97513203 - MICRONICS JAPAN

Information

• Trademark
• 97513203

• Source

• Serial Number

  97513203

• Registration Number

  7210901

• International Classifications

  • 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
  • 37 - Building construction

• Filing Date

  July 21, 2022
  3 years ago

• Registration Date

  November 07, 2023
  2 years ago

• Transaction Date

  November 07, 2023
  2 years ago

• Status Date

  November 07, 2023
  2 years ago

• Published for Opposition Date

  August 22, 2023
  2 years ago

• Location Date

  November 07, 2023
  2 years ago

• Status Code

  700

• Current Location

  PUBLICATION AND ISSUE SECTION

  Employee Name

  BURKE, JUSTINE N

• Attorney Docket Number

  S26063

  Attorney Name

  LEIGH ANN LINDQUIST

  Law Office Assigned Location Code

  N30

• Owners

  • Kabushiki Kaisha Nihon Micronics

Case File Statements

• GS0091: Probe cards for testing integrated circuits and semiconductor devices; probe cards for use in connection with inspection of semiconductor devices and integrated circuits; testing, inspection, and probing instruments, namely, semiconductor testing instruments for making electrical contact with probes to semiconductor devices for use in the process of manufacture, testing, and inspection of semiconductor devices and integrated circuit; probes for testing of integrated circuits and semiconductor devices; probe stations being a positioning apparatus for connecting probes to semiconductor device electrodes for testing and inspecting integrated circuits and semiconductor devices, namely, precision instruments for manipulation and positioning of microscopic objects; probes for scientific purposes for the measurement of electronic signals; electric contacts; electrical instruments, namely, sockets and socket terminal carriers being electrical terminal blocks
• GS0371: Repair or maintenance of probe cards for use in connection with inspection of semiconductor devices and integrated circuits; repair or maintenance of probe cards for testing integrated circuits and semiconductor devices
• D10000: "JAPAN"

Case File Event Statements

• 11/7/2023 - 2 years ago

  22 - NOTICE OF REGISTRATION CONFIRMATION EMAILED Type: NRCC

• 11/7/2023 - 2 years ago

  21 - REGISTERED-PRINCIPAL REGISTER Type: R.PR

• 8/22/2023 - 2 years ago

  20 - OFFICIAL GAZETTE PUBLICATION CONFIRMATION E-MAILED Type: NPUB

• 8/22/2023 - 2 years ago

  19 - PUBLISHED FOR OPPOSITION Type: PUBO

• 8/2/2023 - 2 years ago

  18 - NOTIFICATION OF NOTICE OF PUBLICATION E-MAILED Type: NONP

• 7/18/2023 - 2 years ago

  17 - APPROVED FOR PUB - PRINCIPAL REGISTER Type: CNSA

• 7/18/2023 - 2 years ago

  16 - EXAMINER'S AMENDMENT ENTERED Type: XAEC

• 7/18/2023 - 2 years ago

  15 - NOTIFICATION OF EXAMINERS AMENDMENT E-MAILED Type: GNEN

• 7/18/2023 - 2 years ago

  14 - EXAMINERS AMENDMENT E-MAILED Type: GNEA

• 7/18/2023 - 2 years ago

  13 - EXAMINERS AMENDMENT -WRITTEN Type: CNEA

• 7/17/2023 - 2 years ago

  12 - TEAS/EMAIL CORRESPONDENCE ENTERED Type: TEME

• 7/17/2023 - 2 years ago

  11 - CORRESPONDENCE RECEIVED IN LAW OFFICE Type: CRFA

• 7/12/2023 - 2 years ago

  10 - TEAS RESPONSE TO OFFICE ACTION RECEIVED Type: TROA

• 5/12/2023 - 2 years ago

  9 - NOTIFICATION OF NON-FINAL ACTION E-MAILED Type: GNRN

• 5/12/2023 - 2 years ago

  8 - NON-FINAL ACTION E-MAILED Type: GNRT

• 5/12/2023 - 2 years ago

  7 - NON-FINAL ACTION WRITTEN Type: CNRT

• 5/8/2023 - 2 years ago

  6 - ASSIGNED TO EXAMINER Type: DOCK

• 9/14/2022 - 3 years ago

  5 - PRELIMINARY/VOLUNTARY AMENDMENT - ENTERED Type: AMPX

• 9/14/2022 - 3 years ago

  4 - ASSIGNED TO LIE Type: ALIE

• 8/10/2022 - 3 years ago

  3 - TEAS VOLUNTARY AMENDMENT RECEIVED Type: PARI

• 8/11/2022 - 3 years ago

  2 - NEW APPLICATION OFFICE SUPPLIED DATA ENTERED Type: NWOS

• 7/25/2022 - 3 years ago

  1 - NEW APPLICATION ENTERED Type: NWAP