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G01N2021/95615
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PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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G01N2021/95615
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Patents Grants
last 30 patents
Information
Patent Grant
Inspection device and inspection method
Patent number
11,971,367
Issue date
Apr 30, 2024
JUKI CORPORATION
Yasuyuki Nuriya
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Defect inspection apparatus, method for inspecting defect, and meth...
Patent number
11,940,391
Issue date
Mar 26, 2024
Shin-Etsu Chemical Co., Ltd.
Ryusei Terashima
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Measuring and calculating apparatus and measuring and calculating p...
Patent number
11,841,331
Issue date
Dec 12, 2023
Kioxia Corporation
Kentaro Kasa
G01 - MEASURING TESTING
Information
Patent Grant
Chemical mechanical planarization system and a method of using the...
Patent number
11,806,833
Issue date
Nov 7, 2023
Taiwan Semiconductor Manufacturing Co., Ltd
Fang-Yi Su
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of automatically setting optical parameters and automated op...
Patent number
11,788,972
Issue date
Oct 17, 2023
Industrial Technology Research Institute
Chi-Chun Hsia
G01 - MEASURING TESTING
Information
Patent Grant
RNA molecules, methods of producing circular RNA, and treatment met...
Patent number
11,756,183
Issue date
Sep 12, 2023
Cornell University
Samie R. Jaffrey
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Semiconductor wafer fault analysis system and operation method thereof
Patent number
11,741,596
Issue date
Aug 29, 2023
Samsung Electronics Co., Ltd.
Min-Chul Park
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and system for inspection of products
Patent number
11,733,178
Issue date
Aug 22, 2023
Applied Materials, Inc.
Asaf Schlezinger
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inspection device and inspection method
Patent number
11,733,180
Issue date
Aug 22, 2023
JUKI CORPORATION
Yasuyuki Nuriya
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods for synthesizing a diamond using machine learning
Patent number
11,698,347
Issue date
Jul 11, 2023
FRAUNHOFER USA, INC.
Rohan Reddy Mekala
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Parameter estimation for metrology of features in an image
Patent number
11,569,056
Issue date
Jan 31, 2023
FEI Company
Brad Larson
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Image analysis of applied adhesive with fluorescence enhancement
Patent number
11,455,716
Issue date
Sep 27, 2022
Rivian IP Holdings, LLC
Nathaniel Christopher Wynn
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Optical characteristics measuring device and optical characteristic...
Patent number
11,209,374
Issue date
Dec 28, 2021
TOSHIBA MEMORY CORPORATION
Ken Hoshino
G01 - MEASURING TESTING
Information
Patent Grant
Degraded feature identification apparatus, degraded feature identif...
Patent number
11,157,752
Issue date
Oct 26, 2021
Pioneer Corporation
Tomoaki Iwai
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inspecting method, inspection system, and manufacturing method
Patent number
11,060,985
Issue date
Jul 13, 2021
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Ryosuke Mitaka
G01 - MEASURING TESTING
Information
Patent Grant
Solder paste printing quality inspection system and method
Patent number
11,029,260
Issue date
Jun 8, 2021
HONGFUJIN PRECISION ELECTRONICS (CHENGDU) Co., Ltd.
Zi-Qing Xia
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Adaptive care areas for die-die inspection
Patent number
10,997,710
Issue date
May 4, 2021
KLA-Tencor Corporation
Himanshu Vajaria
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Pattern inspection method and pattern inspection apparatus
Patent number
10,984,525
Issue date
Apr 20, 2021
NuFlare Technology, Inc.
Ryoichi Hirano
G01 - MEASURING TESTING
Information
Patent Grant
Raman spectroscopy and machine learning for quality control
Patent number
10,955,362
Issue date
Mar 23, 2021
Braskem America, Inc.
Gustavo A. Guzman Cardozo
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Seam inspection device
Patent number
10,947,663
Issue date
Mar 16, 2021
Juki Corporation
Kimiko Fujie
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Monitoring of process chamber
Patent number
10,943,804
Issue date
Mar 9, 2021
Taiwan Semiconductor Manufacturing Co., Ltd
Bo-Chen Chen
G01 - MEASURING TESTING
Information
Patent Grant
System and method for the positioning and optical inspection of an...
Patent number
10,928,333
Issue date
Feb 23, 2021
VIT
Nicolas Guillot
G01 - MEASURING TESTING
Information
Patent Grant
Metrology system for substrate deformation measurement
Patent number
10,923,371
Issue date
Feb 16, 2021
Applied Materials, Inc.
Mehdi Vaez-Iravani
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Correlating SEM and optical images for wafer noise nuisance identif...
Patent number
10,921,262
Issue date
Feb 16, 2021
KLA-Tencor Corporation
Qiang Zhang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Pattern structure inspection device and inspection method
Patent number
10,852,246
Issue date
Dec 1, 2020
THE WAVE TALK, INC.
Young Dug Kim
G01 - MEASURING TESTING
Information
Patent Grant
Multiscale deformation measurements leveraging tailorable and multi...
Patent number
10,845,187
Issue date
Nov 24, 2020
Drexel University
Antonios Kontsos
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Pattern defect detection method
Patent number
10,802,073
Issue date
Oct 13, 2020
TASMIT, INC.
Ryo Shimoda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inspection system and inspection method
Patent number
10,796,428
Issue date
Oct 6, 2020
Koh Young Technology Inc.
Seung Ae Seo
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Laser processing device for determining the presence of contaminati...
Patent number
10,761,037
Issue date
Sep 1, 2020
FANUC CORPORATION
Takashi Izumi
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Embedded particle depth binning based on multiple scattering signals
Patent number
10,732,130
Issue date
Aug 4, 2020
KLA-Tencor Corporation
Haiping Zhang
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
VEHICLE LAMP SYSTEM, FOREIGN SUBSTANCE DETERMINATION DEVICE, AND FO...
Publication number
20240101073
Publication date
Mar 28, 2024
Koito Manufacturing Co., Ltd.
Hiroki SUMITANI
B60 - VEHICLES IN GENERAL
Information
Patent Application
RNA MOLECULES, METHODS OF PRODUCING CIRCULAR RNA, AND TREATMENT MET...
Publication number
20240078661
Publication date
Mar 7, 2024
Cornell University
Samie R. JAFFREY
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEMS AND METHODS FOR SYNTHESIZING A DIAMOND USING MACHINE LEARNING
Publication number
20230349835
Publication date
Nov 2, 2023
Fraunhofer USA, Inc.
Rohan Reddy MEKALA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD OF EVALUATING SEMICONDUCTOR WAFER
Publication number
20230194438
Publication date
Jun 22, 2023
SUMCO CORPORATION
Motoi KUROKAMI
G01 - MEASURING TESTING
Information
Patent Application
MASK INSPECTION FOR SEMICONDUCTOR SPECIMEN FABRICATION
Publication number
20230080151
Publication date
Mar 16, 2023
APPLIED MATERIALS ISRAEL LTD.
Ariel SHKALIM
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MEASURING AND CALCULATING APPARATUS AND MEASURING AND CALCULATING P...
Publication number
20220404292
Publication date
Dec 22, 2022
KIOXIA Corporation
Kentaro KASA
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF AUTOMATICALLY SETTING OPTICAL PARAMETERS AND AUTOMATED OP...
Publication number
20220373468
Publication date
Nov 24, 2022
Industrial Technology Research Institute
Chi-Chun HSIA
G01 - MEASURING TESTING
Information
Patent Application
EFFECTIVE CELL APPROXIMATION MODEL FOR LOGIC STRUCTURES
Publication number
20220357286
Publication date
Nov 10, 2022
ONTO INNOVATION INC.
Kevin Eduard HEIDRICH
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DEFECT INSPECTION APPARATUS, METHOD FOR INSPECTING DEFECT, AND METH...
Publication number
20220317061
Publication date
Oct 6, 2022
Shin-Etsu Chemical Co., Ltd.
Ryusei TERASHIMA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DATA PROCESSING METHOD AND SYSTEM FOR DETECTION OF DETERIORATION OF...
Publication number
20220283099
Publication date
Sep 8, 2022
TOP TECHNOLOGY PLATFORM CO., LTD.
Chyuan-Ruey LIN
G01 - MEASURING TESTING
Information
Patent Application
Apparatus for Aiding Manufacturing of Optoelectronic Device
Publication number
20220236194
Publication date
Jul 28, 2022
Nippon Telegraph and Telephone Corporation
Nobuhiro Nunoya
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INSPECTION DEVICE, INSPECTION METHOD, MACHINE LEARNING DEVICE, AND...
Publication number
20220207684
Publication date
Jun 30, 2022
SINTOKOGIO, LTD.
Takehiro SUGINO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
PRODUCT INSPECTION METHOD AND PRODUCT INSPECTION APPARATUS
Publication number
20220178848
Publication date
Jun 9, 2022
USHIO DENKI KABUSHIKI KAISHA
Go YAMADA
G01 - MEASURING TESTING
Information
Patent Application
MASK INSPECTION APPARATUS AND MASK INSPECTION METHOD USING THE SAME
Publication number
20220114714
Publication date
Apr 14, 2022
SAMSUNG DISPLAY CO., LTD.
ILHA SONG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEMS AND METHODS FOR SYNTHESIZING A DIAMOND USING MACHINE LEARNING
Publication number
20210364448
Publication date
Nov 25, 2021
Fraunhofer USA, Inc.
Rohan Reddy MEKALA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND SYSTEM FOR INSPECTION OF PRODUCTS
Publication number
20210262945
Publication date
Aug 26, 2021
Applied Materials, Inc.
Asaf SCHLEZINGER
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
Publication number
20210172884
Publication date
Jun 10, 2021
Juki Corporation
Yasuyuki NURIYA
G01 - MEASURING TESTING
Information
Patent Application
Finding Semiconductor Defects Using Convolutional Context Attributes
Publication number
20210158223
Publication date
May 27, 2021
KLA Corporation
Abdurrahman Sezginer
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SOLDER PASTE PRINTING QUALITY INSPECTION SYSTEM AND METHOD
Publication number
20200292471
Publication date
Sep 17, 2020
HONGFUJIN PRECISION ELECTRONICS (CHENGDU) CO., LTD.
ZI-QING XIA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
CORRELATING SEM AND OPTICAL IMAGES FOR WAFER NOISE NUISANCE IDENTIF...
Publication number
20200292468
Publication date
Sep 17, 2020
KLA-Tencor Corporation
Qiang Zhang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SEMICONDUCTOR WAFER FAULT ANALYSIS SYSTEM AND OPERATION METHOD THEREOF
Publication number
20200175665
Publication date
Jun 4, 2020
Samsung Electronics Co., Ltd.
Min-Chul PARK
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
PARAMETER ESTIMATION FOR METROLOGY OF FEATURES IN AN IMAGE
Publication number
20200161083
Publication date
May 21, 2020
FEI Company
Brad LARSON
G01 - MEASURING TESTING
Information
Patent Application
CHEMICAL MECHANICAL PLANARIZATION SYSTEM AND A METHOD OF USING THE...
Publication number
20200070307
Publication date
Mar 5, 2020
Taiwan Semiconductor Manufacturing Co., Ltd.
Jassie SU
B24 - GRINDING POLISHING
Information
Patent Application
APPARATUS FOR INSPECTING A DISPLAY PANEL FOR DEFECTS
Publication number
20200074901
Publication date
Mar 5, 2020
SAMSUNG DISPLAY CO., LTD.
Hoon SOHN
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL CHARACTERISTICS MEASURING DEVICE AND OPTICAL CHARACTERISTIC...
Publication number
20200064279
Publication date
Feb 27, 2020
Toshiba Memory Corporation
Ken HOSHINO
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR THE POSITIONING AND OPTICAL INSPECTION OF AN...
Publication number
20200057004
Publication date
Feb 20, 2020
VIT
Nicolas GUILLOT
G01 - MEASURING TESTING
Information
Patent Application
MONITORING OF PROCESS CHAMBER
Publication number
20200006101
Publication date
Jan 2, 2020
Taiwan Semiconductor Manufacturing Co., Ltd.
Bo Chen CHEN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SURFACE HEIGHT DETERMINATION OF TRANSPARENT FILM
Publication number
20190391088
Publication date
Dec 26, 2019
Nanometrics Incorporated
Graham M. LYNCH
G01 - MEASURING TESTING
Information
Patent Application
Embedded Particle Depth Binning Based on Multiple Scattering Signals
Publication number
20190383754
Publication date
Dec 19, 2019
KLA-Tencor Corporation
Haiping Zhang
G01 - MEASURING TESTING
Information
Patent Application
CORRELATING SEM AND OPTICAL IMAGES FOR WAFER NOISE NUISANCE IDENTIF...
Publication number
20190383753
Publication date
Dec 19, 2019
KLA-Tencor Corporation
Qiang Zhang
G01 - MEASURING TESTING