Number | Date | Country | Kind |
---|---|---|---|
42 09 343.0 | Mar 1992 | DEX |
Number | Name | Date | Kind |
---|---|---|---|
4424270 | Erdmann et al. | Jan 1984 | |
4555469 | Erdmann et al. | Nov 1985 | |
4863827 | Jain et al. | Sep 1989 | |
4929536 | Spak et al. | May 1990 | |
4931381 | Spak et al. | Jun 1990 | |
5114816 | Scheler et al. | May 1992 | |
5217840 | Spak et al. | Jun 1993 | |
5238775 | Kajita et al. | Aug 1993 |
Number | Date | Country |
---|---|---|
0336605 | Oct 1989 | EPX |
0351849 | Jan 1990 | EPX |
1-017049 | Jan 1989 | JPX |
Entry |
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M unzel et al., "A-and B- Parameter Dependent Submicron Stepper Performance of Positive Tupe Photoresist," Microelectronic Engineering, vol. 6, pp. 421-426 (1987). |
Trefonas et al., "New Principle for Image Enhancement in Single Layer Positive Photoresists," SPIE, vol. 771, pp. 194-210 (1987). |
Kosar, Light Sensitive Systems: Chemistry and Application of Nonsilver Halide Photographic Processes, (New York: John Wiley & Sons, Inc.), pp. 336-353 (1965). |