William R. Smythe, “Static and Dynamic Electricity,” Third Edition, pp. 128-227. |
M. Fee et al., “Scanning Electromagnetic Transmission Line Microscope with Sub-Wavelength Resolution,” Optics Communications, vol. 69, No. 3.4, Jan. 1, 1989, pp. 219-224. |
James Baker-Jarvis et al., “Analysis of an Open-Ended Coaxial Probe with Lift-Off for Nondestructive testing,” IEEE Transactions on Instrumentation and Measurement, vol. 43, No. 5, Oct. 1994, pp. 711-717. |
D. E. Steinhauer et al., “Surface Resistance Imaging With a Scanning Near-Field Microwave Microscope,” Applied Physics Letters, vol. 71, No. 12, Sep. 22, 1997, pp. 1736-1738. |
Saeed Pilevar et al., “Focused Ion-Beam Fabrication of Fiber Probes with Well-Defined Aperatures for Use in Near-Field Scanning Optical Microscopy,” Applied Physics Letters, vol. 72, No. 24, Jun. 15, 1998, pp. 3133-3135. |
Paul J. Petersan et al., “Measurement of Resonant Frequency and Quality Factor of Microwave Resonators: Comparison of Methods,” Journal of Applied Physics, vol. 84, No. 6, Sep. 15, 1998, pp. 3392-3402. |
C. Gao et al., “Quantitative Microwave Near-Field Microscopy of Dielectric Properties,” Review of Scientific Instruments, vol. 69, No. 11, Nov. 1998, pp. 3846-3851. |
Fred Duewer et al., “Tip-Sample Distance Feedback Control in a Scanning Evanescent Microwave Microscope,” Applied Physics Letters, vol. 74, No. 18, May 3, 1999, pp. 2696-2698. |
M. Tabib-Azar et al., Nondestructive Superresolution Imaging of Defects and Nonuniformities in Metals. Semiconductors, Dielectrics, Composites, and Plants Using Evanescent Microwaves, Review of Scientific Instruments, vol. 70, No. 6, Jun. 1999, pp. 2783-2792. |
Rimma Dekhter et al., “Investigating Material and Functional Properties of Static Random Access Memories Using Cantilevered Glass Multiple-Wire Force-Sensing Thermal Probes,” Applied Physics Letters, vol. 77, No. 26, Dec. 25, 2000, pp. 4425-4427. |