with stored comparision signal

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CPC
G01N2021/95615

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2021/95615with stored comparision signal

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Cutter analysis and mapping
- Patent number 12,141,960
- Issue date Nov 12, 2024
- Halliburton Energy Services, Inc.
- William Brian Atkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection device, inspection method, machine learning device, and...
- Patent number 12,094,102
- Issue date Sep 17, 2024
- Sintokogio, Ltd.
- Takehiro Sugino
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for synthesizing a diamond using machine learning
- Patent number 12,072,299
- Issue date Aug 27, 2024
- Fraunhofer USA, Inc.
- Rohan Reddy Mekala
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Vehicle lamp system, foreign substance determination device, and fo...
- Patent number 12,065,109
- Issue date Aug 20, 2024
- Koito Manufacturing Co., Ltd.
- Hiroki Sumitani
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Data processing method and system for detection of deterioration of...
- Patent number 12,055,498
- Issue date Aug 6, 2024
- Top Technology Platform Co., Ltd.
- Chyuan-Ruey Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for inspecting a display panel for defects
- Patent number 12,046,167
- Issue date Jul 23, 2024
- Samsung Display Co., Ltd.
- Hoon Sohn
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Mask inspection apparatus and mask inspection method using the same
- Patent number 12,045,975
- Issue date Jul 23, 2024
- Samsung Display Co., Ltd.
- Ilha Song
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Product inspection method and product inspection apparatus
- Patent number 12,013,347
- Issue date Jun 18, 2024
- Ushio Denki Kabushiki Kaisha
- Go Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Effective cell approximation model for logic structures
- Patent number 12,013,350
- Issue date Jun 18, 2024
- Onto Innovation Inc.
- Kevin Eduard Heidrich
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection device and inspection method
- Patent number 11,971,367
- Issue date Apr 30, 2024
- JUKI CORPORATION
- Yasuyuki Nuriya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection apparatus, method for inspecting defect, and meth...
- Patent number 11,940,391
- Issue date Mar 26, 2024
- Shin-Etsu Chemical Co., Ltd.
- Ryusei Terashima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measuring and calculating apparatus and measuring and calculating p...
- Patent number 11,841,331
- Issue date Dec 12, 2023
- Kioxia Corporation
- Kentaro Kasa
- G01 - MEASURING TESTING
Information Patent Grant
Chemical mechanical planarization system and a method of using the...
- Patent number 11,806,833
- Issue date Nov 7, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Fang-Yi Su
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of automatically setting optical parameters and automated op...
- Patent number 11,788,972
- Issue date Oct 17, 2023
- Industrial Technology Research Institute
- Chi-Chun Hsia
- G01 - MEASURING TESTING
Information Patent Grant
RNA molecules, methods of producing circular RNA, and treatment met...
- Patent number 11,756,183
- Issue date Sep 12, 2023
- Cornell University
- Samie R. Jaffrey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor wafer fault analysis system and operation method thereof
- Patent number 11,741,596
- Issue date Aug 29, 2023
- Samsung Electronics Co., Ltd.
- Min-Chul Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for inspection of products
- Patent number 11,733,178
- Issue date Aug 22, 2023
- Applied Materials, Inc.
- Asaf Schlezinger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection device and inspection method
- Patent number 11,733,180
- Issue date Aug 22, 2023
- JUKI CORPORATION
- Yasuyuki Nuriya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for synthesizing a diamond using machine learning
- Patent number 11,698,347
- Issue date Jul 11, 2023
- FRAUNHOFER USA, INC.
- Rohan Reddy Mekala
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Parameter estimation for metrology of features in an image
- Patent number 11,569,056
- Issue date Jan 31, 2023
- FEI Company
- Brad Larson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image analysis of applied adhesive with fluorescence enhancement
- Patent number 11,455,716
- Issue date Sep 27, 2022
- Rivian IP Holdings, LLC
- Nathaniel Christopher Wynn
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical characteristics measuring device and optical characteristic...
- Patent number 11,209,374
- Issue date Dec 28, 2021
- TOSHIBA MEMORY CORPORATION
- Ken Hoshino
- G01 - MEASURING TESTING
Information Patent Grant
Degraded feature identification apparatus, degraded feature identif...
- Patent number 11,157,752
- Issue date Oct 26, 2021
- Pioneer Corporation
- Tomoaki Iwai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspecting method, inspection system, and manufacturing method
- Patent number 11,060,985
- Issue date Jul 13, 2021
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Ryosuke Mitaka
- G01 - MEASURING TESTING
Information Patent Grant
Solder paste printing quality inspection system and method
- Patent number 11,029,260
- Issue date Jun 8, 2021
- HONGFUJIN PRECISION ELECTRONICS (CHENGDU) Co., Ltd.
- Zi-Qing Xia
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Adaptive care areas for die-die inspection
- Patent number 10,997,710
- Issue date May 4, 2021
- KLA-Tencor Corporation
- Himanshu Vajaria
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection method and pattern inspection apparatus
- Patent number 10,984,525
- Issue date Apr 20, 2021
- NuFlare Technology, Inc.
- Ryoichi Hirano
- G01 - MEASURING TESTING
Information Patent Grant
Raman spectroscopy and machine learning for quality control
- Patent number 10,955,362
- Issue date Mar 23, 2021
- Braskem America, Inc.
- Gustavo A. Guzman Cardozo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Seam inspection device
- Patent number 10,947,663
- Issue date Mar 16, 2021
- Juki Corporation
- Kimiko Fujie
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Monitoring of process chamber
- Patent number 10,943,804
- Issue date Mar 9, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Bo-Chen Chen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR DETECTING ABNORMAL DEFECT ON STEEL SURFACE BASED ON SEMI...
- Publication number 20240210329
- Publication date Jun 27, 2024
- Zhejiang University
- Haoji HU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BOARD TESTING APPARATUS AND BOARD TESTING METHOD
- Publication number 20240201106
- Publication date Jun 20, 2024
- CKD CORPORATION
- Kazuyoshi Kikuchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VEHICLE LAMP SYSTEM, FOREIGN SUBSTANCE DETERMINATION DEVICE, AND FO...
- Publication number 20240101073
- Publication date Mar 28, 2024
- Koito Manufacturing Co., Ltd.
- Hiroki SUMITANI
- B60 - VEHICLES IN GENERAL
Information Patent Application
RNA MOLECULES, METHODS OF PRODUCING CIRCULAR RNA, AND TREATMENT MET...
- Publication number 20240078661
- Publication date Mar 7, 2024
- Cornell University
- Samie R. JAFFREY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR SYNTHESIZING A DIAMOND USING MACHINE LEARNING
- Publication number 20230349835
- Publication date Nov 2, 2023
- Fraunhofer USA, Inc.
- Rohan Reddy MEKALA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF EVALUATING SEMICONDUCTOR WAFER
- Publication number 20230194438
- Publication date Jun 22, 2023
- SUMCO CORPORATION
- Motoi KUROKAMI
- G01 - MEASURING TESTING
Information Patent Application
MASK INSPECTION FOR SEMICONDUCTOR SPECIMEN FABRICATION
- Publication number 20230080151
- Publication date Mar 16, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Ariel SHKALIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASURING AND CALCULATING APPARATUS AND MEASURING AND CALCULATING P...
- Publication number 20220404292
- Publication date Dec 22, 2022
- KIOXIA Corporation
- Kentaro KASA
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF AUTOMATICALLY SETTING OPTICAL PARAMETERS AND AUTOMATED OP...
- Publication number 20220373468
- Publication date Nov 24, 2022
- Industrial Technology Research Institute
- Chi-Chun HSIA
- G01 - MEASURING TESTING
Information Patent Application
EFFECTIVE CELL APPROXIMATION MODEL FOR LOGIC STRUCTURES
- Publication number 20220357286
- Publication date Nov 10, 2022
- ONTO INNOVATION INC.
- Kevin Eduard HEIDRICH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTION APPARATUS, METHOD FOR INSPECTING DEFECT, AND METH...
- Publication number 20220317061
- Publication date Oct 6, 2022
- Shin-Etsu Chemical Co., Ltd.
- Ryusei TERASHIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DATA PROCESSING METHOD AND SYSTEM FOR DETECTION OF DETERIORATION OF...
- Publication number 20220283099
- Publication date Sep 8, 2022
- TOP TECHNOLOGY PLATFORM CO., LTD.
- Chyuan-Ruey LIN
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for Aiding Manufacturing of Optoelectronic Device
- Publication number 20220236194
- Publication date Jul 28, 2022
- Nippon Telegraph and Telephone Corporation
- Nobuhiro Nunoya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION DEVICE, INSPECTION METHOD, MACHINE LEARNING DEVICE, AND...
- Publication number 20220207684
- Publication date Jun 30, 2022
- SINTOKOGIO, LTD.
- Takehiro SUGINO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PRODUCT INSPECTION METHOD AND PRODUCT INSPECTION APPARATUS
- Publication number 20220178848
- Publication date Jun 9, 2022
- USHIO DENKI KABUSHIKI KAISHA
- Go YAMADA
- G01 - MEASURING TESTING
Information Patent Application
MASK INSPECTION APPARATUS AND MASK INSPECTION METHOD USING THE SAME
- Publication number 20220114714
- Publication date Apr 14, 2022
- SAMSUNG DISPLAY CO., LTD.
- ILHA SONG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR SYNTHESIZING A DIAMOND USING MACHINE LEARNING
- Publication number 20210364448
- Publication date Nov 25, 2021
- Fraunhofer USA, Inc.
- Rohan Reddy MEKALA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR INSPECTION OF PRODUCTS
- Publication number 20210262945
- Publication date Aug 26, 2021
- Applied Materials, Inc.
- Asaf SCHLEZINGER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20210172884
- Publication date Jun 10, 2021
- Juki Corporation
- Yasuyuki NURIYA
- G01 - MEASURING TESTING
Information Patent Application
Finding Semiconductor Defects Using Convolutional Context Attributes
- Publication number 20210158223
- Publication date May 27, 2021
- KLA Corporation
- Abdurrahman Sezginer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SOLDER PASTE PRINTING QUALITY INSPECTION SYSTEM AND METHOD
- Publication number 20200292471
- Publication date Sep 17, 2020
- HONGFUJIN PRECISION ELECTRONICS (CHENGDU) CO., LTD.
- ZI-QING XIA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CORRELATING SEM AND OPTICAL IMAGES FOR WAFER NOISE NUISANCE IDENTIF...
- Publication number 20200292468
- Publication date Sep 17, 2020
- KLA-Tencor Corporation
- Qiang Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR WAFER FAULT ANALYSIS SYSTEM AND OPERATION METHOD THEREOF
- Publication number 20200175665
- Publication date Jun 4, 2020
- Samsung Electronics Co., Ltd.
- Min-Chul PARK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PARAMETER ESTIMATION FOR METROLOGY OF FEATURES IN AN IMAGE
- Publication number 20200161083
- Publication date May 21, 2020
- FEI Company
- Brad LARSON
- G01 - MEASURING TESTING
Information Patent Application
CHEMICAL MECHANICAL PLANARIZATION SYSTEM AND A METHOD OF USING THE...
- Publication number 20200070307
- Publication date Mar 5, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Jassie SU
- B24 - GRINDING POLISHING
Information Patent Application
APPARATUS FOR INSPECTING A DISPLAY PANEL FOR DEFECTS
- Publication number 20200074901
- Publication date Mar 5, 2020
- SAMSUNG DISPLAY CO., LTD.
- Hoon SOHN
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL CHARACTERISTICS MEASURING DEVICE AND OPTICAL CHARACTERISTIC...
- Publication number 20200064279
- Publication date Feb 27, 2020
- Toshiba Memory Corporation
- Ken HOSHINO
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR THE POSITIONING AND OPTICAL INSPECTION OF AN...
- Publication number 20200057004
- Publication date Feb 20, 2020
- VIT
- Nicolas GUILLOT
- G01 - MEASURING TESTING
Information Patent Application
MONITORING OF PROCESS CHAMBER
- Publication number 20200006101
- Publication date Jan 2, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Bo Chen CHEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SURFACE HEIGHT DETERMINATION OF TRANSPARENT FILM
- Publication number 20190391088
- Publication date Dec 26, 2019
- Nanometrics Incorporated
- Graham M. LYNCH
- G01 - MEASURING TESTING

with stored comparision signal

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Cutter analysis and mapping

Inspection device, inspection method, machine learning device, and...

Systems and methods for synthesizing a diamond using machine learning

Vehicle lamp system, foreign substance determination device, and fo...

Data processing method and system for detection of deterioration of...

Apparatus for inspecting a display panel for defects

Mask inspection apparatus and mask inspection method using the same

Product inspection method and product inspection apparatus

Effective cell approximation model for logic structures

Inspection device and inspection method

Defect inspection apparatus, method for inspecting defect, and meth...

Measuring and calculating apparatus and measuring and calculating p...

Chemical mechanical planarization system and a method of using the...

Method of automatically setting optical parameters and automated op...

RNA molecules, methods of producing circular RNA, and treatment met...

Semiconductor wafer fault analysis system and operation method thereof

Method and system for inspection of products

Inspection device and inspection method

Systems and methods for synthesizing a diamond using machine learning

Parameter estimation for metrology of features in an image

Image analysis of applied adhesive with fluorescence enhancement

Optical characteristics measuring device and optical characteristic...

Degraded feature identification apparatus, degraded feature identif...

Inspecting method, inspection system, and manufacturing method

Solder paste printing quality inspection system and method

Adaptive care areas for die-die inspection

Pattern inspection method and pattern inspection apparatus

Raman spectroscopy and machine learning for quality control

Seam inspection device

Monitoring of process chamber

Patents Applicationslast 30 patents

METHOD FOR DETECTING ABNORMAL DEFECT ON STEEL SURFACE BASED ON SEMI...

BOARD TESTING APPARATUS AND BOARD TESTING METHOD

VEHICLE LAMP SYSTEM, FOREIGN SUBSTANCE DETERMINATION DEVICE, AND FO...

RNA MOLECULES, METHODS OF PRODUCING CIRCULAR RNA, AND TREATMENT MET...

SYSTEMS AND METHODS FOR SYNTHESIZING A DIAMOND USING MACHINE LEARNING

METHOD OF EVALUATING SEMICONDUCTOR WAFER

MASK INSPECTION FOR SEMICONDUCTOR SPECIMEN FABRICATION

MEASURING AND CALCULATING APPARATUS AND MEASURING AND CALCULATING P...

METHOD OF AUTOMATICALLY SETTING OPTICAL PARAMETERS AND AUTOMATED OP...

EFFECTIVE CELL APPROXIMATION MODEL FOR LOGIC STRUCTURES

DEFECT INSPECTION APPARATUS, METHOD FOR INSPECTING DEFECT, AND METH...

DATA PROCESSING METHOD AND SYSTEM FOR DETECTION OF DETERIORATION OF...

Apparatus for Aiding Manufacturing of Optoelectronic Device

INSPECTION DEVICE, INSPECTION METHOD, MACHINE LEARNING DEVICE, AND...

PRODUCT INSPECTION METHOD AND PRODUCT INSPECTION APPARATUS

MASK INSPECTION APPARATUS AND MASK INSPECTION METHOD USING THE SAME

SYSTEMS AND METHODS FOR SYNTHESIZING A DIAMOND USING MACHINE LEARNING

METHOD AND SYSTEM FOR INSPECTION OF PRODUCTS

INSPECTION DEVICE AND INSPECTION METHOD

Finding Semiconductor Defects Using Convolutional Context Attributes

SOLDER PASTE PRINTING QUALITY INSPECTION SYSTEM AND METHOD

CORRELATING SEM AND OPTICAL IMAGES FOR WAFER NOISE NUISANCE IDENTIF...

SEMICONDUCTOR WAFER FAULT ANALYSIS SYSTEM AND OPERATION METHOD THEREOF

PARAMETER ESTIMATION FOR METROLOGY OF FEATURES IN AN IMAGE

CHEMICAL MECHANICAL PLANARIZATION SYSTEM AND A METHOD OF USING THE...

APPARATUS FOR INSPECTING A DISPLAY PANEL FOR DEFECTS

OPTICAL CHARACTERISTICS MEASURING DEVICE AND OPTICAL CHARACTERISTIC...

SYSTEM AND METHOD FOR THE POSITIONING AND OPTICAL INSPECTION OF AN...

MONITORING OF PROCESS CHAMBER

SURFACE HEIGHT DETERMINATION OF TRANSPARENT FILM