LASERTEC

Organization

2992 LA BARENDRECHT, NL

Organizations

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Mask inspection method and mask inspection apparatus
- Patent number 12,050,184
- Issue date Jul 30, 2024
- Lasertec Corporation
- Keita Saito
- G01 - MEASURING TESTING
Information Patent Grant
Image pickup apparatus and focus adjustment method using bending co...
- Patent number 11,822,233
- Issue date Nov 21, 2023
- Lasertec Corporation
- Hiroki Miyai
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Measurement apparatus and measurement method
- Patent number 11,486,693
- Issue date Nov 1, 2022
- Lasertec Corporation
- Ko Gondaira
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Confocal microscope and method for taking image using the same
- Patent number 11,372,222
- Issue date Jun 28, 2022
- Lasertec Corporation
- Ko Gondaira
- G02 - OPTICS
Information Patent Grant
Optical device, and method for preventing contamination of optical...
- Patent number 11,353,802
- Issue date Jun 7, 2022
- Lasertec Corporation
- Haruhiko Kusunose
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Mask inspection apparatus, switching method, and mask inspection me...
- Patent number 10,801,967
- Issue date Oct 13, 2020
- Lasertec Corporation
- Tetsuya Sendoda
- G01 - MEASURING TESTING
Information Patent Grant
Wavelength conversion apparatus and wavelength conversion method
- Patent number 10,761,400
- Issue date Sep 1, 2020
- Lasertec Corporation
- Akihiro Ando
- G02 - OPTICS
Information Patent Grant
Inspection device and inspection method
- Patent number 10,712,287
- Issue date Jul 14, 2020
- Lasertec Corporation
- Masayasu Nishizawa
- G01 - MEASURING TESTING
Information Patent Grant
Correction method, correction apparatus, and inspection apparatus
- Patent number 10,706,527
- Issue date Jul 7, 2020
- Lasertec Corporation
- Tsunehito Kohyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical apparatus and vibration removing method
- Patent number 10,645,289
- Issue date May 5, 2020
- Lasertec Corporation
- Haruhiko Kusunose
- G02 - OPTICS
Information Patent Grant
Detection method, inspection method, detection apparatus, and inspe...
- Patent number 10,539,511
- Issue date Jan 21, 2020
- Lasertec Corporation
- Masayasu Nishizawa
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus of EUV mask and its focus adjustment method
- Patent number 10,319,088
- Issue date Jun 11, 2019
- Lasertec Corporation
- Hiroki Miyai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mask inspection apparatus and mask inspection method
- Patent number 10,156,664
- Issue date Dec 18, 2018
- Lasertec Corporation
- Kiwamu Takehisa
- B08 - CLEANING
Information Patent Grant
Measurement apparatus, measurement method, and correction method
- Patent number 10,106,334
- Issue date Oct 23, 2018
- Lasertec Corporation
- Teruaki Yamazaki
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Laser light source device and inspection device
- Patent number 9,991,670
- Issue date Jun 5, 2018
- Lasertec Corporation
- Kiwamu Takehisa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 9,970,885
- Issue date May 15, 2018
- Lasertec Corporation
- Hiroto Nozawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection apparatus, coordinate detection apparatus, coordinate de...
- Patent number 9,786,057
- Issue date Oct 10, 2017
- Lasertec Coporation
- Hiroki Miyai
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Interferometer and phase shift amount measuring apparatus with diff...
- Patent number 9,719,859
- Issue date Aug 1, 2017
- LASERTEC CORPORATION
- Haruhiko Kusunose
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Light source apparatus and inspection apparatus
- Patent number 9,696,568
- Issue date Jul 4, 2017
- LASERTEC CORPORATION
- Jun Sakuma
- G02 - OPTICS
Information Patent Grant
Defect coordinates measurement device, defect coordinates measureme...
- Patent number 9,638,739
- Issue date May 2, 2017
- Lasertec Corporation
- Haruhiko Kusunose
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Analysis apparatus and analysis method
- Patent number 9,638,729
- Issue date May 2, 2017
- LASERTEC CORPORATION
- Hiroyuki Maekawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pellicle inspection apparatus
- Patent number 9,588,421
- Issue date Mar 7, 2017
- Lasertec Corporation
- Kiwamu Takehisa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Defect classifying method and optical inspection apparatus for sili...
- Patent number 9,551,672
- Issue date Jan 24, 2017
- Lasertec Corporation
- Hirokazu Seki
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus and measuring method
- Patent number 9,544,558
- Issue date Jan 10, 2017
- Lasertec Corporation
- Koyo Tada
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Defect inspection device, defect inspection method, and defect insp...
- Patent number 9,240,041
- Issue date Jan 19, 2016
- Lasertec Corporation
- Tomoya Tamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Chucking device and chucking method
- Patent number 9,117,869
- Issue date Aug 25, 2015
- Lasertec Corporation
- Haruhiko Kusunose
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Microscope and inspection apparatus
- Patent number 9,013,787
- Issue date Apr 21, 2015
- Lasertec Corporation
- Haruhiko Kusunose
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method and inspection apparatus
- Patent number 8,879,055
- Issue date Nov 4, 2014
- Lasertec Corporation
- Hironobu Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Substrate inspection apparatus and mask inspection apparatus
- Patent number 8,760,642
- Issue date Jun 24, 2014
- Lasertec Corporation
- Zenta Hori
- G01 - MEASURING TESTING
Information Patent Grant
Radiation source apparatus and DUV beam generation method
- Patent number 8,503,068
- Issue date Aug 6, 2013
- Lasertec Corporation
- Jun Sakuma
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20250012726
- Publication date Jan 9, 2025
- Lasertec Corporation
- Shota FUJIKI
- G01 - MEASURING TESTING
Information Patent Application
PHOTODETECTOR
- Publication number 20240402592
- Publication date Dec 5, 2024
- Lasertec Corporation
- Keita SAITO
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
OPTICAL APPARATUS AND METHOD OF PREVENTING CONTAMINATION OF OPTICAL...
- Publication number 20240361590
- Publication date Oct 31, 2024
- Lasertec Corporation
- Ko GONDAIRA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
- Publication number 20240337603
- Publication date Oct 10, 2024
- Lasertec Corporation
- Shota FUJIKI
- G01 - MEASURING TESTING
Information Patent Application
ILLUMINATION APPARATUS AND ILLUMINATION METHOD
- Publication number 20240302670
- Publication date Sep 12, 2024
- Lasertec Corporation
- Keitaro HAYASHIDA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
POSITION DETECTION APPARATUS, POSITION DETECTION METHOD, AND NON-TR...
- Publication number 20240292511
- Publication date Aug 29, 2024
- Lasertec Corporation
- Keitaro HAYASHIDA
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
OPTICAL APPARATUS AND FOCUS CORRECTION METHOD
- Publication number 20240280502
- Publication date Aug 22, 2024
- Lasertec Corporation
- Minoru HOSOMI
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL APPARATUS AND EXAMINATION APPARATUS
- Publication number 20240159684
- Publication date May 16, 2024
- Lasertec Corporation
- Ko GONDAIRA
- G01 - MEASURING TESTING
Information Patent Application
POSITION DETECTION APPARATUS, POSITION DETECTION METHOD AND NON-TRA...
- Publication number 20240074022
- Publication date Feb 29, 2024
- Lasertec Corporation
- Tsunehito KOHYAMA
- G01 - MEASURING TESTING
Information Patent Application
LIGHT-SOURCE APPARATUS, INSPECTION APPARATUS, AND ADJUSTMENT METHOD
- Publication number 20230417684
- Publication date Dec 28, 2023
- Lasertec Corporation
- Jun SAKUMA
- G01 - MEASURING TESTING
Information Patent Application
CALCULATION METHOD, IMAGE-CAPTURING METHOD, AND IMAGE-CAPTURING APP...
- Publication number 20230392919
- Publication date Dec 7, 2023
- Lasertec Corporation
- Yoshihiro NISHIMURA
- G01 - MEASURING TESTING
Information Patent Application
CALCULATION METHOD, IMAGING-CAPTURING METHOD, AND IMAGE-CAPTURING A...
- Publication number 20230375816
- Publication date Nov 23, 2023
- Lasertec Corporation
- Yoshihiro NISHIMURA
- G02 - OPTICS
Information Patent Application
IMAGE PROCESSING APPARATUS AND IMAGE PROCESSING METHOD
- Publication number 20230073435
- Publication date Mar 9, 2023
- Lasertec Corporation
- Masafumi SHINODA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LIGHT SOURCE APPARATUS AND INSPECTION APPARATUS
- Publication number 20220376458
- Publication date Nov 24, 2022
- Lasertec Corporation
- Jun SAKUMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EUV MASK INSPECTION DEVICE, EUV MASK INSPECTION METHOD, NON-TRANSIT...
- Publication number 20220222804
- Publication date Jul 14, 2022
- Lasertec Corporation
- Yoshihiro KATO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MASK INSPECTION METHOD AND MASK INSPECTION APPARATUS
- Publication number 20220178847
- Publication date Jun 9, 2022
- Lasertec Corporation
- Keita SAITO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DEVICE, AND METHOD FOR PREVENTING CONTAMINATION OF OPTICAL...
- Publication number 20210373447
- Publication date Dec 2, 2021
- Lasertec Corporation
- Haruhiko KUSUNOSE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20210247323
- Publication date Aug 12, 2021
- Lasertec Corporation
- Kiwamu TAKEHISA
- G01 - MEASURING TESTING
Information Patent Application
IMAGE PICKUP APPARATUS AND FOCUS ADJUSTMENT METHOD
- Publication number 20210018832
- Publication date Jan 21, 2021
- Lasertec Corporation
- Hiroki MIYAI
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
CONFOCAL MICROSCOPE AND METHOD FOR TAKING IMAGE USING THE SAME
- Publication number 20200201011
- Publication date Jun 25, 2020
- Lasertec Corporation
- Ko GONDAIRA
- G02 - OPTICS
Information Patent Application
MASK INSPECTION APPARATUS, SWITCHING METHOD, AND MASK INSPECTION ME...
- Publication number 20200182803
- Publication date Jun 11, 2020
- Lasertec Corporation
- Tetsuya SENDODA
- G01 - MEASURING TESTING
Information Patent Application
WAVELENGTH CONVERSION APPARATUS AND WAVELENGTH CONVERSION METHOD
- Publication number 20200089079
- Publication date Mar 19, 2020
- Lasertec Corporation
- Akihiro ANDO
- G02 - OPTICS
Information Patent Application
MEASUREMENT APPARATUS AND MEASUREMENT METHOD
- Publication number 20200041251
- Publication date Feb 6, 2020
- Lasertec Corporation
- Ko GONDAIRA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20190277772
- Publication date Sep 12, 2019
- Lasertec Corporation
- Masayasu NISHIZAWA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
DETECTION METHOD, INSPECTION METHOD, DETECTION APPARATUS, AND INSPE...
- Publication number 20190204235
- Publication date Jul 4, 2019
- Lasertec Corporation
- Masayasu NISHIZAWA
- G01 - MEASURING TESTING
Information Patent Application
CORRECTION METHOD, CORRECTION APPARATUS, AND INSPECTION APPARATUS
- Publication number 20180276812
- Publication date Sep 27, 2018
- Lasertec Corporation
- Tsunehito KOHYAMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL APPARATUS AND VIBRATION REMOVING METHOD
- Publication number 20180191958
- Publication date Jul 5, 2018
- Lasertec Corporation
- Haruhiko KUSUNOSE
- G02 - OPTICS
Information Patent Application
MEASUREMENT APPARATUS, MEASUREMENT METHOD, AND CORRECTION METHOD
- Publication number 20170355532
- Publication date Dec 14, 2017
- Lasertec Corporation
- Teruaki YAMAZAKI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND ITS FOCUS ADJUSTMENT METHOD
- Publication number 20170256045
- Publication date Sep 7, 2017
- Lasertec Corporation
- Hiroki Miyai
- G01 - MEASURING TESTING
Information Patent Application
MASK INSPECTION APPARATUS AND MASK INSPECTION METHOD
- Publication number 20170235031
- Publication date Aug 17, 2017
- Lasertec Corporation
- Kiwamu TAKEHISA
- B08 - CLEANING

Trademarklast 30 trademarks

Information Trademark
79392327 - MPM
- Serial number 79392327
- Filing date Jan 30, 2024
- LASERTEC CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79361282 - MAGICS
- Serial number 79361282
- Registration number 7362263
- Filing date Nov 17, 2022
- LASERTEC CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79358845 - GALOIS
- Serial number 79358845
- Filing date Oct 27, 2022
- LASERTEC CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79360593 - LASERTEC
- Serial number 79360593
- Registration number 7376555
- Filing date Oct 26, 2022
- LASERTEC CORPORATION
- 7 - Machines and machine tools
Information Trademark
79360594 - LASERTEC
- Serial number 79360594
- Registration number 7376556
- Filing date Oct 26, 2022
- LASERTEC CORPORATION
- 7 - Machines and machine tools
Information Trademark
79357009 - OPTELICS
- Serial number 79357009
- Registration number 7349517
- Filing date Sep 20, 2022
- LASERTEC CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79356977 - SICA
- Serial number 79356977
- Registration number 7333960
- Filing date Sep 20, 2022
- LASERTEC CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79357011 - EPMRS
- Serial number 79357011
- Registration number 7349518
- Filing date Sep 20, 2022
- LASERTEC CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79357294 - MATRICS
- Serial number 79357294
- Registration number 7349522
- Filing date Sep 20, 2022
- LASERTEC CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79351270 - PELMIS
- Serial number 79351270
- Registration number 7333863
- Filing date Jul 21, 2022
- LASERTEC CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79354003 - BASIC
- Serial number 79354003
- Registration number 7265407
- Filing date Jul 21, 2022
- LASERTEC CORPORATION
- 7 - Machines and machine tools
Information Trademark
79350283 - ACTIS
- Serial number 79350283
- Registration number 7333839
- Filing date Jul 21, 2022
- LASERTEC CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79187390 - LASERTEC
- Serial number 79187390
- Registration number 6082221
- Filing date Mar 3, 2016
- LASERTEC CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
85902861 - I.D. PLATFORM
- Serial number 85902861
- Registration number 4443293
- Filing date Apr 12, 2013
- Lasertec, Inc.
- 38 - Telecommunications
Information Trademark
79026660 - LASERTEC
- Serial number 79026660
- Registration number 3398654
- Filing date Feb 8, 2006
- LASERTEC CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
76526159 - OPTELICS
- Serial number 76526159
- Registration number 3105494
- Filing date Jun 26, 2003
- Lasertec Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

Organization

Patents Grantslast 30 patents

Mask inspection method and mask inspection apparatus

Image pickup apparatus and focus adjustment method using bending co...

Measurement apparatus and measurement method

Confocal microscope and method for taking image using the same

Optical device, and method for preventing contamination of optical...

Mask inspection apparatus, switching method, and mask inspection me...

Wavelength conversion apparatus and wavelength conversion method

Inspection device and inspection method

Correction method, correction apparatus, and inspection apparatus

Optical apparatus and vibration removing method

Detection method, inspection method, detection apparatus, and inspe...

Inspection apparatus of EUV mask and its focus adjustment method

Mask inspection apparatus and mask inspection method

Measurement apparatus, measurement method, and correction method

Laser light source device and inspection device

Inspection apparatus and inspection method

Inspection apparatus, coordinate detection apparatus, coordinate de...

Interferometer and phase shift amount measuring apparatus with diff...

Light source apparatus and inspection apparatus

Defect coordinates measurement device, defect coordinates measureme...

Analysis apparatus and analysis method

Pellicle inspection apparatus

Defect classifying method and optical inspection apparatus for sili...

Measuring apparatus and measuring method

Defect inspection device, defect inspection method, and defect insp...

Chucking device and chucking method

Microscope and inspection apparatus

Inspection method and inspection apparatus

Substrate inspection apparatus and mask inspection apparatus

Radiation source apparatus and DUV beam generation method

Patents Applicationslast 30 patents

INSPECTION APPARATUS AND INSPECTION METHOD

PHOTODETECTOR

OPTICAL APPARATUS AND METHOD OF PREVENTING CONTAMINATION OF OPTICAL...

DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD

ILLUMINATION APPARATUS AND ILLUMINATION METHOD

POSITION DETECTION APPARATUS, POSITION DETECTION METHOD, AND NON-TR...

OPTICAL APPARATUS AND FOCUS CORRECTION METHOD

OPTICAL APPARATUS AND EXAMINATION APPARATUS

POSITION DETECTION APPARATUS, POSITION DETECTION METHOD AND NON-TRA...

LIGHT-SOURCE APPARATUS, INSPECTION APPARATUS, AND ADJUSTMENT METHOD

CALCULATION METHOD, IMAGE-CAPTURING METHOD, AND IMAGE-CAPTURING APP...

CALCULATION METHOD, IMAGING-CAPTURING METHOD, AND IMAGE-CAPTURING A...

IMAGE PROCESSING APPARATUS AND IMAGE PROCESSING METHOD

LIGHT SOURCE APPARATUS AND INSPECTION APPARATUS

EUV MASK INSPECTION DEVICE, EUV MASK INSPECTION METHOD, NON-TRANSIT...

MASK INSPECTION METHOD AND MASK INSPECTION APPARATUS

OPTICAL DEVICE, AND METHOD FOR PREVENTING CONTAMINATION OF OPTICAL...

INSPECTION DEVICE AND INSPECTION METHOD

IMAGE PICKUP APPARATUS AND FOCUS ADJUSTMENT METHOD

CONFOCAL MICROSCOPE AND METHOD FOR TAKING IMAGE USING THE SAME

MASK INSPECTION APPARATUS, SWITCHING METHOD, AND MASK INSPECTION ME...

WAVELENGTH CONVERSION APPARATUS AND WAVELENGTH CONVERSION METHOD

MEASUREMENT APPARATUS AND MEASUREMENT METHOD

INSPECTION DEVICE AND INSPECTION METHOD

DETECTION METHOD, INSPECTION METHOD, DETECTION APPARATUS, AND INSPE...

CORRECTION METHOD, CORRECTION APPARATUS, AND INSPECTION APPARATUS

OPTICAL APPARATUS AND VIBRATION REMOVING METHOD

MEASUREMENT APPARATUS, MEASUREMENT METHOD, AND CORRECTION METHOD

INSPECTION APPARATUS AND ITS FOCUS ADJUSTMENT METHOD

MASK INSPECTION APPARATUS AND MASK INSPECTION METHOD

Trademarklast 30 trademarks

79392327 - MPM

79361282 - MAGICS

79358845 - GALOIS

79360593 - LASERTEC

79360594 - LASERTEC

79357009 - OPTELICS

79356977 - SICA

79357011 - EPMRS

79357294 - MATRICS

79351270 - PELMIS

79354003 - BASIC

79350283 - ACTIS

79187390 - LASERTEC

85902861 - I.D. PLATFORM

79026660 - LASERTEC