98422632 - NSTREAM

Information

• Trademark
• 98422632

• Source

• Serial Number

  98422632

• International Classifications

  • 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
  • 42 - Scientific and technological services and research and design relating thereto

• Filing Date

  February 27, 2024
  3 months ago

• Transaction Date

  June 01, 2024
  3 days ago

• Status Date

  February 27, 2024
  3 months ago

• Status Code

  630

• Attorney Docket Number

  TM24-0029

  Attorney Name

  Kumiko Ide

• Owners

  • HITACHI HIGH-TECH CORPO RATION

Case File Statements

• GS0091: Downloadable computer software programs for analyzing data of electron microscopes, scanning electron microscopes, transmission electron microscopes, semiconductor process equipment, semiconductor inspection and metrology equipment; Computer peripheral apparatus; Electron microscopes; Scanning electron microscopes; Transmission electron microscopes
• GS0421: Computer rental; Providing on-line non-downloadable computer software for analyzing data of electron microscopes, scanning electron microscopes, transmission electron microscopes, semiconductor process equipment, semiconductor inspection and metrology equipment; Providing virtual computer systems through cloud computing; Software as a service (SAAS) services featuring software for analyzing data of electron microscopes, scanning electron microscopes, transmission electron microscopes, semiconductor process equipment, semiconductor inspection and metrology equipment; Server hosting; Platform as a service (PAAS) featuring computer software platforms for analyzing data of electron microscopes, scanning electron microscopes, transmission electron microscopes, semiconductor process equipment, semiconductor inspection and metrology equipment; Analysis of technical data obtained from electron microscopes, scanning electron microscopes, transmission electron microscopes, semiconductor process equipment, semiconductor inspection and metrology equipment; Off-site data backup; Monitoring of computer system operation by remote access; Maintenance of computer software; Design, development and implementation of software; updating of computer software; Consultancy in the design and development of computer hardware; Material testing; Quality control for others; Mechanical research; Testing the functionality of machines; Calibration [measuring]; Research in the field of artificial intelligence technology; Technology consultation in the field of artificial intelligence

Case File Event Statements

• 2/27/2024 - 3 months ago

  1 - NEW APPLICATION ENTERED Type: NWAP