Information
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Trademark
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79360593
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Serial Number
79360593
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Registration Number
7376555
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International Classifications
- 7 - Machines and machine tools
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
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Filing Date
October 26, 2022
3 years ago
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Registration Date
May 07, 2024
a year ago
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Transaction Date
November 24, 2024
11 months ago
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Status Date
May 07, 2024
a year ago
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Published for Opposition Date
February 20, 2024
a year ago
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Location Date
May 06, 2024
a year ago
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Status Code
700
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Current Location
FILE REPOSITORY (FRANCONIA)
Employee Name
HUSSAIN, TASNEEM
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Attorney Docket Number
TM230108USIP
Attorney Name
George W. Lewis
Law Office Assigned Location Code
M90
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Owners
Mark Drawing Code
5
Mark Identification
LASERTEC
Case File Statements
- DM0000: The mark consists of the stylized wording "LASERTEC".
- GS0091: Semiconductor photomask optical inspection apparatus; analyzing apparatus, namely, optical inspection apparatus for defect of photomasks for semiconductors; semiconductor photomask pattern optical inspection apparatus; semiconductor photomask pattern measuring apparatus, namely, optical measurement system comprised of optical inspection apparatus for detection, measurement and cleaning of foreign matter and defects on semiconductor photomask pattern; semiconductor photomask imaging apparatus, namely, optical imaging apparatus for inspection of semiconductor photomask; semiconductor photomask phase-shift measuring apparatus, namely, optical measurement system comprised of optical inspection apparatus for measurement of semiconductor photomask phase-shift; semiconductor photomask transmittance measuring apparatus, namely, optical measurement system comprised of optical inspection apparatus for measurement of semiconductor photomask transmittance; apparatus and instruments for measuring semiconductor photomask phase shifting amount, namely, optical measurement system comprised of optical inspection apparatus for measurement of semiconductor photomask phase shifting amount; semiconductor reticle optical inspection apparatus; analyzing apparatus, namely, optical inspection apparatus for defect of semiconductor reticles; semiconductor reticle pattern optical inspection apparatus; semiconductor reticle pattern measuring apparatus, namely, optical measurement system comprised of optical inspection apparatus for detection, measurement and cleaning of foreign matter and defects on semiconductor reticle pattern; semiconductor reticle imaging apparatus, namely, optical imaging apparatus for inspection of semiconductor reticle; semiconductor wafer optical inspection apparatus; semiconductor wafer measuring apparatus, namely, optical measurement system comprised of optical inspection apparatus for detection, measurement and cleaning of foreign matter and defects on semiconductor wafer; semiconductor wafer imaging apparatus, namely, optical imaging apparatus for inspection of semiconductor wafer; semiconductor wafer edge optical inspection apparatus; analyzing apparatus, namely, optical inspection apparatus for defect of wafers for semiconductors; semiconductor photomask blanks optical inspection apparatus; semiconductor photomask blanks imaging apparatus, namely, optical imaging apparatus for inspection of semiconductor photomask blanks; optical inspection apparatus for defect of flat panel display photomasks; optical inspection apparatus for defect of flat panel display photomask pattern; flat panel display photomask pattern measuring apparatus, namely, optical measurement system comprised of optical inspection apparatus for detection, measurement and cleaning of foreign matter and defects on flat panel display photomask pattern; optical inspection apparatus for defect of flat panel display photomask blanks; pellicle optical inspection apparatus for photomasks for flat panel displays; pellicle mounting apparatus, namely, optical inspection apparatus with the capability of mounting pellicles on photomasks for flat panel displays; confocal microscopes; laser microscopes; computer peripheral devices; optical inspection systems for in-suit visualizing of electro-chemical reactions comprising optical inspection apparatus for semi-conductor materials and elements; semi-conductor testing machines and instruments; electron microscopes; semiconductor defect detectors; testing apparatus not for medical purposes, namely, semiconductor testing apparatus; precision crystallographic measuring apparatus; data sets, downloadable, in the field of semiconductors; computer software, recorded, for operating semiconductor photomask, reticle or pellicle optical inspection apparatus; computer software applications, downloadable, for operating semiconductor photomask, reticle or pellicle optical inspection apparatus; computer hardware; computer programs, downloadable, for operating semiconductor photomask, reticle or pellicle optical inspection apparatus
- GS0071: Defect repairing machines for photomasks for semiconductors; defect repairing machines for reticles for semiconductors; defect repairing machines for wafers for semiconductors; defect repairing machines for photomasks for flat panel displays; defect repairing machines for photomask blanks for flat panel displays
- PM0001: LASER TEC; LASER TECH
Case File Event Statements
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1/24/2023 - 2 years ago
4 - APPLICATION FILING RECEIPT MAILED
Type: MAFR
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1/19/2023 - 2 years ago
1 - SN ASSIGNED FOR SECT 66A APPL FROM IB
Type: REPR
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1/20/2023 - 2 years ago
3 - NEW APPLICATION OFFICE SUPPLIED DATA ENTERED
Type: NWOS
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1/20/2023 - 2 years ago
2 - LIMITATION FROM ORIGINAL APPLICATION ENTERED
Type: LIMI
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5/9/2023 - 2 years ago
5 - ASSIGNED TO EXAMINER
Type: DOCK
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5/10/2023 - 2 years ago
6 - NON-FINAL ACTION WRITTEN
Type: CNRT
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5/11/2023 - 2 years ago
7 - NON-FINAL ACTION (IB REFUSAL) PREPARED FOR REVIEW
Type: RFCR
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6/20/2023 - 2 years ago
8 - REFUSAL PROCESSED BY MPU
Type: RFRR
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6/20/2023 - 2 years ago
9 - NON-FINAL ACTION MAILED - REFUSAL SENT TO IB
Type: RFCS
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7/11/2023 - 2 years ago
10 - REFUSAL PROCESSED BY IB
Type: RFNT
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7/20/2023 - 2 years ago
11 - TEAS CHANGE OF OWNER ADDRESS RECEIVED
Type: COAR
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7/20/2023 - 2 years ago
12 - APPLICANT/CORRESPONDENCE CHANGES (NON-RESPONSIVE) ENTERED
Type: CHAN
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7/20/2023 - 2 years ago
13 - TEAS REVOKE/APP/CHANGE ADDR OF ATTY/DOM REP RECEIVED
Type: REAP
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7/20/2023 - 2 years ago
14 - ATTORNEY/DOM.REP.REVOKED AND/OR APPOINTED
Type: ARAA
-
7/20/2023 - 2 years ago
15 - TEAS CHANGE OF DOMESTIC REPRESENTATIVES ADDRESS
Type: ECDR
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7/20/2023 - 2 years ago
16 - TEAS CHANGE OF CORRESPONDENCE RECEIVED
Type: TCCA
-
12/7/2023 - a year ago
17 - TEAS RESPONSE TO OFFICE ACTION RECEIVED
Type: TROA
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12/7/2023 - a year ago
18 - CORRESPONDENCE RECEIVED IN LAW OFFICE
Type: CRFA
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12/8/2023 - a year ago
19 - TEAS/EMAIL CORRESPONDENCE ENTERED
Type: TEME
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1/2/2024 - a year ago
20 - EXAMINERS AMENDMENT -WRITTEN
Type: CNEA
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1/2/2024 - a year ago
21 - EXAMINERS AMENDMENT E-MAILED
Type: GNEA
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1/2/2024 - a year ago
22 - NOTIFICATION OF EXAMINERS AMENDMENT E-MAILED
Type: GNEN
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1/2/2024 - a year ago
23 - EXAMINER'S AMENDMENT ENTERED
Type: XAEC
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1/17/2024 - a year ago
24 - APPROVED FOR PUB - PRINCIPAL REGISTER
Type: CNSA
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1/31/2024 - a year ago
25 - NOTIFICATION OF NOTICE OF PUBLICATION E-MAILED
Type: NONP
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1/31/2024 - a year ago
26 - OFFICIAL GAZETTE PUBLICATION CONFIRMATION E-MAILED
Type: NPUB
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2/20/2024 - a year ago
30 - PUBLISHED FOR OPPOSITION
Type: PUBO
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2/3/2024 - a year ago
27 - NEW REPRESENTATIVE AT IB RECEIVED
Type: NREP
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2/7/2024 - a year ago
29 - NOTIFICATION OF POSSIBLE OPPOSITION SENT TO IB
Type: OPNS
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2/7/2024 - a year ago
28 - NOTICE OF START OF OPPOSITION PERIOD CREATED, TO BE SENT TO IB
Type: OP2R
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2/26/2024 - a year ago
31 - NOTIFICATION PROCESSED BY IB
Type: GPNX
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3/4/2024 - a year ago
32 - OFFICIAL GAZETTE PUBLICATION CONFIRMATION E-MAILED
Type: NPUB
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5/7/2024 - a year ago
33 - REGISTERED-PRINCIPAL REGISTER
Type: R.PR
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5/7/2024 - a year ago
34 - NOTICE OF REGISTRATION CONFIRMATION EMAILED
Type: NRCC
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8/7/2024 - a year ago
35 - FINAL DISPOSITION NOTICE CREATED, TO BE SENT TO IB
Type: FICR
-
11/3/2024 - a year ago
37 - FINAL DISPOSITION NOTICE SENT TO IB
Type: FICS
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11/23/2024 - 11 months ago
38 - FINAL DECISION TRANSACTION PROCESSED BY IB
Type: FINO
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11/2/2024 - a year ago
36 - FINAL DISPOSITION PROCESSED
Type: FIMP