for measuring thickness

Industry

CPC
G01B11/06

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B11/00Measuring arrangements characterised by the use of optical means

Current Industry

G01B11/06for measuring thickness

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Metrology system and method for determining a characteristic of one...
- Patent number 12,366,811
- Issue date Jul 22, 2025
- ASML Netherlands B.V.
- Patricius Aloysius Jacobus Tinnemans
- G01 - MEASURING TESTING
Information Patent Grant
Hybrid metrology method and system
- Patent number 12,366,533
- Issue date Jul 22, 2025
- Gilad Barak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integration of an optical height sensor in mask inspection tools
- Patent number 12,360,058
- Issue date Jul 15, 2025
- KLA Corporation
- Zefram Marks
- G01 - MEASURING TESTING
Information Patent Grant
Systems, methods, and apparatus for providing interactive inspectio...
- Patent number 12,358,141
- Issue date Jul 15, 2025
- Gecko Robotics, Inc.
- Mark J. Loosararian
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Detection method and detection device for detecting concentration o...
- Patent number 12,360,040
- Issue date Jul 15, 2025
- HONOR DEVICE CO., LTD.
- Ye Lv
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for measuring thickness and optical properties of multi-laye...
- Patent number 12,345,518
- Issue date Jul 1, 2025
- Huaqiao University
- Changcai Cui
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement apparatus, measuring method using the same, and...
- Patent number 12,345,521
- Issue date Jul 1, 2025
- Samsung Electronics Co., Ltd.
- Jin Yong Kim
- G01 - MEASURING TESTING
Information Patent Grant
In-situ wafer thickness and gap monitoring using through beam laser...
- Patent number 12,332,042
- Issue date Jun 17, 2025
- Lam Research Corporation
- Goon Heng Wong
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Chemical-dose substrate deposition monitoring
- Patent number 12,333,700
- Issue date Jun 17, 2025
- Applied Materials, Inc.
- Albert Barrett Hicks
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Vibration insensitive interferometry for measuring thickness and pr...
- Patent number 12,326,402
- Issue date Jun 10, 2025
- Korean Research Institute of Standard and Science
- Yong-sik Ghim
- G01 - MEASURING TESTING
Information Patent Grant
Polarization imaging system and polarization imaging method
- Patent number 12,320,741
- Issue date Jun 3, 2025
- Sony Group Corporation
- Piergiorgio Sartor
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Thin film characteristic measuring apparatus
- Patent number 12,320,629
- Issue date Jun 3, 2025
- LG Electronics Inc.
- Jun Park
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining the position of objects on a c...
- Patent number 12,320,628
- Issue date Jun 3, 2025
- FT SYSTEM S.R.L.
- Marco Cipriani
- G01 - MEASURING TESTING
Information Patent Grant
Supercontinuum laser based web gauging system
- Patent number 12,313,558
- Issue date May 27, 2025
- Thermo Electron Scientific Instruments LLC
- Damian Ashmead
- G01 - MEASURING TESTING
Information Patent Grant
Level sensor and substrate processing apparatus including the same
- Patent number 12,313,393
- Issue date May 27, 2025
- Samsung Electronics Co., Ltd.
- Sungho Jang
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measuring coating thickness
- Patent number 12,298,118
- Issue date May 13, 2025
- TeraView Limited
- Ian Stephen Gregory
- G01 - MEASURING TESTING
Information Patent Grant
Method for checking a wall thickness of a container made of an at l...
- Patent number 12,298,119
- Issue date May 13, 2025
- Krones Aktiengesellschaft
- Stefan Piana
- G01 - MEASURING TESTING
Information Patent Grant
Device for inspecting objects in a moving flow and machine comprisi...
- Patent number 12,298,120
- Issue date May 13, 2025
- Pellenc Selective Technologies
- Antoine Bourely
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
High-resolution handheld OCT imaging system
- Patent number 12,298,133
- Issue date May 13, 2025
- Shuixing Zhang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
System and method for conveying a tire component
- Patent number 12,292,272
- Issue date May 6, 2025
- VMI Holland B.V.
- Mattheus Jacobus Kaagman
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
System and method for the automated validation of a semi-anechoic c...
- Patent number 12,292,464
- Issue date May 6, 2025
- Phillip C. Miller
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for monitoring hydraulic accumulator pressure
- Patent number 12,286,985
- Issue date Apr 29, 2025
- The Boeing Company
- Morgan Michael Plamondon
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Pore measurement device
- Patent number 12,287,287
- Issue date Apr 29, 2025
- The Regents of the University of California
- Niall O'Dowd
- G01 - MEASURING TESTING
Information Patent Grant
Identifying desirable T lymphocytes by change in mass responses
- Patent number 12,287,325
- Issue date Apr 29, 2025
- The Regents of the University of California
- Michael A. Teitell
- G01 - MEASURING TESTING
Information Patent Grant
Ultra-spectrally selective terahertz band stop reflector
- Patent number 12,276,606
- Issue date Apr 15, 2025
- University of Central Florida Research Foundation, Inc.
- Anthony C. Terracciano
- G01 - MEASURING TESTING
Information Patent Grant
System and method to map thickness variations of substrates in manu...
- Patent number 12,276,490
- Issue date Apr 15, 2025
- Applied Materials, Inc.
- Mehdi Vaez-Iravani
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Ice cream stick insertion device for ice cream products and method...
- Patent number 12,274,277
- Issue date Apr 15, 2025
- GRAM EQUIPMENT A/S
- Klaus Wittrup Jensen
- A23 - FOODS OR FOODSTUFFS THEIR TREATMENT, NOT COVERED BY OTHER CLASSES
Information Patent Grant
Tissue sample containers and related methods
- Patent number 12,275,011
- Issue date Apr 15, 2025
- Leavitt Medical, Inc.
- Mark S. Evans
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Device and method for measuring height
- Patent number 12,264,907
- Issue date Apr 1, 2025
- MAGPIE TECH INC.
- Ung Chul Shin
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus
- Patent number 12,264,908
- Issue date Apr 1, 2025
- Disco Corporation
- Keiji Nomaru
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
TISSUE SAMPLE CONTAINERS AND RELATED METHODS
- Publication number 20250235868
- Publication date Jul 24, 2025
- Leavitt Medical, Inc.
- Mark S. Evans
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Coating Thickness Measuring Device and Coating Device Including the...
- Publication number 20250231020
- Publication date Jul 17, 2025
- LG CHEM, LTD.
- Do-Hyun Lee
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETERMINING A HEIGHT MAP USING A WHITE LIGHT INTERFEROME...
- Publication number 20250231019
- Publication date Jul 17, 2025
- MITUTOYO CORPORATION
- Nitish KUMAR
- G01 - MEASURING TESTING
Information Patent Application
System and Method/Process for In-Field Measurements of Plant Crops
- Publication number 20250231299
- Publication date Jul 17, 2025
- Agriculture Victoria Services PTY LTD
- German Carlos Spangenberg
- G01 - MEASURING TESTING
Information Patent Application
METHOD, SYSTEM AND SENSOR FOR ANALYSING A SAMPLE, AND PROCESS FOR M...
- Publication number 20250224331
- Publication date Jul 10, 2025
- TERAVIEW LIMITED
- Ian Alasdair Pentland
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR PERFORMING VEHICLE INSPECTIONS
- Publication number 20250224310
- Publication date Jul 10, 2025
- Clay Skelton
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASUREMENT METHOD AND MEASUREMENT SYSTEM
- Publication number 20250224227
- Publication date Jul 10, 2025
- Kabushiki Kaisha Toshiba
- Daisuke HIRATSUKA
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD TO MAP THICKNESS VARIATIONS OF SUBSTRATES IN MANU...
- Publication number 20250224228
- Publication date Jul 10, 2025
- Applied Materials, Inc.
- Mehdi Vaez-Iravani
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
APPARATUS AND METHOD FOR MANUFACTURING ELECTRODE
- Publication number 20250219047
- Publication date Jul 3, 2025
- Samsung SDI Co., Ltd.
- Hyun Woo KIM
- B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information Patent Application
REFRACTIVE INDEX DISTRIBUTION MEASUREMENT DEVICE, FILM THICKNESS DI...
- Publication number 20250216192
- Publication date Jul 3, 2025
- Hamamatsu Photonics K.K.
- Kunihiko TSUCHIYA
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING ELECTRODE PLATE THICKNESS
- Publication number 20250216191
- Publication date Jul 3, 2025
- Samsung SDI Co., Ltd.
- So Hun KIM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Optical Sensor and Method for use in Detecting the Deposition of Ma...
- Publication number 20250207910
- Publication date Jun 26, 2025
- University of York
- Thomas Fraser-Krauss
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COMBINED PHOTOTHERMAL AND OCD FOR SEMI-OPAQUE STRUCTURES
- Publication number 20250207909
- Publication date Jun 26, 2025
- NOVA LTD
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Application
OBJECT THICKNESS MEASURING APPARATUS AND METHOD
- Publication number 20250207908
- Publication date Jun 26, 2025
- Samsung SDI Co., Ltd.
- Joonkil Kim
- G01 - MEASURING TESTING
Information Patent Application
USING UN-PATTERNED AND PATTERNED METROLOGY TARGETS FOR IN SITU PROC...
- Publication number 20250210385
- Publication date Jun 26, 2025
- Applied Materials, Inc.
- Shifang Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE AND METHOD FOR MEASURING WAFERS
- Publication number 20250198743
- Publication date Jun 19, 2025
- PRECITEC OPTRONIK GMBH
- Stephan Weiß
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR INSPECTING THICKNESS
- Publication number 20250198746
- Publication date Jun 19, 2025
- ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Sang Kyu LIM
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR TERAHERTZ TOMOGRAPHY ANALYSIS OF GOLF BALLS
- Publication number 20250198918
- Publication date Jun 19, 2025
- Acushnet Company
- Robert Blink
- G01 - MEASURING TESTING
Information Patent Application
Unwinding Device for Manufacturing Secondary Battery and Secondary...
- Publication number 20250201893
- Publication date Jun 19, 2025
- LG ENERGY SOLUTION, LTD.
- Yeong-Tae Gwon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SENSOR SYSTEM AND METHOD TO DETECT OVERLAPPING OBJECTS
- Publication number 20250198745
- Publication date Jun 19, 2025
- Datalogic IP Tech, S.r.l.
- Paolo Tosato
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR MEASURING HEIGHT
- Publication number 20250198747
- Publication date Jun 19, 2025
- MAGPIE TECH INC.
- Ung Chul Shin
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR PRINTING PACKAGES
- Publication number 20250187352
- Publication date Jun 12, 2025
- CRYOVAC, LLC
- Theodore F. Cyman
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Application
SECOND HARMONIC GENERATION (SHG) MEASUREMENT DEVICE AND MEASUREMENT...
- Publication number 20250189295
- Publication date Jun 12, 2025
- Samsung Electronics Co., Ltd.
- Hidaka Yasuhiro
- G01 - MEASURING TESTING
Information Patent Application
Device and Method for Measuring Wafers
- Publication number 20250189299
- Publication date Jun 12, 2025
- PRECITEC OPTRONIK GMBH
- Stephan Weiß
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR COMBINING HEIGHT MAPS AND PROFILOMETER FOR THE SAME
- Publication number 20250189303
- Publication date Jun 12, 2025
- MITUTOYO CORPORATION
- Ruslan Akhmedovich SEPKHANOV
- G01 - MEASURING TESTING
Information Patent Application
NON-CONTACT OPTIC PROBE FOR ENHANCING MEASUREMENT OF BACK DRILLING...
- Publication number 20250189304
- Publication date Jun 12, 2025
- CIN PHOWN TECHNOLOGY CO., LTD.
- FENG-CHIEH LI
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY AND PROCESS CONTROL FOR SEMICONDUCTOR MANUFACTURING
- Publication number 20250181941
- Publication date Jun 5, 2025
- NOVA LTD
- EITAN ROTHSTEIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PARALLEL PLATE MEASUREMENT APPARATUS FOR BATTERY THICKNESS MEASUREMENT
- Publication number 20250172380
- Publication date May 29, 2025
- Microsoft Technology Licensing, LLC
- Benjamin Edward NEWTON
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
DISPLAY INSPECTION APPARATUS OF WAVELENGTH SCAN TYPE
- Publication number 20250172381
- Publication date May 29, 2025
- Korea Electronics Technology Institute
- Kyoungwon PARK
- G01 - MEASURING TESTING
Information Patent Application
DETECTION SYSTEM, COMPENSATION METHOD, AND COMPUTER READABLE MEDIUM...
- Publication number 20250172379
- Publication date May 29, 2025
- CHROMA ATE INC.
- HAO-CHIANG HU
- G06 - COMPUTING CALCULATING COUNTING

for measuring thickness

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Metrology system and method for determining a characteristic of one...

Hybrid metrology method and system

Integration of an optical height sensor in mask inspection tools

Systems, methods, and apparatus for providing interactive inspectio...

Detection method and detection device for detecting concentration o...

Method for measuring thickness and optical properties of multi-laye...

Optical measurement apparatus, measuring method using the same, and...

In-situ wafer thickness and gap monitoring using through beam laser...

Chemical-dose substrate deposition monitoring

Vibration insensitive interferometry for measuring thickness and pr...

Polarization imaging system and polarization imaging method

Thin film characteristic measuring apparatus

Method and apparatus for determining the position of objects on a c...

Supercontinuum laser based web gauging system

Level sensor and substrate processing apparatus including the same

Method and system for measuring coating thickness

Method for checking a wall thickness of a container made of an at l...

Device for inspecting objects in a moving flow and machine comprisi...

High-resolution handheld OCT imaging system

System and method for conveying a tire component

System and method for the automated validation of a semi-anechoic c...

Method and system for monitoring hydraulic accumulator pressure

Pore measurement device

Identifying desirable T lymphocytes by change in mass responses

Ultra-spectrally selective terahertz band stop reflector

System and method to map thickness variations of substrates in manu...

Ice cream stick insertion device for ice cream products and method...

Tissue sample containers and related methods

Device and method for measuring height

Measuring apparatus

Patents Applicationslast 30 patents

TISSUE SAMPLE CONTAINERS AND RELATED METHODS

Coating Thickness Measuring Device and Coating Device Including the...

METHOD FOR DETERMINING A HEIGHT MAP USING A WHITE LIGHT INTERFEROME...

System and Method/Process for In-Field Measurements of Plant Crops

METHOD, SYSTEM AND SENSOR FOR ANALYSING A SAMPLE, AND PROCESS FOR M...

SYSTEMS AND METHODS FOR PERFORMING VEHICLE INSPECTIONS

MEASUREMENT METHOD AND MEASUREMENT SYSTEM

SYSTEM AND METHOD TO MAP THICKNESS VARIATIONS OF SUBSTRATES IN MANU...

APPARATUS AND METHOD FOR MANUFACTURING ELECTRODE

REFRACTIVE INDEX DISTRIBUTION MEASUREMENT DEVICE, FILM THICKNESS DI...

APPARATUS AND METHOD FOR MEASURING ELECTRODE PLATE THICKNESS

Optical Sensor and Method for use in Detecting the Deposition of Ma...

COMBINED PHOTOTHERMAL AND OCD FOR SEMI-OPAQUE STRUCTURES

OBJECT THICKNESS MEASURING APPARATUS AND METHOD

USING UN-PATTERNED AND PATTERNED METROLOGY TARGETS FOR IN SITU PROC...

DEVICE AND METHOD FOR MEASURING WAFERS

SYSTEM AND METHOD FOR INSPECTING THICKNESS

SYSTEM AND METHOD FOR TERAHERTZ TOMOGRAPHY ANALYSIS OF GOLF BALLS

Unwinding Device for Manufacturing Secondary Battery and Secondary...

SENSOR SYSTEM AND METHOD TO DETECT OVERLAPPING OBJECTS

DEVICE AND METHOD FOR MEASURING HEIGHT

SYSTEM AND METHOD FOR PRINTING PACKAGES

SECOND HARMONIC GENERATION (SHG) MEASUREMENT DEVICE AND MEASUREMENT...

Device and Method for Measuring Wafers

METHOD FOR COMBINING HEIGHT MAPS AND PROFILOMETER FOR THE SAME

NON-CONTACT OPTIC PROBE FOR ENHANCING MEASUREMENT OF BACK DRILLING...

METROLOGY AND PROCESS CONTROL FOR SEMICONDUCTOR MANUFACTURING

PARALLEL PLATE MEASUREMENT APPARATUS FOR BATTERY THICKNESS MEASUREMENT

DISPLAY INSPECTION APPARATUS OF WAVELENGTH SCAN TYPE

DETECTION SYSTEM, COMPENSATION METHOD, AND COMPUTER READABLE MEDIUM...