This U.S. non-provisional application claims priority under 35 U.S.C. §119 from Korean Patent Application No. 2004-51957, which was filed in the Korean Intellectual Property Office on Jul. 5, 2004, the contents of which are incorporated by reference herein in its entirety.
1. Field of the Invention
The present invention relates generally to electronic packaging technology and, more particularly, to an apparatus for ejecting relatively thin IC chips from a semiconductor wafer in a chip separation process.
2. Description of the Related Art
Integrated circuits (IC) are reaching the limit of minimization, and further, two-dimensional wafers restrict the rise in degree of integration of IC chips. Three-dimensional (3-D) stacking technology is therefore being studied to provide higher integration density.
A great number of IC chips are simultaneously fabricated on the wafer during the wafer fabrication process. Each individual IC chip is then separated from the wafer and vertically stacked in a bare form or a package form. Such 3-D stacking is inevitably confronted with an increase in thickness of stack. So, 3-D stacking often requires a relatively thin IC chip. The thin IC chip is, however, very susceptible to mechanical shocks during separation or handling.
Referring to
To completely separate the individual IC chip 22 from the wafer 20, the chip-ejecting apparatus 10 is used together with UV exposure. The chip-ejecting apparatus 10 is located under the wafer 20, and a vacuum holder 11 supports the UV-sensitive tape 23 by applying a vacuum force. Then ejecting pins 13 move upward by the ascent of a pin-driving plate 14 and push up on the IC chip 22. In addition, a chip-transferring tool 30 pulls the IC chip 22 by vacuum force, keeping in contact with the top face of the IC chip 22.
Although the UV-sensitive tape 23 is exposed to UV rays so as to reduce the adhesive strength, the UV-sensitive tape 23 still has some residual adhesive strength. Such residual adhesion is not a problem in the case of a normal, relatively thick IC chip. However, adhesion becomes an issue in the case of the relatively thin IC chip 22 having a thickness of about 801 μm and less. While the ejecting pins 13 still exert a force enough to detach the IC chip 22 from the UV-sensitive tape 23, such a force exerted by the ejecting pins 13 may be too strong for the thin IC chip 22. Since the IC chip 22 is mainly made of silicon which is inherently brittle, the thin IC chip 22 may often succumb to the mechanical stress caused by the chip-ejecting force and, therefore, may be cracked or broken.
The thin IC chip 22 may further encounter another problem during separation. The above-discussed residual adhesion of the UV-sensitive tape 23 may also unfavorably affect the planarity of the thin IC chip 22 and therefore warp the IC chip 22. Such warpage may invite a poor placement of the thin IC chip 22 on a next-level substrate, and may also lead to defective wire bonding between the IC chip and the substrate.
Some attempts to relieve mechanical stress applied to the thin IC chip have been disclosed in Korean Utility Model No. 194288 and Korean Patent Nos. 142152 and 206911, for example. According to these disclosures, the ejecting pins are vested with elasticity to reduce mechanical stress. However, the foregoing problem relating to chip warpage is still unsettled.
Embodiments of the present invention provide an apparatus and method for ejecting a thin IC chip from a UV-sensitive tape that is attached to a bottom face of a semiconductor wafer.
In one embodiment, the chip ejecting apparatus includes a vacuum holder, an ejecting block, and a plurality of ejecting pins. The vacuum holder is adapted to support the UV-sensitive tape by applying a vacuum force to the UV-sensitive tape. The ejecting block is positioned in the vacuum holder and configured to move vertically relative to the vacuum holder. The plurality of ejecting pins are inserted in a corresponding plurality of pin holes located in the ejecting block and are configured to move vertically and elastically relative to the ejecting block. The ejecting pins are adapted to move upward from the ejecting block to position the ejecting pins against the UV-sensitive tape below the IC chip to be ejected. The ejecting block is adapted to then move upward from the vacuum holder to position the ejecting block across a bottom surface of the IC chip.
Another embodiment provides a method of separating an IC chip from a semiconductor wafer. The sawed IC chip is supported on a UV-sensitive tape. A vacuum force is applied to a bottom surface of the UV-sensitive tape in an area below the chip. A vacuum force is applied to a top surface of the IC chip with a chip transferring tool. The adhesion of the UV-sensitive tape is reduced by exposing the tape to UV rays. The IC chip is pushed upward from the wafer by applying a plurality of point forces to the bottom surface of the UV-sensitive tape with a plurality of ejecting pins. The IC chip is then pressed against the chip transferring tool to eliminate or reduce warping of the chip by applying a surface pressure across a bottom surface of the IC chip with an ejecting block moving upward to the bottom surface of the IC chip. The vacuum force is removed from the bottom surface of the UV-sensitive tape, and the IC chip is transferred to a next place by the chip transferring tool.
Exemplary, non-limiting embodiments of the present invention will now be described more fully hereinafter with reference to the accompanying drawings. This invention may, however, be embodied in many different forms and should not be construed as limited to the exemplary embodiments set forth herein. Rather, the disclosed embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art. The principles and feature of this invention may be employed in varied and numerous embodiments without departing from the scope of the invention.
In this disclosure, well-known structures and processes are not described or illustrated in detail to avoid obscuring the present invention. Furthermore, the figures are not drawn to scale in the drawings. Rather, for simplicity and clarity of illustration, the dimensions of some of the elements are exaggerated relative to other elements. Like reference numerals are used for like and corresponding parts of the various drawings.
Referring to FIGS. 2 to 4, the thin IC chip ejecting apparatus 50 includes a vacuum holder 51 and a dual ejecting unit 52. The vacuum holder 51 supports, by applying vacuum force, parts of a UV-sensitive tape around the targeted IC chip to be ejected. The dual ejecting unit 52, which is placed at the central region of the vacuum holder 51, ejects the individual thin IC chip from the UV-sensitive tape. The dual ejecting unit 52 has several ejecting pins 53, a pin-driving plate 54, a vacuum hose 55, a block-driving shaft 56, and an ejecting block 57.
The ejecting block 57 is movably inserted in the central region of the vacuum holder 51 and configured to move vertically. Further, the ejecting block 57 is connected to the block-driving shaft 56, which is located under the ejecting block 57 and supplies motive force to the ejecting block 57. As will be described later, the ejecting block 57 is a tool for applying a pressure to the bottom face of the IC chip so as to compensate the warpage of the IC chip. The ejecting block 57 has a number of vacuum holes 58 and pin holes 59, which are regularly arranged. The ejecting block 57 may have a size, in a plan view, substantially equal to or smaller than that of the IC chip.
The vacuum holes 58 can communicate with the vacuum hose 55 directly or through the block-driving shaft 56. The vacuum hose 55 is configured such that the pin-driving plate 54 does not interfere with the vacuum hose 55. Each individual pin hole 59 contains an ejecting pin 53. The ejecting pins 53 are movably inserted in the pin holes 59, respectively and configured to move vertically and elastically. Further, the ejecting pins 53 are connected to the pin-driving plate 54, which is located under the ejecting pins 53 and supplies motive force to the ejecting pins 53. As will be described later, the ejecting pins 53 are tools for pushing up an IC chip to detach the IC chip from the UV-sensitive tape.
Referring to
FIGS. 5 to 9 show in sequence a method for ejecting the thin IC chip 22 from the UV-sensitive tape 23 by using the above-discussed ejecting apparatus 50.
The wafer table 70 includes a hollow circular center 72. The wafer 20 loaded on the wafer table 70 is located over the hollow circular center 72, and further, the above-discussed ejecting apparatus 50 is located within the hollow circular center 72 under the wafer 20.
After the wafer 20 is loaded on the wafer table 70, the vacuum holder 51 of the ejecting apparatus 50 partly supports the UV-sensitive tape 23, as shown in
In addition, a chip-transferring tool 60 located above the wafer 20 moves onto the targeted IC chip 22 and is placed in contact with the top face of the IC chip 22. By doing so, the chip-transferring tool 60 can prevent an undesirable shift in position of the IC chip 22 or an accidental fall of the IC chip 22 when the IC chip 22 is ejected from the UV-sensitive tape 23.
After the UV-sensitive tape 23 is supported, the ejecting pins 53 push up the IC chip 22, as shown in
As discussed above, the ejecting pin 53 can move elastically. Referring to
Subsequently, the ejecting block 57 moves upward and applies a pressure to the bottom face of the IC chip 22, as shown in
After the ejecting block 57 moves upward, the chip-transferring tool 60 carries the ejected IC chip 22, as shown in
While this invention has been particularly shown and described with reference to exemplary embodiments thereof, it will be understood by those skilled in the art that various changes in form and details may be made therein without departing from the spirit and scope of the invention as defined by the appended claims.
Number | Date | Country | Kind |
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2004-0051957 | Jul 2004 | KR | national |