for measuring thickness

Industry

CPC
G01B11/06

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B11/00Measuring arrangements characterised by the use of optical means

Current Industry

G01B11/06for measuring thickness

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Device and method for measuring the profile of flat objects compris...
- Patent number 12,235,209
- Issue date Feb 25, 2025
- SENTRONICS METROLOGY GMBH
- Bernd Srocka
- G01 - MEASURING TESTING
Information Patent Grant
Method for operating a coating installation for producing layer sys...
- Patent number 12,234,547
- Issue date Feb 25, 2025
- Rodenstock GmbH
- Rüdiger Scherschlicht
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Detection device and image forming apparatus
- Patent number 12,235,092
- Issue date Feb 25, 2025
- Ricoh Company, Ltd.
- Shinya Ohishi
- G01 - MEASURING TESTING
Information Patent Grant
Metrology and process control for semiconductor manufacturing
- Patent number 12,236,364
- Issue date Feb 25, 2025
- Nova Ltd.
- Eitan Rothstein
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus to characterize substrates and films
- Patent number 12,235,091
- Issue date Feb 25, 2025
- Onto Innovation Inc.
- Jian Ding
- G01 - MEASURING TESTING
Information Patent Grant
Axial deviation estimating device
- Patent number 12,235,099
- Issue date Feb 25, 2025
- Denso Corporation
- Katsuhiko Kondo
- G01 - MEASURING TESTING
Information Patent Grant
Information processing apparatus, information processing method and...
- Patent number 12,228,390
- Issue date Feb 18, 2025
- Tokyo Electron Limited
- Masahide Tadokoro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for measuring a filter cake thickness
- Patent number 12,228,391
- Issue date Feb 18, 2025
- BHS-Sonthofen GmbH
- Martin Schäfer
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Optical fiber multi-parameter sensing system and method
- Patent number 12,222,286
- Issue date Feb 11, 2025
- Wenzhou University
- Zhihong Li
- G01 - MEASURING TESTING
Information Patent Grant
Method for calibrating a THz measuring apparatus, THz measuring met...
- Patent number 12,216,050
- Issue date Feb 4, 2025
- CiTEX Holding GmbH
- Roland Böhm
- G01 - MEASURING TESTING
Information Patent Grant
Automated non-contact thickness inspection and projection system
- Patent number 12,215,965
- Issue date Feb 4, 2025
- Lockheed Martin Corporation
- Shane Whitaker
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Conveyance apparatus, planarization apparatus, and article manufact...
- Patent number 12,214,529
- Issue date Feb 4, 2025
- Canon Kabushiki Kaisha
- Takashi Hosaka
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Cleanroom compatible robotic end effector exchange system
- Patent number 12,217,997
- Issue date Feb 4, 2025
- KLA Corporation
- Benjamin James Thomas Clarke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems of optical inspection of electronic device manu...
- Patent number 12,215,966
- Issue date Feb 4, 2025
- Applied Materials, Inc.
- Mohsin Waqar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for measuring thickness and physical properties of thin film...
- Patent number 12,216,044
- Issue date Feb 4, 2025
- Seoul National University R&DB Foundation
- Heui Jae Pahk
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact apparatus for measuring wafer thickness
- Patent number 12,209,853
- Issue date Jan 28, 2025
- Fujikoshi Machinery Corp.
- Chihiro Miyagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spatial pattern loading measurement with imaging metrology
- Patent number 12,211,717
- Issue date Jan 28, 2025
- Applied Materials, Inc.
- Eric Chin Hong Ng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fiber-optic based material property measurement system and related...
- Patent number 12,209,961
- Issue date Jan 28, 2025
- University of Virginia Patent Foundation
- Brian M. Foley
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for controlling the printing on cable
- Patent number 12,204,963
- Issue date Jan 21, 2025
- Encore Wire Corporation
- William T. Bigbee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
THz measuring and THz measuring device for measuring a corrugated pipe
- Patent number 12,203,740
- Issue date Jan 21, 2025
- CiTEX Holding GmbH
- Jan Hendrik Petermann
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement system
- Patent number 12,196,550
- Issue date Jan 14, 2025
- National Cheng Kung University
- Chien-Sheng Liu
- G01 - MEASURING TESTING
Information Patent Grant
Laser processing device, laser processing system and laser processi...
- Patent number 12,191,168
- Issue date Jan 7, 2025
- Tokyo Electron Limited
- Hirotoshi Mori
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Apparatus comprising at least one THz device and method of operatin...
- Patent number 12,188,859
- Issue date Jan 7, 2025
- HELMUT FISCHER GMBH INSTITUT FÜR ELEKRONIK UND MESSTECHNIK
- Rüdiger Mästle
- G01 - MEASURING TESTING
Information Patent Grant
Electrochemical deposition system including optical probes
- Patent number 12,180,607
- Issue date Dec 31, 2024
- Lam Research Corporation
- Andrew James Pfau
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Crop state map generation and control system
- Patent number 12,178,157
- Issue date Dec 31, 2024
- Deere & Company
- Nathan R. Vandike
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Facility and method for measuring the thickness of the walls of gla...
- Patent number 12,181,266
- Issue date Dec 31, 2024
- TIAMA
- Marc Leconte
- G01 - MEASURING TESTING
Information Patent Grant
Measuring method
- Patent number 12,181,267
- Issue date Dec 31, 2024
- Disco Corporation
- Yasukuni Nomura
- G01 - MEASURING TESTING
Information Patent Grant
Measurement tool for cable-preparation system
- Patent number 12,176,689
- Issue date Dec 24, 2024
- 3M Innovative Properties Company
- Douglas B. Gundel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nanopore fabrication
- Patent number 12,168,265
- Issue date Dec 17, 2024
- Technion Research & Development Foundation Limited
- Amit Meller
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Digital holography for alignment in layer deposition
- Patent number 12,163,783
- Issue date Dec 10, 2024
- Applied Materials, Inc.
- Yeishin Tung
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
EPOXY MOLDING COMPOUND THICKNESS MEASUREMENT METHOD AND MEASUREMENT...
- Publication number 20250060212
- Publication date Feb 20, 2025
- ACTRO CO., LTD
- Seong Hoon OH
- G01 - MEASURING TESTING
Information Patent Application
ANALYZING SYSTEM FOR IDENTIFYING AND MEASURING SOLAR PANEL MODULE
- Publication number 20250061598
- Publication date Feb 20, 2025
- NATIONAL UNIVERSITY OF TAINAN
- Yao-Hsien FU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS
- Publication number 20250052704
- Publication date Feb 13, 2025
- NOVA MEASURING INSTRUMENTS INC.
- Wei Ti LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MEASURING THE THICKNESS OF A VARNISH LAYER
- Publication number 20250044077
- Publication date Feb 6, 2025
- ARCELORMITTAL
- Nathalie LABBE
- G01 - MEASURING TESTING
Information Patent Application
THIN FILM THICKNESS ADJUSTMENTS FOR THREE-DIMENSIONAL INTERFEROMETR...
- Publication number 20250044073
- Publication date Feb 6, 2025
- ORBOTECH LTD.
- Yulia Lovsky
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM, APPARATUS AND METHOD FOR IMPROVED LOCATION IDENTIFICATION W...
- Publication number 20250033212
- Publication date Jan 30, 2025
- Gecko Robotics, Inc.
- Alberto Pinero
- B60 - VEHICLES IN GENERAL
Information Patent Application
CONTACTLESS DETERMINING A PHYSICAL FEATURE OF A TARGET ITEM
- Publication number 20250035428
- Publication date Jan 30, 2025
- DAS-NANO TECH S.L.
- Mikel SUBIZA GARCÍA
- G01 - MEASURING TESTING
Information Patent Application
CHIP MEASUREMENT SYSTEM
- Publication number 20250037543
- Publication date Jan 30, 2025
- Yasushi SHIGETA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING THE THICKNESS OF ONE OR MORE LAY...
- Publication number 20250020449
- Publication date Jan 16, 2025
- SYNCRO S.R.L.
- Marco BRANCA
- G01 - MEASURING TESTING
Information Patent Application
SENSOR SYSTEM FOR DETERMINING A THICKNESS OF A MATERIAL BODY
- Publication number 20250020450
- Publication date Jan 16, 2025
- Cargill, Incorporated
- Amina ALAOUI
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR CONTINUOUSLY MEASURING THICKNESS OF THIN MATERIAL, ME...
- Publication number 20250020451
- Publication date Jan 16, 2025
- KOREA ELECTROTECHNOLOGY RESEARCH INSTITUTE
- In Sung PARK
- G01 - MEASURING TESTING
Information Patent Application
PROCESSING METHOD OF CUTTING THROUGH WORKPIECE AND PROCESSING SYSTEM
- Publication number 20250018604
- Publication date Jan 16, 2025
- TCL ZHONGHUAN RENEWABLE ENERGY TECHNOLOGY CO., LTD.
- Haoming ZHANG
- B28 - WORKING CEMENT, CLAY, OR STONE
Information Patent Application
SAMPLE THICKNESS METROLOGY USING FOCUSED BEAM INTERFERENCE
- Publication number 20250012560
- Publication date Jan 9, 2025
- Applied Materials, Inc.
- Venkatakaushik Voleti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL METROLOGY WITH INFLUENCE MAP OF UNKNOWN SECTION
- Publication number 20250012737
- Publication date Jan 9, 2025
- ONTO INNOVATION INC.
- Yiliang LIU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HYBRID METROLOGY METHOD AND SYSTEM
- Publication number 20250003882
- Publication date Jan 2, 2025
- NOVA LTD
- GILAD BARAK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MATERIAL MEASUREMENT SYSTEM AND METHOD
- Publication number 20250003734
- Publication date Jan 2, 2025
- Samsung Electronics Co., Ltd.
- Sungyoon Ryu
- G01 - MEASURING TESTING
Information Patent Application
HIGH TEMPERATURE MOLD GAP MEASUREMENT USING OPTICAL FIBER INTERFERO...
- Publication number 20250003735
- Publication date Jan 2, 2025
- THE CURATORS OF THE UNIVERSITY OF MISSOURI
- Jie Huang
- G01 - MEASURING TESTING
Information Patent Application
DETECTION OF SNOW AND ICE ACCUMULATION ON A VEHICLE
- Publication number 20250002025
- Publication date Jan 2, 2025
- GM Cruise Holdings LLC
- Jeffrey Brandon
- B60 - VEHICLES IN GENERAL
Information Patent Application
COMBINATION OF MULTIWAVELENGTH RAMAN AND SPECTROSCOPIC ELLIPSOMETRY...
- Publication number 20240418633
- Publication date Dec 19, 2024
- KLA Corporation
- Shova Subedi
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SENSOR FOR FILM THICKNESS MEASUREMENT
- Publication number 20240418501
- Publication date Dec 19, 2024
- TOKYO ELECTRON LIMITED
- Ivan MALEEV
- G01 - MEASURING TESTING
Information Patent Application
CAP-SHAPED PORTABLE STADIOMETER
- Publication number 20240415411
- Publication date Dec 19, 2024
- Andrew LEE
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
IN-SITU FILM GROWTH RATE MONITORING APPARATUS, SYSTEMS, AND METHODS...
- Publication number 20240410078
- Publication date Dec 12, 2024
- Applied Materials, Inc.
- Zhepeng CONG
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
COMPACT INTRAORAL SCANNER WITH IMPROVED AXIAL MAGNIFICATION
- Publication number 20240398235
- Publication date Dec 5, 2024
- Align Technology, Inc.
- Yossef ATIYA
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
FULL WAFER THICKNESS MAP REFLECTOMETRY
- Publication number 20240401930
- Publication date Dec 5, 2024
- GLOBALWAFERS CO., LTD.
- Benno Orschel
- G01 - MEASURING TESTING
Information Patent Application
WAFER THICKNESS MEASUREMENT DEVICE AND METHOD FOR SAME
- Publication number 20240401931
- Publication date Dec 5, 2024
- KOBELCO RESEARCH INSTITUTE, INC.
- Kazuhiko TAHARA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR EXTRACTING OVERLAPPING PEAKS BASED ON MODE DE...
- Publication number 20240393177
- Publication date Nov 28, 2024
- Optosky (Xiamen) Photonics Inc
- HongFei Liu
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM, DEVICE AND METHOD FOR MEASURING THE INTERIOR REFRACTORY LIN...
- Publication number 20240393102
- Publication date Nov 28, 2024
- PROCESS METRIX, LLC
- Michel Bonin
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND METHOD FOR ANALYZING FAULTS
- Publication number 20240393258
- Publication date Nov 28, 2024
- WICKON HIGHTECH GMBH
- Roman WIESER
- G01 - MEASURING TESTING
Information Patent Application
Assembly for Measuring the Thickness of a Continuous Material Web
- Publication number 20240384981
- Publication date Nov 21, 2024
- MATTHEWS INTERNATIONAL GMBH
- Thomas HACKFORT
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
SUBSTRATE PROCESSING SYSTEM AND FILM THICKNESS MEASURING METHOD
- Publication number 20240387301
- Publication date Nov 21, 2024
- TOKYO ELECTRON LIMITED
- Hirokazu KYOKANE
- H01 - BASIC ELECTRIC ELEMENTS

for measuring thickness

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Device and method for measuring the profile of flat objects compris...

Method for operating a coating installation for producing layer sys...

Detection device and image forming apparatus

Metrology and process control for semiconductor manufacturing

Apparatus to characterize substrates and films

Axial deviation estimating device

Information processing apparatus, information processing method and...

Device and method for measuring a filter cake thickness

Optical fiber multi-parameter sensing system and method

Method for calibrating a THz measuring apparatus, THz measuring met...

Automated non-contact thickness inspection and projection system

Conveyance apparatus, planarization apparatus, and article manufact...

Cleanroom compatible robotic end effector exchange system

Methods and systems of optical inspection of electronic device manu...

System for measuring thickness and physical properties of thin film...

Non-contact apparatus for measuring wafer thickness

Spatial pattern loading measurement with imaging metrology

Fiber-optic based material property measurement system and related...

Apparatus for controlling the printing on cable

THz measuring and THz measuring device for measuring a corrugated pipe

Optical measurement system

Laser processing device, laser processing system and laser processi...

Apparatus comprising at least one THz device and method of operatin...

Electrochemical deposition system including optical probes

Crop state map generation and control system

Facility and method for measuring the thickness of the walls of gla...

Measuring method

Measurement tool for cable-preparation system

Nanopore fabrication

Digital holography for alignment in layer deposition

Patents Applicationslast 30 patents

EPOXY MOLDING COMPOUND THICKNESS MEASUREMENT METHOD AND MEASUREMENT...

ANALYZING SYSTEM FOR IDENTIFYING AND MEASURING SOLAR PANEL MODULE

METHOD AND SYSTEM FOR NON-DESTRUCTIVE METROLOGY OF THIN LAYERS

METHOD FOR MEASURING THE THICKNESS OF A VARNISH LAYER

THIN FILM THICKNESS ADJUSTMENTS FOR THREE-DIMENSIONAL INTERFEROMETR...

SYSTEM, APPARATUS AND METHOD FOR IMPROVED LOCATION IDENTIFICATION W...

CONTACTLESS DETERMINING A PHYSICAL FEATURE OF A TARGET ITEM

CHIP MEASUREMENT SYSTEM

METHOD AND APPARATUS FOR MEASURING THE THICKNESS OF ONE OR MORE LAY...

SENSOR SYSTEM FOR DETERMINING A THICKNESS OF A MATERIAL BODY

APPARATUS FOR CONTINUOUSLY MEASURING THICKNESS OF THIN MATERIAL, ME...

PROCESSING METHOD OF CUTTING THROUGH WORKPIECE AND PROCESSING SYSTEM

SAMPLE THICKNESS METROLOGY USING FOCUSED BEAM INTERFERENCE

OPTICAL METROLOGY WITH INFLUENCE MAP OF UNKNOWN SECTION

HYBRID METROLOGY METHOD AND SYSTEM

MATERIAL MEASUREMENT SYSTEM AND METHOD

HIGH TEMPERATURE MOLD GAP MEASUREMENT USING OPTICAL FIBER INTERFERO...

DETECTION OF SNOW AND ICE ACCUMULATION ON A VEHICLE

COMBINATION OF MULTIWAVELENGTH RAMAN AND SPECTROSCOPIC ELLIPSOMETRY...

OPTICAL SENSOR FOR FILM THICKNESS MEASUREMENT

CAP-SHAPED PORTABLE STADIOMETER

IN-SITU FILM GROWTH RATE MONITORING APPARATUS, SYSTEMS, AND METHODS...

COMPACT INTRAORAL SCANNER WITH IMPROVED AXIAL MAGNIFICATION

FULL WAFER THICKNESS MAP REFLECTOMETRY

WAFER THICKNESS MEASUREMENT DEVICE AND METHOD FOR SAME

METHOD AND DEVICE FOR EXTRACTING OVERLAPPING PEAKS BASED ON MODE DE...

SYSTEM, DEVICE AND METHOD FOR MEASURING THE INTERIOR REFRACTORY LIN...

INSPECTION SYSTEM AND METHOD FOR ANALYZING FAULTS

Assembly for Measuring the Thickness of a Continuous Material Web

SUBSTRATE PROCESSING SYSTEM AND FILM THICKNESS MEASURING METHOD