of integrated circuits

Industry

CPC
G01R31/311

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/311of integrated circuits

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Loopback waveguide
- Patent number 12,164,148
- Issue date Dec 10, 2024
- POET Technologies, Inc.
- Suresh Venkatesan
- G02 - OPTICS
Information Patent Grant
Semiconductor failure analysis device and semiconductor failure ana...
- Patent number 12,117,480
- Issue date Oct 15, 2024
- Hamamatsu Photonics K.K.
- Masataka Ikesu
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for laser probing for hardware trojan detection
- Patent number 12,105,858
- Issue date Oct 1, 2024
- University of Florida Research Foundation, Incorporated
- Mark M. Tehranipoor
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Structure and method for testing of PIC with an upturned mirror
- Patent number 12,105,141
- Issue date Oct 1, 2024
- Lucas Soldano
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit and method for diagnosing an integrated circuit
- Patent number 11,953,546
- Issue date Apr 9, 2024
- STMicroelectronics (Alps) SAS
- Etienne Auvray
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optical circuit board for contacting photonic integrated ci...
- Patent number 11,946,950
- Issue date Apr 2, 2024
- Carl Zeiss SMT GmbH
- Philipp Huebner
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device having an optical device degradation sensor
- Patent number 11,940,489
- Issue date Mar 26, 2024
- Infineon Technologies AG
- Thomas Aichinger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor sample inspection device and inspection method
- Patent number 11,927,626
- Issue date Mar 12, 2024
- Hamamatsu Photonics K.K.
- Toshiki Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Structure and method for testing of PIC with an upturned mirror
- Patent number 11,921,156
- Issue date Mar 5, 2024
- Lucas Soldano
- G01 - MEASURING TESTING
Information Patent Grant
Wafer-level test method for optoelectronic chips
- Patent number 11,906,579
- Issue date Feb 20, 2024
- JENOPTIK GmbH
- Tobias Gnausch
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for precise signal injection into microelectron...
- Patent number 11,899,060
- Issue date Feb 13, 2024
- Battelle Memorial Institute
- Thomas F. Kent
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Connecting apparatus and light condensing substrate
- Patent number 11,874,511
- Issue date Jan 16, 2024
- Kabushiki Kaisha Nihon Micronics
- Hiroshi Kamiya
- G02 - OPTICS
Information Patent Grant
Chip detection method and chip detection apparatus
- Patent number 11,862,266
- Issue date Jan 2, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Jianbo Zhou
- G11 - INFORMATION STORAGE
Information Patent Grant
Element having antenna array structure
- Patent number 11,831,063
- Issue date Nov 28, 2023
- Canon Kabushiki Kaisha
- Yasushi Koyama
- G01 - MEASURING TESTING
Information Patent Grant
Methods of producing augmented probe system images and associated p...
- Patent number 11,821,912
- Issue date Nov 21, 2023
- FormFactor, Inc.
- Anthony James Lord
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive imaging techniques for integrated circuits and othe...
- Patent number 11,798,157
- Issue date Oct 24, 2023
- The Regents of the University of Michigan
- Parag Deotare
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mixed high-resolution and low-resolution inspection for tamper dete...
- Patent number 11,789,069
- Issue date Oct 17, 2023
- International Business Machines Corporation
- Effendi Leobandung
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Efficient laser-induced single-event latchup and methods of operation
- Patent number 11,774,494
- Issue date Oct 3, 2023
- Vanderbilt University
- Andrew L. Sternberg
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor inspection device
- Patent number 11,719,746
- Issue date Aug 8, 2023
- HITACHI HIGH-TECH CORPORATION
- Masaaki Komori
- G01 - MEASURING TESTING
Information Patent Grant
Wafer level testing of optical components
- Patent number 11,688,652
- Issue date Jun 27, 2023
- II-VI DELAWARE, INC.
- Shiyun Lin
- G01 - MEASURING TESTING
Information Patent Grant
Opto electrical test measurement system for integrated photonic dev...
- Patent number 11,680,870
- Issue date Jun 20, 2023
- STMicroelectronics (Crolles 2) SAS
- Philippe Grosse
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz plasmonics for testing very large-scale integrated circui...
- Patent number 11,675,002
- Issue date Jun 13, 2023
- The Government of the United States, as represented by the Secretary of the Army
- Greg Rupper
- G01 - MEASURING TESTING
Information Patent Grant
Defect localization in embedded memory
- Patent number 11,639,959
- Issue date May 2, 2023
- GLOBALFOUNDRIES Singapore Pte. Ltd.
- Szu Huat (Wu Shifa) Goh
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus and method for testing a semiconductor device
- Patent number 11,635,461
- Issue date Apr 25, 2023
- NXP B.V.
- Abdellatif Zanati
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit and method for diagnosing an integrated circuit
- Patent number 11,624,779
- Issue date Apr 11, 2023
- STMicroelectronics (Alps) SAS
- Etienne Auvray
- G01 - MEASURING TESTING
Information Patent Grant
Loopback waveguide
- Patent number 11,614,584
- Issue date Mar 28, 2023
- Suresh Venkatesan
- G01 - MEASURING TESTING
Information Patent Grant
Controller structural testing with automated test vectors
- Patent number 11,598,808
- Issue date Mar 7, 2023
- Micron Technology, Inc.
- Michael Richard Spica
- G11 - INFORMATION STORAGE
Information Patent Grant
Loopback waveguide
- Patent number 11,598,918
- Issue date Mar 7, 2023
- Suresh Venkatesan
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor sample inspection device and inspection method
- Patent number 11,573,251
- Issue date Feb 7, 2023
- Hamamatsu Photonics K.K.
- Yoshitaka Iwaki
- G01 - MEASURING TESTING
Information Patent Grant
Correlation between emission spots utilizing CAD data in combinatio...
- Patent number 11,561,256
- Issue date Jan 24, 2023
- Synopsys, Inc.
- Ankush Bharati Oberai
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR FAULT ANALYSIS DEVICE AND SEMICONDUCTOR FAULT ANALYSI...
- Publication number 20240393384
- Publication date Nov 28, 2024
- HAMAMATSU PHOTONICS K. K.
- Masataka IKESU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electrical and Optical Semiconductor Probe Head
- Publication number 20240385216
- Publication date Nov 21, 2024
- Teramount Ltd.
- Hesham Taha
- G01 - MEASURING TESTING
Information Patent Application
USE OF ELECTROMAGNETIC SIGNATURE TO DETERMINE THE TYPE OF INTEGRATE...
- Publication number 20240369618
- Publication date Nov 7, 2024
- Ohio State Innovation Foundation
- Robert Lee
- G01 - MEASURING TESTING
Information Patent Application
WAFER-LEVEL TEST METHOD FOR OPTOELECTRONIC CHIPS
- Publication number 20240369624
- Publication date Nov 7, 2024
- JENOPTIK OPTICAL SYSTEMS GMBH
- Christian KARRAS
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR FAILURE ANALYSIS DEVICE AND SEMICONDUCTOR FAILURE ANA...
- Publication number 20240361382
- Publication date Oct 31, 2024
- Hamamatsu Photonics K.K.
- Masataka IKESU
- G01 - MEASURING TESTING
Information Patent Application
ENHANCED ELECTRON BEAM (E-BEAM) APPARATUS AND METHODOLOGY WITH NANO...
- Publication number 20240219460
- Publication date Jul 4, 2024
- Xianghong TONG
- G01 - MEASURING TESTING
Information Patent Application
CONTACTING MODULE HAVING A MOUNTING PLATE FOR CONTACTING OPTOELECTR...
- Publication number 20240219461
- Publication date Jul 4, 2024
- Robert BUETTNER
- G01 - MEASURING TESTING
Information Patent Application
EOP PROBING ON MULTI-DIE STACKS
- Publication number 20240201252
- Publication date Jun 20, 2024
- Micron Technology, Inc.
- John M. Gonzales
- G01 - MEASURING TESTING
Information Patent Application
LED CHUCK
- Publication number 20240159825
- Publication date May 16, 2024
- TOKYO ELECTRON LIMITED
- Tomoki NUKANOBU
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR PRECISE SIGNAL INJECTION INTO MICROELECTRON...
- Publication number 20240142517
- Publication date May 2, 2024
- Battelle Memorial Institute
- Thomas F. Kent
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEFECT DETECTION USING THERMAL LASER STIMULATION AND ATOMIC FORCE M...
- Publication number 20240069095
- Publication date Feb 29, 2024
- Intel Corporation
- Huei Hao YAP
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE
- Publication number 20240012047
- Publication date Jan 11, 2024
- Hamamatsu Photonics K.K.
- Tomonori NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
ELEMENT HAVING ANTENNA ARRAY STRUCTURE
- Publication number 20240014559
- Publication date Jan 11, 2024
- Canon Kabushiki Kaisha
- Yasushi Koyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Terahertz Plasmonics for Testing Very Large-Scale Integrated Circui...
- Publication number 20230393195
- Publication date Dec 7, 2023
- The Government of the United States, as Represented by the Secretary of the Army
- Greg Rupper
- G01 - MEASURING TESTING
Information Patent Application
LOOPBACK WAVEGUIDE
- Publication number 20230384515
- Publication date Nov 30, 2023
- POET Technologies, Inc.
- Suresh Venkatesan
- G01 - MEASURING TESTING
Information Patent Application
LOOPBACK WAVEGUIDE
- Publication number 20230384516
- Publication date Nov 30, 2023
- POET Technologies, Inc.
- Suresh Venkatesan
- G01 - MEASURING TESTING
Information Patent Application
CONTACTING MODULE FOR CONTACTING OPTOELECTRONIC CHIPS
- Publication number 20230296668
- Publication date Sep 21, 2023
- JENOPTIK OPTICAL SYSTEMS GMBH
- Robert BUETTNER
- G01 - MEASURING TESTING
Information Patent Application
CONTACTING MODULE FOR HAVING A MOUNTING PLATE FOR CONTACTING OPTOEL...
- Publication number 20230288475
- Publication date Sep 14, 2023
- JENOPTIK OPTICAL SYSTEMS GMBH
- Robert BUETTNER
- G01 - MEASURING TESTING
Information Patent Application
WAFER LEVEL TESTING OF OPTICAL COMPONENTS
- Publication number 20230282527
- Publication date Sep 7, 2023
- II-VI Delaware, Inc.
- Shiyun Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT AND METHOD FOR DIAGNOSING AN INTEGRATED CIRCUIT
- Publication number 20230213577
- Publication date Jul 6, 2023
- STMicroelectronics (Grenoble 2) SAS
- Etienne Auvray
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND METHOD OF INSPECTING WAFER
- Publication number 20230204503
- Publication date Jun 29, 2023
- Samsung Electronics Co., Ltd.
- Martin Priwisch
- G01 - MEASURING TESTING
Information Patent Application
TECHNOLOGIES FOR VERIFYING AND VALIDATING ELECTRONIC DEVICES USING...
- Publication number 20230194599
- Publication date Jun 22, 2023
- Battelle Memorial Institute
- Russell GILABERT
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE INSPECTION METHOD AND SEMICONDUCTOR DEVICE INS...
- Publication number 20230184827
- Publication date Jun 15, 2023
- Hamamatsu Photonics K.K.
- Norimichi CHINONE
- G01 - MEASURING TESTING
Information Patent Application
MIXED HIGH-RESOLUTION AND LOW-RESOLUTION INSPECTION FOR TAMPER DETE...
- Publication number 20230176117
- Publication date Jun 8, 2023
- International Business Machines Corporation
- Effendi Leobandung
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor Device Having an Optical Device Degradation Sensor
- Publication number 20230121426
- Publication date Apr 20, 2023
- Thomas Aichinger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR FAILURE ANALYSIS DEVICE AND SEMICONDUCTOR FAILURE ANA...
- Publication number 20230072615
- Publication date Mar 9, 2023
- Hamamatsu Photonics K.K.
- Masataka IKESU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHIP DETECTION METHOD AND CHIP DETECTION APPARATUS
- Publication number 20230056149
- Publication date Feb 23, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Jianbo ZHOU
- G11 - INFORMATION STORAGE
Information Patent Application
WAFER-LEVEL TEST METHOD FOR OPTOELECTRONIC CHIPS
- Publication number 20220397602
- Publication date Dec 15, 2022
- Tobias GNAUSCH
- G01 - MEASURING TESTING
Information Patent Application
Illuminator Method and Device for Semiconductor Package Testing
- Publication number 20220390510
- Publication date Dec 8, 2022
- UTAC Headquarters Pte. Ltd.
- Boon Chew Goh
- G01 - MEASURING TESTING
Information Patent Application
EFFICIENT LASER-INDUCED SINGLE-EVENT LATCHUP AND METHODS OF OPERATION
- Publication number 20220390511
- Publication date Dec 8, 2022
- Vanderbilt University
- Andrew L. STERNBERG
- G01 - MEASURING TESTING

of integrated circuits

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Loopback waveguide

Semiconductor failure analysis device and semiconductor failure ana...

Systems and methods for laser probing for hardware trojan detection

Structure and method for testing of PIC with an upturned mirror

Integrated circuit and method for diagnosing an integrated circuit

Electro-optical circuit board for contacting photonic integrated ci...

Semiconductor device having an optical device degradation sensor

Semiconductor sample inspection device and inspection method

Structure and method for testing of PIC with an upturned mirror

Wafer-level test method for optoelectronic chips

Systems and methods for precise signal injection into microelectron...

Connecting apparatus and light condensing substrate

Chip detection method and chip detection apparatus

Element having antenna array structure

Methods of producing augmented probe system images and associated p...

Non-destructive imaging techniques for integrated circuits and othe...

Mixed high-resolution and low-resolution inspection for tamper dete...

Efficient laser-induced single-event latchup and methods of operation

Semiconductor inspection device

Wafer level testing of optical components

Opto electrical test measurement system for integrated photonic dev...

Terahertz plasmonics for testing very large-scale integrated circui...

Defect localization in embedded memory

Test apparatus and method for testing a semiconductor device

Integrated circuit and method for diagnosing an integrated circuit

Loopback waveguide

Controller structural testing with automated test vectors

Loopback waveguide

Semiconductor sample inspection device and inspection method

Correlation between emission spots utilizing CAD data in combinatio...

Patents Applicationslast 30 patents

SEMICONDUCTOR FAULT ANALYSIS DEVICE AND SEMICONDUCTOR FAULT ANALYSI...

Electrical and Optical Semiconductor Probe Head

USE OF ELECTROMAGNETIC SIGNATURE TO DETERMINE THE TYPE OF INTEGRATE...

WAFER-LEVEL TEST METHOD FOR OPTOELECTRONIC CHIPS

SEMICONDUCTOR FAILURE ANALYSIS DEVICE AND SEMICONDUCTOR FAILURE ANA...

ENHANCED ELECTRON BEAM (E-BEAM) APPARATUS AND METHODOLOGY WITH NANO...

CONTACTING MODULE HAVING A MOUNTING PLATE FOR CONTACTING OPTOELECTR...

EOP PROBING ON MULTI-DIE STACKS

LED CHUCK

SYSTEMS AND METHODS FOR PRECISE SIGNAL INJECTION INTO MICROELECTRON...

DEFECT DETECTION USING THERMAL LASER STIMULATION AND ATOMIC FORCE M...

INSPECTION DEVICE

ELEMENT HAVING ANTENNA ARRAY STRUCTURE

Terahertz Plasmonics for Testing Very Large-Scale Integrated Circui...

LOOPBACK WAVEGUIDE

LOOPBACK WAVEGUIDE

CONTACTING MODULE FOR CONTACTING OPTOELECTRONIC CHIPS

CONTACTING MODULE FOR HAVING A MOUNTING PLATE FOR CONTACTING OPTOEL...

WAFER LEVEL TESTING OF OPTICAL COMPONENTS

INTEGRATED CIRCUIT AND METHOD FOR DIAGNOSING AN INTEGRATED CIRCUIT

INSPECTION APPARATUS AND METHOD OF INSPECTING WAFER

TECHNOLOGIES FOR VERIFYING AND VALIDATING ELECTRONIC DEVICES USING...

SEMICONDUCTOR DEVICE INSPECTION METHOD AND SEMICONDUCTOR DEVICE INS...

MIXED HIGH-RESOLUTION AND LOW-RESOLUTION INSPECTION FOR TAMPER DETE...

Semiconductor Device Having an Optical Device Degradation Sensor

SEMICONDUCTOR FAILURE ANALYSIS DEVICE AND SEMICONDUCTOR FAILURE ANA...

CHIP DETECTION METHOD AND CHIP DETECTION APPARATUS

WAFER-LEVEL TEST METHOD FOR OPTOELECTRONIC CHIPS

Illuminator Method and Device for Semiconductor Package Testing

EFFICIENT LASER-INDUCED SINGLE-EVENT LATCHUP AND METHODS OF OPERATION