01 - MEASURING TESTING
Information Patent Grant
Method of operating a mass spectrometer to suppress unwanted ions
- Patent number 6,627,912
- Issue date Sep 30, 2003
- MDS Inc.
- Dmitry R. Bandura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for imaging a particle beam
- Patent number 6,198,095
- Issue date Mar 6, 2001
- Staib Instruments GmbH
- Philippe Staib
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer and related method
- Patent number 5,654,543
- Issue date Aug 5, 1997
- Hewlett-Packard Company
- Gangqiang Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron energy spectrometer
- Patent number 5,594,244
- Issue date Jan 14, 1997
- University of York
- Martin Prutton
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resolution retarding potential analyzer
- Patent number 5,541,409
- Issue date Jul 30, 1996
- The United States of America as represented by the Secretary of the Air Force
- Carl L. Enloe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle analyzer
- Patent number 4,849,629
- Issue date Jul 18, 1989
- Shimadzu Corporation
- Hiroshi Daimon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spectrometer objective for electron beam mensuration techniques
- Patent number 4,808,821
- Issue date Feb 28, 1989
- Siemens Aktiengesellschaft
- Hans-Peter Feuerbaum
- G01 - MEASURING TESTING
Information Patent Grant
Retarding field spectrometer
- Patent number 4,786,806
- Issue date Nov 22, 1988
- GAF Corporation
- Carl A. Listl
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spectrometer lens for particle beam apparatus
- Patent number 4,769,543
- Issue date Sep 6, 1988
- Siemens Aktiengesellschaft
- Erich Plies
- G01 - MEASURING TESTING
Information Patent Grant
Electrostatic opposing field spectrometer for electron beam test me...
- Patent number 4,748,324
- Issue date May 31, 1988
- Siemens Aktiengesellschaft
- Erich Plies
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low-abberation spectrometer objective with high secondary electron...
- Patent number 4,728,790
- Issue date Mar 1, 1988
- Siemens Aktiengesellschaft
- Erich Plies
- G01 - MEASURING TESTING
Information Patent Grant
Spherical retarding grid analyzer
- Patent number 4,714,831
- Issue date Dec 22, 1987
- International Business Machines
- Gregory J. Clark
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spectrometer objective for particle beam measurement technique
- Patent number 4,551,625
- Issue date Nov 5, 1985
- Siemens Aktiengesellschaft
- Burkhard Lischke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle energy analyzer
- Patent number 4,546,254
- Issue date Oct 8, 1985
- Shimadzu Corporation
- Hiroshi Yamauchi
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer objective having parallel objective fields and spectro...
- Patent number 4,540,885
- Issue date Sep 10, 1985
- Siemens Aktiengesellschaft
- Erich Plies
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for contact-free potential measurements
- Patent number 4,292,519
- Issue date Sep 29, 1981
- Siemens Aktiengesellschaft
- Hans P. Feuerbaum
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for contact-free potential measurements of an...
- Patent number 4,277,679
- Issue date Jul 7, 1981
- Siemens Aktiengesellschaft
- Hans P. Feuerbaum
- G01 - MEASURING TESTING
Information Patent Grant
Electron collection in electron spectrometers
- Patent number 3,935,454
- Issue date Jan 27, 1976
- E. I. Du Pont de Nemours and Company
- Jerald Dana Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3914606
- Patent number 3,914,606
- Issue date Oct 21, 1975
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3836775
- Patent number 3,836,775
- Issue date Sep 17, 1974
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
RETARDING POTENTIAL TYPE ENERGY ANALYZER
- Publication number 20180082829
- Publication date Mar 22, 2018
- JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE
- Takayuki MURO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARALLEL RADIAL MIRROR ANALYSER FOR SCANNING MICROSCOPES
- Publication number 20140042317
- Publication date Feb 13, 2014
- National University of Singapore
- Anjam KHURSHEED
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION ENERGY ANALYZER
- Publication number 20120248310
- Publication date Oct 4, 2012
- TOKYO ELECTRON LIMITED
- Lee Chen
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHODS OF ELECTRICAL SIGNALING IN AN ION ENERGY ANALYZER
- Publication number 20120248322
- Publication date Oct 4, 2012
- TOKYO ELECTRON LIMITED
- Merritt Funk
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
ION ENERGY ANALYZER AND METHODS OF MANUFACTURING THE SAME
- Publication number 20120248311
- Publication date Oct 4, 2012
- TOKYO ELECTRON LIMITED
- Merritt Funk
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
CHARGED PARTICLE ANALYSER AND METHOD
- Publication number 20100163725
- Publication date Jul 1, 2010
- Ian Richard Barkshire
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated Optical Element and Faraday Cup
- Publication number 20100141236
- Publication date Jun 10, 2010
- Brenton J. Knuffman
- G02 - OPTICS
Information Patent Application
Photonic Detector Device and Method
- Publication number 20080067323
- Publication date Mar 20, 2008
- Erez Halahmi
- G01 - MEASURING TESTING
Information Patent Application
Analyzing system and charged particle beam device
- Publication number 20060226361
- Publication date Oct 12, 2006
- Juergen Frosien
- G01 - MEASURING TESTING
Information Patent Application
Method of operating a mass spectrometer to suppress unwanted ion
- Publication number 20040124353
- Publication date Jul 1, 2004
- Scott D Tanner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of operating a mass spectrometer to suppress unwanted ions
- Publication number 20020166959
- Publication date Nov 14, 2002
- Dmitry R. Bandura
- H01 - BASIC ELECTRIC ELEMENTS

with retarding grids

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Electrostatic lens, and parallel beam generation device and paralle...

Retarding potential type energy analyzer

Methods of electrical signaling in an ion energy analyzer

Parallel radial mirror analyser with an angled zero-volt equipotent...

Ion energy analyzer

Ion energy analyzer and methods of manufacturing the same

Charged particle analyser and method using electrostatic filter gri...

Integrated optical element and Faraday cup

Device for photon energy measurement and method thereof

Analyzing system and charged particle beam device

Method of operating a mass spectrometer to suppress unwanted ions

Apparatus and method for imaging a particle beam

Mass spectrometer and related method

Electron energy spectrometer

High resolution retarding potential analyzer

Charged particle analyzer

Spectrometer objective for electron beam mensuration techniques

Retarding field spectrometer

Spectrometer lens for particle beam apparatus

Electrostatic opposing field spectrometer for electron beam test me...

Low-abberation spectrometer objective with high secondary electron...

Spherical retarding grid analyzer

Spectrometer objective for particle beam measurement technique

Charged particle energy analyzer

Spectrometer objective having parallel objective fields and spectro...

Device for contact-free potential measurements

Apparatus and method for contact-free potential measurements of an...

Electron collection in electron spectrometers

3914606

3836775

Patents Applicationslast 30 patents

RETARDING POTENTIAL TYPE ENERGY ANALYZER

PARALLEL RADIAL MIRROR ANALYSER FOR SCANNING MICROSCOPES

ION ENERGY ANALYZER

METHODS OF ELECTRICAL SIGNALING IN AN ION ENERGY ANALYZER

ION ENERGY ANALYZER AND METHODS OF MANUFACTURING THE SAME

CHARGED PARTICLE ANALYSER AND METHOD

Integrated Optical Element and Faraday Cup

Photonic Detector Device and Method

Analyzing system and charged particle beam device

Method of operating a mass spectrometer to suppress unwanted ion

Method of operating a mass spectrometer to suppress unwanted ions