X-ray

Industry

CPC
H01J2237/24415

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/24415X-ray

Industries

Patents Grantslast 30 patents

Information Patent Grant
High resolution light valve detector for detecting x-ray
- Patent number 12,130,392
- Issue date Oct 29, 2024
- Carl Zeiss X-ray Microscopy Inc.
- Xiaochao Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 11,676,796
- Issue date Jun 13, 2023
- Jeol Ltd.
- Kazuki Yagi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sensor module for scanning electron microscopy applications
- Patent number 11,610,757
- Issue date Mar 21, 2023
- KLA Corporation
- Marcel Trimpl
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope with composite detection system and sp...
- Patent number 11,145,487
- Issue date Oct 12, 2021
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Shuai Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope and method for determining crystal ori...
- Patent number 10,935,505
- Issue date Mar 2, 2021
- Jeol Ltd.
- Takeshi Otsuka
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis in air
- Patent number 10,354,834
- Issue date Jul 16, 2019
- Oxford Instruments Nanotechnology Tools Limited
- Peter J. Statham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Radiolucent window, radiation detector and radiation detection appa...
- Patent number 10,147,511
- Issue date Dec 4, 2018
- Horiba, Ltd.
- Satoshi Ohashi
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray analysis in air
- Patent number 9,704,688
- Issue date Jul 11, 2017
- Oxford Instruments Nanotechnology Tools Limited
- Peter Statham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Radiolucent window, radiation detector and radiation detection appa...
- Patent number 9,666,323
- Issue date May 30, 2017
- Horiba, Ltd.
- Satoshi Ohashi
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Source for selectively providing positively or negatively charged p...
- Patent number 9,601,312
- Issue date Mar 21, 2017
- FEI Company
- Brian Roberts Routh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged-particle lens that transmits emissions from sample
- Patent number 9,349,564
- Issue date May 24, 2016
- FEI Company
- N. William Parker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray detector including integrated electron detector
- Patent number 9,341,585
- Issue date May 17, 2016
- Pulsetor, LLC
- Nicholas C. Barbi
- G01 - MEASURING TESTING
Information Patent Grant
Source for selectively providing positively or negatively charged p...
- Patent number 9,275,828
- Issue date Mar 1, 2016
- FEI Company
- Brian Roberts Routh
- G01 - MEASURING TESTING
Information Patent Grant
Back scattered electron detector
- Patent number 9,153,417
- Issue date Oct 6, 2015
- TOTOLTD.
- Toshihiro Aoshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope with integrated detector(s)
- Patent number 8,987,665
- Issue date Mar 24, 2015
- FEI Company
- Frederick H. Schamber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon drift diode detector configured to switch between pulse hei...
- Patent number 8,941,072
- Issue date Jan 27, 2015
- FEI Company
- Cornelis Sander Kooijman
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscope
- Patent number 8,901,493
- Issue date Dec 2, 2014
- Hitachi High-Technologies Corporation
- Kazutoshi Kaji
- G01 - MEASURING TESTING
Information Patent Grant
Electron detector including an intimately-coupled scintillator-phot...
- Patent number 8,729,471
- Issue date May 20, 2014
- Pulsetor, LLC
- Nicholas C. Barbi
- G01 - MEASURING TESTING
Information Patent Grant
Inductively coupled plasma source as an electron beam source for sp...
- Patent number 8,716,673
- Issue date May 6, 2014
- FEI Company
- Brian Roberts Routh
- G01 - MEASURING TESTING
Information Patent Grant
Silicon drift X-ray detector
- Patent number 8,648,313
- Issue date Feb 11, 2014
- Jeol Ltd.
- Toshiyoshi Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle analyser and method using electrostatic filter gri...
- Patent number 8,421,027
- Issue date Apr 16, 2013
- Oxford Instruments Nanotechnology Tools Limited
- Ian Richard Barkshire
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for tomographic projection correction
- Patent number 8,353,628
- Issue date Jan 15, 2013
- Xradia, Inc.
- Wenbing Yun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope with integrated detector(s)
- Patent number 8,334,511
- Issue date Dec 18, 2012
- FEI Company
- Frederick H. Schamber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle filter
- Patent number 8,049,182
- Issue date Nov 1, 2011
- Oxford Instruments Nanotechnology Tools Limited
- Angus Bewick
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 7,449,692
- Issue date Nov 11, 2008
- Hitachi High-Technologies Corporation
- Takashi Onishi
- G01 - MEASURING TESTING
Information Patent Grant
Methods for detecting and analyzing piled-up X-rays in an X-ray spe...
- Patent number 7,430,481
- Issue date Sep 30, 2008
- RJ Lee Group, Inc.
- Richard B. Mott
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope
- Patent number 7,294,834
- Issue date Nov 13, 2007
- National University of Singapore
- Anjam Khursheed
- G01 - MEASURING TESTING
Information Patent Grant
Optical axis adjusting mechanism for X-ray lens, X-ray analytical i...
- Patent number 7,289,597
- Issue date Oct 30, 2007
- SII NanoTechnology Inc.
- Norio Sasayama
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 7,223,976
- Issue date May 29, 2007
- Hitachi, Ltd.
- Takashi Onishi
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 7,208,731
- Issue date Apr 24, 2007
- Hitachi, Ltd.
- Takashi Onishi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SENSOR MODULE FOR SCANNING ELECTRON MICROSCOPY APPLICATIONS
- Publication number 20230230800
- Publication date Jul 20, 2023
- KLA Corporation
- Marcel Trimpl
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20220084783
- Publication date Mar 17, 2022
- JEOL Ltd.
- Kazuki Yagi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High Resolution Light Valve Detector for Detecting X-Ray
- Publication number 20210311211
- Publication date Oct 7, 2021
- Carl Zeiss X-ray Microscopy, Inc.
- Xiaochao Xu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SENSOR MODULE FOR SCANNING ELECTRON MICROSCOPY APPLICATIONS
- Publication number 20210066035
- Publication date Mar 4, 2021
- KLA Corporation
- Marcel Trimpl
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE WITH COMPOSITE DETECTION SYSTEM AND SP...
- Publication number 20210066031
- Publication date Mar 4, 2021
- Focus-eBeam Technology (Beijing) Co., Ltd.
- Shuai LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY ANALYSIS IN AIR
- Publication number 20170271125
- Publication date Sep 21, 2017
- OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
- Peter J. STATHAM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RADIOLUCENT WINDOW, RADIATION DETECTOR AND RADIATION DETECTION APPA...
- Publication number 20170229206
- Publication date Aug 10, 2017
- HORIBA, Ltd.
- Satoshi OHASHI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYSIS IN AIR
- Publication number 20160233051
- Publication date Aug 11, 2016
- OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
- Peter STATHAM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BACK SCATTERED ELECTRON DETECTOR
- Publication number 20140339436
- Publication date Nov 20, 2014
- Toshihiro Aoshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Source for Selectively Providing Positively or Negatively Charged P...
- Publication number 20140326877
- Publication date Nov 6, 2014
- FEI Company
- Brian Roberts Routh
- G01 - MEASURING TESTING
Information Patent Application
CHARGED-PARTICLE RADIATION APPARATUS
- Publication number 20140284477
- Publication date Sep 25, 2014
- Yuta Ebine
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-ray detector including integrated electron detector
- Publication number 20140042316
- Publication date Feb 13, 2014
- PulseTor, LLC.
- Nicholas C. Barbi
- G01 - MEASURING TESTING
Information Patent Application
Electron Microscope with Integrated Detector(s)
- Publication number 20130299698
- Publication date Nov 14, 2013
- Frederick H. Schamber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Inductively Coupled Plasma Source as an Electron Beam Source for Sp...
- Publication number 20130134307
- Publication date May 30, 2013
- FEI Company
- Brian Roberts Routh
- G01 - MEASURING TESTING
Information Patent Application
DETECTOR FOR USE IN A CHARGED PARTICLE APPARATUS
- Publication number 20130099114
- Publication date Apr 25, 2013
- FEI Company
- Cornelis Sander Kooijman
- G01 - MEASURING TESTING
Information Patent Application
Electron Microscope
- Publication number 20120241611
- Publication date Sep 27, 2012
- Hitachi High-Technologies Corporation
- Kazutoshi Kaji
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON DETECTOR INCLUDING AN INTIMATELY-COUPLED SCINTILLATOR-PHO...
- Publication number 20120025074
- Publication date Feb 2, 2012
- PulseTor, LLC.
- Nicholas C. Barbi
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON MICROCOPE WHITH INTEGRATED DETECTOR(S)
- Publication number 20110204229
- Publication date Aug 25, 2011
- Frederick H Schamber
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE FILTER
- Publication number 20110168887
- Publication date Jul 14, 2011
- OXFORD INSTRUMENTS ANALYTICAL LIMITED
- Angus BEWICK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Silicon Drift X-Ray Detector
- Publication number 20100163742
- Publication date Jul 1, 2010
- JEOL Ltd.
- Toshiyoshi WATANABE
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE ANALYSER AND METHOD
- Publication number 20100163725
- Publication date Jul 1, 2010
- Ian Richard Barkshire
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR DETECTING AND ANALYZING PILED-UP X-RAYS IN AN X-RAY SPE...
- Publication number 20080172206
- Publication date Jul 17, 2008
- Richard B. Mott
- G01 - MEASURING TESTING
Information Patent Application
Charged particle beam apparatus
- Publication number 20070152150
- Publication date Jul 5, 2007
- Hitachi, Ltd
- Takashi Onishi
- G01 - MEASURING TESTING
Information Patent Application
Charged particle beam apparatus
- Publication number 20060289753
- Publication date Dec 28, 2006
- Hitachi, Ltd
- Takashi Onishi
- G01 - MEASURING TESTING
Information Patent Application
Charged particle beam apparatus
- Publication number 20060289754
- Publication date Dec 28, 2006
- Hitachi, Ltd
- Takashi Onishi
- G01 - MEASURING TESTING
Information Patent Application
Optical axis adjusting mechanism for X-ray lens, X-ray analytical i...
- Publication number 20060226340
- Publication date Oct 12, 2006
- Norio Sasayama
- G01 - MEASURING TESTING
Information Patent Application
Scanning electron microscope
- Publication number 20060060782
- Publication date Mar 23, 2006
- Anjam Khursheed
- G01 - MEASURING TESTING
Information Patent Application
Charged particle beam apparatus
- Publication number 20050045822
- Publication date Mar 3, 2005
- Takashi Onishi
- G01 - MEASURING TESTING
Information Patent Application
X-ray detector and charged-patricle apparatus
- Publication number 20020100877
- Publication date Aug 1, 2002
- Isao Ochiai
- G01 - MEASURING TESTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

High resolution light valve detector for detecting x-ray

Charged particle beam device

Sensor module for scanning electron microscopy applications

Scanning electron microscope with composite detection system and sp...

Scanning electron microscope and method for determining crystal ori...

X-ray analysis in air

Radiolucent window, radiation detector and radiation detection appa...

X-ray analysis in air

Radiolucent window, radiation detector and radiation detection appa...

Source for selectively providing positively or negatively charged p...

Charged-particle lens that transmits emissions from sample

X-ray detector including integrated electron detector

Source for selectively providing positively or negatively charged p...

Back scattered electron detector

Electron microscope with integrated detector(s)

Silicon drift diode detector configured to switch between pulse hei...

Electron microscope

Electron detector including an intimately-coupled scintillator-phot...

Inductively coupled plasma source as an electron beam source for sp...

Silicon drift X-ray detector

Charged particle analyser and method using electrostatic filter gri...

Method and system for tomographic projection correction

Electron microscope with integrated detector(s)

Charged particle filter

Charged particle beam apparatus

Methods for detecting and analyzing piled-up X-rays in an X-ray spe...

Scanning electron microscope

Optical axis adjusting mechanism for X-ray lens, X-ray analytical i...

Charged particle beam apparatus

Charged particle beam apparatus

Patents Applicationslast 30 patents

SENSOR MODULE FOR SCANNING ELECTRON MICROSCOPY APPLICATIONS

Charged Particle Beam Device

High Resolution Light Valve Detector for Detecting X-Ray

SENSOR MODULE FOR SCANNING ELECTRON MICROSCOPY APPLICATIONS

SCANNING ELECTRON MICROSCOPE WITH COMPOSITE DETECTION SYSTEM AND SP...

X-RAY ANALYSIS IN AIR

RADIOLUCENT WINDOW, RADIATION DETECTOR AND RADIATION DETECTION APPA...

X-RAY ANALYSIS IN AIR

BACK SCATTERED ELECTRON DETECTOR

Source for Selectively Providing Positively or Negatively Charged P...

CHARGED-PARTICLE RADIATION APPARATUS

X-ray detector including integrated electron detector

Electron Microscope with Integrated Detector(s)

Inductively Coupled Plasma Source as an Electron Beam Source for Sp...

DETECTOR FOR USE IN A CHARGED PARTICLE APPARATUS

Electron Microscope

ELECTRON DETECTOR INCLUDING AN INTIMATELY-COUPLED SCINTILLATOR-PHO...

ELECTRON MICROCOPE WHITH INTEGRATED DETECTOR(S)

CHARGED PARTICLE FILTER

Silicon Drift X-Ray Detector

CHARGED PARTICLE ANALYSER AND METHOD

METHODS FOR DETECTING AND ANALYZING PILED-UP X-RAYS IN AN X-RAY SPE...

Charged particle beam apparatus

Charged particle beam apparatus

Charged particle beam apparatus

Optical axis adjusting mechanism for X-ray lens, X-ray analytical i...

Scanning electron microscope

Charged particle beam apparatus

X-ray detector and charged-patricle apparatus