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Testing or calibrating of apparatus covered by the preceding groups
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G01R35/00
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Parent Industries
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PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
Current Industry
G01R35/00
Testing or calibrating of apparatus covered by the preceding groups
Sub Industries
G01R35/002
of cathode ray oscilloscopes
G01R35/005
Calibrating; Standards or reference devices
G01R35/007
Standards or reference devices
G01R35/02
of auxiliary devices
G01R35/04
of instruments for measuring time integral of power or current
G01R35/06
by stroboscopic methods
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Patents Grants
last 30 patents
Information
Patent Grant
Method for calibrating gradient amplifiers of a magnetic resonance...
Patent number
12,366,621
Issue date
Jul 22, 2025
Siemens Healthineers AG
Michael Köhler
G01 - MEASURING TESTING
Information
Patent Grant
Devices and methods for smart sensor application
Patent number
12,352,806
Issue date
Jul 8, 2025
Analog Devices International Unlimited Company
GuangYang Qu
G01 - MEASURING TESTING
Information
Patent Grant
System and method of directional sensor calibration
Patent number
12,345,547
Issue date
Jul 1, 2025
Bench Tree Group, LLC
Jian-Qun Wu
E21 - EARTH DRILLING MINING
Information
Patent Grant
Sensor system and method for calibrating a sensor system
Patent number
12,345,752
Issue date
Jul 1, 2025
Rohde & Schwarz GmbH & Co. KG
Thomas Ruster
G01 - MEASURING TESTING
Information
Patent Grant
Metering component testing
Patent number
12,339,344
Issue date
Jun 24, 2025
Lunar Energy, Inc.
Kyle Breuning Evans
G01 - MEASURING TESTING
Information
Patent Grant
Active load pull system
Patent number
12,332,296
Issue date
Jun 17, 2025
Christos Tsironis
G01 - MEASURING TESTING
Information
Patent Grant
Self-calibration system and procedure for autonomous loop and groun...
Patent number
12,320,884
Issue date
Jun 3, 2025
APLICACIONES TECNOLOGICAS, S.A.
Verónica Pomar Pedredo
G01 - MEASURING TESTING
Information
Patent Grant
Resistivity-based adjustment of thresholds for in-situ monitoring
Patent number
12,320,883
Issue date
Jun 3, 2025
Applied Materials, Inc.
Kun Xu
C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information
Patent Grant
Integrated vector network analyzer
Patent number
12,320,882
Issue date
Jun 3, 2025
Keysight Technologies, Inc.
Keith F. Anderson
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Method and system for improved current sensor
Patent number
12,313,657
Issue date
May 27, 2025
ABB E-MOBILITY B.V.
Adrian Hozoi
G01 - MEASURING TESTING
Information
Patent Grant
Calibrator having an enhanced user interface
Patent number
12,314,552
Issue date
May 27, 2025
Fluke Corporation
Joseph V. Ferrante
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Power sensor arrangement for on-wafer power calibration
Patent number
12,313,719
Issue date
May 27, 2025
Rohde & Schwarz GmbH & Co. KG
Christopher Stumpf
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and methods for determining force applied to the tip of a...
Patent number
12,310,753
Issue date
May 27, 2025
The University of Sheffield
Dilichukwu Anumba
G01 - MEASURING TESTING
Information
Patent Grant
Apparatuses and methods for passive fault monitoring of current sen...
Patent number
12,306,252
Issue date
May 20, 2025
Hubbell Incorporated
Gary Michael Miller
G01 - MEASURING TESTING
Information
Patent Grant
Solutionless sensor calibration
Patent number
12,298,333
Issue date
May 13, 2025
Parker-Hannifin Corporation
Charlene N. Gibbert
G01 - MEASURING TESTING
Information
Patent Grant
Voltage measurement channel calibration for battery management systems
Patent number
12,298,355
Issue date
May 13, 2025
Cypress Semiconductor Corporation
Roman Ogirko
G01 - MEASURING TESTING
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Patent Grant
Accurate and model-based measurement and management systems and met...
Patent number
12,298,376
Issue date
May 13, 2025
HEATHKIT COMPANY, INC.
Andrew S. Cromarty
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Application of electrochemical impedance spectroscopy in sensor sys...
Patent number
12,290,360
Issue date
May 6, 2025
Medtronic MiniMed, Inc.
Ning Yang
G08 - SIGNALLING
Information
Patent Grant
Method for heteronuclear quantitative determination by NMR spectros...
Patent number
12,292,493
Issue date
May 6, 2025
Bruker Biospin GmbH
Bernd Willi Karl-Heinz Diehl
G01 - MEASURING TESTING
Information
Patent Grant
Hybrid digital and analog signal generation systems and methods
Patent number
12,287,390
Issue date
Apr 29, 2025
Lake Shore Cryotronics, Inc.
Houston Fortney
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Methods and systems for diagnosing magnetic sensors
Patent number
12,282,081
Issue date
Apr 22, 2025
Texas Instruments Incorporated
Harish Kumar
G01 - MEASURING TESTING
Information
Patent Grant
Current-sensing resistor
Patent number
12,282,042
Issue date
Apr 22, 2025
Isabellenhutte Heusler GmbH & Co. KG
Benedikt Kramm
G01 - MEASURING TESTING
Information
Patent Grant
Electronic component handling apparatus, electronic component testi...
Patent number
12,276,693
Issue date
Apr 15, 2025
Advantest Corporation
Matthias Werner
G01 - MEASURING TESTING
Information
Patent Grant
Calibration arrangement and corresponding calibration method, and c...
Patent number
12,276,692
Issue date
Apr 15, 2025
ERS Electronic GmbH
Klemens Reitinger
G01 - MEASURING TESTING
Information
Patent Grant
Auto-calibration for coreless current sensors
Patent number
12,270,887
Issue date
Apr 8, 2025
ALLEGRO MICROSYSTEMS, LLC
Yannick Vuillermet
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus to trigger calibration of a sensor node using...
Patent number
12,270,886
Issue date
Apr 8, 2025
Intel Corporation
Yatish Mishra
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Peak detector calibration
Patent number
12,265,146
Issue date
Apr 1, 2025
Infineon Technologies AG
Giovanni Boi
G01 - MEASURING TESTING
Information
Patent Grant
Fault-tolerant control for static transfer switch system
Patent number
12,267,007
Issue date
Apr 1, 2025
L3HARRIS TECHNOLOGIES, INC.
Lixin Tang
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Circuit and method for calibrating a plurality of automated test eq...
Patent number
12,259,425
Issue date
Mar 25, 2025
Advantest Corporation
Bernhard Roth
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for vector-short-open-calibration de-embedding...
Patent number
12,259,453
Issue date
Mar 25, 2025
Murata Manufacturing Co., Ltd.
Jackson W. Massey
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
High-bandwidth Vector Network Analyzer System for Transmitting and...
Publication number
20250231268
Publication date
Jul 17, 2025
Transcom (Shanghai) Technology Co., Ltd.
Shuang CHEN
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
CAPACITANCE MEASUREMENT METHOD FOR A CAPACITIVE DEVICE
Publication number
20250216431
Publication date
Jul 3, 2025
United Microelectronics Corp.
Pei Chieh Chiu
G01 - MEASURING TESTING
Information
Patent Application
TESTER WITH SELF-TEST FUNCTIONS
Publication number
20250216494
Publication date
Jul 3, 2025
FLUKE CORPORATION
Songnan Fan
G01 - MEASURING TESTING
Information
Patent Application
CURRENT MEASUREMENT SYSTEM AND METHOD
Publication number
20250208247
Publication date
Jun 26, 2025
NXP USA, Inc.
Trevor Mark Newlin
G01 - MEASURING TESTING
Information
Patent Application
PROCESSING DEVICE AND OUTPUT DEVICE
Publication number
20250199105
Publication date
Jun 19, 2025
OSAKA UNIVERSITY
Shuichi TSURUTA
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
MONITORING TECHNOLOGIES FOR MRI COILS AND ARRAYS
Publication number
20250199104
Publication date
Jun 19, 2025
Nortech Systems, Inc.
Carl SNYDER
G08 - SIGNALLING
Information
Patent Application
Circuit arrangement for evaluating an output signal, and sensor device
Publication number
20250189611
Publication date
Jun 12, 2025
Balluff GmbH
Marton Palmann
G01 - MEASURING TESTING
Information
Patent Application
CIRCUITS AND METHODS TO CALIBRATE MIRROR DISPLACEMENT
Publication number
20250189291
Publication date
Jun 12, 2025
TEXAS INSTRUMENTS INCORPORATED
Robert Floyd Payne
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
AUTOMATIC CALIBRATION METHOD AND AUTOMATIC CALIBRATION EQUIPMENT FO...
Publication number
20250180687
Publication date
Jun 5, 2025
United Microelectronics Corp.
Zheng-Yang LI
G01 - MEASURING TESTING
Information
Patent Application
Self-calibration system and procedure for autonomous loop and groun...
Publication number
20250172647
Publication date
May 29, 2025
APLICACIONES TECNOLOGICAS, S.A.
Verónica POMAR PEDREDO
G01 - MEASURING TESTING
Information
Patent Application
REAL TIME LIVE LINE MEASUREMENT OF METROLOGICAL PROPERTIES OF VOLTA...
Publication number
20250172634
Publication date
May 29, 2025
Uros KOVACEVIC
G01 - MEASURING TESTING
Information
Patent Application
CALIBRATION METHOD OF MAGNETIC FIELD MODEL AND CONTROLLER FOR ELECT...
Publication number
20250172648
Publication date
May 29, 2025
Metal Industries Research & Development Centre
Zong-Hsin Liu
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC FIELD DETECTION DEVICE
Publication number
20250172638
Publication date
May 29, 2025
ALPS ALPINE CO., LTD.
Hiroki KANAYA
G01 - MEASURING TESTING
Information
Patent Application
MULTIPLE OUTPUT INSTRUMENT CALIBRATOR
Publication number
20250164594
Publication date
May 22, 2025
FLUKE CORPORATION
Simon T. Hollingworth
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC SENSOR MODULE AND METHOD FOR DETERMINING OPERATION CONDITI...
Publication number
20250164586
Publication date
May 22, 2025
Hamamatsu Photonics K.K.
Norihisa KATO
G01 - MEASURING TESTING
Information
Patent Application
UNIDENTIFIED AERIAL PHENOMENA FIELD DISTURBANCE DETECTOR
Publication number
20250164535
Publication date
May 22, 2025
William Samuel DiPoala
G08 - SIGNALLING
Information
Patent Application
GAS SENSOR
Publication number
20250155398
Publication date
May 15, 2025
Niterra Co., Ltd.
Masahiro YAMASHITA
G01 - MEASURING TESTING
Information
Patent Application
VOLTAGE MEASUREMENT SYSTEM DIAGNOSIS SYSTEM, VOLTAGE MEASUREMENT SY...
Publication number
20250155537
Publication date
May 15, 2025
Panasonic Intellectual Property Management Co., Ltd.
Mutsuhiko TAKEDA
G01 - MEASURING TESTING
Information
Patent Application
HIGH-END VOLTAGE DIFFERENTIAL SAMPLING AND CALIBRATION SYSTEM AND M...
Publication number
20250138062
Publication date
May 1, 2025
MACROTEST SEMICONDUCTOR TECHNOLOGY CO., LTD
Xing ZHONG
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR POWER CALIBRATION
Publication number
20250138066
Publication date
May 1, 2025
ELECTDIS AB
Laurens SWAANS
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
APPARATUS AND METHOD FOR MEASURING CURRENT OF BATTERY
Publication number
20250138128
Publication date
May 1, 2025
Samsung SDI Co., Ltd.
Suk Ki KIM
G01 - MEASURING TESTING
Information
Patent Application
MANAGEMENT SYSTEM FOR PROBE CARDS
Publication number
20250130253
Publication date
Apr 24, 2025
STAR TECHNOLOGIES, INC.
CHOON LEONG LOU
G01 - MEASURING TESTING
Information
Patent Application
POWER VECTOR ANALYZER
Publication number
20250130279
Publication date
Apr 24, 2025
Tektronix, Inc.
John J. Pickerd
G01 - MEASURING TESTING
Information
Patent Application
SYNCHRONOUS SAMPLING
Publication number
20250125692
Publication date
Apr 17, 2025
INFINEON TECHNOLOGIES AG
Georg KAFFL
G01 - MEASURING TESTING
Information
Patent Application
STATISTICAL VISUALIZATIONS AND ANOMALY DETECTION FOR VEHICLE CALIBR...
Publication number
20250123348
Publication date
Apr 17, 2025
GM GLOBAL TECHNOLOGY OPERATIONS LLC
Kaushik SHANBOUG VIDURA PRASAD
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MULTIPORT RF CALIBRATION USING PEER-TERMINATED STANDARDS
Publication number
20250123349
Publication date
Apr 17, 2025
MPI Corporation
Kooho Jung
G01 - MEASURING TESTING
Information
Patent Application
Current Sensor Diagnosis Method, and Current Sensor Diagnosis Syste...
Publication number
20250116744
Publication date
Apr 10, 2025
LG ENERGY SOLUTION, LTD.
Junsik Park
G01 - MEASURING TESTING
Information
Patent Application
SUBSTRATE AND A METHOD FOR TESTING A MAGNETORESISTIVE SENSOR
Publication number
20250116745
Publication date
Apr 10, 2025
INFINEON TECHNOLOGIES AG
Wolfgang RABERG
G01 - MEASURING TESTING
Information
Patent Application
CALIBRATION SYSTEM AND CALIBRATION METHOD FOR A VECTOR NETWORK ANAL...
Publication number
20250116746
Publication date
Apr 10, 2025
ROHDE & SCHWARZ GMBH & CO. KG
Maximilian FRIESINGER
G01 - MEASURING TESTING
Information
Patent Application
CURRENT LIMIT TESTING SYSTEM FOR A TRANSISTOR
Publication number
20250110171
Publication date
Apr 3, 2025
TEXAS INSTRUMENTS INCORPORATED
Abhinay PATIL
G01 - MEASURING TESTING