HITACHI HIGH-TECH CORPO RATION

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MINATO-KU, JP

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Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam apparatus
- Patent number 12,169,182
- Issue date Dec 17, 2024
- HITACHI HIGH-TECH CORPORATION
- Wei Chean Tan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle microscope device and method for adjusting field-o...
- Patent number 12,170,183
- Issue date Dec 17, 2024
- HITACHI HIGH-TECH CORPORATION
- Mitsutoshi Kobayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission electron microscope and inspection method using transm...
- Patent number 12,170,184
- Issue date Dec 17, 2024
- HITACHI HIGH-TECH CORPORATION
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cartridge for clinical analyzer
- Patent number D1054058
- Issue date Dec 10, 2024
- HITACHI HIGH-TECH CORPORATION
- Daichi Furukawa
- D24 - Medical and laboratory equipment
Information Patent Grant
Automatic analysis apparatus
- Patent number 12,163,971
- Issue date Dec 10, 2024
- HITACHI HIGH-TECH CORPORATION
- Taichiro Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Automated analysis device, and abnormality detecting method
- Patent number 12,163,972
- Issue date Dec 10, 2024
- HITACHI HIGH-TECH CORPORATION
- Hirobumi Shiohata
- G01 - MEASURING TESTING
Information Patent Grant
Electron gun and electron beam application apparatus
- Patent number 12,165,828
- Issue date Dec 10, 2024
- HITACHI HIGH-TECH CORPORATION
- Takashi Ohshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Flow passage switching valve and liquid chromatograph having the same
- Patent number 12,158,452
- Issue date Dec 3, 2024
- HITACHI HIGH-TECH CORPORATION
- Ayano Otsubo
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Defect inspecting system and defect inspecting method
- Patent number 12,154,264
- Issue date Nov 26, 2024
- HITACHI HIGH-TECH CORPORATION
- Minoru Harada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Liquid feeding apparatus and liquid feeding method
- Patent number 12,153,026
- Issue date Nov 26, 2024
- HITACHI HIGH-TECH CORPORATION
- Daisuke Akieda
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analyzer
- Patent number 12,151,954
- Issue date Nov 26, 2024
- HITACHI HIGH-TECH CORPORATION
- Akihiro Shimase
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Plasma processing apparatus and plasma processing method
- Patent number 12,154,765
- Issue date Nov 26, 2024
- HITACHI HIGH-TECH CORPORATION
- Nanako Tamari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle quantitative measurement device
- Patent number 12,146,822
- Issue date Nov 19, 2024
- HITACHI HIGH-TECH CORPORATION
- Noriko Ebine
- G01 - MEASURING TESTING
Information Patent Grant
Cell analysis apparatus and cell analysis method
- Patent number 12,146,846
- Issue date Nov 19, 2024
- HITACHI HIGH-TECH CORPORATION
- Akiko Hisada
- G01 - MEASURING TESTING
Information Patent Grant
Ion beam device
- Patent number 12,148,593
- Issue date Nov 19, 2024
- HITACHI HIGH-TECH CORPORATION
- Shinichi Matsubara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma processing apparatus and method for releasing sample
- Patent number 12,148,633
- Issue date Nov 19, 2024
- HITACHI HIGH-TECH CORPORATION
- Masaki Ishiguro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Testing apparatus and testing method
- Patent number 12,146,131
- Issue date Nov 19, 2024
- HITACHI HIGH-TECH CORPORATION
- Kiyotaka Sugiyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Distributed control system and semiconductor inspection apparatus i...
- Patent number 12,147,374
- Issue date Nov 19, 2024
- HITACHI HIGH-TECH CORPORATION
- Kazushi Yamashina
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection device
- Patent number 12,146,840
- Issue date Nov 19, 2024
- HITACHI HIGH-TECH CORPORATION
- Eiji Arima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated analyzer and automated analysis method
- Patent number 12,146,890
- Issue date Nov 19, 2024
- HITACHI HIGH-TECH CORPORATION
- Yuto Kazama
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam device
- Patent number 12,142,457
- Issue date Nov 12, 2024
- HITACHI HIGH-TECH CORPORATION
- Takahiro Nishihata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Error factor estimation device and error factor estimation method
- Patent number 12,141,173
- Issue date Nov 12, 2024
- HITACHI HIGH-TECH CORPORATION
- Yasuhiro Yoshida
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Solenoid valve abnormality detection device, automatic medical anal...
- Patent number 12,142,423
- Issue date Nov 12, 2024
- HITACHI HIGH-TECH CORPORATION
- Guangbin Zhou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dispensing device, tip mounting method, and tip removing method
- Patent number 12,140,603
- Issue date Nov 12, 2024
- HITACHI HIGH-TECH CORPORATION
- Masashi Shibahara
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device manufacturing method and plasma processing method
- Patent number 12,142,489
- Issue date Nov 12, 2024
- HITACHI HIGH-TECH CORPORATION
- Mamoru Yakushiji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Power supply module and charged particle beam device
- Patent number 12,132,411
- Issue date Oct 29, 2024
- HITACHI HIGH-TECH CORPORATION
- Ryo Kadoi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma processing apparatus and plasma processing method
- Patent number 12,131,964
- Issue date Oct 29, 2024
- HITACHI HIGH-TECH CORPORATION
- Kousuke Fukuchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 12,131,882
- Issue date Oct 29, 2024
- HITACHI HIGH-TECH CORPORATION
- Shuntaro Ito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample discrimination system and sample automatic processing appara...
- Patent number 12,123,885
- Issue date Oct 22, 2024
- HITACHI HIGH-TECH CORPORATION
- Tooru Miyasaka
- G01 - MEASURING TESTING
Information Patent Grant
Electrolyte analyzing device
- Patent number 12,123,847
- Issue date Oct 22, 2024
- HITACHI HIGH-TECH CORPORATION
- Masaki Hara
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20240420915
- Publication date Dec 19, 2024
- HITACHI HIGH-TECH CORPORATION
- Mihiro TAKASAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPECIMEN INSPECTION AUTOMATION SYSTEM AND FIXED POSITION INFORMATIO...
- Publication number 20240420832
- Publication date Dec 19, 2024
- HITACHI HIGH-TECH CORPORATION
- Daigo SHISHIDO
Information Patent Application
CONVEYANCE DEVICE
- Publication number 20240420877
- Publication date Dec 19, 2024
- Hitachi High-Tech Corporation
- Satoru KANEKO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Particle Measuring Apparatus
- Publication number 20240410811
- Publication date Dec 12, 2024
- Hitachi High-Tech Corporation
- Hiroyuki MINEMURA
- G01 - MEASURING TESTING
Information Patent Application
BIOLOGICAL SAMPLE MEASURING DEVICE
- Publication number 20240410821
- Publication date Dec 12, 2024
- HITACHI HIGH-TECH CORPORATION
- Mayu SAO
- G01 - MEASURING TESTING
Information Patent Application
PRESSURE SENSOR MODULE AND DISPENSING DEVICE INCLUDING PRESSURE SEN...
- Publication number 20240408560
- Publication date Dec 12, 2024
- HITACHI HIGH-TECH CORPORATION
- Masatoshi KANAMARU
- G01 - MEASURING TESTING
Information Patent Application
OBSERVATION SYSTEM AND ARTIFACT CORRECTION METHOD FOR SAME
- Publication number 20240412333
- Publication date Dec 12, 2024
- Hitachi High-Tech Corporation
- Mitsutoshi KOBAYASHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Lamella Mounting Method, and Analysis System
- Publication number 20240412941
- Publication date Dec 12, 2024
- Hitachi High-Tech Corporation
- Wei Chean TAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING DIFFRACTION GRATING AND METHOD FOR MANUFAC...
- Publication number 20240411068
- Publication date Dec 12, 2024
- HITACHI HIGH- TECH CORPORTION
- Kenta Yaegashi
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
SEMICONDUCTOR PROCESSING APPARATUS
- Publication number 20240404780
- Publication date Dec 5, 2024
- HITACHI HIGH-TECH CORPORATION
- Masahiro KAMIGAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRANSPORT DEVICE
- Publication number 20240405699
- Publication date Dec 5, 2024
- Hitachi High-Tech Corporation
- Takahiro SUZUKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTILEAF COLLIMATOR AND RADIATION THERAPY DEVICE
- Publication number 20240399171
- Publication date Dec 5, 2024
- HITACHI HIGH-TECH CORPORATION
- Koki YOSHIDA
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Image Processing Program, Image Processing Device, and Image Proces...
- Publication number 20240404043
- Publication date Dec 5, 2024
- HITACHI HIGH-TECH CORPORATION
- Masanori OUCHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Automatic Analyzer and Abnormality Determination Method for the Same
- Publication number 20240402200
- Publication date Dec 5, 2024
- Hitachi High-Tech Corporation
- Hiroki HAMADA
- G01 - MEASURING TESTING
Information Patent Application
Error Factor Estimation Device, Error Factor Estimation Method, and...
- Publication number 20240403183
- Publication date Dec 5, 2024
- Hitachi High-Tech Corporation
- Yasuhiro YOSHIDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE CONTROL METHOD AND AUTOMATIC ANALYSIS DEVICE
- Publication number 20240402205
- Publication date Dec 5, 2024
- HITACHI HIGH-TECH CORPORATION
- Mayuko ITO
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE DETECTOR AND SEMICONDUCTOR PROCESSING APPARATUS
- Publication number 20240402018
- Publication date Dec 5, 2024
- Hitachi High-Tech Corporation
- Yosuke KUROSAKI
- G01 - MEASURING TESTING
Information Patent Application
RADIONUCLIDE PRODUCTION SYSTEM AND RADIONUCLIDE PRODUCTION METHOD
- Publication number 20240404721
- Publication date Dec 5, 2024
- HITACHI HIGH-TECH CORPORATION
- Yuichiro UENO
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Particle Measurement Device, Particle Measurement Method, Sample Co...
- Publication number 20240402064
- Publication date Dec 5, 2024
- Hitachi High-Tech Corporation
- Hiroyuki MINEMURA
- G01 - MEASURING TESTING
Information Patent Application
DATA ANALYSIS METHOD AND SERVER DEVICE
- Publication number 20240402199
- Publication date Dec 5, 2024
- Hitachi High-Tech Corporation
- Takuya IMI
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYZING SYSTEM AND CONVEYING METHOD
- Publication number 20240402204
- Publication date Dec 5, 2024
- HITACHI HIGH-TECH CORPORATION
- Nobuya FUKUDA
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20240404782
- Publication date Dec 5, 2024
- HITACHI HIGH-TECH CORPORATION
- Hirohisa ENOMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POSITIONING DEVICE, RADIOTHERAPY DEVICE, AND POSITIONING METHOD
- Publication number 20240390701
- Publication date Nov 28, 2024
- HITACHI HIGH-TECH CORPORATION
- Takaaki FUJII
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Analysis System
- Publication number 20240393270
- Publication date Nov 28, 2024
- Hitachi High-Tech Corporation
- Azusa KONNO
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROCESSING DEVICE AND AUTOMATIC ANALYSIS SYSTEM
- Publication number 20240394137
- Publication date Nov 28, 2024
- HITACHI HIGH-TECH CORPORATION
- Takashi YOKOHARI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DIAGNOSTIC DEVICE, DIAGNOSTIC METHOD, SEMICONDUCTOR MANUFACTURING E...
- Publication number 20240395518
- Publication date Nov 28, 2024
- Hitachi High-Tech Corporation
- Shota UMEDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYTICAL SYSTEM AND METHOD
- Publication number 20240385155
- Publication date Nov 21, 2024
- Roche Diagnostics Operations, Inc.
- Robert Lang
- G01 - MEASURING TESTING
Information Patent Application
NANOPORE FORMATION METHOD
- Publication number 20240385169
- Publication date Nov 21, 2024
- HITACHI HIGH-TECH CORPORATION
- Hai Huy NGUYENPHAM
- G01 - MEASURING TESTING
Information Patent Application
IMAGE CAPTURING APPARATUS AND IMAGE CAPTURING METHOD
- Publication number 20240385539
- Publication date Nov 21, 2024
- HITACHI HIGH-TECH CORPORATION
- Akira NISHIOKA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
AUTOMATIC ANALYSIS DEVICE
- Publication number 20240377424
- Publication date Nov 14, 2024
- HITACHI HIGH-TECH CORPORATION
- Yosuke HORIE
- G06 - COMPUTING CALCULATING COUNTING

Trademarklast 30 trademarks

Information Trademark
98610109 - IACE
- Serial number 98610109
- Filing date Jun 20, 2024
- Hitachi High-Tech Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
98422632 - NSTREAM
- Serial number 98422632
- Filing date Feb 27, 2024
- Hitachi High-Tech Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
98422625 - NANOSLYNX
- Serial number 98422625
- Filing date Feb 27, 2024
- Hitachi High-Tech Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
98148348 - HUMAN CHROMOSOME EXPLORER
- Serial number 98148348
- Registration number 7568752
- Filing date Aug 24, 2023
- Hitachi High Tech Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
98083305 - SWINGARC
- Serial number 98083305
- Registration number 7526569
- Filing date Jul 13, 2023
- Hitachi, Ltd.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
97882734 - COVISIONVX
- Serial number 97882734
- Registration number 7555045
- Filing date Apr 11, 2023
- Hitachi High Tech Corporation
- 7 - Machines and machine tools
Information Trademark
97304989 - MARTIPORT
- Serial number 97304989
- Registration number 7046898
- Filing date Mar 10, 2022
- Hitachi High-Tech Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
90809087 - COPY ME DIRECT
- Serial number 90809087
- Registration number 6855910
- Filing date Jul 2, 2021
- HITACHI HIGH-TECH CORPORATION
- 7 - Machines and machine tools
Information Trademark
90461304 - EXTOPE
- Serial number 90461304
- Registration number 6720183
- Filing date Jan 12, 2021
- HITACHI HIGH-TECH CORPORATION
- 42 - Scientific and technological services and research and design relating thereto
Information Trademark
88782576 - RAXIO
- Serial number 88782576
- Registration number 6513839
- Filing date Feb 3, 2020
- HITACHI HIGH-TECH CORPORATION
- 7 - Machines and machine tools
Information Trademark
88729852 - S.I.NAVI
- Serial number 88729852
- Registration number 6513816
- Filing date Dec 17, 2019
- HITACHI HIGH-TECH CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
88106576 - D-PREX
- Serial number 88106576
- Registration number 6337581
- Filing date Sep 6, 2018
- HITACHI HIGH-TECH CORPORATION
- 42 - Scientific and technological services and research and design relating thereto
Information Trademark
79216054 - ETHOS
- Serial number 79216054
- Registration number 5377505
- Filing date Jun 1, 2017
- Hitachi High-Tech Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79221967 - EXTOPE
- Serial number 79221967
- Registration number 5771966
- Filing date Mar 27, 2017
- Hitachi High-Tech Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79212361 - EXBRAIN
- Serial number 79212361
- Registration number 5472107
- Filing date Feb 28, 2017
- Hitachi High-Tech Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79198316 - MIRELIS
- Serial number 79198316
- Registration number 5193611
- Filing date Sep 21, 2016
- Hitachi High-Technologies Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79189114 - FLEXSEM
- Serial number 79189114
- Registration number 5080143
- Filing date Mar 15, 2016
- Hitachi High-Technologies Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79195807 - ARBLADE
- Serial number 79195807
- Registration number 5158597
- Filing date Mar 15, 2016
- Hitachi High-Technologies Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79170037 - AEROSURF
- Serial number 79170037
- Registration number 4966888
- Filing date May 28, 2015
- Hitachi High-Technologies Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79150904 - ES-CORRECTOR
- Serial number 79150904
- Registration number 4797226
- Filing date May 22, 2014
- Hitachi High-Technologies Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79110412 - OPTICROSS
- Serial number 79110412
- Filing date Feb 1, 2012
- Hitachi High-Tech Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79110413 - EMULOUS
- Serial number 79110413
- Registration number 4200620
- Filing date Feb 1, 2012
- Hitachi High-Technologies Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79109261 - CHROMASTERULTRA
- Serial number 79109261
- Registration number 4212168
- Filing date Jan 19, 2012
- Hitachi High-Technologies Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79109327 - SEBIT
- Serial number 79109327
- Filing date Jan 11, 2012
- Hitachi High-Tech Corporation
- 7 - Machines and machine tools
Information Trademark
79103637 - PRIMAIDE
- Serial number 79103637
- Registration number 4130370
- Filing date Sep 12, 2011
- Hitachi High-Technologies Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79089341 - J-LYNX
- Serial number 79089341
- Filing date Oct 19, 2010
- Hitachi High-Tech Corporation
- 7 - Machines and machine tools
Information Trademark
79086819 - CHROMASTER
- Serial number 79086819
- Registration number 3953640
- Filing date Jul 29, 2010
- Hitachi High-Technologies Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77495038 - FLATMILLING
- Serial number 77495038
- Registration number 4002771
- Filing date Jun 10, 2008
- Kabushiki Kaisha Hitachi High-Technologies
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

HITACHI HIGH-TECH CORPO RATION

Organization

Patents Grantslast 30 patents

Charged particle beam apparatus

Charged particle microscope device and method for adjusting field-o...

Transmission electron microscope and inspection method using transm...

Cartridge for clinical analyzer

Automatic analysis apparatus

Automated analysis device, and abnormality detecting method

Electron gun and electron beam application apparatus

Flow passage switching valve and liquid chromatograph having the same

Defect inspecting system and defect inspecting method

Liquid feeding apparatus and liquid feeding method

Automatic analyzer

Plasma processing apparatus and plasma processing method

Particle quantitative measurement device

Cell analysis apparatus and cell analysis method

Ion beam device

Plasma processing apparatus and method for releasing sample

Testing apparatus and testing method

Distributed control system and semiconductor inspection apparatus i...

Defect inspection device

Automated analyzer and automated analysis method

Charged particle beam device

Error factor estimation device and error factor estimation method

Solenoid valve abnormality detection device, automatic medical anal...

Dispensing device, tip mounting method, and tip removing method

Semiconductor device manufacturing method and plasma processing method

Power supply module and charged particle beam device

Plasma processing apparatus and plasma processing method

Charged particle beam device

Sample discrimination system and sample automatic processing appara...

Electrolyte analyzing device

Patents Applicationslast 30 patents

CHARGED PARTICLE BEAM DEVICE

SPECIMEN INSPECTION AUTOMATION SYSTEM AND FIXED POSITION INFORMATIO...

CONVEYANCE DEVICE

Particle Measuring Apparatus

BIOLOGICAL SAMPLE MEASURING DEVICE

PRESSURE SENSOR MODULE AND DISPENSING DEVICE INCLUDING PRESSURE SEN...

OBSERVATION SYSTEM AND ARTIFACT CORRECTION METHOD FOR SAME

Lamella Mounting Method, and Analysis System

METHOD FOR MANUFACTURING DIFFRACTION GRATING AND METHOD FOR MANUFAC...

SEMICONDUCTOR PROCESSING APPARATUS

TRANSPORT DEVICE

MULTILEAF COLLIMATOR AND RADIATION THERAPY DEVICE

Image Processing Program, Image Processing Device, and Image Proces...

Automatic Analyzer and Abnormality Determination Method for the Same

Error Factor Estimation Device, Error Factor Estimation Method, and...

AUTOMATIC ANALYSIS DEVICE CONTROL METHOD AND AUTOMATIC ANALYSIS DEVICE

TEMPERATURE DETECTOR AND SEMICONDUCTOR PROCESSING APPARATUS

RADIONUCLIDE PRODUCTION SYSTEM AND RADIONUCLIDE PRODUCTION METHOD

Particle Measurement Device, Particle Measurement Method, Sample Co...

DATA ANALYSIS METHOD AND SERVER DEVICE

AUTOMATIC ANALYZING SYSTEM AND CONVEYING METHOD

CHARGED PARTICLE BEAM DEVICE

POSITIONING DEVICE, RADIOTHERAPY DEVICE, AND POSITIONING METHOD

Analysis System

INFORMATION PROCESSING DEVICE AND AUTOMATIC ANALYSIS SYSTEM

DIAGNOSTIC DEVICE, DIAGNOSTIC METHOD, SEMICONDUCTOR MANUFACTURING E...

ANALYTICAL SYSTEM AND METHOD

NANOPORE FORMATION METHOD

IMAGE CAPTURING APPARATUS AND IMAGE CAPTURING METHOD

AUTOMATIC ANALYSIS DEVICE

Trademarklast 30 trademarks

98610109 - IACE

98422632 - NSTREAM

98422625 - NANOSLYNX

98148348 - HUMAN CHROMOSOME EXPLORER

98083305 - SWINGARC

97882734 - COVISIONVX

97304989 - MARTIPORT

90809087 - COPY ME DIRECT

90461304 - EXTOPE

88782576 - RAXIO

88729852 - S.I.NAVI

88106576 - D-PREX

79216054 - ETHOS

79221967 - EXTOPE

79212361 - EXBRAIN