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D. R. Skinner & R. E. Whitcher (Ref. 11), Journal of Physics E: Scientific Instruments, vol. 5 (May '72), pp. 237-238, "Measurement of the radius of a high-power laser beam near the focus of a lens". |
W. B. Bridges (Ref. 12), Applied Optics, vol. 14 (Oct. 75), pp. 2346-2347, "Divergence of high order Gaussian modes". |
Y. Suzaki & A. Tachibana (Ref. 13), Applied Optics, vol. 14 (Dec. '75), pp. 2809-2810, "Measurement of the micron-sized radius of Gaussian laser beam using the scanning knife-edge". |
Y. Suzaki & A. Tachibana (Ref. 14), Applied Optics, vol. 16 (Jun. '77), pp. 1481-1482, "Measurement of the Gaussian laser beam divergence". |
H. M. Lamberton & V. G. Roper (Ref. 14a), The Institute of Physics (1978), Ministry of Defence, UK, pp. 1102-1103, "Beam divergence of a highly multimode CO.sub.2 laser". |
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J. T. Luxon & D. E. Parker (Ref. 18), Applied Optics, vol. 20 (15 May '81), pp. 1728-1729, "Practical Spot Size Definition for Signal Higher-order Rectangular-mode Beams". |
J. T. Luxon & D. E Parker (Ref. 19), Applied Optics, vol. 20 (1 Jun. '81), pp. 1933-1935, "Higher-order CO.sub.2 Laser Beam Spot Size and Depth of Focus Determined". |
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R. L. Phillips & L. C. Andrews (Ref. 21), Applied Optics, vol. 22 (1 Mar. '82), pp. 643-644, "Spot Size and Divergence for Laguerre Gaussian Beams of any Order". |
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D. K. Cohen et al, (Ref. 23), Applied Optics, vol. 23 (15 Feb. '84), pp. 637-640, "Techniques for Measuring 1-micron Diameter Gaussian Beams". |
R. L. McCally (Ref. 24), Applied Optics, vol. 23 (Jul. 15, 1984), p. 2227, "Measurement of Gaussian Beam Parameters". |
J. T. Luxon et al (Ref. 25), Applied Optics, vol. 23 (Jul. 1, 1984), pp. 2088-2090, "Waist Location and Rayleigh Range for Higher-order Mode Laser Beams". |
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A. Siegman (Ref. 27), Lasers, University Science Books, Mill Valley, CA (1986). |
J. M. Fleischer & C. B. Hitz (Ref. 28), Lasers & Optronics, May '87, pp. 61-64, "Gaussian Beam Profiling: How and Why?". |
W. Koechner (Ref. 29), Solid State Laser Engineering, Second Edition, Spring-Verlag, New York, 1988. |
Julian G. Edwards (Ref. 30), Laser Focus/Electro-Optics, May 1987, pp. 76-84, "Choosing and Using Laser-Beam-Profile Monitors". |
Brochure of Photon, Inc. (Ref. 31), BeamScan Model 1180-CP Compact Optical Profiler, printed Sep. 1987. |
Brochure of DATASCAN (Ref. 32), The Complete Beam Profiling System. |
Brochure, Lasers & Optronics (Ref. 33), Apr. '89, Beam Scope Profiler Analyzes Laser Beams. |
Brochure of Photon Technology (Ref. 34), Laser Beam Analyser. |
Brochure, Spiricon Laser Beam Diagnostics (Ref. 35), Circle No. 148, May 1988. |
Abstract from talk by M. W. Sasnett (Ref. 36), CLEO Conference, 27 Apr. 27, 1988, "Propagation of nonfundamental-mode laser beams". |
"Generalized Beam Parameters and Transformation Laws for Partially Coherent Light", Shimon Lavi, Ron Prochaska and Eliezer Keren, Applied Optics, vol. 27, No. 17, 1 Sep. 1988. |