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G01B11/24
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PHYSICS
G01
Measuring instruments
G01B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
G01B11/00
Measuring arrangements characterised by the use of optical means
Current Industry
G01B11/24
for measuring contours or curvatures
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Patents Grants
last 30 patents
Information
Patent Grant
Method and device for inspection of a geometry, the device comprisi...
Patent number
12,203,743
Issue date
Jan 21, 2025
Winteria AB
Martin Engman
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Metrology system configured to illuminate and measure apertures of...
Patent number
12,204,226
Issue date
Jan 21, 2025
Mitutoyo Corporation
Paul Gerard Gladnick
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Log and cant optimization
Patent number
12,202,166
Issue date
Jan 21, 2025
USNR, LLC
Douglas G. Strasky
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Detection device, detection system, detection method, and storage m...
Patent number
12,203,744
Issue date
Jan 21, 2025
Nikon Corporation
Yoshihiro Nakagawa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Optical imaging system and method based on random light field spati...
Patent number
12,203,845
Issue date
Jan 21, 2025
Soochow University
Yahong Chen
G01 - MEASURING TESTING
Information
Patent Grant
System and method for digital-representation-based flight path plan...
Patent number
12,203,742
Issue date
Jan 21, 2025
PHOTOGAUGE, INC.
Sankara J. Subramanian
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Thermal calibration of scanning system
Patent number
12,193,912
Issue date
Jan 14, 2025
Align Technology, Inc.
Tal Verker
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Calibration method of optical coherence tomography device and camera
Patent number
12,196,541
Issue date
Jan 14, 2025
HUVITZ CO., LTD.
Seong Hun Shin
G01 - MEASURING TESTING
Information
Patent Grant
Hardness tester
Patent number
12,196,724
Issue date
Jan 14, 2025
Shaoming Wu
G01 - MEASURING TESTING
Information
Patent Grant
System and method for determining post bonding overlay
Patent number
12,197,137
Issue date
Jan 14, 2025
KLA Corporation
Franz Zach
G01 - MEASURING TESTING
Information
Patent Grant
Method for measuring wafer profile
Patent number
12,188,761
Issue date
Jan 7, 2025
Shin-Etsu Handotai Co., Ltd.
Masato Ohnishi
G01 - MEASURING TESTING
Information
Patent Grant
Special optical fiber for measuring 3D curved shape, manufacturing...
Patent number
12,188,760
Issue date
Jan 7, 2025
OPTONICS CO., LTD
Seong Min Ju
G01 - MEASURING TESTING
Information
Patent Grant
Birefringence mitigation in an optical network
Patent number
12,188,762
Issue date
Jan 7, 2025
The Shape Sensing Company
Alex Tongue
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for shape sensing
Patent number
12,178,400
Issue date
Dec 31, 2024
FBGS TECHNOLOGIES GMBH
Jan Van Roosbroeck
G01 - MEASURING TESTING
Information
Patent Grant
Inspection device for cylindrical bodies
Patent number
12,181,270
Issue date
Dec 31, 2024
Schott AG
André Witzmann
G01 - MEASURING TESTING
Information
Patent Grant
Gear inspection system
Patent number
12,181,272
Issue date
Dec 31, 2024
SLONE GEAR INTERNATIONAL, INC.
Brian W. Slone
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Estimating in-die overlay with tool induced shift correction
Patent number
12,181,271
Issue date
Dec 31, 2024
KLA Corporation
Min-Yeong Moon
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Curvature value detection and evaluation
Patent number
12,181,290
Issue date
Dec 31, 2024
HERE Global B.V.
Liming Wang
G01 - MEASURING TESTING
Information
Patent Grant
Device and method for inspecting reflective surfaces
Patent number
12,174,008
Issue date
Dec 24, 2024
NEXTSENSE GMBH
Eduard Luttenberger
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Calibration system for an extreme ultraviolet light source
Patent number
12,174,550
Issue date
Dec 24, 2024
ASML Netherlands B.V.
Daniel Jason Riggs
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Generation of one or more edges of luminosity to form three-dimensi...
Patent number
12,169,123
Issue date
Dec 17, 2024
VISIE Inc.
Aaron Charles Bernstein
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Device and method for imaging and interferometry measurements
Patent number
12,163,777
Issue date
Dec 10, 2024
FOGALE NANOTECH
Alain Courteville
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Apparatus and method for measuring a three-dimensional shape
Patent number
12,163,776
Issue date
Dec 10, 2024
Koh Young Technology Inc.
Seung-Jun Lee
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Solar-based semi-mobile recharge skid
Patent number
12,163,774
Issue date
Dec 10, 2024
RENU ROBOTICS CORP.
Tim Alan Matus
G02 - OPTICS
Information
Patent Grant
System with substrate carrier deterioration detection and repair
Patent number
12,162,134
Issue date
Dec 10, 2024
Taiwan Semiconductor Manufacturing Co., Ltd
Jen-Ti Wang
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
System, apparatus and method for improved location identification w...
Patent number
12,162,160
Issue date
Dec 10, 2024
Gecko Robotics, Inc.
Alberto Pinero
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Reducing measurement sensor error
Patent number
12,156,755
Issue date
Dec 3, 2024
Auris Health, Inc.
Sean P. Walker
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Item detection device, item detection method, and industrial vehicle
Patent number
12,159,428
Issue date
Dec 3, 2024
Kabushiki Kaisha Toyota Jidoshokki
Yasuyo Kita
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Track geometry inspection
Patent number
12,158,333
Issue date
Dec 3, 2024
Norfolk Southern Corporation
Richard Scott Hailey
B61 - RAILWAYS
Information
Patent Grant
Compact intraoral 3D scanner
Patent number
12,156,785
Issue date
Dec 3, 2024
Align Technology, Inc.
Yossef Atiya
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Patents Applications
last 30 patents
Information
Patent Application
Shape-Sensing Systems with Filters and Methods Thereof
Publication number
20250020453
Publication date
Jan 16, 2025
Bard Access Systems, Inc.
Chase Thompson
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR CREATING A CUSTOM PROTECTIVE EQUIPMENT ITEM
Publication number
20250020454
Publication date
Jan 16, 2025
Steven King
G01 - MEASURING TESTING
Information
Patent Application
PRESS FORMING ANALYSIS METHOD, PRESS FORMING ANALYSIS APPARATUS, AN...
Publication number
20250012562
Publication date
Jan 9, 2025
JFE STEEL CORPORATION
Takeshi OGAWA
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
APPARATUS AND METHOD FOR DETERMINING THREE-DIMENSIONAL SHAPE OF OBJECT
Publication number
20250012565
Publication date
Jan 9, 2025
KOH YOUNG TECHNOLOGY INC.
Chan Kwon LEE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SURFACE SHAPE MEASUREMENT DEVICE AND SURFACE SHAPE MEASUREMENT METHOD
Publication number
20250012563
Publication date
Jan 9, 2025
TOKYO SEIMITSU CO., LTD.
Kyohei HAYASHI
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR QUANTITATIVE EVALUATION OF CONTACT LENS EDGE LIFT BASED...
Publication number
20250003731
Publication date
Jan 2, 2025
Alcon Inc.
Yeming Gu
G02 - OPTICS
Information
Patent Application
METHOD FOR MEASURING OPTICAL PROPERTIES AND GEOMETRIC PROPERTIES OF...
Publication number
20250003866
Publication date
Jan 2, 2025
HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY
Xiuguo Chen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
OFF-AXIS MOTION CHARACTERIZATION OF A LINEAR ACTUATOR
Publication number
20250003737
Publication date
Jan 2, 2025
Applied Materials, Inc.
Andrew Thomas Koll
G01 - MEASURING TESTING
Information
Patent Application
CMM WITH TUNABLE FOCAL LENS
Publication number
20250003732
Publication date
Jan 2, 2025
HEXAGON TECHNOLOGY CENTER GMBH
Thomas JENSEN
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT HEAD AND CONFOCAL DISPLACEMENT SENSOR
Publication number
20250003736
Publication date
Jan 2, 2025
KEYENCE CORPORATION
Hideto TAKEI
G01 - MEASURING TESTING
Information
Patent Application
SURFACE PROCESSING EQUIPMENT
Publication number
20250006475
Publication date
Jan 2, 2025
Industrial Technology Research Institute
Chih-Chieh Chen
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
IMAGE ANALYSIS DEVICE, ANALYIS DEVICE, SHAPE MEASUREMENT DEVICE, IM...
Publication number
20240426599
Publication date
Dec 26, 2024
Nikon Corporation
Sumito NAKANO
G01 - MEASURING TESTING
Information
Patent Application
SCANNER SYSTEM FOR THREE-DIMENSIONAL SCANNING OF MOVING OBJECTS
Publication number
20240426596
Publication date
Dec 26, 2024
Northrop Grumman Systems Corporation
Grant Camden Miars
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND SYSTEM TO DETERMINE SURFACE SHAPES OF HELIOSTATS USING F...
Publication number
20240426597
Publication date
Dec 26, 2024
Arizona Board of Regents on behalf of The University of Arizona
James Roger P . Angel
F24 - HEATING RANGES VENTILATING
Information
Patent Application
SYSTEM AND METHOD FOR CREATING A CUSTOM PROTECTIVE EQUIPMENT ITEM
Publication number
20240426598
Publication date
Dec 26, 2024
Riddell, Inc.
Steven King
G01 - MEASURING TESTING
Information
Patent Application
SHAPE MEASURING DEVICE AND SHAPE MEASURING METHOD
Publication number
20240426600
Publication date
Dec 26, 2024
TOKYO SEIMITSU CO., LTD.
Kyohei HAYASHI
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR THE CONTACTLESS MEASUREMENT OF OBJECTS
Publication number
20240420292
Publication date
Dec 19, 2024
Carl Zeiss Industrielle Messtechnik GmbH
Niklas Mevenkamp
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
THREAD SHAPE DIMENSION MEASURING DEVICE AND THREAD SHAPE DIMENSION...
Publication number
20240418502
Publication date
Dec 19, 2024
NIPPON STEEL CORPORATION
Shinichi OSHIMA
G01 - MEASURING TESTING
Information
Patent Application
REFERENCE MASTER ASSEMBLY FOR CHECKING EQUIPMENT AND METHOD FOR SET...
Publication number
20240410687
Publication date
Dec 12, 2024
MARPOSS SOCIETA' PER AZIONI
Roberto BARUCHELLO
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR MEASURING INTERFACES OF AN OPTICAL ELEMENT
Publication number
20240402039
Publication date
Dec 5, 2024
FOGALE NANOTECH
Eric LEGROS
G01 - MEASURING TESTING
Information
Patent Application
SURFACE METROLOGY SYSTEMS AND METHODS THEREOF
Publication number
20240401938
Publication date
Dec 5, 2024
OptiPro Systems, LLC
James Fredric Munro
G01 - MEASURING TESTING
Information
Patent Application
COMPACT INTRAORAL SCANNER WITH IMPROVED AXIAL MAGNIFICATION
Publication number
20240398235
Publication date
Dec 5, 2024
Align Technology, Inc.
Yossef ATIYA
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
METHOD OF MEASURING BENDING OF AN ELONGATE VERTICALLY ORIENTED CHANNEL
Publication number
20240401937
Publication date
Dec 5, 2024
JOINT STOCK COMPANY "ROSENERGOATOM"
Artyom Nikolaevich FEDOROV
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR THE FUNCTIONAL CHARACTERISATION OF OPTICAL LENSES
Publication number
20240402040
Publication date
Dec 5, 2024
FOGALE NANOTECH
Eric LEGROS
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR TACTILE INTELLIGENCE
Publication number
20240401936
Publication date
Dec 5, 2024
GELSIGHT, INC.
Janos Rohaly
G01 - MEASURING TESTING
Information
Patent Application
THREE-DIMENSIONAL SHAPE MEASURING DEVICE, REFERENCE SURFACE POSITIO...
Publication number
20240393097
Publication date
Nov 28, 2024
TOKYO SEIMITSU CO., LTD.
Yoshiyuki KAWATA
G01 - MEASURING TESTING
Information
Patent Application
METROLOGY SYSTEM CONFIGURED TO ILLUMINATE AND MEASURE APERTURES OF...
Publication number
20240393657
Publication date
Nov 28, 2024
MITUTOYO CORPORATION
Paul Gerard GLADNICK
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Analysis System
Publication number
20240393270
Publication date
Nov 28, 2024
Hitachi High-Tech Corporation
Azusa KONNO
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF FAST SURFACE PARTICLE AND SCRATCH DETECTION FOR EUV MASK...
Publication number
20240393673
Publication date
Nov 28, 2024
Taiwan Semiconductor Manufacturing Company, Ltd.
Chih-Cheng CHEN
G01 - MEASURING TESTING
Information
Patent Application
ADJUSTMENT METHOD FOR SHAPE MEASURING DEVICE
Publication number
20240393098
Publication date
Nov 28, 2024
TOKYO SEIMITSU CO., LTD.
Yoshiyuki KAWATA
G01 - MEASURING TESTING