Information
-
Patent Grant
-
6730904
-
Patent Number
6,730,904
-
Date Filed
Wednesday, April 30, 200321 years ago
-
Date Issued
Tuesday, May 4, 200420 years ago
-
Inventors
-
Original Assignees
-
Examiners
- Lee; John H.
- Smith, II; Johnnie L
Agents
- Popovici; Andrei
- Fishman; Bella
-
CPC
-
US Classifications
Field of Search
US
- 250 288
- 250 281
- 250 292
- 250 282
- 250 287
-
International Classifications
-
Abstract
An electrodynamic ion guide for a mass spectrometer comprises multiple sections having different guiding field central axes. At least one of the guiding fields can be an asymmetric guiding field having a quadrupole component and a dipole component. The ion guide can be positioned in a guide chamber with the first field central axis facing an inlet aperture and the second field central axis facing an outlet aperture. The ion guide allows the efficient use of a guide chamber with no line of sight from the inlet aperture to the outlet aperture, such that undesired liquid droplets entering the guide chamber through the inlet aperture do not exit through the outlet aperture. In the preferred embodiment, the ion guide comprises a plurality of longitudinally-concatenated, progressively narrowing segments, each segment including four flat plates arranged symmetrically about a central geometric axis.
Description
FIELD OF THE INVENTION
The invention in general relates to mass spectrometry, and in particular to electrodynamic ion guide structures suitable for use in mass spectrometers.
BACKGROUND OF THE INVENTION
Methods of mass analyzing chemical substances in the liquid phase often employ electrodynamic guiding structures for guiding ions into a mass analyzer. In a common approach, charged liquid droplets are generated in an ionization chamber using an atmospheric pressure ionization method such as electrospray ionization (ESI) or atmospheric pressure chemical ionization (APCI). The droplets are desolvated, and pass into a vacuum chamber through an orifice that limits the gas flow into the chamber. Gas with entrained ions exits the vacuum restriction and expands to form a shock structure. Ions and other gas can be removed from the silent zone of the shock structure by inserting a skimmer cone through a Mach disk into the silent zone, and allowing the ions to pass through a hole in the tip of the skimmer cone into the next vacuum chamber. The ions in the second vacuum chamber are captured by an electrodynamic ion guiding structure, and guided through the second chamber where more of the gas is pumped away. The ions next pass through a conductance-limiting aperture into a third vacuum chamber and into a mass analyzer. For further information on prior-art mass spectrometers and associated electrodynamic guiding structures see for example U.S. Pat. Nos. 4,963,736, 5,179,278, 5,248,875, 5,847,386, and 6,111,250.
Conventional mass spectrometers can suffer from large noise spikes in the mass spectrum generated by solvent droplets passing from the ionization chamber into the mass analyzer. In U.S. Pat. No. 5,750,993, Bier describes a method of reducing noise due to undesolved charged droplets or charged particles in an ion trap mass spectrometer coupled to an atmospheric pressure ionization source. A high DC voltage, for example about 300 V, is applied to an octopole guide or lens to block the passage of charged particles into the detector during analysis of trapped ions. The method described by Bier may not be optimally effective in preventing the passage of droplets into the analyzer.
SUMMARY OF THE INVENTION
In a preferred embodiment, the present invention provides a mass spectrometry apparatus comprising: an ionization chamber for forming ions of interest: a guide chamber having an inlet aperture in communication with the ionization chamber, and an outlet aperture; an electrodynamic ion guide positioned in the guide chamber, for guiding ions from the inlet aperture to the outlet aperture, a mass analyzer in communication with the outlet aperture, for receiving ions exiting the guide chamber through the outlet aperture; and an ion detector in communication with the mass analyzer, for receiving ions transmitted by the mass analyzer. The ion guide preferably comprises an inlet guide section for generating a first electrodynamic ion guiding field having a first generally longitudinal central field axis, situated such that ions transmitted through the inlet aperture enter the inlet guide section substantially along the first central field axis; and an outlet guide section longitudinally concatenated with the inlet guide section, for generating a second electrodynamic ion guiding field having a second generally longitudinal central field axis displaced from the first central field axis and substantially aligned with the outlet aperture. Displacing the inlet and outlet field axes allows reducing the noise caused by droplets, photons, and other neutral particles, while at the same time inserting the ions of interest along the central axis of the field. Inserting the ions of interest along the central axis of the guiding field allows maximizing the capture efficiency of the guide.
BRIEF DESCRIPTION OF THE DRAWINGS
The foregoing aspects and advantages of the present invention will become better understood upon reading the following detailed description and upon reference to the drawings where:
FIG. 1
is a schematic diagram of a mass spectrometry analysis apparatus according to a preferred embodiment of the present invention.
FIG. 2
shows a schematic longitudinal view of an electrodynamic ion guide comprising a plurality of progressively-narrowing segments defining three guide sections, according to a preferred embodiment of the present invention.
FIG. 3-A
shows a schematic transverse view of one of the segments of the ion guide of FIG.
2
.
FIG. 3-B
shows a transformer arrangement suitable for generating a symmetric quadrupole guiding field, according to an embodiment of the present invention.
FIG. 3-C
shows a transformer arrangement suitable for generating a guiding field having a symmetric quadrupole component and an asymmetric dipole component, according to an embodiment of the present invention.
FIG. 4-A
shows a schematic longitudinal view of an ion guide comprising a plurality of geometrically-identical segments defining two guide sections, according to an embodiment of the present invention.
FIGS. 4-B
and
4
-C show schematic longitudinal and transverse views, respectively, of an ion guide comprising segmented parallel rods, according to an embodiment of the present invention.
FIG. 4-D
shows a schematic longitudinal view of an ion guide comprising segmented tilted rods, according to an embodiment of the present invention.
FIGS. 5-A
through
5
-L illustrate exemplary computed trajectories for ions passing through ion guides under several conditions, according to the present invention.
FIGS. 6-A
and
6
-B illustrate computed electric dipole fields for a flat plate and a round rod electrode configuration, respectively, according to the present invention.
DETAILED DESCRIPTION OF THE INVENTION
In the following description, it is understood that each recited element or structure can be formed by or be part of a monolithic structure, or be formed from multiple distinct structures. For example, an input blocking structure/wall and an output blocking structure/wall can be provided as part of a single monolithic housing. A set of elements is understood to include one or more elements. Two concatenated elements (e.g. guide sections or segments) can be adjacent or can be separated by intervening elements. A voltage source may include one or more electrical nodes/leads and/or other electrical components (e.g. inductors, capacitors, transformers) generating desired voltage values.
The following description illustrates embodiments of the invention by way of example and not necessarily by way of limitation.
FIG. 1
is a schematic diagram of a mass spectrometer
20
according to a preferred embodiment of the present invention. Spectrometer
20
includes a plurality of chambers and associated pumps, guiding components, and analysis components shown in FIG.
1
. An ionization chamber (source)
22
is used to generate ions of interest preferably at atmospheric pressure. The ions can be generated from a liquid or gas sample by known techniques such as electrospray ionization (ESI), atmospheric pressure chemical ionization (APCI), or photo-ionization. Ionization chamber
22
is connected to an inlet vacuum chamber
24
through an orifice
32
that limits the flow of gas into vacuum chamber
24
. Orifice
32
may be defined by an elongated tube connecting chambers
22
,
24
. A first vacuum pump
34
is fluidically coupled to vacuum chamber
24
, for maintaining the pressure within vacuum chamber
24
at a desired level, preferably between 0.1 torr and 10 torr.
A guide vacuum chamber
26
is fluidically connected to first vacuum chamber
24
through an aperture defined in a skimmer cone
36
. The skimmer cone aperture preferably has a size of 1-2 mm. Skimmer cone
36
broadens from a tip in first vacuum chamber
24
to an outlet side within guide chamber
26
. A second vacuum pump
38
is fluidically connected to guide chamber
26
, for maintaining the pressure within guide chamber
26
at a desired level, preferably between 0.5 mtorr and 20 mtorr. Guide vacuum chamber
26
encloses an electrodynamic ion guiding structure (guide)
40
, for selectively guiding ions of interest from the outlet side of skimmer cone
36
to a conductance-limiting outlet aperture
44
defined in an outlet wall of guide vacuum chamber
26
.
Outlet aperture
44
is preferably offset from the inlet direction defined by the inlet aperture of skimmer cone
36
, such that there is no line of sight between the inlet and outlet apertures. Offsetting the inlet and outlet axes of guide chamber
26
allows preventing liquid droplets, photons, and other neutral noise sources from exiting guide chamber
26
through outlet aperture
44
. Preferably, the inlet direction defined by skimmer cone
36
is oriented at an angle relative to the geometric central axis of guide
40
. Generally, the inlet direction defined by skimmer cone
36
may coincide with or be parallel to the geometric central axis of guide
40
.
Outlet aperture
44
connects guide chamber
26
to an analysis vacuum chamber
30
. Analysis chamber
30
may contain, in sequence: a first mass analyzer
45
, a collision cell
46
, a second mass analyzer
47
, and an ion detector
48
. Mass analyzers
45
,
47
can be quadrupole mass filter, time-of-flight (TOF), ion trap, Fourier Transform Ion Cyclotron Resonance (FTICR), or other known types of analyzers. First mass analyzer
45
faces outlet aperture
44
, for receiving ions passing through outlet aperture
44
. Ions having a selected mass distribution are allowed to pass to collision cell
46
, where the ions undergo collision-induced dissociation. Collision cell
46
may include an ion guide such as ion guide
40
. Ions exiting collision cell
46
enter second mass analyzer
47
. Ion detector
48
receives mass-selected ions transmitted by mass analyzer
47
. A third vacuum pump
50
is fluidically connected to analysis chamber
30
, for maintaining the pressure within analysis chamber
30
at a desired level, preferably between 1 and 100 μtorr, for example between 1 and 10 μtorr, or lower. Collision cell
46
may be maintained at a higher pressure, for example between 0.5 mtorr and 20 mtorr.
FIG. 2
shows a schematic longitudinal view of guide
40
according to a preferred embodiment of the present invention. Guide
40
includes a plurality of longitudinally-concatenated electrode segments
52
. Segments
52
are aligned along a longitudinal central geometric axis
54
of guide
40
. Each electrode segment
52
comprises a plurality of plate-shaped electrodes
58
disposed symmetrically about central axis
54
. Each segment
52
comprises four or more symmetrically disposed electrodes
58
. Preferably, the size of the interior space defined between the electrodes of segments
52
decreases monotonically (e.g. linearly) along central axis
54
, from an inlet guide section
60
adjacent to skimmer cone
36
to an outlet guide section
62
adjacent to outlet aperture
44
. Decreasing the distance between the electrodes increases the strength of the guiding electric field (for a constant voltage), which in turn reduces the radial (transverse) distribution of ions.
The center of the electrodynamic guiding field generated by guide
40
has different transverse positions along different longitudinal sections of guide
40
. An inlet guiding field axis
72
and an outlet guiding field axis
66
are displaced from central axis
54
. The center of the guiding field within an inner, middle section of guide
40
preferably coincides with central axis
54
. Inlet axis
72
and outlet axis
66
are preferably displaced from central axis
54
in opposite directions, in order to maximize the transverse displacement generated for a given guiding voltage set. In general, a guide such as guide
40
may have a larger number of guide sections than illustrated. For example, each segment
52
could define a distinct guide section having a separate guiding field central axis.
Outlet aperture
44
is preferably a round aperture defined in a chamber wall
64
situated opposite skimmer cone
36
. Outlet aperture
44
is transversely aligned with outlet guiding field axis
66
. Outlet axis
66
is aligned with the entrance of mass analyzer
45
, shown in FIG.
1
. Mass analyzer
45
can include a plurality of analyzer electrodes
67
arranged symmetrically about outlet axis
66
, as shown in FIG.
2
. Analyzer electrodes
67
can form a transmission quadrupole whose central axis
66
is displaced from the central geometric axis
54
of guide
40
.
Skimmer cone
36
has an inlet aperture
68
defining an inlet axis
73
. Inlet axis
73
preferably forms a non-zero angle with central axis
54
. In general, inlet axis
73
can be parallel to or coincide with central axis
54
. Inlet aperture
68
is preferably positioned so as to send ions substantially to an inlet location along inlet guiding field axis
72
. Positioning inlet aperture
68
to transfer ions into the local center of the guiding field allows maximizing the ion capture efficiency of guide
40
. Inserting ions into guide
40
away from the center of the guiding field can subject the ions to undesired fringe fields exerting longitudinal repulsive forces on the ions. The longitudinal fringe components can act as a potential barrier impeding the movement of ions into the guiding field, and thus reducing the capture efficiency of the guide.
Guide
40
preferably has a length on the order of cm to tens of cm, for example about 6 cm, and an internal transverse size on the order of mm to cm, for example about 10 mm at the inlet and 6 mm at the midpoint or outlet of guide
40
. If guide
40
is employed as part of a collision cell, the length of ion guide is preferably on the order of tens of cm, for example 10-20 cm. The interior size of guide
40
is preferably on the order of mm to cm, for example about 10 mm along inlet guide section
60
and 4-6 mm along outlet guide section
62
. The inlet aperture defined by skimmer cone
36
preferably has a size on the order of mm, e.g. about 1-2 mm. The length of each segment
52
is preferably on the order of mm to cm, for example about 1-2 cm. The transverse displacement between the central field axes along adjacent guide sections is preferably on the order of mm, for example about 1-2 mm.
The angle between the central axis of skimmer cone
36
and central axis
54
can be between 0 and 45°, and is preferably between 2° and 15°. The angle is preferably comparable to the arctangent of the ratio of the midpoint transverse size of guide
40
to the length of guide
40
. For example, if the length of guide
40
is about 6 cm and its midpoint internal transverse spacing is about 6 mm, the skimmer cone angle is preferably approximately equal to the arctangent of {fraction (1/10)}, or about 6°. Increasing the angle can lead to loss of ions within guide
40
, while decreasing the angle can lead to an increase in the neutral particles allowed to pass through outlet aperture
44
.
FIG. 3-A
shows a schematic transverse view of an exemplary quadrupole guide segment
52
comprising four electrodes
58
a-d
, and a corresponding diagram of a set of voltage sources
74
,
76
used to drive electrodes
58
a-d
. Each electrode
58
a-d
is mounted on a corresponding conductive lead
80
defined on a printed circuit board. Each electrode
58
a-d
is preferably I-shaped (H-shaped), with the mounting surface of the electrode separated from the guiding surface of the electrode by a transverse beam. Separating the mounting and guiding regions of electrodes
58
a-d
allows a reduction in the contamination of the insulative substrate around electrodes
58
a-d
. The relatively narrow transverse cross-sections of electrodes
58
a-d
also allow for reduced capacitive coupling between the electrodes of longitudinally-adjacent segments
52
.
Electrodes
58
a-d
enclose a guiding space
72
for guiding gaseous ions. A first pair of electrodes
58
a-b
is disposed on opposite sides of guiding space
72
along a first transverse direction, while a second pair of electrodes
58
c-d
is disposed on opposite sides of guiding space
72
along a second transverse direction orthogonal to the first transverse direction. The first transverse direction is the direction along which outlet axis
44
is displaced from central axis
54
(shown in FIG.
2
). Electrodes
58
a-d
comprise four square flat plates disposed symmetrically about a central axis equidistant to the four plates. Preferably, the transverse distances between the plates of different pairs of electrodes are equal to each other (x
0
=y
0
).
Two voltage sources
74
,
76
are connected to electrodes
58
a-b
, for applying radio-frequency (RF) and/or DC voltages to electrodes
58
a-b
. Voltage sources
74
,
76
can be thought of as components of a single voltage source
71
used to apply RF and/or DC voltages to multiple segments
52
, as described below. A first radio-frequency (alternating) voltage source
74
is connected to the first pair of electrodes
58
a-b
, for applying to electrodes
58
a-b
a voltage having a first symmetric, in-phase quadrupole radio-frequency (RF) component V
RF1
and an out-of-phase dipole RF component V
RF3
. A second RF voltage source
76
is connected to the second pair of electrodes
58
c-d
, for applying to electrodes
58
c-d
a voltage having a second symmetric, in-phase quadrupole RF component V
RF2
. Preferably, the first RE voltage V
RF1
and the second RF voltage V
RF2
have the same frequency and amplitude, but are out of phase by 180° with respect to each other. Identical V
RF1
and V
RF2
voltages are preferably applied to all segments
52
of guide
40
. Voltages V
RF1
and V
RF2
generate a symmetric, quadrupole component of the guiding field.
The dipole RF voltage V
RF3
preferably has the same frequency as the first and second RF voltages V
RF1
and V
RF2
. The amplitude of the dipole RF voltage V
RF3
is preferably a fraction η=5-100% of the amplitude of the first RF voltage V
RF1
. The fraction value determines the displacement between the local central guiding field axis and the central geometric axis of guide
40
. The phase difference between the dipole RF voltage V
RF3
and the first RF voltage V
RF1
is preferably zero. The dipole voltage V
RF3
establishes a potential difference between electrodes
58
a-b
, and a corresponding dipole electric field directed generally along the y-axis. The dipole voltage V
RF3
displaces the central axis of the guiding (confining) electric field from the geometrical center of guiding space
72
, along the y-axis. The direction of the displacement can be altered by changing the phase of the dipole voltage V
RF3
relative to the quadrupole voltage V
RF1
between 0 and π. Ions deviating from the central axis of the guiding field experience an average force directed toward the central field axis. In the absence of the dipole voltage V
RF3
, the central axis of the guiding field would coincide with the geometric axis of guide
40
.
Preferably, different values of the dipole voltage V
RF3
are applied to different segments
52
of guide
40
. Generally, applying different dipole voltages to different sections of guide
40
allows offsetting the centers of the guiding fields along the different sections. In particular, offsetting the inlet and outlet centers of the guiding field reduces the noise which would otherwise be caused by droplets passing through guide
40
. In a presently preferred implementation, a first dipole voltage is applied along the inlet section of guide
40
, no dipole voltage is applied along a middle section of guide
40
, and a second dipole voltage of opposite phase is applied along an outlet section of guide
40
.
The quadrupole voltages V
RF1
and V
RF2
applied to guide
40
preferably have a 0-to-peak amplitude of about 50 to 500 V. For η=5-100%, the corresponding dipole voltage amplitude range is about 2.5 to 500 V. Higher voltages, such as voltages on the order of kV, may also be used if needed to effectively guide relatively massive ions. The frequency of the applied RF voltages is preferably on the order of hundreds of kHz to MHz. Higher frequencies may be used, for example if the guided ions include electrons. Any DC voltage difference between adjacent segments preferably corresponds to an inter-segment electric field on the order of tenths of V/cm, for example about 0.5 V/cm.
An ion guide such as guide
40
can be used as part of an ion collision cell. Mass selected ions can be accelerated to an appropriate collision energy and focused into a collision cell at an elevated pressure. Collisions between the energetic ions and the gas molecules in the collision cell cause the ions to dissociate into smaller ions and neutral fragments. The ions resulting from the dissociation process can then be inserted into a mass analyzer as described above. Collision cells are often constructed by using an electrodynamic ion guiding structure that is surrounded by a low gas conductance enclosure with an entrance and exit hole located along the geometrical axis of symmetry. The ion guiding structure confines the product ions to the interior of the structure due to the electrodynamic fields, and the product ions exit at the end of the structure.
An ion guide such as guide
40
can also be used as an ion trap for collision damping ions of interest prior to mass analysis. Collisions of ions with a light gas remove excess kinetic energy from the ions, which in turn will cause the ions to locate in the region of the trapping field where the restoring force is a minimum, i.e. the center of the trap. Collision cooling of the ion kinetic temperature can be used to allow ions to accumulate along the central axis of the two dimensional guiding/trapping field. The number of collisions experienced by an ion increases with pressure, which is inversely proportional to the mean free path. A gas at a pressure of 20 millitorr has a molecular number density at 20° C. of 7.0×10
14
molecules cm
−3
. An ion with a collision cross section of 100 square angstroms will therefore have a mean free path of approximately 1 mm. Collision cooling reduces both the transverse as well as the axial ion kinetic energy. Therefore, ions will accumulate along the axis of the guiding field and move along the axis only slowly, due to the space charge force of the accumulated ions. This limitation can be eliminated by the addition of an axial DC field to transport the ions along the axis. The axial DC field can be formed by applying a decreasing DC potential to each segment
52
of ion guide
40
, such that a DC voltage difference exists between adjacent segments
52
.
By applying suitable DC voltages to its last segment
52
, ion guide
40
can be employed as an ion gate for temporarily preventing the passage ions through outlet aperture
44
. For positive ions, the DC voltage applied to the last segment
52
is increased to a high-enough value that ions cannot pass through. Suitable DC voltages depend on the mass of the ions to be stopped, and can range from a few V to tens of V. The axial DC voltages applied to the other segments
52
prevent the reflection of the ions back to the entrance segment
52
. Ions accumulate within guide
40
, and can be then released to pass through outlet aperture
44
by suddenly lowering the DC voltage applied to the last segment
52
. Accumulating ions while mass analysis is occurring can be particularly useful with mass analyzers that are not continuous scanning devices. Typically, in ion trap mass analyzers, the ions are periodically gated into the analyzer in order to fill the analyzer. During mass analysis, the ions within the analyzer are released out while incoming ions are discarded and lost. Employing guide
40
as an ion gate allows accumulating and storing incoming ions during the mass analysis period, and subsequently releasing the ions into the mass analyzer. Accumulating ions within guide
40
during the mass analysis period allows increasing the fraction of sample ions used for mass analysis; thus increasing the sensitivity of the mass analyzer.
Guide
40
can be made by soldering electrodes
58
a-d
to corresponding leads
80
of four planar circuit boards. During assembly, electrodes
58
a-d
can be held by a fixture so that their relative orientation is fixed The attachment to the printed circuit boards can be performed by a re-flow solder technique commonly used for surface mount printed wire assemblies. The boards can be secured together to form a generally-tubular assembly. Electrodes
58
a-d
can be made of Cu, Ni-plated Cu, or other conductive materials.
FIG. 3-B
shows a transformer arrangement suitable for generating a quadrupole guiding field, according to an embodiment of the present invention. A transformer
90
has an externally-driven primary inductor
90
′, and a secondary inductor inductively coupled to primary inductor
90
′. A first lead of secondary inductor
90
″ is commonly connected to the first pair of electrodes
58
a-b
, and a second lead of secondary inductor
90
″ is commonly connected to the second pair of electrodes
58
c-d
. The first RF voltage V
RF1
applied to electrodes
58
a-b
is 180° out of phase with respect to the second RF voltage V
RF2
applied to electrodes
58
c-d.
FIG. 3-C
shows a transformer arrangement suitable for generating a guiding field having a quadrupole component and a dipole component, according to an embodiment of the present invention. As above, the second lead of secondary inductor
90
″ is commonly connected to the second pair of electrodes
58
c-d
, and applies the second RF voltage V
RF2
to electrodes
58
c-d
. The first lead of secondary inductor
90
″ is connected to a center tap of a secondary inductor
92
″ of a second transformer
92
. The center tap of secondary inductor
92
″ drives the two leads of secondary inductor
92
″ in-phase with the first lead of secondary inductor
90
″, to apply the first RF voltage V
RF1
to electrodes
58
a-b
. The two leads of secondary inductor
92
″ are connected to electrodes
58
a-b
, respectively. The coupling between electrodes
58
a-b
and the first lead of secondary inductor
90
″ (through the center tap of secondary electrode
92
″) generates an in-phase quadrupole component V
RF1
of the RF voltage applied to electrodes
58
a-b
. The is inductive coupling between secondary inductor
92
″ and an externally-driven primary inductor
92
′ generates an out-of-phase dipole component V
RF3
of the RF voltage applied to electrodes
58
a-b
. Generally, an RF voltage having a quadrupole and a dipole component can be applied to a pair of opposing electrodes using various circuits, such as circuits including inductors and capacitors, rather than through the use of the center tap of a transformer.
FIG. 4-A
shows a longitudinal view of an ion guide
140
according to another embodiment of the present invention. Ion guide
140
comprises a plurality of geometrically-identical, longitudinally-concatenated segments
152
. Segments
152
enclose a guiding space
172
having a uniform transverse cross-section along guide
140
. Segments
152
define two guide sections: an inlet guide section
160
and an outlet guide section
162
. A central axis
154
of the ion guiding field within inlet section
160
coincides with the geometric central longitudinal axis of symmetry of guide
140
. A central axis
166
of the ion guiding field within outlet section
162
is displaced from the central geometric axis. Inlet field central axis
154
is situated to receive ions entering guide
140
through an inlet aperture
168
defined in an inlet chamber wall
136
. Inlet aperture
168
is aligned with inlet field central axis
154
. Outlet field central axis
166
is aligned with an outlet aperture
144
defined in an outlet chamber wall
164
.
FIGS. 4-B
and
4
-C show longitudinal and transverse views, respectively, of an ion guide
240
according to another embodiment of the present invention. Ion guide
240
comprises an inlet guide section
260
and an outlet guide section
262
, each comprising four round (e.g. cylindrical) rods in a quadrupole arrangement. The rods of the two guide sections are arranged end-to-end. A central field axis
255
along inlet guide section
260
is displaced from the geometric central axis of guide
240
, while a central field axis
266
along outlet guide section
262
coincides with the geometric central axis of guide
240
.
FIG. 4-D
shows a longitudinal view of an ion guide
340
according to another embodiment of the present invention. Ion guide
340
comprises an inlet guide section
360
, an outlet guide section
362
, and an intermediate guide section
361
positioned between guide sections
260
,
262
. Corresponding rods of the three guide sections are arranged end-to-end. The central field axes
354
,
355
,
366
are all displaced from the central geometric axis of guide
340
.
While a guiding structure using round rods can be used in general to generate a guiding field having a dipole component, guiding structures using segmented flat plates are presently preferred in an ion guiding structure of the present invention. Guiding structures using flat plates are capable of generating relatively uniform dipole fields, which allow a reduction in the number of ions lost due to guiding field non-uniformities. For guiding structures having no dipole component (e.g. a quadrupole structure with the guiding field central axis coincident with the geometric central axis), rounds rod and flat plate configurations may generate symmetric fields of comparable uniformity.
The following discussion illustrates several theoretical considerations useful for better understanding various embodiment of the present invention, and is not intended to limit the invention.
Electrodynamic Guiding Field
The canonical form of the electrodynamic potential for a time-dependent field in a cylindrical coordinate system (r,z) is given by:
where Π(t)=cos(Ωt) expresses the temporal variations of the field with drive frequency Ω; Φ
N
(r,z) and U
N
(r,z) represent the dynamic and static spatial variations of the field and A
N
, B
N
the normalized constants, respectively. The spatial terms are related to the Legendre polynomials P
N
cos(θ) of order N. In a field with rotational symmetry the potential is independent of the angle φ. The terms of the polynomial are expressed here as a function of the cylindrical coordinates (r,z) and the arbitrary distance necessary to fix the boundary conditions. Quadrupole fields are of particular interest, because quadrupole fields having both AC and DC components can be used as mass filters. Quadrupole fields having only an AC component have been used as ion guiding devices because this type of field will focus ions in the transverse direction, but not in the axial direction; thereby allowing ions to move along the axial direction unaffected by the AC field.
The general form of the potential field in a pure quadrupole field is:
The potential field must satisfy Laplace's equation:
∇
2
V
Q
=0 (3)
From which the following relationship is established:
λ+σ+γ=0 (4)
A pure quadrupole field can be formed from four hyperbolic surfaces, symmetrically disposed about an axis of symmetry, and extending to infinity. This results in the following relationship between the parameters in equation 4: λ=−σ and γ=0. The zero-to-peak amplitude of the electro-dynamic voltage is V, with frequency Ω, and U is the DC potential applied to each electrode pair. The total potential applied to each electrode set V
Q
is:
V
x
=+V
cos (Ωt) and
V
y
=−V
cos (Ωt). (5)
The general form of the equations of motion for ions in an ideal quadrupole potential V
Q
field can be obtained from the vector equation:
where the position vector is {right arrow over (R)} (x, y, z), m is the ion mass and e is the charge of the ion. By convention the axis of symmetry of the four electrodes is along the z-axis, and the opposing pairs of electrodes are oriented along the x-axis and y-axis. The equations of the ion motion for the constraints of equation 4 when applied to equation 2 (λ=1, σ=1) allow the independent separation of the motion into the x and y components.
The canonical form of these equations when equation 7 is substituted into equation 6 is:
which is the well-known Mathieu equation; where the dimensionless parameters ζ, and q
u
are:
q
u
=ψ4 eV/[
m r
0
2
Ω
2
] (9b)
where ψ=λ or σ and u=x or y. This second order differential equation is the Mathieu equation. The stable solutions to the equation are characterized by the parameters q
u
; the value of the parameter defines the operating point of the ion within the stability region. The general solution to equation 9 is:
The secular frequency of the ion motion, ω
n
can be determined from the value of β:
ω
n
=(
n
+/−β/2)Ω (10b)
The value of β is a function of the working point in (q
u
) space and can be computed from a well known continuing fraction.
If an additional alternating potential V
D
(zero-to-peak) is applied between each electrode of one set, a new potential field is formed. If V
D
is applied to the electrode set oriented along the y-axis, a new potential results that contains a dipole component in the potential field.
The applied potential becomes:
The potential field between the two electrodes along the y-axis becomes:
where y
0
is the distance from the axis of symmetry to the surface of the electrode, and
r
0
2
=x
0
2
+y
0
2
. (13)
The dipole voltage is phase shifted by +φ with respect to the quadrupole field, V
Qy
. Restricting the phase to values of: φ=Nπ; where N=0,1,2,- -; V
Dy
=V
Dy(φ=0)
(−1)
N
, the instantaneous electric field acting on an ion in the axial direction due to the potential field V
TY
The equation of ion motion becomes:
Substituting
equation (16) is obtained.
By substitution of equation 16 in equation 15 and 2ζ=Ωt, the basic equation of the ion motion in the axial direction is obtained:
Defining:
and by substitution of equation 18a and equation 18b into equation 17, an equation similar to the Mathieu equation is obtained:
The following definition and substitutions:
into equation 18 yield the form of the Mathieu equation:
The axial displacement of the ion can found to be the sum of two terms:
The first term represents the normal time dependent oscillatory solution, u(ζ) as in equation 10; the second term is an additive offset value which expresses the axial displacement of the ion motion due to the dipole:
During mass analysis it is common to increase the AC voltage of the guiding field as a function of mass. In the special case in which V
D
=ηV
ac
equation 22 becomes:
and thus:
When the dipole is properly phased and present as a constant fraction η of the guiding field, it can be seen from equation
24
that the ion motion is uniformly displaced in the axial direction by a constant amount. The magnitude and sign of the displacement is independent of the mass-to-charge ratio and the polarity of the ion charge. The displacement depends only on the percentage η of dipole and the geometric dimensions of the ion guide structure. The direction of the displacement can be altered by changing the phase of the dipole from 0 to π.
The results described below illustrate characteristics of particular implementations of the present invention, and are not intended to limit the invention.
Results
FIGS.
5
-A-L show simulated ion trajectories for several ion guide configurations. The simulation was performed using SIMION software available from the Idaho National Engineering and Environmental Laboratory, Idaho Falls, Id. Parameter values used in the simulation include: ion mass-to-charge ratio of 800 Da, RF ion guide voltage of 400 V (zero to peak), ion guide length of 60 mm, inner diameter of 5 mm, guide frequency of 1.05 MHz, pressure equivalent to a mean free path of 1 mm, initial ion energy through the skimmer cone hole of 1 eV, common DC offset of all four ion guide plates of −5 V, voltage difference between adjacent segments of −0.5 V, an exit lens of −15 V, and a stop plat of −20 V (if applicable). Other parameter values (e.g. dipole voltage ratios) arc described below with reference to each figure.
FIG. 5-A
shows a computed trajectory for a single ion entering a six-segment ion guiding structure such as the one illustrated in
FIGS. 2-3
, without the dipole generator V
rf3
and with a mean free path of 1 mm.
FIG. 5-A
shows that, in the absence of the applied dipole voltage, the ion trajectory follows generally the geometric axis of symmetry of the guide, and does not exit the guide chamber through the displaced outlet aperture.
FIG. 5-A
also illustrates a gradual decrease in the amplitude of the transverse oscillations of the ion as the ion progresses through the guide.
FIG. 5-B
shows a computed trajectory for a single ion entering a structure such as the one in
FIG. 5-A
. The first two segments have a dipole component, the following two segments have no dipole component, and the last two segments have a dipole component 180° out of phase relative to the dipole component of the two segments. The dipole ratio is η=100% and the mean free path is 1 mm.
FIG. 5-C
shows computed trajectories for number of ions entering the ion guide of
FIG. 5-B
, for varying entrance positions, initial angles, and initial starting times to relative to the RF guiding field phase.
FIG. 5-D
shows a computed trajectory for a single ion entering a structure similar to that of
FIG. 5-A
, with the dipole generator V
rf3
present (V
rf3
=V
rf1
and η=100%) for all guide segments following the first guide segment, and a mean free path of 1 mm. No dipole voltage is applied to the first guide segment. As illustrated, the ion trajectory is displaced from the geometric axis of the guide after the first guide segment, and the ion exits through the outlet aperture aligned with the central field axis.
FIG. 5-E
shows computed trajectories for a distribution of ions entering the structure of
FIG. 5-D
, without the dipole generator V
rf3
. The ions were distributed across the skimmer hole and with a small angular spread about a nominal angle of 6 degrees with respect to the axis of the structure. The ions entered the structure at random RF phases.
FIG. 5-F
shows the trajectory of a distribution of ions entering the structure of
FIG. 5-E
, but with the dipole generator V
rf3
present (V
rf3
=V
rf1
).
FIG. 5-G
illustrates the effect of lowering the gas pressure in the guide structure of
FIG. 5-F
to a mean free path of 10 mm. Many of the ions are lost due to collisions with the guide plates before the ions encounter the conductance aperture at the exit, because of insufficient collision cooling and the large displacement of the ions towards the electrodes by the dipole field.
FIG. 5-H
shows computed trajectories for a distribution of ions entering a structure similar to the one shown in
FIG. 5-D
, but with a zero entrance angle (i.e. the inlet aperture oriented exactly along the central geometric axis}. The mean free path is 1 mm.
FIG. 5-1
shows computed trajectories for a distribution of ions entering a collision cell having a guiding field axis distribution similar to the one shown in
FIG. 4-A
, with a progressively narrowing spacing between the guide electrodes. The middle two segments in
FIG. 5-I
generate no dipole electric field.
FIG. 5-J
illustrates computed trajectories for a guide such as the one shown in
FIG. 5-A
, employed as an ion gate. The gate is closed by reversing the phase on the inlet and outlet guide segments. Reversing the phase subjects incoming ions to fringe fields acting as a barrier, rather than to the center of the restoring field. No dipole is applied, and the mean free path is 4 mm.
FIG. 5-K
shows computed displacements caused by a dipole field component for a group of ions, for flat plate electrodes and a mean free path of 4 mm.
FIG. 5-L
shows computed displacements caused by a dipole field component for a group of ions, for continuous, cylindrical rod electrodes and a mean free path of 4 mm. A comparison of
FIGS. 5-K
and
5
-L reveals that the magnitude of the displacement is smaller for the round rod configuration than for the flat plate configuration; and that many ions strike the electrodes and are lost in the round rod configuration. These effects are due to the greater deviation from an ideal dipole in the round rod configuration. The deviation increases as the displacement from the center increases.
FIGS. 6-A
and
6
-B show two equipotential surfaces perpendicular to the dipole electric fields, computed for flat plate and round rod configuration, respectively. As illustrated, the flat plate configuration generates a relatively uniform dipole electric field.
It will be clear to one skilled in the art that the above embodiments may be altered in many ways without departing from the scope of the invention. Accordingly, the scope of the invention should be determined by the following claims and their legal equivalents.
Claims
- 1. A mass spectrometry apparatus comprising:an ionization chamber for forming ions of interest; a guide chamber having an inlet aperture in communication with the ionization chamber, and an outlet aperture, wherein a central axis of the outlet aperture is displaced from a central axis of the inlet aperture; an electrodynamic ion guide positioned in the guide chamber, for guiding ions from the inlet aperture to the outlet aperture, the ion guide comprising an inlet guide section for generating a first electrodynamic ion guiding field having a first generally longitudinal central field axis, situated such that ions transmitted through the inlet aperture enter the inlet guide section substantially along the first central field axis; an outlet guide section longitudinally concatenated with the inlet guide section, for generating a second electrodynamic ion guiding field having a second generally longitudinal central field axis displaced from the first central field axis and substantially aligned with the outlet aperture; a mass analyzer in communication with the outlet aperture, for receiving ions exiting the guide chamber through the outlet aperture; and an ion detector in communication with the mass analyzer, for receiving ions transmitted by the mass analyzer.
- 2. The apparatus of claim 1, wherein:the inlet guide section comprises a first plurality of quadrupole electrodes disposed symmetrically about a longitudinal, central geometric axis; and the outlet guide section comprises a second plurality of quadrupole electrodes disposed symmetrically about the central geometric axis.
- 3. The apparatus of claim 2, wherein the first field axis substantially coincides with the central geometric axis.
- 4. The apparatus of claim 1, wherein:the first guiding field has a quadrupole component; and the second guiding field is an asymmetric guiding field having a quadrupole component and a dipole component.
- 5. The apparatus of claim 4, wherein the first guiding field is a symmetric quadrupole field.
- 6. The apparatus of claim 1, further comprising:a first voltage source coupled to the inlet guide section, for applying a first quadrupole voltage set to the inlet guide section to generate the first guiding field, wherein the first guiding field is a symmetric quadrupole field; and a second voltage source coupled to the outlet guide section, for applying a second voltage set to the outlet guide section, the second voltage set comprising a quadrupole component for generating a symmetric quadrupole field component of the second guiding field, and a dipole component for generating a dipole field component of the second guiding field.
- 7. The apparatus of claim 6, wherein the first voltage source comprises a pair of leads of a secondary inductor of a transformer, wherein a first lead of the pair of leads is commonly connected to a first pair of opposing electrodes of the inlet guide section, and a second lead of the pair of leads is commonly connected to a second pair of opposing electrodes of the inlet guide section.
- 8. The apparatus of claim 6, wherein the second voltage source comprises a first pair of leads of a secondary inductor of a first transformer, and a second pair of leads of a secondary inductor of a second transformer, wherein:a first lead of the first pair of leads is commonly connected to a first pair of opposing electrodes of the outlet guide section, a second lead of the first pair of leads is connected to a center tap of the secondary inductor of the second transformer, a first lead of the second pair of leads is connected to a first electrode of a second pair of opposing electrodes of the outlet guide section, and a second lead of the second pair of leads is connected to a second electrode of the second pair of opposing electrodes of the outlet guide section.
- 9. The apparatus of claim 1, further comprising a driving DC voltage source coupled to at least one of the inlet guide section and the outlet guide section, for applying a driving DC voltage to at least part of the at least one of the inlet guide section and the outlet guide section to generate a longitudinal ion driving field.
- 10. The apparatus of claim 1, wherein the inlet guide section comprises a set of longitudinally-sequenced segments each comprising a plurality of conductive plates.
- 11. The apparatus of claim 1, wherein the inlet guide section comprises a plurality of generally-longitudinal rods.
- 12. The apparatus of claim 1, wherein an internal guiding space of the ion guide narrows from an inlet end of the guide to an outlet end of the guide.
- 13. The apparatus of claim 1, wherein:the mass analyzer comprises a plurality of analyzer electrodes disposed symmetrically about an analyzer central axis substantially aligned with the outlet aperture of the guide chamber, and the outlet guide section comprises a plurality of outlet guiding electrodes disposed symmetrically about a central geometric axis not substantially aligned with the outlet aperture.
- 14. The apparatus of claim 1, wherein the guide chamber comprises a collision cell enclosing the electrodynamic ion guide.
- 15. The apparatus of claim 14, further comprising a mass filter situated between the ionization chamber and the collision cell.
- 16. An electrodynamic ion guide comprising:a first guide section for generating a first electrodynamic ion guiding field having a first generally longitudinal central field axis; and a second guide section longitudinally concatenated with the first guide section, for generating a second electrodynamic ion guiding field having a second generally longitudinal central field axis displaced from the first central field axis.
- 17. The ion guide of claim 16, wherein:the first guide section comprises a first plurality of electrodes disposed symmetrically about a longitudinal, central geometric axis; and the second guide section comprises a second plurality of electrodes disposed symmetrically about the central geometric axis.
- 18. The ion guide of claim 17, wherein the first field axis substantially coincides with the central geometric axis.
- 19. The ion guide of claim 16, wherein:the first guiding field has a quadrupole component; and the second guiding field is an asymmetric guiding field having a quadrupole component and a dipole component.
- 20. The ion guide of claim 19, wherein the first guiding field is a symmetric quadrupole field.
- 21. The ion guide of claim 16, further comprising:a first voltage source coupled to the inlet guide section, for applying a first quadrupole voltage set to the inlet guide section to generate the first guiding field, wherein the first guiding field is a symmetric quadrupole field; and a second voltage source coupled to the outlet guide section, for applying a second voltage set to the outlet guide section, the second voltage set comprising a quadrupole component for generating a symmetric quadrupole field component of the second guiding field, and a dipole component for generating a dipole field component of the second guiding field.
- 22. The ion guide of claim 21, wherein the first voltage source comprises a pair of leads of a secondary inductor of a transformer, wherein a first lead of the pair of leads is commonly connected to a first pair of opposing electrodes of the inlet guide section, and a second lead of the pair of leads is commonly connected to a second pair of opposing electrodes of the inlet guide section.
- 23. The ion guide of claim 21, wherein the second voltage source comprises a first pair of leads of a secondary inductor of a first transformer, and a second pair of leads of a secondary inductor of a second transformer, wherein:a first lead of the first pair of leads is commonly connected to a first pair of opposing electrodes of the outlet guide section, a second lead of the first pair of leads is connected to a center tap of the secondary inductor of the second transformer, a first lead of the second pair of leads is connected to a first electrode of a second pair of opposing electrodes of the outlet guide section, and a second lead of the second pair of leads is connected to a second electrode of the second pair of opposing electrodes of the outlet guide section.
- 24. The ion guide of claim 16, further comprising:a first voltage source coupled to the first guide section, for applying a first, quadrupole voltage set to the first guide section to generate the first guiding field, wherein the first guiding field is a symmetric quadrupole field; and a second voltage source coupled to the second guide section, for applying a second voltage set to the second guide section, the second voltage set comprising a quadrupole component for generating a symmetric quadrupole field component of the second guiding field, and a dipole component for generating a dipole field component of the second guiding field.
- 25. The ion guide of claim 16, further comprising a driving DC voltage source coupled to at least one of the first guide section and the second guide section, for applying a driving DC voltage to at least part of the at least one of the first guide section and the second guide section to generate a longitudinal ion driving field.
- 26. The ion guide of claim 16, wherein the first guide section comprises a set of longitudinally-sequenced segments each comprising a plurality of conductive plates.
- 27. The ion guide of claim 16, wherein the first guide section comprises a plurality of generally-longitudinal rods.
- 28. The ion guide of claim 16, wherein the second guide section is positioned after the first guide section along an ion direction of motion, and the second guiding field is stronger than the first guiding field.
- 29. The ion guide of claim 16, wherein an internal guiding space of the ion guide narrows from a first end of the guide to a second end of the guide, the second guide being situated longitudinally opposite the first end.
- 30. The ion guide of claim 16, further comprising a third guide section longitudinally concatenated with the second guide section, for generating a third electrodynamic ion guiding field having a third generally longitudinal central field axis displaced from the first central field axis and the second central field axis.
- 31. The ion guide of claim 30, wherein the third guide section is disposed between the first guide section and the second guide section.
- 32. An electrodynamic ion guide for guiding ions into a mass analyzer, comprising:a plurality of longitudinally concatenated quadrupole electrode segments for guiding the ions, wherein each of the plurality of electrode segments comprises a plurality of plate-shaped electrodes arranged symmetrically about a longitudinal central geometric axis of the guide; and a voltage source electrically connected to the plurality of electrode segments, for applying a first set of guiding voltages to a first subset of the plurality of segments, for generating a first guiding field having a first central field axis, and for applying a second set of guiding voltages to a second subset of the plurality of segments, for generating a second guiding field having a second central field axis displaced from the first central field axis.
- 33. The ion guide of claim 32, wherein:the first guiding field is a symmetric quadrupole field, and the first central field axis substantially coincides with the central geometric axis; and the second guiding field has a symmetric quadrupole component and a dipole component.
- 34. A method of guiding ions to a mass analyzer, comprising:inserting the ions into a guide chamber through an inlet aperture, substantially along a first field central axis of a first guiding field; and guiding the ions from the inlet aperture to an outlet aperture of the guide chamber through a generally-longitudinal multi-electrode ion guide situated within the guide chamber, the ion guide having an inlet region in proximity to the inlet aperture and an outlet region situated opposite the inlet region, the ion guide generating the first guiding field along the inlet region, and a second guiding field along the outlet region, and second guiding field having a second field central axis displaced from the first field central axis, the second field central axis being aligned with the outlet aperture.
US Referenced Citations (9)