Claims
- 1. A melting point detection assembly for measuring the melting points of an array of material samples supported on a substrate, said assembly comprising:
a thermal chamber that retains said substrate and controls a temperature of at least one region of said substrate; a light system that provides at least one optical signal to said material samples and monitors said at least one optical signal to determine a melting point of said material samples; and a computer system interconnected to said thermal chamber to control and monitor said at least one thermal profile, said computer system also being interconnected to said light system to obtain data provided by said at least one optical signal.
- 2. The assembly according to claim 1, wherein said thermal chamber comprises:
a thermal base having a region that is configured to contain said substrate; and a thermal cover coupled to said thermal base, thereby enclosing said substrate within said thermal chamber.
- 3. The assembly according to claim 1, wherein said thermal chamber comprises a plurality of holes that provide a plurality of optical paths to said substrate, said plurality of optical paths allow said light system to transmit said at least one optical signal.
- 4. The assembly according to claim 1, wherein said thermal chamber comprises a conductive or convective heat transfer device.
- 5. The assembly according to claim 1, wherein said thermal chamber comprises at least one thermal sensor.
- 6. The apparatus according to claim 5, wherein said at least one thermal sensor is selected from the group consisting of a resistance temperature detector, a thermocouple and a thermistor.
- 7. The assembly according to claim 1, wherein said light system comprises:
an array of signal emitters mounted at a position distal to a first side of said thermal chamber, wherein said array of signal emitters transmits said at least one optical signal along an optical path that passes through a region of said substrate; a first polarization filter mounted between said array of light emitters and said thermal chamber; an array of signal detectors mounted at a second position distal to a second side of said thermal chamber, wherein at least one of said signal detectors is aligned with at least one of said optical paths; and a second polarization filter mounted between said array of signal detectors and said thermal chamber.
- 8. The assembly according to claim 7, wherein said first polarization filter has a first polarization angle and said second polarization filter has a second polarization angle, wherein the difference between said first polarization angle and said second polarization angle is set a predetermined value.
- 9. The assembly according to claim 8, wherein said difference is 90°, wherein said 90° difference diminishes an optical signal that is not altered by one of said material samples.
- 10. The assembly according to claim 7, wherein said array of signal emitters comprises an array that provides light having a wavelength of 300-2000 nm, which is optionally polarized, focused or collimated.
- 11. The assembly according to claim 1, wherein said thermal chamber controls said at least one thermal profile applied to different regions of said substrate.
- 12. The assembly according to claim 7, wherein said array of signal detectors comprises an array of photo diodes.
- 13. The assembly according to claim 7, wherein said array of signal detectors comprises at least one charge-coupled device.
- 14. The assembly according to claim 1, wherein the light system is further configured to perform birefringence measurements on said material samples.
- 15. The assembly according to claim 1, wherein said light system is further configured to perform light scattering measurements on said material samples.
- 16. The assembly according to claim 1, wherein said computer system stores data obtained from said at least one optical signal.
- 17. The assembly according to claim 1, wherein said at least one region comprises said substrate in its entirety.
- 18. The assembly according to claim 1, wherein said light system is configured to use a transmissive light technique that monitors said at least one optical signal that transmits through said materials.
- 19. The assembly according to claim 1, wherein said light system is configured to use a reflective light technique that monitors said at least one optical signal that is reflected by said materials.
- 20. A method for determining a melting point for a plurality of crystalline structures, said method comprising:
monitoring said plurality of crystalline structures with an optical detection technique; heating said plurality of crystalline structures at a user-defined rate; and recording a temperature for each one of said plurality of crystalline structures when each one of said plurality of crystalline structures undergoes a phase transition.
- 21. The method according to claim 20, wherein said optical detection technique comprises a transmissive birefringence testing technique.
- 22. The method according to claim 20, wherein said optical detection technique comprises a reflective birefringence testing technique.
- 23. The method according to claim 20, wherein said optical detection technique comprises a light scattering technique.
- 24. The method according to claim 20, wherein said heating comprises maintaining a uniform temperature throughout said plurality of crystalline structures.
- 25. The method according to claim 20, wherein said heating comprises heating said plurality of crystalline structures up to a user-defined maximum temperature.
- 26. The method according to claim 20, wherein said phase transition comprises a transition between solid phases.
- 27. The method according to claim 20, wherein said phase transition comprises a solid-to-liquid phase transition.
- 28. An in-situ monitoring apparatus that monitors a plurality of members that are subjected to at least one crystallization condition, said apparatus comprising:
a light projection system that transmits at least one light signal to said plurality of members; a light detection system that receives a portion of said at least one light signal that is reflected by said plurality of members, said light detection system configured to monitor said plurality of members for crystallization in-situ.
- 29. The apparatus of claim 28, wherein said light projection system comprises:
a light source that provides said at least one light signal; a beam splitter that redirects a portion of said at least one light signal to one of said plurality of members; and a first polarization plate coupled between said light projection system and said light detection system, said first polarization plate configured to block said at least one light signal that is not altered by one of said plurality of members.
- 30. The apparatus according to claim 29, wherein said beam splitter is configured to allow at least one reflected light signal to pass therethrough to said light detection system.
- 31. The apparatus according to claim 29 further comprising a second polarization filter coupled adjacent to said light projection system.
- 32. The apparatus according to claim 31, wherein said second polarization filter has a polarization angle aligned about 90° with respect to a polarization angle of said first polarization filter, thereby diminishing any said at least one light signal that is not altered by one of said plurality of materials.
- 33. The apparatus according to claim 28, wherein said light detection system detects said at least one light signal if said at least one light signal has its polarization altered by said plurality of members.
- 34. The apparatus according to claim 33, wherein said at least one light signal undergoes a polarization change if said plurality of members contains a crystalline form.
- 35. The apparatus according to claim 29, wherein said light source provides said at least one light signal having a wavelength of 300-2000 nm, which is optionally polarized, focused or collimated.
- 36. The apparatus according to claim 28, wherein said light detection system comprises:
a lens that receives each said at least one light signal; a detector that monitors each said plurality of members in-situ to determine if a crystalline structure forms in any of said plurality of members.
- 37. The apparatus according to claim 36, wherein said lens is a telecentric lens, said telecentric lens minimizes light distortion of said at least one light signal received by said lens.
- 38. The apparatus according to claim 36, wherein said detector comprises a camera, a digital camera, a television camera, a video camera, or a charge-coupled device.
- 39. The apparatus according to claim 28, wherein said light detection system is configured to continuously monitor a portion of said plurality of members.
- 40. The apparatus according to claim 28, wherein said light detection system provides data to a computer, wherein said computer determines whether said plurality of members should be subjected to different crystallization conditions.
- 41. A method for monitoring, in-situ, a plurality of members subjected to at least one crystallization condition, said method comprising:
subjecting said plurality of members to said at least one crystallization condition to promote crystallization of said plurality of members; monitoring said plurality of members in-situ, wherein said monitoring is performed using a reflective or transmissive birefringence optical detection technique; and obtaining data from said monitoring to provide an indication if any of said plurality of members have crystallized.
- 42. The method according to claim 41 further comprising subjecting said library members to a different crystallization condition when said data indicates that a substantial portion of said plurality of members have not crystallized after a predetermined period of time.
- 43. The method according to claim 42, wherein said monitoring comprises:
providing at least one light signal to said plurality of members; reflecting said at least one light signal from said plurality of members, wherein said at least one light signal becomes at least one altered light signal if said plurality of members contains at least one crystalline structure; and detecting said at least one altered light signal.
- 44. The method according to claim 43, wherein said light signal has optical properties, said optical properties are altered when said light signal passes through said crystalline structure, thereby becoming said altered signal.
- 45. The method according to claim 41, wherein said determining comprises analyzing said data to determine if any said plurality of members have crystallized.
CROSS-REFERENCE TO A RELATED PATENT APPLICATION
[0001] This application claims the benefit of U.S. Provisional Application No. 60/311,332, filed Aug. 10, 2001, the disclosure of which is hereby incorporated by reference in its entirety.
Provisional Applications (1)
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Number |
Date |
Country |
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60311332 |
Aug 2001 |
US |