HITACHI HIGH-TECH CORPO RATION

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MINATO-KU, JP

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Patents Grantslast 30 patents

Information Patent Grant
Dimension measurement apparatus, semiconductor manufacturing appara...
- Patent number 12,320,630
- Issue date Jun 3, 2025
- HITACHI HIGH-TECH CORPORATION
- Pushe Zhao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sample rack, adapter for sample rack, and automatic analysis device
- Patent number 12,313,642
- Issue date May 27, 2025
- HITACHI HIGH-TECH CORPORATION
- Masaru Miyazaki
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Sample holder, intermembrane distance adjustment mechanism, and cha...
- Patent number 12,315,695
- Issue date May 27, 2025
- HITACHI HIGH-TECH CORPORATION
- Michio Hatano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defect inspection device and defect inspection method
- Patent number 12,313,566
- Issue date May 27, 2025
- HITACHI HIGH-TECH CORPORATION
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Grant
Circular accelerator and particle therapy system
- Patent number 12,317,404
- Issue date May 27, 2025
- HITACHI HIGH-TECH CORPORATION
- Futaro Ebina
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Specimen processing system
- Patent number 12,306,199
- Issue date May 20, 2025
- HITACHI HIGH-TECH CORPORATION
- Taro Umeki
- G01 - MEASURING TESTING
Information Patent Grant
Conveyance device
- Patent number 12,304,752
- Issue date May 20, 2025
- HITACHI HIGH-TECH CORPORATION
- Ryosuke Hoshi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Conveyance device
- Patent number 12,306,202
- Issue date May 20, 2025
- HITACHI HIGH-TECH CORPORATION
- Ryosuke Hoshi
- G01 - MEASURING TESTING
Information Patent Grant
Sample transporting device, system and method
- Patent number 12,306,195
- Issue date May 20, 2025
- HITACHI HIGH-TECH CORPORATION
- Yuichiro Shiga
- G01 - MEASURING TESTING
Information Patent Grant
Analytical system and method including switching between liquid chr...
- Patent number 12,306,147
- Issue date May 20, 2025
- Roche Diagnostics Operations, Inc.
- Stefan Quint
- G01 - MEASURING TESTING
Information Patent Grant
Biological sample analysis device
- Patent number 12,299,947
- Issue date May 13, 2025
- HITACHI HIGH-TECH CORPORATION
- Mayu Sao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sample transport device and sample transport carrier
- Patent number 12,297,057
- Issue date May 13, 2025
- HITACHI HIGH-TECH CORPORATION
- Takeshi Matsuka
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Automatic analysis apparatus and cleaning method for same
- Patent number 12,298,324
- Issue date May 13, 2025
- HITACHI HIGH-TECH CORPORATION
- Misato Koike
- G01 - MEASURING TESTING
Information Patent Grant
Liquid chromatograph analyzer and method of controlling the same
- Patent number 12,298,283
- Issue date May 13, 2025
- HITACHI HIGH-TECH CORPORATION
- Daisuke Akieda
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometry apparatus
- Patent number 12,292,330
- Issue date May 6, 2025
- HITACHI HIGH-TECH CORPORATION
- Kaifeng Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis apparatus
- Patent number 12,292,453
- Issue date May 6, 2025
- HITACHI HIGH-TECH CORPORATION
- Takeshi Ishida
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus
- Patent number 12,292,389
- Issue date May 6, 2025
- HITACHI HIGH-TECH CORPORATION
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analyzer
- Patent number 12,292,438
- Issue date May 6, 2025
- HITACHI HIGH-TECH CORPORATION
- Koki Yokoyama
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam device
- Patent number 12,283,458
- Issue date Apr 22, 2025
- HITACHI HIGH-TECH CORPORATION
- Mai Yoshihara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 12,283,452
- Issue date Apr 22, 2025
- HITACHI HIGH-TECH CORPORATION
- Hiroshi Morita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Biological sample analysis device and biological sample analysis me...
- Patent number 12,282,000
- Issue date Apr 22, 2025
- HITACHI HIGH-TECH CORPORATION
- Ayaka Okuno
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis device
- Patent number 12,282,034
- Issue date Apr 22, 2025
- HITACHI HIGH-TECH CORPORATION
- Takeshi Setomaru
- G01 - MEASURING TESTING
Information Patent Grant
Image classification device and method
- Patent number 12,283,091
- Issue date Apr 22, 2025
- HITACHI HIGH-TECH CORPORATION
- Sota Komatsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electrophoresis device and foreign matter detection method
- Patent number 12,276,635
- Issue date Apr 15, 2025
- HITACHI HIGH-TECH CORPORATION
- Masashi Tomiyoshi
- G01 - MEASURING TESTING
Information Patent Grant
Analysis system and analysis method
- Patent number 12,276,608
- Issue date Apr 15, 2025
- HITACHI HIGH-TECH CORPORATION
- Takashi Anazawa
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Defect inspection device
- Patent number 12,276,618
- Issue date Apr 15, 2025
- HITACHI HIGH-TECH CORPORATION
- Kazuhide Sato
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis device
- Patent number 12,270,822
- Issue date Apr 8, 2025
- HITACHI HIGH-TECH CORPORATION
- Daisuke Ebihara
- G01 - MEASURING TESTING
Information Patent Grant
Thin film damage detection function and charged particle beam device
- Patent number 12,265,041
- Issue date Apr 1, 2025
- HITACHI HIGH-TECH CORPORATION
- Michio Hatano
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle gun and charged particle beam device
- Patent number 12,266,500
- Issue date Apr 1, 2025
- HITACHI HIGH-TECH CORPORATION
- Tomoyo Sasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma processing apparatus and method for venting a processing cha...
- Patent number 12,266,508
- Issue date Apr 1, 2025
- HITACHI HIGH-TECH CORPORATION
- Kazuyuki Ikenaga
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Electrophoresis Device
- Publication number 20250180511
- Publication date Jun 5, 2025
- Hitachi High-Tech Corporation
- G01 - MEASURING TESTING
Information Patent Application
COMPUTER SYSTEM, DIMENSION MEASURING METHOD, AND SEMICONDUCTOR DEVI...
- Publication number 20250182261
- Publication date Jun 5, 2025
- Hitachi High-Tech Corporation
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Distributed System and Method for Creating Communication Path in Di...
- Publication number 20250175418
- Publication date May 29, 2025
- Hitachi High-Tech Corporation
- Yusuke OMURA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
DISPENSING DEVICE AND AUTOMATIC ANALYSIS DEVICE
- Publication number 20250172580
- Publication date May 29, 2025
- Hitachi High-Tech Corporation
- Tomokazu SHINODA
- G01 - MEASURING TESTING
Information Patent Application
Vacuum Processing Device and Foreign Matter Ejection Method
- Publication number 20250170623
- Publication date May 29, 2025
- Hitachi High-Tech Corporation
- Taiki KOBAYASHI
- B08 - CLEANING
Information Patent Application
ELECTROLYTE ANALYSIS DEVICE
- Publication number 20250164434
- Publication date May 22, 2025
- HITACHI HIGH-TECH CORPORATION
- Atsushi KISHIOKA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE AND PLASMA PROCESSING...
- Publication number 20250169089
- Publication date May 22, 2025
- Hitachi High-Tech Corporation
- Makoto MIURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Liquid Vessel Holding Mechanism and Automatic Analyzer With Liquid...
- Publication number 20250164516
- Publication date May 22, 2025
- Hitachi High-Tech Corporation
- Naohiro TAKEDA
- G01 - MEASURING TESTING
Information Patent Application
Distributed System and Distributed Device Which Constitutes Distrib...
- Publication number 20250168092
- Publication date May 22, 2025
- Hitachi High-Tech Corporation
- Kazushi YAMASHINA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
CHARGED PARTICLE BEAM DEVICE ADJUSTMENT METHOD AND CHARGED PARTICLE...
- Publication number 20250157785
- Publication date May 15, 2025
- HITACHI HIGH-TECH CORPORATION
- Hidenori MACHIYA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Parts Anomaly Detection System, Automatic Analyzer and Parts Anomal...
- Publication number 20250155460
- Publication date May 15, 2025
- Hitachi High-Tech Corporation
- Shunsuke SASAKI
- G01 - MEASURING TESTING
Information Patent Application
PLASMA PROCESSING METHOD
- Publication number 20250149294
- Publication date May 8, 2025
- Hitachi High-Tech Corporation
- Juhyun NAM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DATA ANALYSIS METHOD, DATA ANALYSIS SYSTEM, AND COMPUTER
- Publication number 20250147055
- Publication date May 8, 2025
- HITACHI HIGH-TECH CORPORATION
- Kohei INOUE
- G01 - MEASURING TESTING
Information Patent Application
CONVEYING DEVICE AND CONVEYING METHOD
- Publication number 20250145393
- Publication date May 8, 2025
- HITACHI HIGH-TECH CORPORATION
- Shinji Azuma
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
CONTROL METHOD FOR LIQUID CHROMATOGRAPH MASS SPECTROMETRY DEVICE
- Publication number 20250146985
- Publication date May 8, 2025
- HITACHI HIGH-TECH CORPORATION
- Yuka Sugawara
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Ion Milling Device
- Publication number 20250149287
- Publication date May 8, 2025
- Hitachi High-Tech Corporation
- Shota AIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Milling Device, and Inspection System
- Publication number 20250149288
- Publication date May 8, 2025
- Hitachi High-Tech Corporation
- Naohiro FUJITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Test Sample Reading Device and Test Sample Reading Method
- Publication number 20250148239
- Publication date May 8, 2025
- Hitachi High-Tech Corporation
- Kento SEKIYA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ION MILLING DEVICE
- Publication number 20250149289
- Publication date May 8, 2025
- HITACHI HIGH-TECH CORPORATION
- Shota AIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTROLYTE CONCENTRATION MEASURING DEVICE AND METHOD FOR OBTAINING...
- Publication number 20250146972
- Publication date May 8, 2025
- HITACHI HIGH-TECH CORPORATION
- Kotaro YAMASHITA
- G01 - MEASURING TESTING
Information Patent Application
PLASMA PROCESSING APPARATUS
- Publication number 20250149313
- Publication date May 8, 2025
- HITACHI HIGH-TECH CORPORATION
- Shunsuke TASHIRO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PLASMA PROCESSING APPARATUS AND MANUFACTURING METHOD OF WAFER STAGE...
- Publication number 20250140532
- Publication date May 1, 2025
- Hitachi High-Tech Corporation
- Shintaro NAKATANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATIC ANALYSIS SYSTEM
- Publication number 20250138038
- Publication date May 1, 2025
- HITACHI HIGH-TECH CORPORATION
- Kohei KAWAME
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND SAMPLE USED THEREIN
- Publication number 20250138047
- Publication date May 1, 2025
- Hitachi High-Tech Corporation
- Kaifeng ZHANG
- G01 - MEASURING TESTING
Information Patent Application
PLASMA PROCESSING APPARATUS AND COMMUNICATION SYSTEM FOR CONTROL OF...
- Publication number 20250138516
- Publication date May 1, 2025
- Hitachi High-Tech Corporation
- Tatsuya MARUYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATIC ANALYZER AND CONTROL METHOD THEREOF
- Publication number 20250138042
- Publication date May 1, 2025
- Hitachi High-Tech Corporation
- Kyohei MATSUDA
- G01 - MEASURING TESTING
Information Patent Application
Recipe Creating System, Length Measurement System, and Recipe Creat...
- Publication number 20250140516
- Publication date May 1, 2025
- Hitachi High-Tech Corporation
- Hiromi FUJITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD
- Publication number 20250137993
- Publication date May 1, 2025
- HITACHI HIGH-TECH CORPORATION
- Michiko FUKUYAMA
- G01 - MEASURING TESTING
Information Patent Application
ELECTROPHORESIS DEVICE
- Publication number 20250137965
- Publication date May 1, 2025
- HITACHI HIGH-TECH CORPORATION
- Hitoshi Miyata
- G01 - MEASURING TESTING
Information Patent Application
ACCELERATOR, PARTICLE THERAPY SYSTEM, AND CONTROL METHOD
- Publication number 20250133647
- Publication date Apr 24, 2025
- HITACHI HIGH-TECH CORPORATION
- Takamitsu HAE
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Trademarklast 30 trademarks

Information Trademark
99064181 - DESIGNGAUGE
- Serial number 99064181
- Filing date Mar 3, 2025
- Hitachi High-Tech Corporation
- 42 - Scientific and technological services and research and design relating thereto
Information Trademark
98610109 - IACE
- Serial number 98610109
- Filing date Jun 20, 2024
- Hitachi High-Tech Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
98422632 - NSTREAM
- Serial number 98422632
- Registration number 7676363
- Filing date Feb 27, 2024
- Hitachi High-Tech Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
98422625 - NANOSLYNX
- Serial number 98422625
- Registration number 7676362
- Filing date Feb 27, 2024
- Hitachi High-Tech Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
98148348 - HUMAN CHROMOSOME EXPLORER
- Serial number 98148348
- Registration number 7568752
- Filing date Aug 24, 2023
- Hitachi High Tech Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
98083305 - SWINGARC
- Serial number 98083305
- Registration number 7526569
- Filing date Jul 13, 2023
- Hitachi, Ltd.
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
97882734 - COVISIONVX
- Serial number 97882734
- Registration number 7555045
- Filing date Apr 11, 2023
- Hitachi High Tech Corporation
- 7 - Machines and machine tools
Information Trademark
97304989 - MARTIPORT
- Serial number 97304989
- Registration number 7046898
- Filing date Mar 10, 2022
- Hitachi High-Tech Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
90809087 - COPY ME DIRECT
- Serial number 90809087
- Registration number 6855910
- Filing date Jul 2, 2021
- HITACHI HIGH-TECH CORPORATION
- 7 - Machines and machine tools
Information Trademark
90461304 - EXTOPE
- Serial number 90461304
- Registration number 6720183
- Filing date Jan 12, 2021
- HITACHI HIGH-TECH CORPORATION
- 42 - Scientific and technological services and research and design relating thereto
Information Trademark
88782576 - RAXIO
- Serial number 88782576
- Registration number 6513839
- Filing date Feb 3, 2020
- HITACHI HIGH-TECH CORPORATION
- 7 - Machines and machine tools
Information Trademark
88729852 - S.I.NAVI
- Serial number 88729852
- Registration number 6513816
- Filing date Dec 17, 2019
- HITACHI HIGH-TECH CORPORATION
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
88106576 - D-PREX
- Serial number 88106576
- Registration number 6337581
- Filing date Sep 6, 2018
- HITACHI HIGH-TECH CORPORATION
- 42 - Scientific and technological services and research and design relating thereto
Information Trademark
79216054 - ETHOS
- Serial number 79216054
- Registration number 5377505
- Filing date Jun 1, 2017
- Hitachi High-Tech Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79221967 - EXTOPE
- Serial number 79221967
- Registration number 5771966
- Filing date Mar 27, 2017
- Hitachi High-Tech Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79212361 - EXBRAIN
- Serial number 79212361
- Registration number 5472107
- Filing date Feb 28, 2017
- Hitachi High-Tech Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79198316 - MIRELIS
- Serial number 79198316
- Registration number 5193611
- Filing date Sep 21, 2016
- Hitachi High-Technologies Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79189114 - FLEXSEM
- Serial number 79189114
- Registration number 5080143
- Filing date Mar 15, 2016
- Hitachi High-Technologies Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79195807 - ARBLADE
- Serial number 79195807
- Registration number 5158597
- Filing date Mar 15, 2016
- Hitachi High-Technologies Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79170037 - AEROSURF
- Serial number 79170037
- Registration number 4966888
- Filing date May 28, 2015
- Hitachi High-Technologies Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79150904 - ES-CORRECTOR
- Serial number 79150904
- Registration number 4797226
- Filing date May 22, 2014
- Hitachi High-Technologies Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79110412 - OPTICROSS
- Serial number 79110412
- Filing date Feb 1, 2012
- Hitachi High-Tech Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79110413 - EMULOUS
- Serial number 79110413
- Registration number 4200620
- Filing date Feb 1, 2012
- Hitachi High-Technologies Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79109261 - CHROMASTERULTRA
- Serial number 79109261
- Registration number 4212168
- Filing date Jan 19, 2012
- Hitachi High-Technologies Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79109327 - SEBIT
- Serial number 79109327
- Filing date Jan 11, 2012
- Hitachi High-Tech Corporation
- 7 - Machines and machine tools
Information Trademark
79103637 - PRIMAIDE
- Serial number 79103637
- Registration number 4130370
- Filing date Sep 12, 2011
- Hitachi High-Technologies Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
79089341 - J-LYNX
- Serial number 79089341
- Filing date Oct 19, 2010
- Hitachi High-Tech Corporation
- 7 - Machines and machine tools
Information Trademark
79086819 - CHROMASTER
- Serial number 79086819
- Registration number 3953640
- Filing date Jul 29, 2010
- Hitachi High-Technologies Corporation
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments
Information Trademark
77495038 - FLATMILLING
- Serial number 77495038
- Registration number 4002771
- Filing date Jun 10, 2008
- Kabushiki Kaisha Hitachi High-Technologies
- 9 - Scientific, nautical, surveying, photographic, cinematographic, optical, weighing, measuring, signalling, checking (supervision), life-saving and teaching apparatus and instruments

HITACHI HIGH-TECH CORPO RATION

Organization

Patents Grantslast 30 patents

Dimension measurement apparatus, semiconductor manufacturing appara...

Sample rack, adapter for sample rack, and automatic analysis device

Sample holder, intermembrane distance adjustment mechanism, and cha...

Defect inspection device and defect inspection method

Circular accelerator and particle therapy system

Specimen processing system

Conveyance device

Conveyance device

Sample transporting device, system and method

Analytical system and method including switching between liquid chr...

Biological sample analysis device

Sample transport device and sample transport carrier

Automatic analysis apparatus and cleaning method for same

Liquid chromatograph analyzer and method of controlling the same

Spectrometry apparatus

Automatic analysis apparatus

Defect inspection apparatus

Automatic analyzer

Charged particle beam device

Charged particle beam apparatus

Biological sample analysis device and biological sample analysis me...

Automatic analysis device

Image classification device and method

Electrophoresis device and foreign matter detection method

Analysis system and analysis method

Defect inspection device

Automatic analysis device

Thin film damage detection function and charged particle beam device

Charged particle gun and charged particle beam device

Plasma processing apparatus and method for venting a processing cha...

Patents Applicationslast 30 patents

Electrophoresis Device

COMPUTER SYSTEM, DIMENSION MEASURING METHOD, AND SEMICONDUCTOR DEVI...

Distributed System and Method for Creating Communication Path in Di...

DISPENSING DEVICE AND AUTOMATIC ANALYSIS DEVICE

Vacuum Processing Device and Foreign Matter Ejection Method

ELECTROLYTE ANALYSIS DEVICE

METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE AND PLASMA PROCESSING...

Liquid Vessel Holding Mechanism and Automatic Analyzer With Liquid...

Distributed System and Distributed Device Which Constitutes Distrib...

CHARGED PARTICLE BEAM DEVICE ADJUSTMENT METHOD AND CHARGED PARTICLE...

Parts Anomaly Detection System, Automatic Analyzer and Parts Anomal...

PLASMA PROCESSING METHOD

DATA ANALYSIS METHOD, DATA ANALYSIS SYSTEM, AND COMPUTER

CONVEYING DEVICE AND CONVEYING METHOD

CONTROL METHOD FOR LIQUID CHROMATOGRAPH MASS SPECTROMETRY DEVICE

Ion Milling Device

Ion Milling Device, and Inspection System

Test Sample Reading Device and Test Sample Reading Method

ION MILLING DEVICE

ELECTROLYTE CONCENTRATION MEASURING DEVICE AND METHOD FOR OBTAINING...

PLASMA PROCESSING APPARATUS

PLASMA PROCESSING APPARATUS AND MANUFACTURING METHOD OF WAFER STAGE...

AUTOMATIC ANALYSIS SYSTEM

SCANNING PROBE MICROSCOPE AND SAMPLE USED THEREIN

PLASMA PROCESSING APPARATUS AND COMMUNICATION SYSTEM FOR CONTROL OF...

AUTOMATIC ANALYZER AND CONTROL METHOD THEREOF

Recipe Creating System, Length Measurement System, and Recipe Creat...

AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD

ELECTROPHORESIS DEVICE

ACCELERATOR, PARTICLE THERAPY SYSTEM, AND CONTROL METHOD

Trademarklast 30 trademarks

99064181 - DESIGNGAUGE

98610109 - IACE

98422632 - NSTREAM

98422625 - NANOSLYNX

98148348 - HUMAN CHROMOSOME EXPLORER

98083305 - SWINGARC

97882734 - COVISIONVX

97304989 - MARTIPORT

90809087 - COPY ME DIRECT

90461304 - EXTOPE

88782576 - RAXIO

88729852 - S.I.NAVI

88106576 - D-PREX

79216054 - ETHOS

79221967 - EXTOPE