Number | Name | Date | Kind |
---|---|---|---|
3580065 | Strittmater | May 1971 | |
3985597 | Zielinski | Oct 1976 | |
4024567 | Iwata et al. | May 1977 | |
4316200 | Ames et al. | Feb 1982 | |
4365264 | Mukai et al. | Dec 1982 | |
4367119 | Logan et al. | Jan 1983 | |
4501154 | Mori | Feb 1985 | |
4533935 | Mochizuki | Aug 1985 |
Number | Date | Country |
---|---|---|
146210 | Jan 1981 | DEX |
Entry |
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C. Altman et al., "Measuring Adhesion of Thin Films", IBM Tech. Disclosure Bulletin, vol. 12, No. 10, Mar. 1970, p. 1674. |
Chang, "Testing Site for Determining Capacitances of Integrated Circuits", IBM Tech. Disclosure Bulletin, vol. 16, No. 6, Nov. 1973, pp. 1990-1992. |
Lukianoff, "Testsite Layout", IBM Tech. Disclosure Bulletin, vol. 24, No. 12, May 1982, pp. 6445-6447. |