Claims
- 1. An optical waveguide, comprising a substrate made of a solid material and multiple layers of solid state material disposed on the substrate, and a non-solid core extending through at least one of said multiple layers, whereby said non-solid core may be used to contain a sample material whose light transmission, absorption, and/or interference characteristics are to be measured.
- 2. An optical waveguide as recited in claim 1, wherein said substrate comprises Silicon (Si) and said multiple layers include SiO2 and SiN.
- 3. An optical waveguide as recited in claim 2, wherein said non-solid core has an index of refraction which is lower than the index of refraction of the surrounding solid-state material, and wherein light can be transmitted with low loss through the non-solid core.
- 4. An optical waveguide as recited in claim 1, wherein said optical waveguide is generally structured as an anti-resonant reflecting optical waveguide (ARROW).
- 5. An optical waveguide as recited in claim 1, comprising a antiresonant reflecting layers adjacent to said non-solid core, whereby light is substantially prevented from leaking out of said core in a transverse direction.
- 6. An optical waveguide as recited in claim 1, further comprising a perpendicular waveguide portion for use in injecting light into said non-solid core for measuring fluorescence characteristics associated with the sample material.
- 7. An optical waveguide as recited in claim 1, wherein the non-solid core has a substantially square cross-section.
- 8. An optical waveguide as recited in claim 1, wherein the non-solid core has a substantially rectangular cross-section.
- 9. An optical waveguide as recited in claim 1, wherein the non-solid core has a substantially semicircular cross-section.
- 10. An optical waveguide as recited in claim 1, further comprising a sample-injection port for injecting a fluid into said non-solid core, said sample injection port being oriented substantially perpendicularly with respect to a longitudinal axis of said non-solid core.
- 11. An optical waveguide as recited in claim 1, wherein said substrate comprises a semiconductor material.
- 12. An optical waveguide as recited in claim 1, wherein said substrate comprises a metal.
- 13. An optical waveguide as recited in claim 1, wherein said substrate comprises a plastic.
- 14. An optical waveguide as recited in claim 1, wherein said substrate comprises a polymer.
- 15. An optical waveguide as recited in claim 1, wherein said substrate comprises a Silicon based glass.
- 16. An optical waveguide as recited in claim 1, wherein said substrate comprises alumina.
- 17. An optical waveguide as recited in claim 1, wherein said substrate comprises sapphire.
- 18. An optical waveguide as recited in claim 1, wherein the layer of solid state material through which said non-solid core extends comprises a material deposited by chemical vapor deposition.
- 19. An optical waveguide as recited in claim 1, wherein the layer of solid state material through which said non-solid core extends comprises silicon oxy-nitride.
- 20. An optical waveguide as recited in claim 1, wherein the layer of solid state material through which said non-solid core extends comprises a material sputtered onto said substrate.
- 21. An optical waveguide as recited in claim 1, wherein the layer of solid state material through which said non-solid core extends comprises a material evaporated onto said substrate.
- 22. An optical waveguide as recited in claim 1, wherein the layer of solid state material through which said non-solid core extends comprises silicon dioxide.
- 23. An optical waveguide as recited in claim 1, wherein the layer of solid state material through which said non-solid core extends comprises silicon nitride.
- 24. An optical waveguide as recited in claim 1, wherein the layer of solid state material through which said non-solid core extends comprises silicon-oxynitride.
- 25. An optical waveguide as recited in claim 1, wherein the layer of solid state material through which said non-solid core extends comprises a material spun-on said substrate.
- 26. An optical waveguide as recited in claim 1, wherein the layer of solid state material through which said non-solid core extends comprises a material dip coated onto said substrate.
- 27. An optical waveguide as recited in claim 1, wherein the waveguide is made using a sacrificial layer material comprising a metal.
- 28. An optical waveguide as recited in claim 1, wherein the waveguide is made using a sacrificial layer material comprising a polymer.
- 29. An optical waveguide generally structured as an anti-resonant reflecting optical waveguide (ARROW), comprising:
a substrate and multiple layers of solid state material, including SiO2 and SiN, disposed on the substrate, and a non-solid core extending through at least one of said multiple layers, wherein said non-solid core has an index of refraction which is lower than the index of refraction of the surrounding solid-state material, and wherein light can be transmitted with low loss through the non-solid core; a Fabry-Perot reflector adjacent to said non-solid core, for substantially preventing light from leaking out of said core in a transverse direction; a perpendicular waveguide portion for use in injecting light into said non-solid core for measuring fluorescence characteristics associated with the sample material; and a sample-injection port for injecting a fluid into said non-solid core, said sample injection port being oriented substantially perpendicularly with respect to a longitudinal axis of said non-solid core; whereby said non-solid core may be used to contain a sample material whose light transmission, absorption, and/or interference characteristics are to be measured.
- 30. An optical waveguide as recited in claim 29, wherein the non-solid core has a substantially square cross-section.
- 31. An optical waveguide as recited in claim 29, wherein the non-solid core has a substantially rectangular cross-section.
- 32. An optical waveguide as recited in claim 29, wherein the non-solid core has a substantially semicircular cross-section.
- 33. An optical measurement system, comprising:
(a) an optical waveguide comprising a channel surrounded by a solid-state material, including a Fabry-Perot reflector adjacent to said channel, whereby light is substantially prevented from leaking out of said channel in a transverse direction; (b) means for injecting into said channel a sample material having an index of refraction which is lower than the index of refraction of the surrounding solid-state material; and (c) means for injecting light into said channel, wherein the injected light is guided within the channel and through the sample material; (d) a perpendicular waveguide portion for use in injecting light into the channel; and (e) means for measuring selected optical properties associated with the sample.
- 34. A system as recited in claim 33, wherein said selected optical properties include transmission, absorption, interference and/or fluorescence characteristics associated with said sample material over macroscopic distances within the channel.
- 35. A system as recited in claim 33, wherein the channel has a length which is optimized for a desired range of wavelengths.
- 36. A system as recited in claim 33, wherein said optical waveguide comprises a Silicon (Si) substrate and multiple layers of solid state material disposed on the substrate, and a non-solid core extending through at least one of said multiple layers, whereby said non-solid core may be used to contain the sample material.
- 37. A system as recited in claim 36, wherein said multiple layers include SiO2 and SiN.
- 38. A system as recited in claim 33, wherein said non-solid core has an index of refraction which is lower than the index of refraction of the surrounding solid-state material, and wherein light can be transmitted with low loss through the non-solid core.
- 39. A system as recited in claim 33, wherein said optical waveguide is generally structured as an anti-resonant reflecting optical waveguide (ARROW).
- 40. A system as recited in claim 33, wherein the non-solid core has a substantially square cross-section.
- 41. A system as recited in claim 33, wherein the non-solid core has a substantially rectangular cross-section.
- 42. A system as recited in claim 33, wherein the non-solid core has a substantially semicircular cross-section.
- 43. A system for making parallel optical measurements, comprising:
(a) an optical waveguide comprising a generally planar solid-state material and a plurality of parallel channels within said solid-state material, including a Fabry-Perot reflector adjacent to each channel, whereby light injected into said channels is substantially prevented from leaking out of said channels in a transverse direction; (b) means for injecting through each of said channels a sample material having an index of refraction which is lower than the index of refraction of the surrounding solid-state material; (c) a perpendicular waveguide portion for use in injecting light into the channels in a direction which is generally perpendicular to the orientation of said channels and the flow of said sample materials; and (d) means for measuring selected optical properties associated with the sample materials.
- 44. A system as recited in claim 43, wherein said selected optical properties include transmission, absorption, interference and/or fluorescence characteristics associated with said sample materials over macroscopic distances within the channel.
- 45. An integrated optical tweezers device for use in controlling the placement of small sample particles, comprising:
an optical waveguide comprising a tapered channel surrounded by a solid-state material, including a Fabry-Perot reflector adjacent to said tapered channel, whereby light, once injected, is substantially prevented from leaking out of said channel in a transverse direction, wherein at least one dimension of said tapered channel is tapered so as to create designed light intensity gradients within said channel.
- 46. A device as recited in claim 45, further comprising means for injecting into said channel a sample material having an index of refraction which is lower than the index of refraction of the surrounding solid-state material.
- 47. A device as recited in claim 45, further comprising means for injecting light into said tapered channel, wherein the injected light is guided within the channel and through the sample material.
- 48. A device as recited in claim 45, wherein said light intensity gradients are designed to exert a holding force on small particles of micron or sub-micron size.
- 49. A device as recited in claim 45, and further comprising a perpendicular waveguide portion for use in injecting light into said channel in a direction which is substantially perpendicular to a longitudinal axis of said tapered channel.
- 50. A device as recited in claim 45, and further comprising:
means for injecting into said channel a sample material having an index of refraction which is lower than the index of refraction of the surrounding solid-state material; means for injecting light into said tapered channel, wherein the injected light is guided within the channel and through the sample material; and a perpendicular waveguide portion for use in injecting light into said channel in a direction which is substantially perpendicular to a longitudinal axis of said tapered channel; and wherein said light intensity gradients are designed to exert a holding force on small particles of micron or sub-micron size.
CROSS REFERENCE
[0001] This application claims the benefit of the filing date of U.S. Provisional Application No. 60/479,376, filed Jun. 16, 2003, “Apparatus For Optical Measurements On Low-Index Non-Solid Materials Based On Arrow Waveguides,” which is hereby incorporated by reference in its entirety.
Provisional Applications (1)
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Number |
Date |
Country |
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60479376 |
Jun 2003 |
US |