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Radiation detector
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Patent number 11,968,849
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Issue date Apr 23, 2024
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Kabushiki Kaisha Toshiba
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Kohei Nakayama
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G01 - MEASURING TESTING
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Tethered laparoscopic probe
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Patent number 11,963,807
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Issue date Apr 23, 2024
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Lightpoint Surgical Ltd.
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David Tuch
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G01 - MEASURING TESTING
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Semiconductor x-ray detector
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Patent number 11,947,059
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Issue date Apr 2, 2024
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SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
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Peiyan Cao
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G01 - MEASURING TESTING
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Dual mode detector
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Patent number 11,933,923
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Issue date Mar 19, 2024
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Paul Scherrer Institut
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Gemma Tinti
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G01 - MEASURING TESTING
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Radiation detector
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Patent number 11,927,706
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Issue date Mar 12, 2024
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Kabushiki Kaisha Toshiba
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Isao Takasu
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G01 - MEASURING TESTING
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Radiation detector
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Patent number 11,918,394
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Issue date Mar 5, 2024
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SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
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Peiyan Cao
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G01 - MEASURING TESTING
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Detector circuit
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Patent number 11,921,244
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Issue date Mar 5, 2024
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Oy Direct Conversion Ltd.
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Tuomas Pantsar
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H01 - BASIC ELECTRIC ELEMENTS
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Dosimeter
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Patent number 11,914,083
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Issue date Feb 27, 2024
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Centre National de la Recherche Scientifique
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Sree Bash Chandra Debnath
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G01 - MEASURING TESTING
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