Kabushiki Kaisha Nihon Micronics

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Blood vessel position display device and blood vessel position disp...
- Patent number 12,171,573
- Issue date Dec 24, 2024
- Kabushiki Kaisha Nihon Micronics
- Yuki Saito
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Secondary battery
- Patent number 12,170,374
- Issue date Dec 17, 2024
- Kabushiki Kaisha Nihon Micronics
- Daisuke Hasegawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrical contactor and electrical connecting apparatus
- Patent number 12,105,119
- Issue date Oct 1, 2024
- Kabushiki Kaisha Nihon Micronics
- Tomoaki Kuga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electric contact
- Patent number D1043581
- Issue date Sep 24, 2024
- Kabushiki Kaisha Nihon Micronics
- Satoshi Narita
- D13 - Equipment for production, distribution, or transformation of energy
Information Patent Grant
Measurement system
- Patent number 12,031,921
- Issue date Jul 9, 2024
- Kabushiki Kaisha Nihon Micronics
- Michitaka Okuta
- G01 - MEASURING TESTING
Information Patent Grant
Electrical connecting device
- Patent number 12,000,867
- Issue date Jun 4, 2024
- Kabushiki Kaisha Nihon Micronics
- Takayuki Hayashizaki
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system and measurement method
- Patent number 11,971,296
- Issue date Apr 30, 2024
- Kabushiki Kaisha Nihon Micronics
- Michitaka Okuta
- G01 - MEASURING TESTING
Information Patent Grant
Optical probe, optical probe array, optical probe card, and method...
- Patent number 11,971,431
- Issue date Apr 30, 2024
- Kabushiki Kaisha Nihon Micronics
- Michitaka Okuta
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus having a contactor for inspecting electrical c...
- Patent number 11,965,911
- Issue date Apr 23, 2024
- Kabushiki Kaisha Nihon Micronics
- Satoshi Narita
- G01 - MEASURING TESTING
Information Patent Grant
Connecting device for inspection
- Patent number 11,899,054
- Issue date Feb 13, 2024
- Kabushiki Kaisha Nihon Micronics
- Minoru Sato
- G01 - MEASURING TESTING
Information Patent Grant
Connecting apparatus and light condensing substrate
- Patent number 11,874,511
- Issue date Jan 16, 2024
- Kabushiki Kaisha Nihon Micronics
- Hiroshi Kamiya
- G02 - OPTICS
Information Patent Grant
Probe unit with a free length cantilever contactor and pedestal
- Patent number 11,860,190
- Issue date Jan 2, 2024
- Kabushiki Kaisha Nihon Micronics
- Satoshi Narita
- G01 - MEASURING TESTING
Information Patent Grant
Electrical connecting device
- Patent number 11,828,773
- Issue date Nov 28, 2023
- Kabushiki Kaisha Nihon Micronics
- Akihiro Shuto
- G01 - MEASURING TESTING
Information Patent Grant
Connecting device for inspection
- Patent number 11,762,008
- Issue date Sep 19, 2023
- Kabushiki Kaisha Nihon Micronics
- Minoru Sato
- G01 - MEASURING TESTING
Information Patent Grant
Probe substrate and electrical connecting apparatus
- Patent number 11,747,365
- Issue date Sep 5, 2023
- Kabushiki Kaisha Nihon Micronics
- Toshinori Omori
- G01 - MEASURING TESTING
Information Patent Grant
Electrical connecting device and inspection method
- Patent number 11,709,182
- Issue date Jul 25, 2023
- Kabushiki Kaisha Nihon Micronics
- Shota Hetsugi
- G01 - MEASURING TESTING
Information Patent Grant
Connecting device for inspection
- Patent number 11,592,402
- Issue date Feb 28, 2023
- Kabushiki Kaisha Nihon Micronics
- Minoru Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing electrical contactor
- Patent number 11,502,472
- Issue date Nov 15, 2022
- Kabushiki Kaisha Nihon Micronics
- Tomoaki Kuga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrical contactor, electrical connecting structure and electrica...
- Patent number 11,482,805
- Issue date Oct 25, 2022
- Kabushiki Kaisha Nihon Micronics
- Tomoaki Kuga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection method and inspection system
- Patent number 11,435,392
- Issue date Sep 6, 2022
- Kabushiki Kaisha Nihon Micronics
- Osamu Arai
- G01 - MEASURING TESTING
Information Patent Grant
Prober
- Patent number 11,428,727
- Issue date Aug 30, 2022
- Kabushiki Kaisha Nihon Micronics
- Katsuo Yasuta
- G01 - MEASURING TESTING
Information Patent Grant
Electrical connection device
- Patent number 11,378,591
- Issue date Jul 5, 2022
- Kabushiki Kaisha Nihon Micronics
- Kenichi Tsuruta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrical contactor and electrical connecting apparatus
- Patent number 11,372,022
- Issue date Jun 28, 2022
- Kabushiki Kaisha Nihon Micronics
- Yasutaka Kishi
- G01 - MEASURING TESTING
Information Patent Grant
Electrical contactor and electrical connecting apparatus
- Patent number 11,340,289
- Issue date May 24, 2022
- Kabushiki Kaisha Nihon Micronics
- Eichi Osato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrical contactor and electrical connecting apparatus
- Patent number 11,255,878
- Issue date Feb 22, 2022
- Kabushiki Kaisha Nihon Micronics
- Yasutaka Kishi
- G01 - MEASURING TESTING
Information Patent Grant
Electric connection device
- Patent number 11,249,109
- Issue date Feb 15, 2022
- Kabushiki Kaisha Nihon Micronics
- Mika Nasu
- G01 - MEASURING TESTING
Information Patent Grant
Secondary battery
- Patent number 11,245,113
- Issue date Feb 8, 2022
- Kabushiki Kaisha Nihon Micronics
- Takashi Tonokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrical connection device with a short-circuit wiring pattern th...
- Patent number 11,209,460
- Issue date Dec 28, 2021
- Kabushiki Kaisha Nihon Micronics
- Tatsuya Ito
- G01 - MEASURING TESTING
Information Patent Grant
Probe
- Patent number 11,204,370
- Issue date Dec 21, 2021
- Kabushiki Kaisha Nihon Micronics
- Mika Nasu
- G01 - MEASURING TESTING
Information Patent Grant
Electric connection device
- Patent number 11,150,268
- Issue date Oct 19, 2021
- Kabushiki Kaisha Nihon Micronics
- Tatsuya Ito
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTRICAL CONNECTION APPARATUS
- Publication number 20240426903
- Publication date Dec 26, 2024
- Kabushiki Kaisha Nihon Micronics
- Souichi KANOSUE
- G01 - MEASURING TESTING
Information Patent Application
SPACE TRANSFORMER SUPPORT STRUCTURE AND AN ELECTRICAL CONNECTION DE...
- Publication number 20240426874
- Publication date Dec 26, 2024
- Kabushiki Kaisha Nihon Micronics
- Ken HASEGAWA
- G01 - MEASURING TESTING
Information Patent Application
RELAY CIRCUIT AND ELECTRICAL CONNECTION APPARATUS
- Publication number 20240420908
- Publication date Dec 19, 2024
- Kabushiki Kaisha Nihon Micronics
- Souichi KANOSUE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE AND PROBE CARD
- Publication number 20240168056
- Publication date May 23, 2024
- Kabushiki Kaisha Nihon Micronics
- Mika NASU
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL CONNECTING DEVICE AND METHOD FOR MANUFACTURING ELECTRICA...
- Publication number 20230400481
- Publication date Dec 14, 2023
- Kabushiki Kaisha Nihon Micronics
- Satoshi NARITA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PROBE, PROBE CARD, MEASURING SYSTEM, AND MEASURING METHOD
- Publication number 20230038088
- Publication date Feb 9, 2023
- Kabushiki Kaisha Nihon Micronics
- Michitaka OKUTA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS, POSITION ADJUSTING UNIT AND POSITION ADJUSTIN...
- Publication number 20230003764
- Publication date Jan 5, 2023
- KABUSHIKI KAISHA NIHON MICRONICS
- SATOSHI NARITA
- G01 - MEASURING TESTING
Information Patent Application
PROBE UNIT
- Publication number 20220390489
- Publication date Dec 8, 2022
- Kabushiki Kaisha Nihon Micronics
- SATOSHI NARITA
- G01 - MEASURING TESTING
Information Patent Application
BLOOD VESSEL SPECIFYING DEVICE AND BLOOD VESSEL SPECIFYING METHOD
- Publication number 20220257874
- Publication date Aug 18, 2022
- Kabushiki Kaisha Nihon Micronics
- Yuki SAITO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Connecting Apparatus and Light Condensing Substrate
- Publication number 20220260792
- Publication date Aug 18, 2022
- Kabushiki Kaisha Nihon Micronics
- HIROSHI KAMIYA
- G01 - MEASURING TESTING
Information Patent Application
BLOOD VESSEL POSITION DISPLAY DEVICE AND BLOOD VESSEL POSITION DISP...
- Publication number 20220249016
- Publication date Aug 11, 2022
- Kabushiki Kaisha Nihon Micronics
- Yuki SAITO
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
CONNECTING DEVICE FOR INSPECTION
- Publication number 20220221502
- Publication date Jul 14, 2022
- Kabushiki Kaisha Nihon Micronics
- Minoru SATO
- G01 - MEASURING TESTING
Information Patent Application
CONNECTING DEVICE FOR INSPECTION
- Publication number 20220214391
- Publication date Jul 7, 2022
- Kabushiki Kaisha Nihon Micronics
- Minoru SATO
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT SYSTEM
- Publication number 20220196570
- Publication date Jun 23, 2022
- Kabushiki Kaisha Nihon Micronics
- Michitaka OKUTA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRICAL CONNECTING APPARATUS
- Publication number 20220149549
- Publication date May 12, 2022
- Kabushiki Kaisha Nihon Micronics
- Shou HARAKO
- G01 - MEASURING TESTING
Information Patent Application
SECONDARY BATTERY
- Publication number 20220123358
- Publication date Apr 21, 2022
- Kabushiki Kaisha Nihon Micronics
- Kazuyuki TSUNOKUNI
- C01 - INORGANIC CHEMISTRY
Information Patent Application
PROBE SUBSTRATE AND ELECTRICAL CONNECTING APPARATUS
- Publication number 20220099702
- Publication date Mar 31, 2022
- Kabushiki Kaisha Nihon Micronics
- TOSHINORI OMORI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRICAL CONNECTING DEVICE
- Publication number 20220074971
- Publication date Mar 10, 2022
- Kabushiki Kaisha Nihon Micronics
- Akihiro SHUTO
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT SYSTEM AND MEASUREMENT METHOD
- Publication number 20220034714
- Publication date Feb 3, 2022
- Kabushiki Kaisha Nihon Micronics
- Michitaka OKUTA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD AND INSPECTION SYSTEM
- Publication number 20220034959
- Publication date Feb 3, 2022
- Kabushiki Kaisha Nihon Micronics
- Osamu ARAI
- G01 - MEASURING TESTING
Information Patent Application
CONNECTING DEVICE FOR INSPECTION
- Publication number 20220034821
- Publication date Feb 3, 2022
- Kabushiki Kaisha Nihon Micronics
- Minoru SATO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SECONDARY BATTERY AND METHOD OF MANUFACTURING THE SAME
- Publication number 20210399350
- Publication date Dec 23, 2021
- Kabushiki Kaisha Nihon Micronics
- Tomokazu SAITO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE CARD AND INSPECTION METHOD
- Publication number 20210373049
- Publication date Dec 2, 2021
- Kabushiki Kaisha Nihon Micronics
- Makoto KIKUTA
- G01 - MEASURING TESTING
Information Patent Application
Electrical Contactor and Method of Manufacturing Electrical Contactor
- Publication number 20210376548
- Publication date Dec 2, 2021
- Kabushiki Kaisha Nihon Micronics
- TOMOAKI KUGA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL PROBE, OPTICAL PROBE ARRAY, OPTICAL PROBE CARD, AND METHOD...
- Publication number 20210364552
- Publication date Nov 25, 2021
- Kabushiki Kaisha Nihon Micronics
- Michitaka OKUTA
- G01 - MEASURING TESTING
Information Patent Application
SECONDARY BATTERY
- Publication number 20210351412
- Publication date Nov 11, 2021
- Kabushiki Kaisha Nihon Micronics
- Daisuke HASEGAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRICAL CONNECTING DEVICE AND INSPECTION METHOD
- Publication number 20210318354
- Publication date Oct 14, 2021
- Kabushiki Kaisha Nihon Micronics
- Shota HETSUGI
- G01 - MEASURING TESTING
Information Patent Application
SCREENING METHOD, SCREENING APPARATUS, AND METHOD FOR MANUFACTURING...
- Publication number 20210286013
- Publication date Sep 16, 2021
- Kabushiki Kaisha Nihon Micronics
- Masami SANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POWER STORAGE DEVICE
- Publication number 20210193924
- Publication date Jun 24, 2021
- Kabushiki Kaisha Nihon Micronics
- Takuo KUDOH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE
- Publication number 20210156885
- Publication date May 27, 2021
- Kabushiki Kaisha Nihon Micronics
- Akihiro SHUTO
- H01 - BASIC ELECTRIC ELEMENTS

Trademarklast 30 trademarks

Information Trademark
97513203 - MICRONICS JAPAN
- Serial number 97513203
- Registration number 7210901
- Filing date Jul 21, 2022
- KABUSHIKI KAISHA NIHON MICRONICS
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
88767105 - MICRONICS JAPAN
- Serial number 88767105
- Registration number 6489005
- Filing date Jan 21, 2020
- KABUSHIKI KAISHA NIHON MICRONICS
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
88682133 - BEECONTACTS
- Serial number 88682133
- Registration number 6578768
- Filing date Nov 6, 2019
- Kabushiki Kaisha Nihon Micronics
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
87821966 - SCRUZ
- Serial number 87821966
- Registration number 5784768
- Filing date Mar 6, 2018
- Kabushiki Kaisha Nihon Micronics
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
87590610 - VATRY
- Serial number 87590610
- Registration number 5591533
- Filing date Aug 30, 2017
- Kabushiki Kaisha Nihon Micronics
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79194594 - BATTENICE
- Serial number 79194594
- Registration number 5144063
- Filing date Jul 19, 2016
- KABUSHIKI KAISHA NIHON MICRONICS
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79194705
- Serial number 79194705
- Registration number 5163665
- Filing date Jul 19, 2016
- KABUSHIKI KAISHA NIHON MICRONICS
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79158492 - MJC QDCCSS QUALITY + DELIVERY + COST + COMPLIANCE + SERV...
- Serial number 79158492
- Registration number 4920052
- Filing date Sep 2, 2014
- KABUSHIKI KAISHA NIHON MICRONICS
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79165700 - PROBING THE FUTURE MJC
- Serial number 79165700
- Registration number 4975311
- Filing date Jun 23, 2014
- KABUSHIKI KAISHA NIHON MICRONICS
- 7 - Machines and machine tools
Information Trademark
79168629 - MJC
- Serial number 79168629
- Registration number 5070509
- Filing date Jun 23, 2014
- KABUSHIKI KAISHA NIHON MICRONICS
- 7 - Machines and machine tools
Information Trademark
79143840 - BATTENICE
- Serial number 79143840
- Registration number 4570532
- Filing date Dec 11, 2013
- KABUSHIKI KAISHA NIHON MICRONICS
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79138807 - BATTENICE
- Serial number 79138807
- Registration number 4519822
- Filing date Sep 13, 2013
- KABUSHIKI KAISHA NIHON MICRONICS
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79138806 - QUANPOWER
- Serial number 79138806
- Registration number 4519821
- Filing date Sep 13, 2013
- KABUSHIKI KAISHA NIHON MICRONICS
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
85217239 - MJC PROBING THE FUTURE
- Serial number 85217239
- Registration number 3994063
- Filing date Jan 13, 2011
- Kabushiki Kaisha Nihon Micronics
- 37 - Building construction
Information Trademark
85183288 - BEECONTACTS
- Serial number 85183288
- Registration number 4086376
- Filing date Nov 23, 2010
- KABUSHIKI KAISHA NIHON MICRONICS
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
78939416 - MJC
- Serial number 78939416
- Registration number 3279878
- Filing date Jul 27, 2006
- Kabushiki Kaisha Nihon Micronics
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

Kabushiki Kaisha Nihon Micronics

Organization

Patents Grantslast 30 patents

Blood vessel position display device and blood vessel position disp...

Secondary battery

Electrical contactor and electrical connecting apparatus

Electric contact

Measurement system

Electrical connecting device

Measurement system and measurement method

Optical probe, optical probe array, optical probe card, and method...

Inspection apparatus having a contactor for inspecting electrical c...

Connecting device for inspection

Connecting apparatus and light condensing substrate

Probe unit with a free length cantilever contactor and pedestal

Electrical connecting device

Connecting device for inspection

Probe substrate and electrical connecting apparatus

Electrical connecting device and inspection method

Connecting device for inspection

Method of manufacturing electrical contactor

Electrical contactor, electrical connecting structure and electrica...

Inspection method and inspection system

Prober

Electrical connection device

Electrical contactor and electrical connecting apparatus

Electrical contactor and electrical connecting apparatus

Electrical contactor and electrical connecting apparatus

Electric connection device

Secondary battery

Electrical connection device with a short-circuit wiring pattern th...

Probe

Electric connection device

Patents Applicationslast 30 patents

ELECTRICAL CONNECTION APPARATUS

SPACE TRANSFORMER SUPPORT STRUCTURE AND AN ELECTRICAL CONNECTION DE...

RELAY CIRCUIT AND ELECTRICAL CONNECTION APPARATUS

PROBE AND PROBE CARD

ELECTRICAL CONNECTING DEVICE AND METHOD FOR MANUFACTURING ELECTRICA...

OPTICAL PROBE, PROBE CARD, MEASURING SYSTEM, AND MEASURING METHOD

INSPECTION APPARATUS, POSITION ADJUSTING UNIT AND POSITION ADJUSTIN...

PROBE UNIT

BLOOD VESSEL SPECIFYING DEVICE AND BLOOD VESSEL SPECIFYING METHOD

Connecting Apparatus and Light Condensing Substrate

BLOOD VESSEL POSITION DISPLAY DEVICE AND BLOOD VESSEL POSITION DISP...

CONNECTING DEVICE FOR INSPECTION

CONNECTING DEVICE FOR INSPECTION

MEASUREMENT SYSTEM

ELECTRICAL CONNECTING APPARATUS

SECONDARY BATTERY

PROBE SUBSTRATE AND ELECTRICAL CONNECTING APPARATUS

ELECTRICAL CONNECTING DEVICE

MEASUREMENT SYSTEM AND MEASUREMENT METHOD

INSPECTION METHOD AND INSPECTION SYSTEM

CONNECTING DEVICE FOR INSPECTION

SECONDARY BATTERY AND METHOD OF MANUFACTURING THE SAME

PROBE CARD AND INSPECTION METHOD

Electrical Contactor and Method of Manufacturing Electrical Contactor

OPTICAL PROBE, OPTICAL PROBE ARRAY, OPTICAL PROBE CARD, AND METHOD...

SECONDARY BATTERY

ELECTRICAL CONNECTING DEVICE AND INSPECTION METHOD

SCREENING METHOD, SCREENING APPARATUS, AND METHOD FOR MANUFACTURING...

POWER STORAGE DEVICE

PROBE

Trademarklast 30 trademarks

97513203 - MICRONICS JAPAN

88767105 - MICRONICS JAPAN

88682133 - BEECONTACTS

87821966 - SCRUZ

87590610 - VATRY

79194594 - BATTENICE

79194705

79158492 - MJC QDCCSS QUALITY + DELIVERY + COST + COMPLIANCE + SERV...

79165700 - PROBING THE FUTURE MJC

79168629 - MJC

79143840 - BATTENICE

79138807 - BATTENICE

79138806 - QUANPOWER

85217239 - MJC PROBING THE FUTURE

85183288 - BEECONTACTS