| Number | Name | Date | Kind |
|---|---|---|---|
| 4334318 | Klank et al. | Jun 1982 | A |
| 4658332 | Baker et al. | Apr 1987 | A |
| 4988925 | Biblarz | Jan 1991 | A |
| 5121282 | White | Jun 1992 | A |
| 5682101 | Brooks et al. | Oct 1997 | A |
| 5805397 | MacKenzie | Sep 1998 | A |
| 5825598 | Dickens et al. | Oct 1998 | A |
| 5834940 | Brooks et al. | Nov 1998 | A |
| 5963405 | Engel et al. | Oct 1999 | A |
| 6034611 | Brooks et al. | Mar 2000 | A |
| 6072673 | Chen et al. | Jun 2000 | A |
| 6195241 | Brooks et al. | Feb 2001 | B1 |
| 6242993 | Fleege et al. | Jun 2001 | B1 |
| 6246556 | Haun et al. | Jun 2001 | B1 |
| 6300766 | Schmalz | Oct 2001 | B1 |
| 6313642 | Brooks | Nov 2001 | B1 |
| 6370001 | Macbeth | Apr 2002 | B1 |
| 6452767 | Brooks | Sep 2002 | B1 |
| 6456471 | Haun et al. | Sep 2002 | B1 |
| Entry |
|---|
| Schneider Electric Data Bulletin 0760DB0204, “Determining the Cause of AFCI Tripping”, Jun. 2003. |
| Electric Device Corporation “GF Series FGI/AFCI Test Systems”, Oct. 2002. |
| ARC-Fault Circuit-Interrupters—UL 1699, “Carbonized path Arc Clearing Time Test”, pp. 33-34, Dec. 2, 2000. |
| ARC-Fault Circuit-Interrupters—UL 1699, “Operation Inhibition Tests”, pp. 40-44, Dec. 2, 2000. |