The present invention generally relates to an active-illumination scanning imager, i.e. a scanning imager that illuminates the scene to be imaged, in particular such an scanning imager that comprises an oscillating scanning mirror to scan a light beam though the scene to be imaged.
EP 1 289 273 discloses a scanning camera equipped with a micromechanical mirror that oscillates about two mutually perpendicular axes to scan an object. The scene is imaged in time-division multiplexed manner onto a punctiform optoelectronic sensor. The scanning camera, however, does not illuminate the scene actively.
Imagers with active scene illumination are used, for instance, for recording range images based on the time-of-flight measurement principle. In the context of the present document, a “range image” is an image composed of pixels, each of which contains a distance value representing the distance from the imager to the point in the scene with which the pixel is associated.
Systems for creating such 3-D representations of a scene have a variety of applications in many different technology fields. Examples are automotive sensor technology (e.g. vehicle occupant detection and classification), robotic sensor technology (e.g. object identification) or safety engineering (e.g. plant monitoring, people counting and pedestrian detection) to name only a few. As opposed to conventional 2-D imaging, a 3-D imaging system requires depth information about the target scene. In other words, the distances between one or more observed objects and an optical receiver of the system need to be determined. A well-known approach for distance measurement, which is used e.g. in radar applications, consists in timing the interval between emission and echo-return of a measurement signal. This so called time-of-flight (TOF) approach is based on the principle that, for a signal with known propagation speed in a given medium, the distance to be measured is given by the product of the propagation speed and half the time the signal spends to travel back and forth. In case of optical imaging systems, the measurement signals are light waves. For the purposes of the present description, the term “light” is to be understood as including visible, infrared (IR) and ultraviolet (UV) light.
Another possible application of an active-illumination scanning imager is gas sensing. A map of gas distribution may be obtained by scanning a scene with a laser beam of a wavelength corresponding to an absorption line of the target gas and measuring the absorption of the laser light in each part of the scene.
With scanning imagers that scan a light beam through the scene under observation, the quality of the image depends to some extent on beam divergence. Each pixel of the image to be computed corresponds to a solid angle element along a particular direction of the scanning light beam. Most accurate images are normally obtained when the illuminating light beam approximately matches with the solid angle elements in terms of shape and divergence. If the illuminating light beam is too narrow, the properties of one sample of reflected and detected light will not necessarily be representative for the entire solid angle element (or the pixel). If the illuminating light beam is too broad, the image will suffer from poor contrast due to averaging between neighboring pixels.
Active-illumination laser imagers typically use a laser diode as the light source. The beam produced by laser diodes diverges rapidly when coupled out of the semiconductor chip. This means that a special optic with a small focal length (typically a few millimeters, e.g. 1 to 10 mm) has to be placed in front of the laser diode to achieve low beam divergence (typically less than 1°, e.g. about 0.2°, but higher divergence may be tolerated if lower image resolution is acceptable). Due to the small focal length, very careful alignment of the laser diode and the optical system is necessary to obtain a collimated beam that propagates along the desired direction.
The invention facilitates collimation of a light beam used for active illumination of a scene to be imaged.
An active-illumination scanning imager comprises a light source (e.g. a laser diode) for producing a light beam, an optical collimator (e.g. a collimating lens or mirror) for collimating the light beam in at least one direction transversal to the beam direction, a scanning mirror for scanning the light beam through a scene to be imaged, and a light detector arranged with respect to the scanning mirror in such a way as to receive a fraction of the light beam reflected from the scene via the scanning mirror. According to the invention, the active illumination scanning imager includes an actuator (e.g. an automated tip/tilt stage, an automated linear actuator, an automated XY or XYZ-stage, a piezoelectric actuator, etc.) configured to position the light source and/or the optical collimator relative to each other, and/or the light detector relative to the scanning mirror, and a controller operatively connected to the actuator for controlling the positioning.
Those skilled will appreciate that the invention is especially suited for active-illumination imagers, wherein a laser diode serves as the light source. As indicated above, the collimator in this case has to have a relatively small focal length, making careful alignment necessary. Beam divergence is indeed highly dependent on the precise position of the collimator relative to the laser diode. Due to system ageing, misalignment of the optical system could occur, leading to beam defocusing. Thanks to the actuator, which may be arranged to position the light source or the collimator or both, precise alignment or re-alignment of the system may be achieved easily.
It should be noted that the beam could be collimated in one transversal direction of the beam only. For instance, the light source and the collimator could be configured to emit a fan-shaped (pulsed or continuous-wave) light beam with linear cross section. In this case, the scanning mirror is preferably arranged in the light path of the light beam to guide the light beam into the scene and to successively illuminate slices of the scene by sweeping the light beam through the scene transversally to the linear cross section. In this embodiment of the invention, the light detector is preferably part of an imager chip with a linear photosensor array disposed in such a way that the illuminated slices of the scene are successively imaged thereon. The actuator is then preferably controlled by the controller and arranged so as to maintain the alignment and the overlap of the images of the illuminated slices of the scene and the linear photosensor array. In other words, the actuator modifies the position of the light detector, the collimator and/or the light source in such a way that the illuminated slices of the scene are imaged (e.g. via a cylindrical lens or a curved mirror) on the linear photosensor array.
The controller preferably comprises an interface for operatively connecting the imager to a sensor (e.g. a beam profiler) and is preferably configured to attempt to achieve a predefined sensor response through controlling the positioning. Such configuration of the controller is especially advantageous for aligning the light source and the collimator after the imager has been assembled. Slight misalignment of the light source and the collimator could thus be tolerated during the assembly. After the assembly, the imager may be mounted on a test bench equipped with a beam profiler (such as e.g. a CCD or CMOS camera without focusing optics). The beam profiler is preferably connected to the controller via the interface and the controller is most preferably configured to execute an alignment procedure during which the beam profile is optimized under standardized conditions.
During operation of the imager, the light detector (photodetector) may acquire samples of the light reflected from the scene in a time-division multiplexed manner. The position of the scanning mirror being known for each sample, each sample can be associated to the corresponding pixel (image element) and the image can be computed.
The light detector may be operatively connected to the controller, which is then advantageously configured to control the positioning of the light source and the collimator relative to each other in response to a detection signal from the detector. The controller could e.g. be configured to optimize one or more parameters (e.g. the signal-to-noise ratio) of the detection signal. The light detector could e.g. be or comprise a position sensing photodetector (commonly referred to as PSD), e.g. a segmented PSD (in particular a two- or a four-quadrant PSD), a lateral-effect PSD (in particular a duo- or tetra-lateral PSD). If a position sensing photodetector is used, the position signal of that detector may be used by the controller to achieve the positioning.
Preferably, the scanning mirror comprises a resonance-type micro-mechanical mirror.
The imager may e.g. be a time-of-flight scanning imager. In this case, the light beam emitted into the scene is modulated in intensity and the light detector is advantageously a lock-in photodetector, i.e. a photodetector clocked in synchronism with the modulation of the emitted light for modulation-phase sensitive detection of the reflected light. Examples of lock-in photodetectors can e.g. be found in R. Lange's doctoral thesis “3D Time-of-Flight Distance Measurement with Custom Solid-State Image Sensors in CMOS/CCD-Technology” (2000, University of Siegen) or in T. Spirig's doctoral thesis “Smart CCD/CMOS Based Image Sensors with Programmable, Real-Time, Temporal and Spatial Convolution Capabilities for Applications in Machine Vision and Optical Metrology” (1997, Swiss Federal Institute of Technology, Diss. ETH No. 11993). Alternatively, in case of a pulsed light source, the light detector could be a photodiode associated with a time-to-digital converter (TDC).
The actuator is preferably configured and arranged to change an optical path length between the light source and the optical collimator. The actuator may e.g. be configured to move the light source relative to the optical collimator along the optical axis of the collimator. Such movement may be used to adjust the divergence of the emitted light beam. Additionally or alternatively, the actuator may be configured and arranged to move the light source and or the optical collimator transversally to the optical path. As a further option, the actuator may be configured and arranged to tilt the light source and/or the optical collimator relative to one another. Finally, the actuator may be configured and arranged to displace and/or to tilt the light detector.
A preferred embodiment of the invention will now be described, by way of example, with reference to the accompanying drawings in which:
The scanning mirror 20 is a resonance-type micro-mechanical mirror, which is shown in more detail in
The collimator 18 is arranged relative to the laser diode in such a way as to obtain a collimated laser beam at the output of the collimator 18. As the laser beam generated by the laser diode 14 is highly diverging, the collimator 18 is chosen with a short focal length. Consequently, positioning of the collimator 18 and the laser diode 14 relative to each other is critical. The active-illumination scanning imager 10 comprises an actuator 40 (schematically represented in
The laser diode 14, the photodetector 22, the actuator 40 and the scanning mirror driver 26 are controlled by a microcontroller 46 (implemented e.g. as a microprocessor, a field-programmable gate array—FPGA—, an application-specific integrated circuit, or the like). The microcontroller 46 comprises an interface for connecting it to an external beam profiler 48 (e.g. a CCD or CMOS camera without focusing optics). Such beam profiler 48 is used on a test bench on which the active-illumination scanning imager 10 is temporarily mounted after its assembly. The microcontroller 46 is configured to carry out an alignment procedure when connected to the external beam profiler 48. During the alignment procedure, the microcontroller 46 adjusts the position of the laser diode 14 relative to the collimator 18 until the parameters of the beam profile (such as e.g. position of beam center, beam widths) are in agreement with target parameter values. During the alignment procedure, the scanning mirror 26 is kept in its rest position until the alignment of the collimator 18 and the laser diode 14 has been completed.
In the illustrated embodiment of the invention, the microcontroller 46 is furthermore configured to adjust beam divergence in real time when the active-illumination scanning imager 10 is operating. The microcontroller 46 controls the actuator depending on the detection signal received from the photodetector 22, e.g. in such a way as to optimize the signal-to-noise ratio. Those skilled will appreciate that such real-time correction of the laser diode 14 position also compensates for ageing effects on the alignment of the laser diode 14 and the collimator 18. It should be noted that in lieu of using a real-time alignment procedure, the microcontroller 46 could be configured to perform a re-alignment at each start-up of the active-illumination scanning imager 10, before the actual imaging procedure is carried out.
In the embodiments of
In the variant of
Each photodetector 22 and its associated circuits 66, 67 measure the duration between a reference point in time (the time of emission of a laser pulse) and the instant when the return pulse from the scene hits the photodetector 22.
The photodetectors 22 are preferably SPADs (Single Photon Avalanche Diodes). Advantageously, the photodetector array of
As in the previously discussed embodiments of the invention, the actuator 40 is configured and arranged to maintain the alignment of the laser beam 16 with the desired optical axis. The actuator is controlled by a controller (not shown in
It should be noted that, instead of a deflection mirror 54 with a punctiform or elongated opening, one could use a beam splitter to direct the reflected light fraction to the photodetector(s).
While specific embodiments have been described in detail, those skilled in the art will appreciate that various modifications and alternatives to those details could be developed in light of the overall teachings of the disclosure. Accordingly, the particular arrangements disclosed are meant to be illustrative only and not limiting as to the scope of the invention, which is to be given the full breadth of the appended claims and any and all equivalents thereof.
Number | Date | Country | Kind |
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91 714 | Jul 2010 | LU | national |
Filing Document | Filing Date | Country | Kind | 371c Date |
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PCT/EP2011/062314 | 7/19/2011 | WO | 00 | 4/1/2013 |