for measuring contours or curvatures

Industry

CPC
G01B11/24

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B11/00Measuring arrangements characterised by the use of optical means

Current Industry

G01B11/24for measuring contours or curvatures

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method ad apparatus for digital thread inspection
- Patent number 12,326,330
- Issue date Jun 10, 2025
- TUBULAR SOLUTIONS, INC.
- Aubrey A. Stigall
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Vibration insensitive interferometry for measuring thickness and pr...
- Patent number 12,326,402
- Issue date Jun 10, 2025
- Korean Research Institute of Standard and Science
- Yong-sik Ghim
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system for manufactured components
- Patent number 12,326,406
- Issue date Jun 10, 2025
- General Inspection, LLC
- Mike Nygaard
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional measuring device, and three- dimensional measurin...
- Patent number 12,326,329
- Issue date Jun 10, 2025
- FANUC CORPORATION
- Yuusuke Oota
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Three-dimensional scanner, control method, and recording medium for...
- Patent number 12,324,660
- Issue date Jun 10, 2025
- J. MORITA MFG. CORP.
- Tsuyoshi Tanaka
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method and apparatus for determining the position of objects on a c...
- Patent number 12,320,628
- Issue date Jun 3, 2025
- FT SYSTEM S.R.L.
- Marco Cipriani
- G01 - MEASURING TESTING
Information Patent Grant
Dimension measurement apparatus, semiconductor manufacturing appara...
- Patent number 12,320,630
- Issue date Jun 3, 2025
- HITACHI HIGH-TECH CORPORATION
- Pushe Zhao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated 3-D modeling of shoe parts
- Patent number 12,313,395
- Issue date May 27, 2025
- Nike, Inc.
- Patrick C. Regan
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Warp detection in traveling corrugated product
- Patent number 12,311,632
- Issue date May 27, 2025
- INTPRO, LLC
- Herbert B. Kohler
- B31 - MAKING ARTICLES OF PAPER OR CARDBOARD WORKING PAPER OR CARDBOARD
Information Patent Grant
Three-dimensional measurement apparatus, system, and production method
- Patent number 12,313,399
- Issue date May 27, 2025
- Canon Kabushiki Kaisha
- Akihiro Yamada
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Low-coherence interferometer with surface power compensation
- Patent number 12,305,981
- Issue date May 20, 2025
- Corning Incorporated
- Joshua Monroe Cobb
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for measuring a feature of glass-based substrate
- Patent number 12,305,983
- Issue date May 20, 2025
- Corning Incorporated
- Earle William Gillis
- G01 - MEASURING TESTING
Information Patent Grant
Structured light three-dimensional measurement method based on join...
- Patent number 12,307,696
- Issue date May 20, 2025
- Hangzhou Chengguang Medical Technology Co., Ltd.
- Mengyu Jia
- G01 - MEASURING TESTING
Information Patent Grant
Automated seal inspection system
- Patent number 12,305,973
- Issue date May 20, 2025
- Caterpillar Inc.
- Nien L. Lee
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for scanning and printing a 3D object
- Patent number 12,309,333
- Issue date May 20, 2025
- Magic Leap, Inc.
- Alexander Ilic
- G01 - MEASURING TESTING
Information Patent Grant
Control of a manufacturing process using contour curvature analysis...
- Patent number 12,299,868
- Issue date May 13, 2025
- Applied Materials Israel Ltd.
- Einat Frishman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Calibration method for optical rotation probe
- Patent number 12,298,121
- Issue date May 13, 2025
- Tokyo Seimitsu Co., Ltd.
- Yoshiyuki Kawata
- G01 - MEASURING TESTING
Information Patent Grant
Operation accuracy measuring method
- Patent number 12,298,126
- Issue date May 13, 2025
- Disco Corporation
- Atsushi Oda
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Calculating distributed twist of a multi-fiber 3D shape sensor bund...
- Patent number 12,292,353
- Issue date May 6, 2025
- The Shape Sensing Company
- Alex Tongue
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric lens aligner and method
- Patent number 12,292,274
- Issue date May 6, 2025
- Zygo Corporation
- Jan Liesener
- G01 - MEASURING TESTING
Information Patent Grant
Superresolution metrology methods based on singular distributions a...
- Patent number 12,293,594
- Issue date May 6, 2025
- BioAxial SAS
- Gabriel Y. Sirat
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Imaging device, information processing device, imaging method, and...
- Patent number 12,293,534
- Issue date May 6, 2025
- Sony Group Corporation
- Shinichiro Gomi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for characterizing the surface shape of an optica...
- Patent number 12,292,281
- Issue date May 6, 2025
- Carl Zeiss SMT GmbH
- Regina Christ
- G01 - MEASURING TESTING
Information Patent Grant
Wide-field multi-axis aberrometer
- Patent number 12,285,214
- Issue date Apr 29, 2025
- Wavefront Dynamics Inc.
- James Copland
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Tool wear monitoring device, tool wear monitoring system, and program
- Patent number 12,283,038
- Issue date Apr 22, 2025
- Hitachi, Ltd.
- Kenji Nishikawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optically computed phase microscopy
- Patent number 12,281,888
- Issue date Apr 22, 2025
- New Jersey Institute of Technology
- Xuan Liu
- G01 - MEASURING TESTING
Information Patent Grant
Tire shape measurement device and method
- Patent number 12,281,889
- Issue date Apr 22, 2025
- The Yokohama Rubber Co., Ltd.
- Naoki Akiyama
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for measuring lift of a gas cell
- Patent number 12,275,515
- Issue date Apr 15, 2025
- LTA Research and Exploration, LLC
- Kyle Vernyi
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Grant
Ink droplet volume measuring apparatus and ink droplet volume measu...
- Patent number 12,274,154
- Issue date Apr 8, 2025
- Samsung Display Co., Ltd.
- Jeongwon Han
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Grant
Compact intraoral scanner
- Patent number 12,268,474
- Issue date Apr 8, 2025
- Align Technology, Inc.
- Yossef Atiya
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT DEVICE
- Publication number 20250189298
- Publication date Jun 12, 2025
- Panasonic Intellectual Property Management Co., Ltd.
- Katsuya NOZAWA
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT DEVICE
- Publication number 20250189301
- Publication date Jun 12, 2025
- Panasonic Intellectual Property Management Co., Ltd.
- Katsuya NOZAWA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR COMBINING HEIGHT MAPS AND PROFILOMETER FOR THE SAME
- Publication number 20250189303
- Publication date Jun 12, 2025
- MITUTOYO CORPORATION
- Ruslan Akhmedovich SEPKHANOV
- G01 - MEASURING TESTING
Information Patent Application
NON-CONTACT OPTIC PROBE FOR ENHANCING MEASUREMENT OF BACK DRILLING...
- Publication number 20250189304
- Publication date Jun 12, 2025
- CIN PHOWN TECHNOLOGY CO., LTD.
- FENG-CHIEH LI
- G01 - MEASURING TESTING
Information Patent Application
Wide-Field Dynamic Aberrometer Measurements for Myopia Control with...
- Publication number 20250176824
- Publication date Jun 5, 2025
- Wavefront Dynamics, Inc.
- James Copland
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THREE-DIMENSIONAL CONTOUR MEASUREMENT SYSTEM
- Publication number 20250180347
- Publication date Jun 5, 2025
- TRIPLE WIN TECHNOLOGY(SHENZHEN) CO.LTD.
- HSUAN-WEI HO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL FIBER SENSING METHOD AND SENSING SYSTEM FOR STRAIGHTNESS OF...
- Publication number 20250172385
- Publication date May 29, 2025
- China University of Mining and Technology
- Xinqiu FANG
- G01 - MEASURING TESTING
Information Patent Application
A METHOD FOR MANUFACTURING A CERAMIC TILE AND AN EQUIPMENT FOR MANU...
- Publication number 20250171362
- Publication date May 29, 2025
- Marazzi Group SRL
- Daniele PAGANELLI
- B28 - WORKING CEMENT, CLAY, OR STONE
Information Patent Application
COMPACT INTRAORAL SCANNER
- Publication number 20250160654
- Publication date May 22, 2025
- Align Technology, Inc.
- Yossef Atiya
- G01 - MEASURING TESTING
Information Patent Application
CALCULATION METHOD FOR MEASURING FLATNESS OF CROSS-SECTION OF TUNNE...
- Publication number 20250164236
- Publication date May 22, 2025
- CCCC NATIONAL ENGINEERING RESEARCH CENTER OF DREDGING TECHNOLOGY AND EQUIPMEN...
- Yuanquan MIAO
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF IDENTIFICATION AND DETECTION OF OBJECTS VIA INFRARED REFL...
- Publication number 20250164237
- Publication date May 22, 2025
- Universal City Studios LLC
- Eric To Chan
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DEVICE AND INSPECTION METHOD
- Publication number 20250155236
- Publication date May 15, 2025
- Nikon Corporation
- Naonori KITA
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS OF OPTICAL INSPECTION OF ELECTRONIC DEVICE MANU...
- Publication number 20250155234
- Publication date May 15, 2025
- Applied Materials, Inc.
- Mohsin Waqar
- G01 - MEASURING TESTING
Information Patent Application
DEVICE TRACKING USING LONGITUDINAL ENCODING
- Publication number 20250152254
- Publication date May 15, 2025
- Koninklijke Philips N.V.
- Sander Hans DENISSEN
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
CALIBRATED INTRAORAL SCANNING SYSTEM
- Publication number 20250143850
- Publication date May 8, 2025
- Align Technology, Inc.
- Tal Verker
- G01 - MEASURING TESTING
Information Patent Application
METHODS OF DESIGNING AND FABRICATING A CUSTOMIZED WAVEFRONT GUIDED...
- Publication number 20250143564
- Publication date May 8, 2025
- Wavefront Dynamics, Inc.
- Daniel R. Neal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TRANSISTOR CHANNEL STRESS AND MOBILITY METROLOGY USING MULTIPASS SP...
- Publication number 20250146893
- Publication date May 8, 2025
- KLA Corporation
- Houssam Chouaib
- G01 - MEASURING TESTING
Information Patent Application
RESIST PATTERN INSPECTION METHOD, RESIST PATTERN MANUFACTURING METH...
- Publication number 20250147432
- Publication date May 8, 2025
- Resonac Corporation
- Tetsuya KATO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PRE-CHARGE MODULATION OF A LASER ARRAY FOR 3D IMAGING APPLICATIONS
- Publication number 20250149853
- Publication date May 8, 2025
- II-VI Delaware, Inc.
- Steve Troyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASURING MACHINE AND PROCESS FOR POSITIONING A WORKPIECE IN THE ME...
- Publication number 20250146811
- Publication date May 8, 2025
- CARL MAHR HOLDING GMBH
- Nelli BEHRENS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method And Device For Measuring The Straightness Error Of Bars And...
- Publication number 20250146810
- Publication date May 8, 2025
- Q-TECH S.R.L.
- Luca FUMAGALLI
- G01 - MEASURING TESTING
Information Patent Application
MULTI-THICKNESS OVERLAY MEASUREMENT SYSTEM
- Publication number 20250123096
- Publication date Apr 17, 2025
- KLA Corporation
- Amiram Hazzot
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT MACHINE
- Publication number 20250123097
- Publication date Apr 17, 2025
- MITUTOYO CORPORATION
- Yuki NAKAJIMA
- G01 - MEASURING TESTING
Information Patent Application
LASER AND SYNTHETIC PROFILOMETRY OF A POSITIVE DISPLACEMENT MOTOR (...
- Publication number 20250123098
- Publication date Apr 17, 2025
- Turnco LLC
- Lonnie L. Smith
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PLANT TREATMENT BASED ON MORPHOLOGICAL AND PHYSIOLOGICAL MEASUREMENTS
- Publication number 20250113780
- Publication date Apr 10, 2025
- Blue River Technology Inc.
- Lee Kamp Redden
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Application
METHODS AND DEVICES FOR ONLINE MEASUREMENT OF BINOCULAR LASER SYSTEMS
- Publication number 20250116778
- Publication date Apr 10, 2025
- Northwestern Polytechnical University
- Pengfei GAO
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Generation of One or More Edges of Luminosity to Form Three-Dimensi...
- Publication number 20250116511
- Publication date Apr 10, 2025
- VISIE, Inc.
- Aaron Charles Bernstein
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASURING A STATOR SHAFT AND ASSEMBLING A STATOR AND A GENERATOR
- Publication number 20250116510
- Publication date Apr 10, 2025
- Siemens Gamesa Renewable Energy A/S
- Marius Fuerst-Sylvester
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
TIRE MANUFACTURING METHOD AND MANUFACTURING SYSTEM
- Publication number 20250108578
- Publication date Apr 3, 2025
- The Yokohama Rubber Co., LTD.
- Yuta TAKANASHI
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE CARRIER DETERIORATION DETECTION AND REPAIR
- Publication number 20250100161
- Publication date Mar 27, 2025
- Taiwan Semiconductor Manufacturing Co., LTD
- Jen-Ti WANG
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR

for measuring contours or curvatures

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method ad apparatus for digital thread inspection

Vibration insensitive interferometry for measuring thickness and pr...

Inspection system for manufactured components

Three-dimensional measuring device, and three- dimensional measurin...

Three-dimensional scanner, control method, and recording medium for...

Method and apparatus for determining the position of objects on a c...

Dimension measurement apparatus, semiconductor manufacturing appara...

Automated 3-D modeling of shoe parts

Warp detection in traveling corrugated product

Three-dimensional measurement apparatus, system, and production method

Low-coherence interferometer with surface power compensation

Methods and apparatus for measuring a feature of glass-based substrate

Structured light three-dimensional measurement method based on join...

Automated seal inspection system

Method and apparatus for scanning and printing a 3D object

Control of a manufacturing process using contour curvature analysis...

Calibration method for optical rotation probe

Operation accuracy measuring method

Calculating distributed twist of a multi-fiber 3D shape sensor bund...

Interferometric lens aligner and method

Superresolution metrology methods based on singular distributions a...

Imaging device, information processing device, imaging method, and...

Method and device for characterizing the surface shape of an optica...

Wide-field multi-axis aberrometer

Tool wear monitoring device, tool wear monitoring system, and program

Optically computed phase microscopy

Tire shape measurement device and method

Systems and methods for measuring lift of a gas cell

Ink droplet volume measuring apparatus and ink droplet volume measu...

Compact intraoral scanner

Patents Applicationslast 30 patents

MEASUREMENT DEVICE

MEASUREMENT DEVICE

METHOD FOR COMBINING HEIGHT MAPS AND PROFILOMETER FOR THE SAME

NON-CONTACT OPTIC PROBE FOR ENHANCING MEASUREMENT OF BACK DRILLING...

Wide-Field Dynamic Aberrometer Measurements for Myopia Control with...

THREE-DIMENSIONAL CONTOUR MEASUREMENT SYSTEM

OPTICAL FIBER SENSING METHOD AND SENSING SYSTEM FOR STRAIGHTNESS OF...

A METHOD FOR MANUFACTURING A CERAMIC TILE AND AN EQUIPMENT FOR MANU...

COMPACT INTRAORAL SCANNER

CALCULATION METHOD FOR MEASURING FLATNESS OF CROSS-SECTION OF TUNNE...

METHOD OF IDENTIFICATION AND DETECTION OF OBJECTS VIA INFRARED REFL...

OPTICAL DEVICE AND INSPECTION METHOD

METHODS AND SYSTEMS OF OPTICAL INSPECTION OF ELECTRONIC DEVICE MANU...

DEVICE TRACKING USING LONGITUDINAL ENCODING

CALIBRATED INTRAORAL SCANNING SYSTEM

METHODS OF DESIGNING AND FABRICATING A CUSTOMIZED WAVEFRONT GUIDED...

TRANSISTOR CHANNEL STRESS AND MOBILITY METROLOGY USING MULTIPASS SP...

RESIST PATTERN INSPECTION METHOD, RESIST PATTERN MANUFACTURING METH...

PRE-CHARGE MODULATION OF A LASER ARRAY FOR 3D IMAGING APPLICATIONS

MEASURING MACHINE AND PROCESS FOR POSITIONING A WORKPIECE IN THE ME...

Method And Device For Measuring The Straightness Error Of Bars And...

MULTI-THICKNESS OVERLAY MEASUREMENT SYSTEM

MEASUREMENT MACHINE

LASER AND SYNTHETIC PROFILOMETRY OF A POSITIVE DISPLACEMENT MOTOR (...

PLANT TREATMENT BASED ON MORPHOLOGICAL AND PHYSIOLOGICAL MEASUREMENTS

METHODS AND DEVICES FOR ONLINE MEASUREMENT OF BINOCULAR LASER SYSTEMS

Generation of One or More Edges of Luminosity to Form Three-Dimensi...

MEASURING A STATOR SHAFT AND ASSEMBLING A STATOR AND A GENERATOR

TIRE MANUFACTURING METHOD AND MANUFACTURING SYSTEM

SUBSTRATE CARRIER DETERIORATION DETECTION AND REPAIR