Claims
- 1. An apparatus for analyzing relaxation spectra in materials, said apparatus comprises:
- (a) means for varying the temperature of at least one sample of a material according to a predetermined temperature program;
- (b) means for applying to the sample at least two coupled excitation fields simultaneously with said temperature program;
- (c) means for varying the excitation fields according to a predetermined excitation program co-extensive in time with said temperature program; and
- (d) means for measuring at least one sample parameter representative of the relaxation behavior of the sample during a portion of the temperature program.
- 2. An apparatus as recited in claim 1 wherein said excitation field application means is designed to apply an excitation field selected from the group consisting of electric excitation fields, mechanical excitation fields, magnetic excitation fields and electromagnetic excitation fields.
- 3. An apparatus as recited in claim 1 wherein said means for measuring at least one sample parameter is designed to measure temperature.
- 4. An apparatus as recited in claim 3 wherein said means for measuring at least one sample parameter is selected from the group consisting of a micro calorimeter and a differential thermal analyzer.
- 5. An apparatus as recited in claim 3 wherein said apparatus further comprises:
- (a) means for simultaneously varying the temperature of at least two samples according to said temperature program;
- (b) means for maintaining said samples at the same temperature but at different pressures; and
- (c) means for performing differential calorimetry by measuring simultaneously the temperature difference between said samples and a reference temperature.
- 6. An apparatus as recited in claim 3 wherein said apparatus further comprises means for varying the pressure over time according to a predetermined program.
- 7. An apparatus as recited in claim 1 wherein said excitation field application means is designed to apply oscillatory fields.
Priority Claims (1)
Number |
Date |
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Kind |
89 00950 |
Jan 1989 |
FRX |
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CROSS-REFERENCE INFORMATION
This is a continuation-in-part application of co-pending application Ser. No. 803,791 filed Dec. 6, 1991, now U.S. Pat. No. 5,152,607 which is a continuation of application Ser. No. 470,782 filed Jan. 26, 1990, now abandoned.
US Referenced Citations (10)
Foreign Referenced Citations (2)
Number |
Date |
Country |
0346968 |
Dec 1989 |
EPX |
3511788 |
Oct 1986 |
DEX |
Non-Patent Literature Citations (2)
Entry |
Ibar, et al., "Characterization Of Polymers By Thermally Stimulated Current Analysis And Relaxation Map Analysis Spectroscopy", Polymer Characterization, Ch. 10 (1990). |
Demont, et al., "Thermally Stimulated Creep For The Study Of Copolymers And Blends", Polymers Characterization, Ch. 11 (1990). |
Continuations (1)
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Number |
Date |
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Parent |
470782 |
Jan 1990 |
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Continuation in Parts (1)
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Number |
Date |
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Parent |
803791 |
Dec 1991 |
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