with semiconductor detectors

Industry

CPC
G01T1/24

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Parent Industries

GPHYSICS G01Measuring instruments G01TMEASUREMENT OF NUCLEAR OR X-RADIATION G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation

Current Industry

G01T1/24with semiconductor detectors

Industries

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Patents Grantslast 30 patents

Information Patent Grant
System and method for mitigating trace triggering of channels in X-...
- Patent number 12,232,897
- Issue date Feb 25, 2025
- GE Precision Healthcare LLC
- Brian David Yanoff
- G01 - MEASURING TESTING
Information Patent Grant
Radiation detector
- Patent number 12,235,397
- Issue date Feb 25, 2025
- Kabushiki Kaisha Toshiba
- Isao Takasu
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Grant
Energy measurement apparatus, energy computation apparatus, energy...
- Patent number 12,235,399
- Issue date Feb 25, 2025
- Nippon Telegraph and Telephone Corporation
- Yoshiharu Hiroshima
- G01 - MEASURING TESTING
Information Patent Grant
Lithium-containing chalcophosphates for thermal neutron detection
- Patent number 12,234,147
- Issue date Feb 25, 2025
- Northwestern University
- Mercouri G. Kanatzidis
- C01 - INORGANIC CHEMISTRY
Information Patent Grant
Apparatuses for radiation detection and methods of making them
- Patent number 12,216,236
- Issue date Feb 4, 2025
- SHENZHEN XPECTVISIONTECHNOLOGY CO., LTD.
- Yurun Liu
- G01 - MEASURING TESTING
Information Patent Grant
Detection substrate, method for manufacturing the same and flat pan...
- Patent number 12,210,127
- Issue date Jan 28, 2025
- BEIJING BOE SENSOR TECHNOLOGY CO., LTD.
- Jianxing Shang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High dose rate radiation therapy systems and dosimetry
- Patent number 12,201,850
- Issue date Jan 21, 2025
- Sun Nuclear Corporation
- William E. Simon
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor charged particle detector for microscopy
- Patent number 12,205,792
- Issue date Jan 21, 2025
- ASML Netherlands B.V.
- Yongxin Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pin diode detector, method of making the same, and system including...
- Patent number 12,206,038
- Issue date Jan 21, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Lianjie Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Radon gas sensor
- Patent number 12,204,058
- Issue date Jan 21, 2025
- Airthings ASA
- Bjørn Magne Sundal
- G01 - MEASURING TESTING
Information Patent Grant
Radiation detecting device
- Patent number 12,196,895
- Issue date Jan 14, 2025
- Konica Minolta, Inc.
- Junichiro Otaki
- G01 - MEASURING TESTING
Information Patent Grant
Photon counting detector
- Patent number 12,196,897
- Issue date Jan 14, 2025
- The Johns Hopkins University
- Katsuyuki Taguchi
- G01 - MEASURING TESTING
Information Patent Grant
Signal processing system and method for radiation detector based on...
- Patent number 12,196,898
- Issue date Jan 14, 2025
- INSTITUTE OF RADIATION MEDICINE CHINESE ACADEMY OF MEDICAL SCIENCES
- Qiang Liu
- G01 - MEASURING TESTING
Information Patent Grant
Detection panel, method for manufacturing the same and flat panel d...
- Patent number 12,196,896
- Issue date Jan 14, 2025
- BEIJING BOE SENSOR TECHNOLOGY CO., LTD.
- Xiangmi Zhan
- G01 - MEASURING TESTING
Information Patent Grant
Radiological instrument with a pulse shaper circuit
- Patent number 12,181,618
- Issue date Dec 31, 2024
- Koninklijke Philips N.V.
- Christoph Herrmann
- G01 - MEASURING TESTING
Information Patent Grant
Direct-conversion X-ray detector, method of detecting X-ray, and X-...
- Patent number 12,171,594
- Issue date Dec 24, 2024
- Canon Medical Systems Corporation
- Akihiro Ishida
- G01 - MEASURING TESTING
Information Patent Grant
Flat panel detector, driving method, driving device and flat panel...
- Patent number 12,170,305
- Issue date Dec 17, 2024
- BEIJING BOE SENSOR TECHNOLOGY CO., LTD.
- Shuai Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detection substrate and ray detector
- Patent number 12,164,069
- Issue date Dec 10, 2024
- BEIJING BOE SENSOR TECHNOLOGY CO., LTD.
- Jianxing Shang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Radiation imaging apparatus
- Patent number 12,164,065
- Issue date Dec 10, 2024
- Konica Minolta, Inc.
- Makoto Sumi
- G01 - MEASURING TESTING
Information Patent Grant
Silicon photomultipliers reflective pulse compression
- Patent number 12,164,070
- Issue date Dec 10, 2024
- Thorlabs, Inc.
- Bill Radtke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Baseline restoration technique for photon counting computed tomogra...
- Patent number 12,161,498
- Issue date Dec 10, 2024
- Analog Devices, Inc.
- Matthew A. Woodruff
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method of reading out data in a radiation detector, radiation detec...
- Patent number 12,158,549
- Issue date Dec 3, 2024
- Varex Imaging Sweden AB
- Christer Ullberg
- G01 - MEASURING TESTING
Information Patent Grant
Nuclear reaction detection device, method and program
- Patent number 12,158,552
- Issue date Dec 3, 2024
- National University Corporation Hokkaido University
- Hidenori Iwashita
- G01 - MEASURING TESTING
Information Patent Grant
Radiographic device
- Patent number 12,153,173
- Issue date Nov 26, 2024
- National University Corporation Shizuoka University
- Toru Aoki
- G01 - MEASURING TESTING
Information Patent Grant
X-ray detection system with improved spatial coverage
- Patent number 12,153,174
- Issue date Nov 26, 2024
- Universiteit Gent
- Frederic Van Assche
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuit arrangement and method for charge integration
- Patent number 12,149,246
- Issue date Nov 19, 2024
- ams International AG
- Andreas Fitzi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Positioning of sensor units using a positioning substrate
- Patent number 12,146,998
- Issue date Nov 19, 2024
- Siemens Healthineers AG
- Jan Wrege
- G01 - MEASURING TESTING
Information Patent Grant
Amplifier for dark noise compensation
- Patent number 12,146,999
- Issue date Nov 19, 2024
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Huabin Cheng
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Detection substrate and manufacturing method thereof, flat panel de...
- Patent number 12,148,720
- Issue date Nov 19, 2024
- BEIJING BOE SENSOR TECHNOLOGY CO., LTD.
- Bin Zhao
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Programmable SiPM arrays
- Patent number 12,147,000
- Issue date Nov 19, 2024
- Waymo LLC
- Simon Verghese
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor X-Ray Detector with Light Emitting Layer and Method T...
- Publication number 20250072152
- Publication date Feb 27, 2025
- Carl Zeiss X-ray Microscopy Inc.
- Philipp Brenner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR PRODUCING A DETECTOR AND DETECTOR
- Publication number 20250067886
- Publication date Feb 27, 2025
- KETEK GmbH Halbleiter- Und Reinraumtechnik
- Lothar Höllt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEDICAL IMAGING DETECTOR
- Publication number 20250052916
- Publication date Feb 13, 2025
- GE Precision Healthcare LLC
- Brian D. Yanoff
- G01 - MEASURING TESTING
Information Patent Application
RADIATION DETECTION APPARATUS, MANUFACTURING METHOD THEREOF, AND SY...
- Publication number 20250044465
- Publication date Feb 6, 2025
- Canon Kabushiki Kaisha
- TOMOHIRO HOSHINA
- G01 - MEASURING TESTING
Information Patent Application
RADIATION DETECTION SYSTEMS AND METHODS
- Publication number 20250044466
- Publication date Feb 6, 2025
- Cerium Laboratories LLC
- Will Flanagan
- G01 - MEASURING TESTING
Information Patent Application
THIN-FILM TRANSISTOR AND X-RAY SENSOR
- Publication number 20250040274
- Publication date Jan 30, 2025
- TIANMA JAPAN, LTD.
- Jun TANAKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUB-PIXEL IMAGING METHOD AND DEVICE, IMAGING APPARATUS, DETECTOR AN...
- Publication number 20250035799
- Publication date Jan 30, 2025
- Raycan Technology Co., Ltd. (Suzhou)
- Yuqing Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Programmable SiPM Arrays
- Publication number 20250035800
- Publication date Jan 30, 2025
- WAYMO LLC
- Simon Verghese
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND P...
- Publication number 20250032072
- Publication date Jan 30, 2025
- Canon Kabushiki Kaisha
- Daisuke Yamada
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
RADIATION DETECTORS HAVING SULFIDE-CONTAINING ANODE CONTACTS AND ME...
- Publication number 20250035798
- Publication date Jan 30, 2025
- REDLEN TECHNOLOGIES, INC.
- Thomas TIEDJE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY IMAGING APPARATUS
- Publication number 20250025122
- Publication date Jan 23, 2025
- FUJIFILM Healthcare Corporation
- Takafumi ISHITSU
- G01 - MEASURING TESTING
Information Patent Application
RADIATION DETECTION APPARATUS HAVING A STABILIZED PHOTOMULTIPLIER
- Publication number 20250020820
- Publication date Jan 16, 2025
- LUXIUM SOLUTIONS, LLC
- Diane L. FRUEHAUF
- G01 - MEASURING TESTING
Information Patent Application
RADIATION DETECTOR AND DETECTION SYSTEM
- Publication number 20250020817
- Publication date Jan 16, 2025
- Canon Kabushiki Kaisha
- TATSUHITO GODEN
- G01 - MEASURING TESTING
Information Patent Application
RADIATION IMAGE IMAGING APPARATUS
- Publication number 20250020819
- Publication date Jan 16, 2025
- Konica Minolta, Inc.
- Sho URUSHIYAMA
- G01 - MEASURING TESTING
Information Patent Application
High Resolution Light Valve Detector for Detecting X-Ray
- Publication number 20250020818
- Publication date Jan 16, 2025
- Carl Zeiss X-ray Microscopy, Inc.
- Xiaochao Xu
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC COMPONENT, RADIATION DETECTOR, AND RADIATION IMAGING SYSTEM
- Publication number 20250022906
- Publication date Jan 16, 2025
- Canon Kabushiki Kaisha
- YU KATASE
- G01 - MEASURING TESTING
Information Patent Application
RADIOGRAPHY APPARATUS, RADIOGRAPHY SYSTEM, AND CONTROL METHOD OF RA...
- Publication number 20250012933
- Publication date Jan 9, 2025
- Canon Kabushiki Kaisha
- TAKUYA RYU
- G01 - MEASURING TESTING
Information Patent Application
RADIATION IMAGE CAPTURE APPARATUS, RADIATION IMAGE SHOOTING SYSTEM,...
- Publication number 20250012936
- Publication date Jan 9, 2025
- Canon Kabushiki Kaisha
- HIDEAKI MORITA
- G01 - MEASURING TESTING
Information Patent Application
SOLID STATE DETECTOR FOR VERY HIGH DOSE RATE RADIATION
- Publication number 20250006857
- Publication date Jan 2, 2025
- Michael Bardash
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NON-DESTRUCTIVE X-RAY IMAGING DETECTOR UTILIZING ARTIFICIAL INTELLI...
- Publication number 20250004147
- Publication date Jan 2, 2025
- Randall Arthur Wilcox
- G01 - MEASURING TESTING
Information Patent Application
PIXEL SENSOR CIRCUIT
- Publication number 20250004148
- Publication date Jan 2, 2025
- InnoCare Optoelectronics Corporation
- Hui-Hsin Lu
- G01 - MEASURING TESTING
Information Patent Application
CT DETECTOR MODULE AND CT DEVICE
- Publication number 20240427032
- Publication date Dec 26, 2024
- Siemens Healthineers AG
- Jan WREGE
- G01 - MEASURING TESTING
Information Patent Application
FABRICATION OF PIXELATED RADIATION DETECTORS VIA LASER CUTTING
- Publication number 20240424602
- Publication date Dec 26, 2024
- Northwestern University
- Mercouri G. Kanatzidis
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHOD FOR PROCESSING A DETECTOR SIGNAL AND DETECTOR DEVICE
- Publication number 20240427034
- Publication date Dec 26, 2024
- KETEK GmbH Halbleiter- Und Reinraumtechnik
- Florian Kriegler
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PROVIDING ELECTRICAL POWER TO A DETECTOR
- Publication number 20240427033
- Publication date Dec 26, 2024
- KETEK GmbH Halbleiter- und Reinraumtechnik
- Florian Kriegler
- G01 - MEASURING TESTING
Information Patent Application
RADIATION IMAGING APPARATUS, RADIATION IMAGING SYSTEM, AND CONTROL...
- Publication number 20240418873
- Publication date Dec 19, 2024
- Canon Kabushiki Kaisha
- KATSURO TAKENAKA
- G01 - MEASURING TESTING
Information Patent Application
PHOTON COUNTING DETECTORS AND MEDICAL IMAGING DEVICES
- Publication number 20240418876
- Publication date Dec 19, 2024
- Shanghai United Imaging Healthcare Co., Ltd.
- Jingbo LI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR TIME OF FLIGHT POSITRON EMISSION TOMOGRAPHY
- Publication number 20240418879
- Publication date Dec 19, 2024
- GE Precision Healthcare LLC
- Sergei Dolinsky
- G01 - MEASURING TESTING
Information Patent Application
DIRECT ATTACH RADIATION DETECTOR STRUCTURES HAVING REDUCED CROSS-TALK
- Publication number 20240418877
- Publication date Dec 19, 2024
- REDLEN TECHNOLOGIES, INC.
- Krzysztof INIEWSKI
- G01 - MEASURING TESTING
Information Patent Application
FABRICATION METHOD FOR FUSED MULTI-LAYER AMORPHOUS SELENIUM SENSOR
- Publication number 20240422999
- Publication date Dec 19, 2024
- The Research Foundation for the State University of New York
- James SCHEUERMANN
- H01 - BASIC ELECTRIC ELEMENTS

with semiconductor detectors

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

System and method for mitigating trace triggering of channels in X-...

Radiation detector

Energy measurement apparatus, energy computation apparatus, energy...

Lithium-containing chalcophosphates for thermal neutron detection

Apparatuses for radiation detection and methods of making them

Detection substrate, method for manufacturing the same and flat pan...

High dose rate radiation therapy systems and dosimetry

Semiconductor charged particle detector for microscopy

Pin diode detector, method of making the same, and system including...

Radon gas sensor

Radiation detecting device

Photon counting detector

Signal processing system and method for radiation detector based on...

Detection panel, method for manufacturing the same and flat panel d...

Radiological instrument with a pulse shaper circuit

Direct-conversion X-ray detector, method of detecting X-ray, and X-...

Flat panel detector, driving method, driving device and flat panel...

Detection substrate and ray detector

Radiation imaging apparatus

Silicon photomultipliers reflective pulse compression

Baseline restoration technique for photon counting computed tomogra...

Method of reading out data in a radiation detector, radiation detec...

Nuclear reaction detection device, method and program

Radiographic device

X-ray detection system with improved spatial coverage

Circuit arrangement and method for charge integration

Positioning of sensor units using a positioning substrate

Amplifier for dark noise compensation

Detection substrate and manufacturing method thereof, flat panel de...

Programmable SiPM arrays

Patents Applicationslast 30 patents

Semiconductor X-Ray Detector with Light Emitting Layer and Method T...

METHOD FOR PRODUCING A DETECTOR AND DETECTOR

MEDICAL IMAGING DETECTOR

RADIATION DETECTION APPARATUS, MANUFACTURING METHOD THEREOF, AND SY...

RADIATION DETECTION SYSTEMS AND METHODS

THIN-FILM TRANSISTOR AND X-RAY SENSOR

SUB-PIXEL IMAGING METHOD AND DEVICE, IMAGING APPARATUS, DETECTOR AN...

Programmable SiPM Arrays

INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND P...

RADIATION DETECTORS HAVING SULFIDE-CONTAINING ANODE CONTACTS AND ME...

X-RAY IMAGING APPARATUS

RADIATION DETECTION APPARATUS HAVING A STABILIZED PHOTOMULTIPLIER

RADIATION DETECTOR AND DETECTION SYSTEM

RADIATION IMAGE IMAGING APPARATUS

High Resolution Light Valve Detector for Detecting X-Ray

ELECTRONIC COMPONENT, RADIATION DETECTOR, AND RADIATION IMAGING SYSTEM

RADIOGRAPHY APPARATUS, RADIOGRAPHY SYSTEM, AND CONTROL METHOD OF RA...

RADIATION IMAGE CAPTURE APPARATUS, RADIATION IMAGE SHOOTING SYSTEM,...

SOLID STATE DETECTOR FOR VERY HIGH DOSE RATE RADIATION

NON-DESTRUCTIVE X-RAY IMAGING DETECTOR UTILIZING ARTIFICIAL INTELLI...

PIXEL SENSOR CIRCUIT

CT DETECTOR MODULE AND CT DEVICE

FABRICATION OF PIXELATED RADIATION DETECTORS VIA LASER CUTTING

METHOD FOR PROCESSING A DETECTOR SIGNAL AND DETECTOR DEVICE

METHOD FOR PROVIDING ELECTRICAL POWER TO A DETECTOR

RADIATION IMAGING APPARATUS, RADIATION IMAGING SYSTEM, AND CONTROL...

PHOTON COUNTING DETECTORS AND MEDICAL IMAGING DEVICES

SYSTEMS AND METHODS FOR TIME OF FLIGHT POSITRON EMISSION TOMOGRAPHY

DIRECT ATTACH RADIATION DETECTOR STRUCTURES HAVING REDUCED CROSS-TALK

FABRICATION METHOD FOR FUSED MULTI-LAYER AMORPHOUS SELENIUM SENSOR