Embodiments relate to a chamber cleaning system, and more particularly, to an automatic chamber cleaning system in which an inner wall of a chamber used in a semiconductor manufacturing apparatus may be automatically cleaned.
During semiconductor manufacturing, an acidic process by-product (i.e., a contaminant) may be formed, through a plasma reaction of an etching gas, on an inner wall of a chamber (e.g., a process chamber or a reaction chamber) used in a semiconductor manufacturing apparatus, e.g., an etching apparatus. Such by-products, e.g., contaminants, require removal.
According to an aspect of example embodiments, there is provided an automatic chamber cleaning system including a chamber including an opening in an upper portion, an inner space, and an inner wall, and an automatic chamber cleaning device mounted on the chamber. The automatic chamber cleaning device includes a plurality of roller cleaning devices configured to clean the inner wall of the chamber, a vertical driving device configured to move the plurality of roller cleaning devices in an vertical direction of the chamber and locate the plurality of roller cleaning devices in the inner space of the chamber through the opening, a horizontal driving device configured to move the plurality of roller cleaning devices, located in the inner space of the chamber, in a radial direction of the chamber, and a main rotation driver configured to rotate the plurality of roller cleaning devices, located in the inner space of the chamber, about center of the chamber in a rotation direction of the chamber.
According to another aspect of example embodiments, there is provided an automatic chamber cleaning system including a chamber including an opening in an upper portion, an inner space, and an inner wall; and an automatic chamber cleaning device mounted on the chamber. The automatic chamber cleaning device includes a first roller cleaning device configured to clean the inner wall of the chamber, the first roller cleaning device including a first roller device and a first roller rotation driver configured to rotate the first roller device, a second roller cleaning device spaced apart from the first roller cleaning device and configured to clean the inner wall of the chamber, the second roller cleaning device including a second roller device and a second roller rotation driver configured to rotate the second roller device, a vertical driving device configured to move the first roller cleaning device and the second roller cleaning device in an vertical direction of the chamber and locate the first roller cleaning device and the second roller cleaning device in the inner space of the chamber through the opening, a horizontal driving device configured to move the first roller cleaning device and the second roller cleaning device, located in the inner space of the chamber, in a radial direction of the chamber, and a main rotation driver configured to rotate the first roller cleaning device and the second roller cleaning device, located in the inner space of the chamber, about center of the chamber in a rotation direction of the chamber.
Features will become apparent to those of skill in the art by describing in detail exemplary embodiments with reference to the attached drawings, in which:
As used herein, the singular forms “a,” “an,” and “the” are intended to include the plural forms as well, unless the context clearly indicates otherwise. The size of each element in the drawings may be exaggerated for the purpose of convenience and clarity of explanation.
In detail,
As illustrated in
As illustrated in
The chamber 10 may be cylindrical. A cylindrical coordinate system applicable to the chamber 10 is illustrated in
An up-down direction (e.g., a vertical direction that extends along a normal direction to the bottom of the chamber 10) of the chamber 10 may be a Z-axis direction vertically extending from a chamber center O. A radial direction of the chamber 10 may be an X-axis direction or a Y-axis direction radially extending from the chamber center O. A rotation direction of the chamber 10 may be a rotation direction about the chamber center O between the X-axis and a Y-axis.
Each value of a point P(r, θ, z) is as follows. The variable “r” denotes a distance from the chamber center O to a point where the point P is projected on an XY plane, and may be equal to or greater than 0. The variable “Θ” may denote an angle formed from the X-axis to the point where the point P is projected on the XY plane, and may range from 0° to 360°. The variable “z” denotes a Z-axis value of the point P.
Referring back to
The first roller cleaning device 30a may include a first roller 32a and a first roller rotation driver 40a. The first roller rotation driver 40a may rotate the first roller 32a. The first roller 32a may include a pad or a protrusion to remove a contaminant formed on the inner wall 15 of the chamber 10. For example, the first roller 32a may include a cleaning pad, e.g., a scrubber, to remove a contaminant formed on the inner wall 15 of the chamber 10. The first roller 32a will be described below in more detail.
The first roller rotation driver 40a may include a first roller rotation driving shaft 34a, a first belt 36a, and a first motor 38a. A rotational force of the first motor 38a may be transmitted to the first roller rotation driving shaft 34a through the first belt 36a, and the first roller rotation driving shaft 34a may rotate the first roller 32a. The first roller rotation driving shaft 34a may be located in, e.g., extend along, the up-down direction of the chamber 10.
The second roller cleaning device 30b may include a second roller 32b (see
The second roller rotation driver 40b may include a second roller rotation driving shaft 34b, a second belt 36b, and a second motor 38b. A rotational force of the second motor 38b may be transmitted to the second roller rotation driving shaft 34b through the second belt 36b, and the second roller rotation driving shaft 34b may rotate the second roller 32b. The second roller rotation driving shaft 34b may be located in the up-down direction of the chamber 10.
The automatic chamber cleaning device ACL may include a vertical driver 90. The vertical driver 90 may enable the roller cleaning devices 30 to move in the up-down direction of the chamber 10, e.g., the vertical driver 90 may insert and remove the roller cleaning devices 30 into and out of the chamber 10 through the openings of the mount 16 and chamber 10. The vertical driver 90 may enable the roller cleaning devices 30 to be located in the inner space 14 of the chamber 10 through the opening 12 of the chamber 10 (e.g., along the white vertical arrow in
The vertical driver 90 may include a first support plate 91, a vertical driving shaft 92, a third belt 93, a third motor 94, and a handle 96. The first support plate 91 supports each element of the vertical driver 90. The handle 96 may be used by an operator to move the automatic chamber cleaning device ACL.
A rotational force of the third motor 94 may be transmitted to the vertical driving shaft 92 through the third belt 93, and the vertical driving shaft 92 may extend upward or downward with respect to the chamber 10 to move the roller cleaning devices 30 in the up-down direction of the chamber 10. The vertical driving shaft 92 may be connected to the roller cleaning devices 30, and may move the roller cleaning devices 30 in the up-down direction of the chamber 10.
The automatic chamber cleaning device ACL may include a horizontal driver 50. The horizontal driver 50 may be located between the first roller cleaning device 30a and the second roller cleaning device 30b in the Y direction (e.g., the radial direction). The horizontal driver 50 may enable the roller cleaning devices 30 located in the inner space 14 of the chamber 10 to move in the radial direction of the chamber 10. The horizontal driver 50 may include a second support plate 31, a fourth motor 52, a horizontal driving shaft 54, and a fourth belt 56.
The second support plate 31 supports each element of the horizontal driver 50. A rotational force of the fourth motor 52 may be transmitted to the horizontal driving shaft 54 through the fourth belt 56, and the horizontal driving shaft 54 may move the roller cleaning devices 30 in the radial direction of the chamber 10. The horizontal driving shaft 54 may be between and connected to the roller cleaning devices 30, and may move the roller cleaning devices 30 in the radial direction of the chamber 10 (e.g., along the white horizontal arrow in
The automatic chamber cleaning device ACL may include a main rotation driver 70. The main rotation driver 70 may enable the roller cleaning devices 30 located in the inner space 14 of the chamber 10 to rotate about the center of the chamber 10 in the rotation direction of the chamber 10. The main rotation driver 70 may include a third support plate 71, a main rotation driving shaft 72, a fifth motor 73, and a fifth belt 74.
The third support plate 71 supports each element of the main rotation driver 70. A rotational force of the fifth motor 73 may be transmitted to the main rotation driving shaft 72 through the fifth belt 74, and the main rotation driving shaft 72 may move the roller cleaning devices 30 about the center of the chamber 10 in the rotation direction of the chamber 10. The main rotation driving shaft 72 may be connected to the roller cleaning devices 30, and may move the roller cleaning devices 30 about the center of the chamber 10 in the rotation direction of the chamber 10.
The automatic chamber cleaning device ACL may include a vision inspection device 130 for inspecting whether there is a contaminant on the inner wall 15 of the chamber 10. A plurality of, e.g., two, vision inspection devices 130 may be provided, e.g., the vision inspection devices 130 may be attached to the bottoms of the first and second roller rotation drivers 40a and 40b. For example, the vision inspection device 130 may be a camera. The vision inspection device 130 (e.g., an imager) may quantitatively identify and evaluate a cleaning area and a non-cleaning area in the chamber 10, e.g., the roller cleaning devices 30 may be moved and rotated inside the chamber 10 in accordance with the inspection results of the vision inspection device 130. The automatic chamber cleaning device ACL may reduce a cleaning time by determining whether a contaminant is removed by using the vision inspection device 130, and may improve cleaning quality by quantitatively evaluating whether a contaminant is removed.
In addition, the automatic chamber cleaning device ACL may include a contaminant collection device 110 (see
As described above, the automatic chamber cleaning device ACL of the automatic chamber cleaning system ACLS may include the vertical driver 90, the horizontal driver 50, and the main rotation driver 70 respectively connected to the vertical driving shaft 92, the horizontal driving shaft 54, and the main rotation driving shaft 72, which are movable in the up-down direction, the radial direction, and the rotation direction of the chamber 10, the roller cleaning devices 30 connected to the vertical driver 90, the horizontal driver 50, and the main rotation driver 70, the vision inspection device 130 for inspecting contamination of the inner wall 15 of the chamber 10, and the contaminant collection device 110 for collecting a contaminant in the chamber 10 cleaned by the roller cleaning devices 30.
Accordingly, because the automatic chamber cleaning device ACL of the automatic chamber cleaning system ACLS automatically cleans the inner wall 15 of the chamber 10 by using the roller cleaning devices 30, health risks of an operator may be prevented or substantially reduced. Also, because the automatic chamber cleaning device ACL of the automatic chamber cleaning system ACLS determines whether a contaminant is removed by using the vision inspection device 130, cleaning quality may be improved.
In detail, the automatic chamber cleaning system ACLS of
As illustrated in
The main rotation driver 70 may include the third support plate 71, main rotation driving shafts 72a and 72b, the fifth motor 73, and the fifth belt 74, as described above. The main rotation driving shafts 72a and 72b are the same as, e.g., constitute, the main rotation driving shaft 72 described with reference to
The automatic chamber cleaning device ACL may include the roller cleaning devices 30. The roller cleaning devices 30 may include the first roller cleaning device 30a and the second roller cleaning device 30b on opposite sides of the main rotation driver 70, e.g., as illustrated in
The first roller cleaning device 30a may include the first roller 32a and the first roller rotation driver 40a. The first roller rotation driver 40a may rotate the first roller 32a (e.g., in the direction of the small white arrows in
The first roller 32a may be in close, e.g., direct, contact with the inner wall 15 (see
As illustrated in
The second roller cleaning device 30b may include the second roller 32b and the second roller rotation driver 40b. The second roller rotation driver 40b may rotate the second roller 32b. The second roller rotation driver 40b may include the second roller rotation driving shaft 34b and the second belt 36b.
The second roller 32b may be in close, e.g., direct, contact with the inner wall 15 (see
As illustrated in
While
In detail, in
The automatic chamber cleaning device ACL may be easily installed on the chamber 10 by the operator HUM to automatically clean the chamber 10. Accordingly, the automatic chamber cleaning device ACL may easily clean the chamber 10 used in semiconductor manufacturing. For example, the automatic chamber cleaning device ACL may be detachable from the chamber 10, e.g., the automatic chamber cleaning device ACL may be portable and may be installed on and removed from the chamber 10 in accordance with cleaning requirements.
Referring to
Referring to
As described above, the rollers 32-1 and 32-2 used in the automatic chamber cleaning device ACLS may be configured in various shapes to physically remove a contaminant formed on the inner wall 15 of the chamber 10.
Referring to
The automatic chamber cleaning device ACL may include the vertical driver 90 (i.e., a vertical driving device) connected to the roller cleaning devices 30. The vertical driver 90 may enable the roller cleaning devices 30 to move in the up-down direction of the chamber 10.
The automatic chamber cleaning device ACL may include the horizontal driver 50 (i.e., a horizontal driving device) connected to the roller cleaning devices 30. The horizontal driver 50 may enable the roller cleaning devices 30 to move in the radial direction of the chamber 10. The horizontal driver 50 may enable each of the first roller cleaning device 30a and the second roller cleaning device 30b to move in the radial direction of the chamber 10.
The automatic chamber cleaning device ACL may include the main rotation driver 70 connected to the roller cleaning devices 30. The main rotation driver 70 may enable the roller cleaning devices 30 to rotate about the center of the chamber 10 in the rotation direction of the chamber 10. The automatic chamber cleaning device ACL may include the contaminant collection device 110 for collecting a contaminant in the chamber 10, and the vision inspection device 130 for inspecting whether there is a contaminant on the inner wall 15 of the chamber 10.
The automatic chamber cleaning device ACL may include a control device 150 (i.e., a controller) connected to each of the elements, i.e., to each of the roller cleaning devices 30, the horizontal driver 50, the main rotation driver 70, the vertical driver 90, the contaminant collection device 110, and the vision inspection device 130 to control them. For example, the control device 150 may control movement of the drivers in accordance with inspection results of the vision inspection device 130.
In detail, referring to
The roller cleaning devices 30 are loaded into the chamber 10 by using the vertical driver 90 of the automatic chamber cleaning device ACL (S210). In other words, the roller cleaning devices 30 are located in the chamber 10 by using the vertical driver 90, e.g., the vertical driver 90 moves downwardly to insert (e.g., position) the roller cleaning devices 30 completely inside the chamber 10.
A cleaning area is determined by inspecting the inner wall (wall surface) of the chamber 10 by using the vision inspection device 130 (S220). In other words, a cleaning area is determined by analyzing an image obtained by imaging the inner wall 15 of the chamber 10 by using the vision inspection device 130.
A contaminant on the inner wall 15 of the chamber 10 used in a semiconductor manufacturing apparatus may be formed in a multi-colored band shape due to gas reaction characteristics. Before cleaning, the vision inspection device 130 may determine a cleaning area by inspecting a contaminant on the inner wall of the chamber 10, e.g., by using an HSV model. The HSV model is a color model that represents all colors in hue, saturation, and value. The hue ranges from 1 to 100 degrees, the saturation ranges from 0% to 100%, and the value ranges from 0% to 100%. The HSV model is a color model similar to a human visual system, and thus, is useful for inspecting a contaminant.
Since the vision inspection device 130 is used, an image of the wall surface of the chamber 10 may be easily obtained. When the inner wall 15 (e.g., wall surface) of the chamber 10 is imaged by using the vision inspection device 130, the image is analyzed by the control device 150 to determine if cleaning is necessary and the location of the area to be cleaned.
Once the cleaning area is determined, the roller cleaning devices 30 may be moved by using the horizontal driver 50 (S230). For example, the roller cleaning devices 30 may be moved toward the wall surface of the chamber 10 by using the horizontal driver 50. In other words, the first and second rollers 32a and 32b of the roller cleaning devices 30 are brought into close contact with the wall surface of the chamber 10 by using the horizontal driver 50.
Once the roller cleaning devices 30 are in close contact with the wall surface of the chamber 10, the first and second rollers 32a and 32b are rotated by using the first and second roller rotation drivers 40a and 40b to clean the inner wall of the chamber (S240). In other words, each of the first and second rollers 32a and 32b are rotated (around own vertical axis) by using the first and second roller rotation drivers 40a and 40b to physically peel off and remove a contaminant formed on the inner wall of the chamber.
The roller cleaning devices 30 are rotated by using the main rotation driver 70 (S250). In other words, the first roller 32a and the second roller 32b of the roller cleaning devices 30 are rotated in the rotation direction of the chamber 10, e.g., along a circumference of the chamber 10) to remove a contaminant formed on the inner wall 15 of the chamber 10 of a larger area. For example, operations S240 and S240 may be performed simultaneously or sequentially.
Subsequently, the vision inspection device 130 is used to determine whether to re-clean the inner wall 15 of the chamber 10 (S260). In detail, as a contaminant remaining on the inner wall 15 of the chamber 10 may be distributed irregularly, after cleaning, contaminant may be inspected by the vision inspection device 130 via, e.g., blob detection. Blob detection is a method of detecting the presence or distribution of a contaminant by detecting features of the contaminant, e.g., an area, a size, a length, a shape, a width, and a circumference.
When the inner wall 15 of the chamber 10, which has been cleaned, is inspected by the vision inspection device 130 and determined, e.g., evaluated, as being clean, i.e., that the contaminant is removed, the cleaning process is stopped, and when it is evaluated that the contaminant is not removed, the cleaning process continues to be performed, e.g., operations S200 through S260 are repeated. Through such an automatic chamber cleaning method, a contaminant formed on an inner wall of a chamber may be easily removed and evaluation of a remaining contaminant may be easily performed.
By way of summation and review, when preventive maintenance is regularly performed on a semiconductor manufacturing apparatus, an operator may physically remove contaminant from an inner wall of a chamber by using a scrubber or the like. When the operator removes the contaminant from the inner wall of the chamber, the operator must bend down for a long time to perform a cleaning process for removing the contaminant from the inner wall of the chamber. Accordingly, the operator may develop a musculoskeletal disease, and toxic gas generated by the contaminants may cause health risks in the long term.
In addition, after the operator removes the contaminants from the inner wall of the chamber, the operator may visually determine whether the contaminants were sufficiently removed. However, a visual inspection may be inaccurate, thereby resulting in errors and multiple and repetitive cleaning operations to ensure removal of contaminants.
Example embodiments provide an automatic chamber cleaning system in which an inner wall of a chamber used in a semiconductor manufacturing apparatus may be automatically cleaned.
Example embodiments have been disclosed herein, and although specific terms are employed, they are used and are to be interpreted in a generic and descriptive sense only and not for purpose of limitation. In some instances, as would be apparent to one of ordinary skill in the art as of the filing of the present application, features, characteristics, and/or elements described in connection with a particular embodiment may be used singly or in combination with features, characteristics, and/or elements described in connection with other embodiments unless otherwise specifically indicated. Accordingly, it will be understood by those of skill in the art that various changes in form and details may be made without departing from the spirit and scope of the present invention as set forth in the following claims.