Number | Name | Date | Kind |
---|---|---|---|
4680635 | Khurana | Jul 1987 | |
4755874 | Esrig et al. | Jul 1988 | |
4811090 | Khurana | Mar 1989 | |
5006717 | Tsutsu et al. | Apr 1991 | |
5239548 | Babbitt et al. | Aug 1993 | |
5343404 | Girgis | Aug 1994 | |
5737077 | Lee et al. | Apr 1998 | |
5784285 | Tamaki et al. | Jul 1998 | |
5912911 | Usami et al. | Jun 1999 | |
5923190 | Yamaguchi | Jul 1999 | |
5940545 | Kash et al. | Aug 1999 | |
5990823 | Peele et al. | Nov 1999 |
Entry |
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U.S. Patent Appln. No. 08/683,837 filed Jul. 18, 1996 entitled “Noninvasive Optical Method for Measuring Internal Switching and Other Dynamic Parameters of CMOS Circuits”. |
IBM Invention Disclosure No. YO998-066 entitled “System and Method for Compressing and Analyzing Time-Resolved Optical Data Obtained from Operating Integrated Circuits”. |