with several stacked filters or stacked filter-detector pairs

Industry

CPC
G01J2003/516

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Parent Industries

GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY

Current Industry

G01J2003/516with several stacked filters or stacked filter-detector pairs

Industries

Patents Grantslast 30 patents

Information Patent Grant
Filter array, spectral detector including the filter array and spec...
- Patent number 11,913,832
- Issue date Feb 27, 2024
- Samsung Electronics Co., Ltd.
- Kyungsang Cho
- G01 - MEASURING TESTING
Information Patent Grant
Polarization property image measurement device, and polarization pr...
- Patent number 11,268,900
- Issue date Mar 8, 2022
- Nikon Corporation
- Takanori Kojima
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Filter array, spectral detector including the filter array and spec...
- Patent number 11,137,286
- Issue date Oct 5, 2021
- Samsung Electronics Co., Ltd.
- Kyungsang Cho
- G02 - OPTICS
Information Patent Grant
Photodetector and electronic apparatus
- Patent number 11,125,609
- Issue date Sep 21, 2021
- Rohm Co., Ltd.
- Yoshitsugu Uedaira
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical sensor and electronic device
- Patent number 10,760,973
- Issue date Sep 1, 2020
- Rohm Co., Ltd.
- Koji Saito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Polarization property image measurement device, and polarization pr...
- Patent number 10,620,116
- Issue date Apr 14, 2020
- Nikon Corporation
- Takanori Kojima
- G01 - MEASURING TESTING
Information Patent Grant
Polarization sensitive image sensor
- Patent number 10,341,576
- Issue date Jul 2, 2019
- X Development LLC
- Martin Friedrich Schubert
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Light detection device and electronic apparatus
- Patent number 10,203,244
- Issue date Feb 12, 2019
- Rohm Co., Ltd.
- Gota Tateishi
- G01 - MEASURING TESTING
Information Patent Grant
Photodetector and electronic apparatus
- Patent number 9,989,408
- Issue date Jun 5, 2018
- Rohm Co., Ltd.
- Yoshitsugu Uedaira
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical filter
- Patent number 8,288,708
- Issue date Oct 16, 2012
- Hamamatsu Photonics K.K.
- Katurou Hikita
- G01 - MEASURING TESTING
Information Patent Grant
Ambient light detectors using conventional CMOS image sensor process
- Patent number 7,960,807
- Issue date Jun 14, 2011
- Intersil Americas Inc.
- Xijian Lin
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Radiation detector with an epitaxially grown semiconductor body
- Patent number 7,525,083
- Issue date Apr 28, 2009
- Osram Opto Semiconductors GmbH
- Arndt Jaeger
- G01 - MEASURING TESTING
Information Patent Grant
Color image capture element and color image signal processing circuit
- Patent number 7,170,046
- Issue date Jan 30, 2007
- Sanyo Electric Co., LTD
- Yoshihito Higashitsutsumi
- G01 - MEASURING TESTING
Information Patent Grant
Infrared correction system
- Patent number 6,825,470
- Issue date Nov 30, 2004
- Intel Corporation
- Edward J. Bawolek
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Luminance-priority electronic color image sensor
- Patent number 6,593,558
- Issue date Jul 15, 2003
- Applied Science Fiction, Inc.
- Albert D. Edgar
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Infrared pixel sensor and infrared signal correction
- Patent number 6,211,521
- Issue date Apr 3, 2001
- Intel Corporation
- Edward J. Bawolek
- G02 - OPTICS
Information Patent Grant
Multi-spectral filter
- Patent number 5,164,858
- Issue date Nov 17, 1992
- Deposition Sciences, Inc.
- John A. Aguilera
- G02 - OPTICS
Information Patent Grant
Multicolor infrared focal plane arrays
- Patent number 5,157,258
- Issue date Oct 20, 1992
- Rockwell International Corporation
- William J. Gunning
- G01 - MEASURING TESTING
Information Patent Grant
Photocell array with multi-spectral filter
- Patent number 5,072,109
- Issue date Dec 10, 1991
- John A. Aguilera
- G02 - OPTICS
Information Patent Grant
Layered solid state color photosensitive device
- Patent number 4,656,109
- Issue date Apr 7, 1987
- Fuji Electric Co., Ltd.
- Masakazu Ueno
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL STACK, OPTICAL DEVICE AND OPTICAL CONSTRUCTION
- Publication number 20240151586
- Publication date May 9, 2024
- 3M INNOVATIVE PROPERTIES COMPANY
- John A. Wheatley
- G01 - MEASURING TESTING
Information Patent Application
FILTER ARRAY, SPECTRAL DETECTOR INCLUDING THE FILTER ARRAY AND SPEC...
- Publication number 20210389177
- Publication date Dec 16, 2021
- Samsung Electronics Co., Ltd.
- Kyungsang CHO
- G01 - MEASURING TESTING
Information Patent Application
POLARIZATION PROPERTY IMAGE MEASUREMENT DEVICE, AND POLARIZATION PR...
- Publication number 20200173911
- Publication date Jun 4, 2020
- Nikon Corporation
- Takanori KOJIMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PHOTODETECTOR AND ELECTRONIC APPARATUS
- Publication number 20180259389
- Publication date Sep 13, 2018
- Rohm Co., Ltd.
- Yoshitsugu Uedaira
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL FILTER
- Publication number 20100171024
- Publication date Jul 8, 2010
- HAMMAMATSU PHOTONICS K.K.
- Katurou Hikita
- G02 - OPTICS
Information Patent Application
AMBIENT LIGHT DETECTORS USING CONVENTIONAL CMOS IMAGE SENSOR PROCESS
- Publication number 20080191298
- Publication date Aug 14, 2008
- Intersil Americas Inc.
- Xijian Lin
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
RADIATION DETECTOR WITH AN EPITAXIALLY GROWN SEMICONDUCTOR BODY
- Publication number 20070241260
- Publication date Oct 18, 2007
- Osram Opto Semiconductors GmbH
- Arndt Jaeger
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
Color image capture element and color image signal processing circuit
- Publication number 20050133690
- Publication date Jun 23, 2005
- SANYO ELECTRIC CO., LTD.
- Yoshihito Higashitsutsumi
- G01 - MEASURING TESTING

with several stacked filters or stacked filter-detector pairs

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Filter array, spectral detector including the filter array and spec...

Polarization property image measurement device, and polarization pr...

Filter array, spectral detector including the filter array and spec...

Photodetector and electronic apparatus

Optical sensor and electronic device

Polarization property image measurement device, and polarization pr...

Polarization sensitive image sensor

Light detection device and electronic apparatus

Photodetector and electronic apparatus

Optical filter

Ambient light detectors using conventional CMOS image sensor process

Radiation detector with an epitaxially grown semiconductor body

Color image capture element and color image signal processing circuit

Infrared correction system

Luminance-priority electronic color image sensor

Infrared pixel sensor and infrared signal correction

Multi-spectral filter

Multicolor infrared focal plane arrays

Photocell array with multi-spectral filter

Layered solid state color photosensitive device

Patents Applicationslast 30 patents

OPTICAL STACK, OPTICAL DEVICE AND OPTICAL CONSTRUCTION

FILTER ARRAY, SPECTRAL DETECTOR INCLUDING THE FILTER ARRAY AND SPEC...

POLARIZATION PROPERTY IMAGE MEASUREMENT DEVICE, AND POLARIZATION PR...

PHOTODETECTOR AND ELECTRONIC APPARATUS

OPTICAL FILTER

AMBIENT LIGHT DETECTORS USING CONVENTIONAL CMOS IMAGE SENSOR PROCESS

RADIATION DETECTOR WITH AN EPITAXIALLY GROWN SEMICONDUCTOR BODY

Color image capture element and color image signal processing circuit