BRIEF DESCRIPTION OF THE DRAWINGS
[FIG. 1] FIG. 1 is a view schematically showing a cross section of filled metal wirings by an existent technique.
[FIG. 2] FIG. 2 is a view schematically showing the state of a substrate before treatment with the method of the invention.
[FIG. 3] FIG. 3 is a view schematically showing the state of a substrate after treatment with the method of the invention.
[FIG. 4] FIG. 4 is a view showing cross sectional observation images (200×) of blind via holes of an IC substrate after plating in Example 1. In the drawing, (a) is specimen 1, and (b) is specimen 2.
[FIG. 5] FIG. 5 is a view showing cross sectional observation images (200×) of through holes of an IC substrate after plating according to Example 2.
[FIG. 6] FIG. 6 is a view showing cross sectional observation images (200×) of blind via holes of an IC substrate after plating according to Example 3. In the drawings, (a) is specimen 1, and (b) is specimen 2.
[FIG. 7] FIG. 7 is a view showing cross sectional observation images (200×) of the blind via holes of the IC substrate of specimen 1 after plating in Example 4.