"Rectangular Grid Fring Pattern for Topographic Applications", Taboada et al, Applied Optics, 3-1976, pp. 597-599. |
Si Wafer Thickness Measurement Using Infrared Lichtshnitt Method-Shingaku Giho, vol. 81, 1981, pp. 9-15, by A. Sawada et al. |
Thickness Measurement of Plastic Film by Infrared Sensor-Sensor Gijutsu, vol. 2, No. 7, Jun. 1982, pp. 45-51, (in Japanese language), by M. Sawaguti. |
Construction of an Interferometric Gauge System for Thickness Measurement in White Light-Goedgebuer, Lacourt, Guignard, "Optics and Laser Technology", Aug. 1978, pp. 193-196. |