97308055 - ONTO INNOVATION

Information

• Trademark
• 97308055

• Source

• Serial Number

  97308055

• International Classifications

  • 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
  • 42 - Scientific and technological services and research and design relating thereto

• Filing Date

  March 11, 2022
  2 years ago

• Transaction Date

  March 30, 2022
  2 years ago

• Status Date

  March 30, 2022
  2 years ago

• Location Date

  March 15, 2022
  2 years ago

• Status Code

  601

• Current Location

  NEW APPLICATION PROCESSING

• Attorney Docket Number

  15067147US02

  Attorney Name

  Heather J. Kliebenstein

• Owners

  • ONTO INNOVATION INC

Case File Statements

• GS0091: Scientific instruments, based principally upon optical microscope, electron microscope, spectrophotometer, ellipsometer and scanning slit densitometer technology, for metrology purposes, namely, apparatus for measuring physical dimensions of samples and thicknesses of deposited films or for analyzing chemical composition of materials; Interferometers for use in the testing of transmitted wavefront and surface shape of optical components, surface roughness of optics, metals, semiconductors, ceramics, plastics, paints and other finely finished materials, and defects and geometries of parts in aerospace, automotive, power generation, semiconductor, data storage, bearings, additive manufacturing and other precision-machined components; Metrology inspection equipment for use in the manufacturing, inspection, testing and repair of semiconductor substrates; Metrology inspection equipment and devices, namely, instruments and devices that sense and capture images of semiconductor components, semiconductor wafers, semiconductor die, packaged integrated circuits, printed circuit boards, liquid crystal displays, electronic displays, and disk storage media, and inspect these images for defects, coordinate or position determination, identification, or presence or absence of a feature, characteristic or substance thereon; Metrology inspection systems comprised of one or more light sources, one or more cameras and/or sensors in communication with computer software and hardware used for the measurement of thickness, adhesion properties, and structural properties of semiconductor materials and for monitoring the performance of semiconductor fabrication processes; Optical inspection equipment for 2D and 3D inspection of semiconductor materials; Metrology instruments metrology purposes, namely, apparatus for measuring physical dimensions of samples and thicknesses of deposited films or for analyzing chemical composition of materials, consisting of optical microscope, electron microscope, spectrophotometer, ellipsometer and scanning slit densitometer technology
• GS0421: Software for the semiconductor industry, namely, software for identifying defects in semiconductor structures, software for identifying semiconductor fabrication process excursions, software for recording and reviewing defects in semiconductors structures, software for identifying root causes of defects in semiconductor structures, and software for controlling and monitoring semiconductor fabrication equipment

Case File Event Statements

• 3/30/2022 - 2 years ago

  5 - ABANDONMENT NOTICE E-MAILED - EXPRESS ABANDONMENT Type: MAB1

• 3/30/2022 - 2 years ago

  4 - ABANDONMENT - EXPRESS MAILED Type: ABN1

• 3/29/2022 - 2 years ago

  3 - TEAS EXPRESS ABANDONMENT RECEIVED Type: EXAR

• 3/16/2022 - 2 years ago

  2 - NEW APPLICATION OFFICE SUPPLIED DATA ENTERED IN TRAM Type: NWOS

• 3/15/2022 - 2 years ago

  1 - NEW APPLICATION ENTERED IN TRAM Type: NWAP