TREA

79360594 - LASERTEC

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Information

  • Trademark
  • 79360594
  • Serial Number
    79360594
  • Registration Number
    7376556
  • Filing Date
    October 26, 2022
    2 years ago
  • Registration Date
    May 07, 2024
    8 months ago
  • Transaction Date
    November 24, 2024
    a month ago
  • Status Date
    May 07, 2024
    8 months ago
  • Published for Opposition Date
    February 20, 2024
    11 months ago
  • Location Date
    May 06, 2024
    8 months ago
  • Status Code
    700
  • Current Location
    FILE REPOSITORY (FRANCONIA)
    Employee Name
    HUSSAIN, TASNEEM
  • Attorney Docket Number
    TM230104USIP
    Attorney Name
    George W. Lewis
    Law Office Assigned Location Code
    M90
  • Owners
Information
Mark Drawing Code
4
Mark Identification
LASERTEC
Case File Statements
  • GS0091: Semiconductor photomask optical inspection apparatus; analyzing apparatus, namely, optical inspection apparatus for defect of photomasks for semiconductors; semiconductor photomask pattern optical inspection apparatus; semiconductor photomask pattern measuring apparatus, namely, optical measurement system comprised of optical inspection apparatus for detection, measurement and cleaning of foreign matter and defects on semiconductor photomask pattern; semiconductor photomask imaging apparatus, namely, optical imaging apparatus for inspection of semiconductor photomask; semiconductor photomask phase-shift measuring apparatus, namely, optical measurement system comprised of optical inspection apparatus for measurement of semiconductor photomask phase-shift; semiconductor photomask transmittance measuring apparatus, namely, optical measurement system comprised of optical inspection apparatus for measurement of semiconductor photomask transmittance; apparatus and instruments for measuring semiconductor photomask phase shifting amount, namely, optical measurement system comprised of optical inspection apparatus for measurement of semiconductor photomask phase shifting amount; semiconductor reticle optical inspection apparatus; analyzing apparatus, namely, optical inspection apparatus for defect of semiconductor reticles; semiconductor reticle pattern optical inspection apparatus; semiconductor reticle pattern measuring apparatus, namely, optical measurement system comprised of optical inspection apparatus for detection, measurement and cleaning of foreign matter and defects on semiconductor reticle pattern; semiconductor reticle imaging apparatus, namely, optical imaging apparatus for inspection of semiconductor reticle; semiconductor wafer optical inspection apparatus; semiconductor wafer measuring apparatus, namely, optical measurement system comprised of optical inspection apparatus for detection, measurement and cleaning of foreign matter and defects on semiconductor wafer; semiconductor wafer imaging apparatus, namely, optical imaging apparatus for inspection of semiconductor wafer; semiconductor wafer edge optical inspection apparatus; analyzing apparatus, namely, optical inspection apparatus for defect of wafers for semiconductors; semiconductor photomask blanks optical inspection apparatus; semiconductor photomask blanks imaging apparatus, namely, optical imaging apparatus for inspection of semiconductor photomask blanks; optical inspection apparatus for defect of flat panel display photomasks; optical inspection apparatus for defect of flat panel display photomask pattern; flat panel display photomask pattern measuring apparatus, namely, optical measurement system comprised of optical inspection apparatus for detection, measurement and cleaning of foreign matter and defects on flat panel display photomask pattern; optical inspection apparatus for defect of flat panel display photomask blanks; pellicle optical inspection apparatus for photomasks for flat panel displays; pellicle mounting apparatus, namely, optical inspection apparatus with the capability of mounting pellicles on photomasks for flat panel displays; confocal microscopes; laser microscopes; computer peripheral devices; optical inspection systems for in-suit visualizing of electro-chemical reactions comprising optical inspection apparatus for semi-conductor materials and elements; semi-conductor testing machines and instruments; electron microscopes; semiconductor defect detectors; testing apparatus not for medical purposes, namely, semiconductor testing apparatus; precision crystallographic measuring apparatus; data sets, downloadable, in the field of semiconductors; computer software, recorded, for operating semiconductor photomask, reticle or pellicle optical inspection apparatus; computer software applications, downloadable, for operating semiconductor photomask, reticle or pellicle optical inspection apparatus; computer hardware; computer programs, downloadable, for operating semiconductor photomask, reticle or pellicle optical inspection apparatus
  • GS0071: Defect repairing machines for photomasks for semiconductors; defect repairing machines for reticles for semiconductors; defect repairing machines for wafers for semiconductors; defect repairing machines for photomasks for flat panel displays; defect repairing machines for photomask blanks for flat panel displays
  • PM0001: LASER TECH
Case File Event Statements
  • 5/9/2023 - a year ago
    5 - ASSIGNED TO EXAMINER Type: DOCK
  • 1/19/2023 - a year ago
    1 - SN ASSIGNED FOR SECT 66A APPL FROM IB Type: REPR
  • 1/23/2023 - a year ago
    2 - LIMITATION FROM ORIGINAL APPLICATION ENTERED Type: LIMI
  • 1/24/2023 - a year ago
    3 - NEW APPLICATION OFFICE SUPPLIED DATA ENTERED Type: NWOS
  • 1/28/2023 - a year ago
    4 - APPLICATION FILING RECEIPT MAILED Type: MAFR
  • 5/10/2023 - a year ago
    6 - NON-FINAL ACTION WRITTEN Type: CNRT
  • 5/11/2023 - a year ago
    7 - NON-FINAL ACTION (IB REFUSAL) PREPARED FOR REVIEW Type: RFCR
  • 6/20/2023 - a year ago
    8 - REFUSAL PROCESSED BY MPU Type: RFRR
  • 6/20/2023 - a year ago
    9 - NON-FINAL ACTION MAILED - REFUSAL SENT TO IB Type: RFCS
  • 7/11/2023 - a year ago
    10 - REFUSAL PROCESSED BY IB Type: RFNT
  • 7/20/2023 - a year ago
    11 - TEAS CHANGE OF OWNER ADDRESS RECEIVED Type: COAR
  • 7/20/2023 - a year ago
    12 - APPLICANT/CORRESPONDENCE CHANGES (NON-RESPONSIVE) ENTERED Type: CHAN
  • 7/20/2023 - a year ago
    13 - TEAS REVOKE/APP/CHANGE ADDR OF ATTY/DOM REP RECEIVED Type: REAP
  • 7/20/2023 - a year ago
    14 - ATTORNEY/DOM.REP.REVOKED AND/OR APPOINTED Type: ARAA
  • 7/20/2023 - a year ago
    15 - TEAS CHANGE OF DOMESTIC REPRESENTATIVES ADDRESS Type: ECDR
  • 7/20/2023 - a year ago
    16 - TEAS CHANGE OF CORRESPONDENCE RECEIVED Type: TCCA
  • 12/7/2023 - a year ago
    17 - TEAS RESPONSE TO OFFICE ACTION RECEIVED Type: TROA
  • 12/7/2023 - a year ago
    18 - CORRESPONDENCE RECEIVED IN LAW OFFICE Type: CRFA
  • 12/8/2023 - a year ago
    19 - TEAS/EMAIL CORRESPONDENCE ENTERED Type: TEME
  • 1/2/2024 - a year ago
    20 - EXAMINERS AMENDMENT -WRITTEN Type: CNEA
  • 1/2/2024 - a year ago
    21 - EXAMINERS AMENDMENT E-MAILED Type: GNEA
  • 1/2/2024 - a year ago
    22 - NOTIFICATION OF EXAMINERS AMENDMENT E-MAILED Type: GNEN
  • 1/2/2024 - a year ago
    23 - EXAMINER'S AMENDMENT ENTERED Type: XAEC
  • 1/17/2024 - 12 months ago
    24 - APPROVED FOR PUB - PRINCIPAL REGISTER Type: CNSA
  • 1/31/2024 - 11 months ago
    25 - OFFICIAL GAZETTE PUBLICATION CONFIRMATION E-MAILED Type: NPUB
  • 2/1/2024 - 11 months ago
    27 - NOTIFICATION OF NOTICE OF PUBLICATION E-MAILED Type: NONP
  • 2/3/2024 - 11 months ago
    28 - NEW REPRESENTATIVE AT IB RECEIVED Type: NREP
  • 2/1/2024 - 11 months ago
    26 - NOTIFICATION OF NOTICE OF PUBLICATION E-MAILED Type: NONP
  • 2/20/2024 - 11 months ago
    31 - PUBLISHED FOR OPPOSITION Type: PUBO
  • 3/4/2024 - 10 months ago
    33 - OFFICIAL GAZETTE PUBLICATION CONFIRMATION E-MAILED Type: NPUB
  • 2/7/2024 - 11 months ago
    30 - NOTIFICATION OF POSSIBLE OPPOSITION SENT TO IB Type: OPNS
  • 2/7/2024 - 11 months ago
    29 - NOTICE OF START OF OPPOSITION PERIOD CREATED, TO BE SENT TO IB Type: OP2R
  • 2/26/2024 - 10 months ago
    32 - NOTIFICATION PROCESSED BY IB Type: GPNX
  • 5/7/2024 - 8 months ago
    34 - REGISTERED-PRINCIPAL REGISTER Type: R.PR
  • 8/7/2024 - 5 months ago
    36 - FINAL DISPOSITION NOTICE CREATED, TO BE SENT TO IB Type: FICR
  • 11/2/2024 - 2 months ago
    37 - FINAL DISPOSITION PROCESSED Type: FIMP
  • 11/3/2024 - 2 months ago
    38 - FINAL DISPOSITION NOTICE SENT TO IB Type: FICS
  • 5/7/2024 - 8 months ago
    35 - NOTICE OF REGISTRATION CONFIRMATION EMAILED Type: NRCC
  • 11/23/2024 - a month ago
    39 - FINAL DECISION TRANSACTION PROCESSED BY IB Type: FINO