for measuring contours or curvatures

Industry

CPC
G01B11/24

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B11/00Measuring arrangements characterised by the use of optical means

Current Industry

G01B11/24for measuring contours or curvatures

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for the contactless measurement of objects
- Patent number 12,367,559
- Issue date Jul 22, 2025
- Carl Zeiss Industrielle Messtechnik GmbH
- Niklas Mevenkamp
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Machine learning method used for laser processing system, simulatio...
- Patent number 12,365,049
- Issue date Jul 22, 2025
- The University of Tokyo
- Yohei Kobayashi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Surface inspection device and shape measurement software
- Patent number 12,366,443
- Issue date Jul 22, 2025
- HITACHI HIGH-TECH CORPORATION
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for measuring interfaces of an optical element
- Patent number 12,359,910
- Issue date Jul 15, 2025
- FOGALE NANOTECH
- Sylvain Petitgrand
- G01 - MEASURING TESTING
Information Patent Grant
Systems, methods, and apparatus for providing interactive inspectio...
- Patent number 12,358,141
- Issue date Jul 15, 2025
- Gecko Robotics, Inc.
- Mark J. Loosararian
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Calibration method for computer vision system and three-dimensional...
- Patent number 12,359,912
- Issue date Jul 15, 2025
- Omron Corporation
- Yoshinori Konishi
- G05 - CONTROLLING REGULATING
Information Patent Grant
Three-dimensional measurement device
- Patent number 12,359,906
- Issue date Jul 15, 2025
- CKD Corporation
- Hiroyuki Ishigaki
- G01 - MEASURING TESTING
Information Patent Grant
Member distinguish apparatus, member distinguish method, and comput...
- Patent number 12,359,908
- Issue date Jul 15, 2025
- NEC Corporation
- Akira Tsuji
- G01 - MEASURING TESTING
Information Patent Grant
Uniform machined parts inspection process
- Patent number 12,359,909
- Issue date Jul 15, 2025
- Rolls-Royce Corporation
- Monica Sy Munoz
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Three-dimensional optical measuring mobile apparatus for ropes with...
- Patent number 12,352,555
- Issue date Jul 8, 2025
- BRIDON INTERNATIONAL LTD.
- Cristiano Bonetti
- G01 - MEASURING TESTING
Information Patent Grant
Optical measuring machine and measuring method
- Patent number 12,352,560
- Issue date Jul 8, 2025
- VICI & C. S.P.A.
- Stefano Andreini
- G01 - MEASURING TESTING
Information Patent Grant
Resilient flooring product and methods of making same
- Patent number 12,352,561
- Issue date Jul 8, 2025
- Columbia Insurance Company
- Tom Odum
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and coordinate measuring machine
- Patent number 12,352,562
- Issue date Jul 8, 2025
- Klingelnberg GmbH
- Markus Finkeldey
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Back-face dynamic profiling system
- Patent number 12,352,559
- Issue date Jul 8, 2025
- Alan Goertz
- G01 - MEASURING TESTING
Information Patent Grant
Perception systems and methods for identifying and processing a var...
- Patent number 12,350,713
- Issue date Jul 8, 2025
- Berkshire Grey Operating Company, Inc.
- Thomas Wagner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Shape reconstruction method and image measurement device
- Patent number 12,352,558
- Issue date Jul 8, 2025
- Machine Vision Lighting Inc.
- Shigeki Masumura
- G01 - MEASURING TESTING
Information Patent Grant
Broadband profiler system and method for constructing a three-dimen...
- Patent number 12,352,569
- Issue date Jul 8, 2025
- AP Infosense Limited
- Kam Chiu Lau
- G01 - MEASURING TESTING
Information Patent Grant
Unscanned optical inspection system using a micro camera array
- Patent number 12,348,879
- Issue date Jul 1, 2025
- Mark Harfouche
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Resilient flooring product and methods of making same
- Patent number 12,345,519
- Issue date Jul 1, 2025
- Columbia Insurance Company
- Tom Odum
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Laser and synthetic profilometry of a positive displacement motor (...
- Patent number 12,345,520
- Issue date Jul 1, 2025
- Turnco LLC
- Lonnie L. Smith
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for inspecting display panel and method for inspecting su...
- Patent number 12,333,709
- Issue date Jun 17, 2025
- Samsung Display Co., Ltd.
- Ja Eun Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement method for interferometrically determining a surface shape
- Patent number 12,332,043
- Issue date Jun 17, 2025
- Carl Zeiss SMT GmbH
- Hans Michael Stiepan
- G02 - OPTICS
Information Patent Grant
Method ad apparatus for digital thread inspection
- Patent number 12,326,330
- Issue date Jun 10, 2025
- TUBULAR SOLUTIONS, INC.
- Aubrey A. Stigall
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Vibration insensitive interferometry for measuring thickness and pr...
- Patent number 12,326,402
- Issue date Jun 10, 2025
- Korean Research Institute of Standard and Science
- Yong-sik Ghim
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system for manufactured components
- Patent number 12,326,406
- Issue date Jun 10, 2025
- General Inspection, LLC
- Mike Nygaard
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional measuring device, and three- dimensional measurin...
- Patent number 12,326,329
- Issue date Jun 10, 2025
- FANUC CORPORATION
- Yuusuke Oota
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Three-dimensional scanner, control method, and recording medium for...
- Patent number 12,324,660
- Issue date Jun 10, 2025
- J. MORITA MFG. CORP.
- Tsuyoshi Tanaka
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method and apparatus for determining the position of objects on a c...
- Patent number 12,320,628
- Issue date Jun 3, 2025
- FT SYSTEM S.R.L.
- Marco Cipriani
- G01 - MEASURING TESTING
Information Patent Grant
Dimension measurement apparatus, semiconductor manufacturing appara...
- Patent number 12,320,630
- Issue date Jun 3, 2025
- HITACHI HIGH-TECH CORPORATION
- Pushe Zhao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated 3-D modeling of shoe parts
- Patent number 12,313,395
- Issue date May 27, 2025
- Nike, Inc.
- Patrick C. Regan
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS

Patents Applicationslast 30 patents

Information Patent Application
CORRECTION DEVICE
- Publication number 20250237497
- Publication date Jul 24, 2025
- SENSWORK GMBH
- Andreas KÖNIG
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
METHOD FOR SEEDING CELLS ON A SENSOR SURFACE
- Publication number 20250237645
- Publication date Jul 24, 2025
- HOFFMANN-LA ROCHE INC.
- Stephen FOWLER
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Methods and Systems for Characterizing Laser Machining Properties b...
- Publication number 20250229357
- Publication date Jul 17, 2025
- IPG PHOTONICS CORPORATION
- Paul J.L. Webster
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
GLASS SUBSTRATE, GLASS LAMINATE, MEMBER FOR DISPLAY DEVICE, DISPLAY...
- Publication number 20250234468
- Publication date Jul 17, 2025
- DAI NIPPON PRINTING CO., LTD.
- Makoto NANAUMI
- B32 - LAYERED PRODUCTS
Information Patent Application
DEVICE FOR MEASURING SEMICONDUCTORS
- Publication number 20250224328
- Publication date Jul 10, 2025
- Samsung Electronics Co., Ltd.
- Sangwoo BAE
- G01 - MEASURING TESTING
Information Patent Application
STABILIZATION OF A MANUFACTURING PROCESS OF A SPECIMEN BY SHAPE ANA...
- Publication number 20250225642
- Publication date Jul 10, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Einat FRISHMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BIOLOGICAL SAMPLE MEASUREMENT DEVICE
- Publication number 20250224267
- Publication date Jul 10, 2025
- Hitachi High-Tech Corporation
- Mayu SAO
- G01 - MEASURING TESTING
Information Patent Application
A METHOD FOR TRACKING OF AT LEAST ONE OBJECT WITH AT LEAST ONE DETE...
- Publication number 20250216552
- Publication date Jul 3, 2025
- VALEO DETECTION SYSTEMS GMBH
- Sergio Fernandez
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION FOR IN-PLANE DISTORTION TOOL-TO-TOOL MATCHING
- Publication number 20250216188
- Publication date Jul 3, 2025
- KLA Corporation
- Wenjiang Guo
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM, APPARATUS AND METHOD FOR PROVIDING 3D SURFACE MEASUREMENTS...
- Publication number 20250209588
- Publication date Jun 26, 2025
- CREAFORM INC.
- Mustafa INANOGLU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ADJUSTMENT METHOD AND SUBSTRATE PROCESSING APPARATUS
- Publication number 20250207259
- Publication date Jun 26, 2025
- TOKYO ELECTRON LIMITED
- Kiyoshi MORI
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD OF MEASURING EDGE ECCENTRICITY WHILE WAFER IS ON PRE-ALIGNER
- Publication number 20250198748
- Publication date Jun 19, 2025
- Canon Kabushiki Kaisha
- Logan L. Simpson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RESILIENT FLOORING PRODUCT AND METHODS OF MAKING SAME
- Publication number 20250198749
- Publication date Jun 19, 2025
- Columbia Insurance Company
- Tom Odum
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SURFACE TOPOGRAPHY MEASUREMENT SYSTEMS
- Publication number 20250203192
- Publication date Jun 19, 2025
- GELSIGHT, INC.
- Janos Rohaly
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
MEASUREMENT DEVICE
- Publication number 20250189298
- Publication date Jun 12, 2025
- Panasonic Intellectual Property Management Co., Ltd.
- Katsuya NOZAWA
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT DEVICE
- Publication number 20250189301
- Publication date Jun 12, 2025
- Panasonic Intellectual Property Management Co., Ltd.
- Katsuya NOZAWA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR COMBINING HEIGHT MAPS AND PROFILOMETER FOR THE SAME
- Publication number 20250189303
- Publication date Jun 12, 2025
- MITUTOYO CORPORATION
- Ruslan Akhmedovich SEPKHANOV
- G01 - MEASURING TESTING
Information Patent Application
NON-CONTACT OPTIC PROBE FOR ENHANCING MEASUREMENT OF BACK DRILLING...
- Publication number 20250189304
- Publication date Jun 12, 2025
- CIN PHOWN TECHNOLOGY CO., LTD.
- FENG-CHIEH LI
- G01 - MEASURING TESTING
Information Patent Application
Wide-Field Dynamic Aberrometer Measurements for Myopia Control with...
- Publication number 20250176824
- Publication date Jun 5, 2025
- Wavefront Dynamics, Inc.
- James Copland
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THREE-DIMENSIONAL CONTOUR MEASUREMENT SYSTEM
- Publication number 20250180347
- Publication date Jun 5, 2025
- TRIPLE WIN TECHNOLOGY(SHENZHEN) CO.LTD.
- HSUAN-WEI HO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL FIBER SENSING METHOD AND SENSING SYSTEM FOR STRAIGHTNESS OF...
- Publication number 20250172385
- Publication date May 29, 2025
- China University of Mining and Technology
- Xinqiu FANG
- G01 - MEASURING TESTING
Information Patent Application
A METHOD FOR MANUFACTURING A CERAMIC TILE AND AN EQUIPMENT FOR MANU...
- Publication number 20250171362
- Publication date May 29, 2025
- Marazzi Group SRL
- Daniele PAGANELLI
- B28 - WORKING CEMENT, CLAY, OR STONE
Information Patent Application
COMPACT INTRAORAL SCANNER
- Publication number 20250160654
- Publication date May 22, 2025
- Align Technology, Inc.
- Yossef Atiya
- G01 - MEASURING TESTING
Information Patent Application
CALCULATION METHOD FOR MEASURING FLATNESS OF CROSS-SECTION OF TUNNE...
- Publication number 20250164236
- Publication date May 22, 2025
- CCCC NATIONAL ENGINEERING RESEARCH CENTER OF DREDGING TECHNOLOGY AND EQUIPMEN...
- Yuanquan MIAO
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF IDENTIFICATION AND DETECTION OF OBJECTS VIA INFRARED REFL...
- Publication number 20250164237
- Publication date May 22, 2025
- Universal City Studios LLC
- Eric To Chan
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DEVICE AND INSPECTION METHOD
- Publication number 20250155236
- Publication date May 15, 2025
- Nikon Corporation
- Naonori KITA
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS OF OPTICAL INSPECTION OF ELECTRONIC DEVICE MANU...
- Publication number 20250155234
- Publication date May 15, 2025
- Applied Materials, Inc.
- Mohsin Waqar
- G01 - MEASURING TESTING
Information Patent Application
DEVICE TRACKING USING LONGITUDINAL ENCODING
- Publication number 20250152254
- Publication date May 15, 2025
- Koninklijke Philips N.V.
- Sander Hans DENISSEN
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
CALIBRATED INTRAORAL SCANNING SYSTEM
- Publication number 20250143850
- Publication date May 8, 2025
- Align Technology, Inc.
- Tal Verker
- G01 - MEASURING TESTING
Information Patent Application
METHODS OF DESIGNING AND FABRICATING A CUSTOMIZED WAVEFRONT GUIDED...
- Publication number 20250143564
- Publication date May 8, 2025
- Wavefront Dynamics, Inc.
- Daniel R. Neal
- G06 - COMPUTING CALCULATING COUNTING

for measuring contours or curvatures

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method and apparatus for the contactless measurement of objects

Machine learning method used for laser processing system, simulatio...

Surface inspection device and shape measurement software

Device and method for measuring interfaces of an optical element

Systems, methods, and apparatus for providing interactive inspectio...

Calibration method for computer vision system and three-dimensional...

Three-dimensional measurement device

Member distinguish apparatus, member distinguish method, and comput...

Uniform machined parts inspection process

Three-dimensional optical measuring mobile apparatus for ropes with...

Optical measuring machine and measuring method

Resilient flooring product and methods of making same

Method and coordinate measuring machine

Back-face dynamic profiling system

Perception systems and methods for identifying and processing a var...

Shape reconstruction method and image measurement device

Broadband profiler system and method for constructing a three-dimen...

Unscanned optical inspection system using a micro camera array

Resilient flooring product and methods of making same

Laser and synthetic profilometry of a positive displacement motor (...

Apparatus for inspecting display panel and method for inspecting su...

Measurement method for interferometrically determining a surface shape

Method ad apparatus for digital thread inspection

Vibration insensitive interferometry for measuring thickness and pr...

Inspection system for manufactured components

Three-dimensional measuring device, and three- dimensional measurin...

Three-dimensional scanner, control method, and recording medium for...

Method and apparatus for determining the position of objects on a c...

Dimension measurement apparatus, semiconductor manufacturing appara...

Automated 3-D modeling of shoe parts

Patents Applicationslast 30 patents

CORRECTION DEVICE

METHOD FOR SEEDING CELLS ON A SENSOR SURFACE

Methods and Systems for Characterizing Laser Machining Properties b...

GLASS SUBSTRATE, GLASS LAMINATE, MEMBER FOR DISPLAY DEVICE, DISPLAY...

DEVICE FOR MEASURING SEMICONDUCTORS

STABILIZATION OF A MANUFACTURING PROCESS OF A SPECIMEN BY SHAPE ANA...

BIOLOGICAL SAMPLE MEASUREMENT DEVICE

A METHOD FOR TRACKING OF AT LEAST ONE OBJECT WITH AT LEAST ONE DETE...

CALIBRATION FOR IN-PLANE DISTORTION TOOL-TO-TOOL MATCHING

SYSTEM, APPARATUS AND METHOD FOR PROVIDING 3D SURFACE MEASUREMENTS...

ADJUSTMENT METHOD AND SUBSTRATE PROCESSING APPARATUS

METHOD OF MEASURING EDGE ECCENTRICITY WHILE WAFER IS ON PRE-ALIGNER

RESILIENT FLOORING PRODUCT AND METHODS OF MAKING SAME

SURFACE TOPOGRAPHY MEASUREMENT SYSTEMS

MEASUREMENT DEVICE

MEASUREMENT DEVICE

METHOD FOR COMBINING HEIGHT MAPS AND PROFILOMETER FOR THE SAME

NON-CONTACT OPTIC PROBE FOR ENHANCING MEASUREMENT OF BACK DRILLING...

Wide-Field Dynamic Aberrometer Measurements for Myopia Control with...

THREE-DIMENSIONAL CONTOUR MEASUREMENT SYSTEM

OPTICAL FIBER SENSING METHOD AND SENSING SYSTEM FOR STRAIGHTNESS OF...

A METHOD FOR MANUFACTURING A CERAMIC TILE AND AN EQUIPMENT FOR MANU...

COMPACT INTRAORAL SCANNER

CALCULATION METHOD FOR MEASURING FLATNESS OF CROSS-SECTION OF TUNNE...

METHOD OF IDENTIFICATION AND DETECTION OF OBJECTS VIA INFRARED REFL...

OPTICAL DEVICE AND INSPECTION METHOD

METHODS AND SYSTEMS OF OPTICAL INSPECTION OF ELECTRONIC DEVICE MANU...

DEVICE TRACKING USING LONGITUDINAL ENCODING

CALIBRATED INTRAORAL SCANNING SYSTEM

METHODS OF DESIGNING AND FABRICATING A CUSTOMIZED WAVEFRONT GUIDED...