applied to monitoring the characteristics of a beam

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G01J1/4257

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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY G01J1/00Photometry

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G01J1/4257applied to monitoring the characteristics of a beam

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Patents Grantslast 30 patents

Information Patent Grant
Eye safety interlock for fiber-coupled high power laser sources
- Patent number 12,345,595
- Issue date Jul 1, 2025
- II-VI DELAWARE, INC.
- Tengda Du
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Control system for dimmable film based on facial recognition
- Patent number 12,332,530
- Issue date Jun 17, 2025
- Wicue USA INC.
- Fenghua Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Nano-textured attenuator for use with laser beam profiling and lase...
- Patent number 12,326,572
- Issue date Jun 10, 2025
- Ophir-Spiricon, LLC
- Kevin Kirkham
- G01 - MEASURING TESTING
Information Patent Grant
Beam alignment system
- Patent number 12,320,697
- Issue date Jun 3, 2025
- Northrop Grumman Systems Corporation
- Gerald R. Fischer
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for determining a focal point
- Patent number 12,313,455
- Issue date May 27, 2025
- Primes GmbH Meßtechnik für die Produktion mit Laserstrahlung
- Reinhard Kramer
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
System and method for profiling a laser beam over a galvanometer sc...
- Patent number 12,313,454
- Issue date May 27, 2025
- Haas Laser Technologies, Inc.
- Michael J. Scaggs
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for inspecting optical power measurement of light...
- Patent number 12,298,179
- Issue date May 13, 2025
- Gramm Inc.
- Jisoo Lee
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Connected epitaxial optical sensing systems
- Patent number 12,298,180
- Issue date May 13, 2025
- Apple Inc.
- Alfredo Bismuto
- G01 - MEASURING TESTING
Information Patent Grant
Illumination correction apparatus
- Patent number 12,298,671
- Issue date May 13, 2025
- Samsung Electronics Co., Ltd.
- Donghyeong Kim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated light testing apparatus and method
- Patent number 12,287,238
- Issue date Apr 29, 2025
- FJP Solution LLC
- Fang Lu
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic correction for an acousto-optic deflector
- Patent number 12,276,897
- Issue date Apr 15, 2025
- Orbotech Ltd.
- Itay Peled
- G01 - MEASURING TESTING
Information Patent Grant
Micro light emitting device inspection apparatus
- Patent number 12,253,411
- Issue date Mar 18, 2025
- PlayNitride Display Co., Ltd.
- Cheng-Cian Lin
- G01 - MEASURING TESTING
Information Patent Grant
Sampling high power beam profiling
- Patent number 12,247,869
- Issue date Mar 11, 2025
- Oren Aharon
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for determining a focal position of laser beam
- Patent number 12,247,867
- Issue date Mar 11, 2025
- Precitec GmbH & Co. KG
- David Blázquez-Sanchez
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Techniques for laser beam sensing and profiling using temperature-s...
- Patent number 12,241,777
- Issue date Mar 4, 2025
- RAM Photonics Industrial, LLC
- Per Adamson
- G01 - MEASURING TESTING
Information Patent Grant
Laser detecting circuit and semiconductor apparatus including the same
- Patent number 12,230,588
- Issue date Feb 18, 2025
- Samsung Electronics Co., Ltd.
- Cheolhwan Lim
- G11 - INFORMATION STORAGE
Information Patent Grant
Device and method for detecting a light irradiating angle
- Patent number 12,216,001
- Issue date Feb 4, 2025
- NATIONAL YANG MING CHIAO TUNG UNIVERSITY
- Mang Ou-Yang
- G01 - MEASURING TESTING
Information Patent Grant
Detection of optical surface of patient interface for ophthalmic la...
- Patent number 12,216,272
- Issue date Feb 4, 2025
- AMO Development, LLC
- Mohammad Saidur Rahaman
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatuses for aligning and diagnosing a laser beam
- Patent number 12,204,161
- Issue date Jan 21, 2025
- Cymer, LLC
- Donald Harrison Barnhart
- G01 - MEASURING TESTING
Information Patent Grant
Optical-path calibration module
- Patent number 12,196,606
- Issue date Jan 14, 2025
- GUANGZHOU DILIGINE PHOTONICS CO., LTD.
- Qiang Xue
- G01 - MEASURING TESTING
Information Patent Grant
Laser measurement apparatus having a removable and replaceable beam...
- Patent number 12,181,337
- Issue date Dec 31, 2024
- Ophir Optronics Solutions Ltd.
- Oleg Zinoviev
- G01 - MEASURING TESTING
Information Patent Grant
Gravity-enforced photon momentum radiometer and measuring optical p...
- Patent number 12,169,141
- Issue date Dec 17, 2024
- GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY O...
- Paul Andrew Williams
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for aligning a laser and a waveguide
- Patent number 12,149,052
- Issue date Nov 19, 2024
- DustPhotonics
- Yoel Chetrit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Using a strong optical beam to detect a weak optical beam
- Patent number 12,146,788
- Issue date Nov 19, 2024
- Chian Chiu Li
- G01 - MEASURING TESTING
Information Patent Grant
Wavefront curvature sensor involving temporal sampling of the image...
- Patent number 12,146,796
- Issue date Nov 19, 2024
- WOOPTIX S.L.
- Sergio Bonaque González
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for monitoring beam profile and power
- Patent number 12,105,036
- Issue date Oct 1, 2024
- ASML Netherlands B.V.
- Jian Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High power laser profiler
- Patent number 12,092,518
- Issue date Sep 17, 2024
- The Johns Hopkins University
- Leo R. Gauthier
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low noise optical assembly
- Patent number 12,078,529
- Issue date Sep 3, 2024
- Lumentum Operations LLC
- Colin Smith
- G01 - MEASURING TESTING
Information Patent Grant
Light sensing module and electronic device using the same
- Patent number 12,072,236
- Issue date Aug 27, 2024
- Lite-On Opto Technology (Changzhou) Co., Ltd.
- Bo-Jhih Chen
- F21 - LIGHTING
Information Patent Grant
Power meter systems for additive manufacturing machines
- Patent number 12,066,325
- Issue date Aug 20, 2024
- Collins Engine Nozzles, Inc.
- Matthew Donovan
- B22 - CASTING POWDER METALLURGY

Patents Applicationslast 30 patents

Information Patent Application
LASER DEVICE AND ELECTRONIC DEVICE MANUFACTURING METHOD
- Publication number 20250233382
- Publication date Jul 17, 2025
- Gigaphoton Inc.
- Takamitsu KOMAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LASER PATH DISPLAY DEVICE AND STORAGE MEDIUM
- Publication number 20250224272
- Publication date Jul 10, 2025
- FANUC CORPORATION
- Takashi OKAMOTO
- G01 - MEASURING TESTING
Information Patent Application
LASER DETECTION USING MULTIPLE IMAGE SENSORS
- Publication number 20250198835
- Publication date Jun 19, 2025
- SRI International
- Namwoong Paik
- G01 - MEASURING TESTING
Information Patent Application
ARRANGEMENT FOR LASER PROTECTION
- Publication number 20250180400
- Publication date Jun 5, 2025
- TRUMPF Lasersystems for Semiconductor Manufacturing GmbH
- Helge Hoeck
- G01 - MEASURING TESTING
Information Patent Application
LASER DETECTING CIRCUIT AND SEMICONDUCTOR APPARATUS INCLUDING THE SAME
- Publication number 20250167139
- Publication date May 22, 2025
- Samsung Electronics Co., Ltd.
- Cheolhwan LIM
- G11 - INFORMATION STORAGE
Information Patent Application
SQUEEZED LIGHT GENERATION WITH A TRIPLY-COUPLED OPTICAL RESONATOR A...
- Publication number 20250123142
- Publication date Apr 17, 2025
- RTX BBN Technologies, Inc.
- Moe D. Soltani
- G01 - MEASURING TESTING
Information Patent Application
LASER MEASUREMENT APPARATUS HAVING A REMOVABLE AND REPLACEABLE BEAM...
- Publication number 20250116550
- Publication date Apr 10, 2025
- OPHIR OPTRONICS SOLUTIONS LTD.
- Oleg Zinoviev
- G01 - MEASURING TESTING
Information Patent Application
LIGHT BEAM CHARACTERIZATION SYSTEM
- Publication number 20250102354
- Publication date Mar 27, 2025
- Leica Microsystems CMS GmbH
- Nicolas CAMUS
- G01 - MEASURING TESTING
Information Patent Application
High-Definition Broad-Band Visible-shortwave Infrared (SWIR) Sensor...
- Publication number 20250076108
- Publication date Mar 6, 2025
- SWIR Vision Systems Inc.
- Jeffery Allan HILTON
- F41 - WEAPONS
Information Patent Application
Method and System for Generating a Warp Field
- Publication number 20250067594
- Publication date Feb 27, 2025
- Chance M. Glenn
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MONITORING AN OPTICAL SIGNAL EXTRACTED FROM AN OPTICAL C...
- Publication number 20250070534
- Publication date Feb 27, 2025
- Institute of Science and Technology Austria
- Fritz DIORICO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROPAGATION ENVIRONMENT ESTIMATION METHOD, PROPAGATION ENVIRONMENT...
- Publication number 20250062844
- Publication date Feb 20, 2025
- Nippon Telegraph and Telephone Corporation
- Ryotaro TANIGUCHI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
ALIGNING A LASER AND A WAVEGUIDE USING A SPECTRAL SIGNATURE
- Publication number 20250055260
- Publication date Feb 13, 2025
- DustPhotonics
- Yoel Chetrit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAFETY APPARATUS AND METHOD FOR MONITORING A LIGHT PATH OF A LASER...
- Publication number 20250035917
- Publication date Jan 30, 2025
- Max-Planck-Gesellschaft zur Foerderung der Wissenschaften e.V.
- Karlheinz KAUNERT
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
Sampling High Power Beam Profiling
- Publication number 20250027810
- Publication date Jan 23, 2025
- Oren Aharon
- G01 - MEASURING TESTING
Information Patent Application
LIGHT-EMITTING DEVICE WITH SENSING FUNCTION AND SENSING DEVICE
- Publication number 20250012626
- Publication date Jan 9, 2025
- Industrial Technology Research Institute
- Ming-Chieh Chou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Using a Strong Optical Beam to Detect a Weak Optical Beam
- Publication number 20250012630
- Publication date Jan 9, 2025
- Chian Chiu Li
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE LIGHT BEAM OPTICAL FREQUENCY MONITORING ASSEMBLY
- Publication number 20250003796
- Publication date Jan 2, 2025
- Lumentum Technology (UK) Limited
- Colin SMITH
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR DETERMINING SPATIAL CHARACTERISTICS OF OPTI...
- Publication number 20240426655
- Publication date Dec 26, 2024
- VulcanForms Inc.
- Michael von Dadelszen
- B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information Patent Application
Device For Monitoring Properties of A Laser Beam
- Publication number 20240426654
- Publication date Dec 26, 2024
- II-VI Delaware, Inc.
- Daniel Labahn
- G01 - MEASURING TESTING
Information Patent Application
DEVICES AND METHODS FOR TESTING ABLATION SYSTEMS
- Publication number 20240393171
- Publication date Nov 28, 2024
- EXIMO MEDICAL LTD.
- Yoel ZABAR
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
OPTICAL ENERGY APPARATUS, SYSTEMS, AND METHODS
- Publication number 20240377249
- Publication date Nov 14, 2024
- Saudi Arabian Oil Company
- Damian Pablo San Roman Alerigi
- G01 - MEASURING TESTING
Information Patent Application
IN-MOTION LASER BEAM ANALYSIS AND ANALYSIS AT FIELD OF VIEW EXTREMI...
- Publication number 20240377248
- Publication date Nov 14, 2024
- Jacob C. Hay
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
ELECTRONIC DETECTION SYSTEM
- Publication number 20240361185
- Publication date Oct 31, 2024
- ULTRA DISPLAY TECHNOLOGY CORP.
- Hsien-Te CHEN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR SIMULTANEOUS NEAR-INFRARED LIGHT AND VISIBL...
- Publication number 20240280490
- Publication date Aug 22, 2024
- Blaze Bioscience, Inc.
- Jeffrey Perry
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL BEAM SENSOR WITH CENTER TRANSMISSIVE CUT-OUT
- Publication number 20240271996
- Publication date Aug 15, 2024
- KLA Corporation
- Matthew Hoffman
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS FOR REAL-TIME LASER POWER MONITORING
- Publication number 20240255346
- Publication date Aug 1, 2024
- Alcon Inc.
- Andrei Deev
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
CHARACTERISTIC VALUE CORRECTION DEVICE, CHARACTERISTIC VALUE CALCUL...
- Publication number 20240201012
- Publication date Jun 20, 2024
- Nichia Corporation.
- Yoshiki YAMAJI
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
MICRO LIGHT EMITTING DEVICE INSPECTION APPARATUS
- Publication number 20240183708
- Publication date Jun 6, 2024
- PlayNitride Display Co., Ltd.
- Cheng-Cian Lin
- G01 - MEASURING TESTING
Information Patent Application
QUICK-MOUNT WARNING RECEIVER
- Publication number 20240185725
- Publication date Jun 6, 2024
- Raytheon Company
- Sean D. Keller
- B64 - AIRCRAFT AVIATION COSMONAUTICS

applied to monitoring the characteristics of a beam

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Eye safety interlock for fiber-coupled high power laser sources

Control system for dimmable film based on facial recognition

Nano-textured attenuator for use with laser beam profiling and lase...

Beam alignment system

Device and method for determining a focal point

System and method for profiling a laser beam over a galvanometer sc...

Device and method for inspecting optical power measurement of light...

Connected epitaxial optical sensing systems

Illumination correction apparatus

Automated light testing apparatus and method

Dynamic correction for an acousto-optic deflector

Micro light emitting device inspection apparatus

Sampling high power beam profiling

Device and method for determining a focal position of laser beam

Techniques for laser beam sensing and profiling using temperature-s...

Laser detecting circuit and semiconductor apparatus including the same

Device and method for detecting a light irradiating angle

Detection of optical surface of patient interface for ophthalmic la...

Methods and apparatuses for aligning and diagnosing a laser beam

Optical-path calibration module

Laser measurement apparatus having a removable and replaceable beam...

Gravity-enforced photon momentum radiometer and measuring optical p...

Method and device for aligning a laser and a waveguide

Using a strong optical beam to detect a weak optical beam

Wavefront curvature sensor involving temporal sampling of the image...

Method and apparatus for monitoring beam profile and power

High power laser profiler

Low noise optical assembly

Light sensing module and electronic device using the same

Power meter systems for additive manufacturing machines

Patents Applicationslast 30 patents

LASER DEVICE AND ELECTRONIC DEVICE MANUFACTURING METHOD

LASER PATH DISPLAY DEVICE AND STORAGE MEDIUM

LASER DETECTION USING MULTIPLE IMAGE SENSORS

ARRANGEMENT FOR LASER PROTECTION

LASER DETECTING CIRCUIT AND SEMICONDUCTOR APPARATUS INCLUDING THE SAME

SQUEEZED LIGHT GENERATION WITH A TRIPLY-COUPLED OPTICAL RESONATOR A...

LASER MEASUREMENT APPARATUS HAVING A REMOVABLE AND REPLACEABLE BEAM...

LIGHT BEAM CHARACTERIZATION SYSTEM

High-Definition Broad-Band Visible-shortwave Infrared (SWIR) Sensor...

Method and System for Generating a Warp Field

METHOD FOR MONITORING AN OPTICAL SIGNAL EXTRACTED FROM AN OPTICAL C...

PROPAGATION ENVIRONMENT ESTIMATION METHOD, PROPAGATION ENVIRONMENT...

ALIGNING A LASER AND A WAVEGUIDE USING A SPECTRAL SIGNATURE

SAFETY APPARATUS AND METHOD FOR MONITORING A LIGHT PATH OF A LASER...

Sampling High Power Beam Profiling

LIGHT-EMITTING DEVICE WITH SENSING FUNCTION AND SENSING DEVICE

Using a Strong Optical Beam to Detect a Weak Optical Beam

MULTIPLE LIGHT BEAM OPTICAL FREQUENCY MONITORING ASSEMBLY

SYSTEMS AND METHODS FOR DETERMINING SPATIAL CHARACTERISTICS OF OPTI...

Device For Monitoring Properties of A Laser Beam

DEVICES AND METHODS FOR TESTING ABLATION SYSTEMS

OPTICAL ENERGY APPARATUS, SYSTEMS, AND METHODS

IN-MOTION LASER BEAM ANALYSIS AND ANALYSIS AT FIELD OF VIEW EXTREMI...

ELECTRONIC DETECTION SYSTEM

SYSTEMS AND METHODS FOR SIMULTANEOUS NEAR-INFRARED LIGHT AND VISIBL...

OPTICAL BEAM SENSOR WITH CENTER TRANSMISSIVE CUT-OUT

SYSTEMS FOR REAL-TIME LASER POWER MONITORING

CHARACTERISTIC VALUE CORRECTION DEVICE, CHARACTERISTIC VALUE CALCUL...

MICRO LIGHT EMITTING DEVICE INSPECTION APPARATUS

QUICK-MOUNT WARNING RECEIVER